Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
01/14/1998 | EP0817973A1 Interface apparatus for automatic test equipment |
01/14/1998 | EP0755581B1 Overvoltage protection |
01/14/1998 | CN1170461A Method and apparatus for semiconductor die testing |
01/14/1998 | CN1170250A Rechargeable battery pack |
01/14/1998 | CN1170187A Driving chip, liquid crystal panel, liquid crystal device and electronic equipment |
01/14/1998 | CN1037047C Arrangement for detecting stator earth leakages in three-phase current machines |
01/13/1998 | US5708773 JTAG interface system for communicating with compliant and non-compliant JTAG devices |
01/13/1998 | US5708614 Data output control circuit of semiconductor memory device having pipeline structure |
01/13/1998 | US5708432 Coherent sampling digitizer system |
01/13/1998 | US5708379 Electronically programmable output impedance circuit |
01/13/1998 | US5708371 Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen |
01/13/1998 | US5708365 Method for analysis of silicon wafers |
01/13/1998 | US5708364 Method of monitoring a communications cable for damage |
01/13/1998 | US5708222 Inspection apparatus, transportation apparatus, and temperature control apparatus |
01/13/1998 | US5707881 Test structure and method for performing burn-in testing of a semiconductor product wafer |
01/13/1998 | US5707000 Apparatus and method for removing known good die using hot shear process |
01/08/1998 | WO1998000944A2 Test detection apparatus and method |
01/08/1998 | WO1998000783A1 Method and apparatus for power management of distributed direct memory access (ddma) devices |
01/08/1998 | WO1998000725A1 Methodology for testing a microcontroller chip adapted to control a liquid crystal display |
01/08/1998 | WO1998000724A1 Circuit board test |
01/08/1998 | DE19628515A1 Detecting and evaluating gaps or voids in bars of squirrel cage motors |
01/08/1998 | DE19627349A1 Antenna testing apparatus for vehicle |
01/08/1998 | DE19626931A1 Testing electrical and/or electronic equipment for electromagnetic compatibility |
01/08/1998 | DE19626527A1 Process and equipment for determination of partial voltage discharges |
01/07/1998 | EP0817559A1 Method of positioning ic and ic handler using the same |
01/07/1998 | EP0817364A1 Method of determining electrical angle and apparatus for the same |
01/07/1998 | EP0817260A2 IC package, IC prober and connector and method of forming the same |
01/07/1998 | EP0817202A2 Testing of a semi-conductor integrated circuit device |
01/07/1998 | EP0817056A1 Firing method & apparatus for random electrostatic discharge testing |
01/07/1998 | EP0816860A2 Detecting anomalies in electrical equipment operation |
01/07/1998 | EP0816830A2 Method and device for diagnosing insulation deterioration of an electrical apparatus |
01/07/1998 | EP0815461A2 Timing generator with multiple coherent synchronized clocks |
01/07/1998 | EP0815460A2 Manufacturing defect analyzer with improved fault coverage |
01/07/1998 | EP0815459A1 Circuitry and process for testing non-intermittent signal generators |
01/07/1998 | EP0655172B1 Method for battery charging and a battery system |
01/07/1998 | CN2272141Y Computerized tester of battery parameter |
01/07/1998 | CN1169560A Logical check apparatus for semiconductor circuits |
01/07/1998 | CN1169553A Battery capacity predicting method, Battery unit and apparatus using battery unit |
01/06/1998 | US5706300 Testing device for interfaces |
01/06/1998 | US5706297 System for adapting maintenance operations to JTAG and non-JTAG modules |
01/06/1998 | US5706296 Bi-directional scan design with memory and latching circuitry |
01/06/1998 | US5706294 Method of finding DC test point of an integrated circuit |
01/06/1998 | US5706234 Testing and repair of wide I/O semiconductor memory devices designed for testing |
01/06/1998 | US5706204 Apparatus for triggering alarms and waveform capture in an electric power system |
01/06/1998 | US5705944 Method and device for detecting internal resistance voltage drop on a chip |
01/06/1998 | US5705942 Method and apparatus for locating and improving critical speed paths in VLSI integrated circuits |
01/06/1998 | US5705936 Method and apparatus for automatically testing semiconductor diodes |
01/06/1998 | US5705935 Method of managing mapping data indicative of excellent/defective chips on semiconductor wafer |
01/06/1998 | US5705934 Integrated circuit |
01/06/1998 | US5705932 System for expanding space provided by test computer to test multiple integrated circuits simultaneously |
01/06/1998 | US5705929 Battery capacity monitoring system |
01/06/1998 | US5705925 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
01/06/1998 | US5705914 Overvoltage detecting apparatus for combination battery |
01/06/1998 | US5705912 Circuit for preventing overdischarge of rechargeable battery pack consisting of a plurality of rechargeable batteries |
01/06/1998 | US5705905 Source impedance measurement for motor control |
01/06/1998 | US5705861 Magnetic field pulse generator |
01/06/1998 | US5704489 SIMM/DIMM board handler |
01/06/1998 | US5704220 Testing equipment having refrigerator incorporated therein |
01/02/1998 | DE19726837A1 Storage test system for testing semiconductor memory unit |
01/02/1998 | DE19719996A1 Programmable compensation system for computer DRAM control chips |
01/02/1998 | DE19625876A1 Isolated handler system for integrated circuit tester |
01/02/1998 | DE19624858A1 ASIC application specified integrated circuit with self-test function |
01/02/1998 | DE19624759A1 Measuring unit for testing multi-core cables with leads twisted in pairs |
12/31/1997 | WO1997050283A1 System for mounting and checking functional assemblies for electric household appliances |
12/31/1997 | WO1997050001A1 A method of testing and fitting electronic surface-mounted components |
12/31/1997 | WO1997049977A1 Model-based fault detection system for electric motors |
12/31/1997 | CN2271715Y Testing device for main lead polarity, flow and high-voltage holding |
12/31/1997 | CN1169227A Method and apparatus for testing lines in a telecommunications network |
12/31/1997 | CN1169056A Variable speed controller for AC motor |
12/31/1997 | CN1169049A Capacity judging apparatus of capacitor in power converter outputting three level voltage |
12/31/1997 | CN1169028A Semiconductor device testing apparatus |
12/31/1997 | CA2258905A1 Test and alignment system for electronic display devices and test fixture for same |
12/30/1997 | US5703928 Method of sensing a signal in a pair of wires |
12/30/1997 | US5703885 Method and apparatus for constructing verification test sequences by merging and touring hierarchical unique input/output sequence (UIO) based test subsequence graphs |
12/30/1997 | US5703884 Scanning pass test circuit |
12/30/1997 | US5703789 In a computer implemented synthesis system |
12/30/1997 | US5703713 Multi-wavelength variable attenuator and half wave plate |
12/30/1997 | US5703515 For generating an output signal in accordance with a rate signal |
12/30/1997 | US5703512 Method and apparatus for test mode entry during power up |
12/30/1997 | US5703495 Data output impedance control |
12/30/1997 | US5703493 Wafer holder for semiconductor applications |
12/30/1997 | US5703492 System and method for fault analysis of semiconductor integrated circuit |
12/30/1997 | US5703491 Voltage detection apparatus |
12/30/1997 | US5703489 Timing calibration circuit and method for test signals |
12/30/1997 | US5703486 Battery remaining capacity measuring device |
12/30/1997 | US5703482 Apparatus for testing electronic devices in hostile media |
12/30/1997 | US5703469 System for determining battery conditions |
12/30/1997 | US5703412 Energy reservoir protection apparatus in vehicle occupant protection system |
12/30/1997 | US5703381 Semiconductor integrated circuit |
12/30/1997 | US5703361 Circuit scanning device and method |
12/30/1997 | US5703324 Shielded banana plug with double shroud and input receptacle |
12/30/1997 | US5703280 Method and apparatus for checking waterproof connectors for waterproofness |
12/30/1997 | US5703279 Waterproofness checking jig for a waterproof connector |
12/30/1997 | US5701667 Method of manufacture of an interconnect stress test coupon |
12/30/1997 | US5701666 Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer |
12/30/1997 | US5701645 Acoustic wave device manufacturing method |
12/30/1997 | CA2062126C Starting and operating circuit for arc discharge lamp |
12/29/1997 | EP0814395A2 Overcurrent sensing circuit for power mos field effect transistor |
12/29/1997 | EP0792462A4 Probe card assembly and kit, and methods of using same |
12/29/1997 | EP0754304B1 Device for checking the insulation condition of alternating-current-carrying lines or cables |