Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1998
01/14/1998EP0817973A1 Interface apparatus for automatic test equipment
01/14/1998EP0755581B1 Overvoltage protection
01/14/1998CN1170461A Method and apparatus for semiconductor die testing
01/14/1998CN1170250A Rechargeable battery pack
01/14/1998CN1170187A Driving chip, liquid crystal panel, liquid crystal device and electronic equipment
01/14/1998CN1037047C Arrangement for detecting stator earth leakages in three-phase current machines
01/13/1998US5708773 JTAG interface system for communicating with compliant and non-compliant JTAG devices
01/13/1998US5708614 Data output control circuit of semiconductor memory device having pipeline structure
01/13/1998US5708432 Coherent sampling digitizer system
01/13/1998US5708379 Electronically programmable output impedance circuit
01/13/1998US5708371 Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen
01/13/1998US5708365 Method for analysis of silicon wafers
01/13/1998US5708364 Method of monitoring a communications cable for damage
01/13/1998US5708222 Inspection apparatus, transportation apparatus, and temperature control apparatus
01/13/1998US5707881 Test structure and method for performing burn-in testing of a semiconductor product wafer
01/13/1998US5707000 Apparatus and method for removing known good die using hot shear process
01/08/1998WO1998000944A2 Test detection apparatus and method
01/08/1998WO1998000783A1 Method and apparatus for power management of distributed direct memory access (ddma) devices
01/08/1998WO1998000725A1 Methodology for testing a microcontroller chip adapted to control a liquid crystal display
01/08/1998WO1998000724A1 Circuit board test
01/08/1998DE19628515A1 Detecting and evaluating gaps or voids in bars of squirrel cage motors
01/08/1998DE19627349A1 Antenna testing apparatus for vehicle
01/08/1998DE19626931A1 Testing electrical and/or electronic equipment for electromagnetic compatibility
01/08/1998DE19626527A1 Process and equipment for determination of partial voltage discharges
01/07/1998EP0817559A1 Method of positioning ic and ic handler using the same
01/07/1998EP0817364A1 Method of determining electrical angle and apparatus for the same
01/07/1998EP0817260A2 IC package, IC prober and connector and method of forming the same
01/07/1998EP0817202A2 Testing of a semi-conductor integrated circuit device
01/07/1998EP0817056A1 Firing method & apparatus for random electrostatic discharge testing
01/07/1998EP0816860A2 Detecting anomalies in electrical equipment operation
01/07/1998EP0816830A2 Method and device for diagnosing insulation deterioration of an electrical apparatus
01/07/1998EP0815461A2 Timing generator with multiple coherent synchronized clocks
01/07/1998EP0815460A2 Manufacturing defect analyzer with improved fault coverage
01/07/1998EP0815459A1 Circuitry and process for testing non-intermittent signal generators
01/07/1998EP0655172B1 Method for battery charging and a battery system
01/07/1998CN2272141Y Computerized tester of battery parameter
01/07/1998CN1169560A Logical check apparatus for semiconductor circuits
01/07/1998CN1169553A Battery capacity predicting method, Battery unit and apparatus using battery unit
01/06/1998US5706300 Testing device for interfaces
01/06/1998US5706297 System for adapting maintenance operations to JTAG and non-JTAG modules
01/06/1998US5706296 Bi-directional scan design with memory and latching circuitry
01/06/1998US5706294 Method of finding DC test point of an integrated circuit
01/06/1998US5706234 Testing and repair of wide I/O semiconductor memory devices designed for testing
01/06/1998US5706204 Apparatus for triggering alarms and waveform capture in an electric power system
01/06/1998US5705944 Method and device for detecting internal resistance voltage drop on a chip
01/06/1998US5705942 Method and apparatus for locating and improving critical speed paths in VLSI integrated circuits
01/06/1998US5705936 Method and apparatus for automatically testing semiconductor diodes
01/06/1998US5705935 Method of managing mapping data indicative of excellent/defective chips on semiconductor wafer
01/06/1998US5705934 Integrated circuit
01/06/1998US5705932 System for expanding space provided by test computer to test multiple integrated circuits simultaneously
01/06/1998US5705929 Battery capacity monitoring system
01/06/1998US5705925 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
01/06/1998US5705914 Overvoltage detecting apparatus for combination battery
01/06/1998US5705912 Circuit for preventing overdischarge of rechargeable battery pack consisting of a plurality of rechargeable batteries
01/06/1998US5705905 Source impedance measurement for motor control
01/06/1998US5705861 Magnetic field pulse generator
01/06/1998US5704489 SIMM/DIMM board handler
01/06/1998US5704220 Testing equipment having refrigerator incorporated therein
01/02/1998DE19726837A1 Storage test system for testing semiconductor memory unit
01/02/1998DE19719996A1 Programmable compensation system for computer DRAM control chips
01/02/1998DE19625876A1 Isolated handler system for integrated circuit tester
01/02/1998DE19624858A1 ASIC application specified integrated circuit with self-test function
01/02/1998DE19624759A1 Measuring unit for testing multi-core cables with leads twisted in pairs
12/1997
12/31/1997WO1997050283A1 System for mounting and checking functional assemblies for electric household appliances
12/31/1997WO1997050001A1 A method of testing and fitting electronic surface-mounted components
12/31/1997WO1997049977A1 Model-based fault detection system for electric motors
12/31/1997CN2271715Y Testing device for main lead polarity, flow and high-voltage holding
12/31/1997CN1169227A Method and apparatus for testing lines in a telecommunications network
12/31/1997CN1169056A Variable speed controller for AC motor
12/31/1997CN1169049A Capacity judging apparatus of capacitor in power converter outputting three level voltage
12/31/1997CN1169028A Semiconductor device testing apparatus
12/31/1997CA2258905A1 Test and alignment system for electronic display devices and test fixture for same
12/30/1997US5703928 Method of sensing a signal in a pair of wires
12/30/1997US5703885 Method and apparatus for constructing verification test sequences by merging and touring hierarchical unique input/output sequence (UIO) based test subsequence graphs
12/30/1997US5703884 Scanning pass test circuit
12/30/1997US5703789 In a computer implemented synthesis system
12/30/1997US5703713 Multi-wavelength variable attenuator and half wave plate
12/30/1997US5703515 For generating an output signal in accordance with a rate signal
12/30/1997US5703512 Method and apparatus for test mode entry during power up
12/30/1997US5703495 Data output impedance control
12/30/1997US5703493 Wafer holder for semiconductor applications
12/30/1997US5703492 System and method for fault analysis of semiconductor integrated circuit
12/30/1997US5703491 Voltage detection apparatus
12/30/1997US5703489 Timing calibration circuit and method for test signals
12/30/1997US5703486 Battery remaining capacity measuring device
12/30/1997US5703482 Apparatus for testing electronic devices in hostile media
12/30/1997US5703469 System for determining battery conditions
12/30/1997US5703412 Energy reservoir protection apparatus in vehicle occupant protection system
12/30/1997US5703381 Semiconductor integrated circuit
12/30/1997US5703361 Circuit scanning device and method
12/30/1997US5703324 Shielded banana plug with double shroud and input receptacle
12/30/1997US5703280 Method and apparatus for checking waterproof connectors for waterproofness
12/30/1997US5703279 Waterproofness checking jig for a waterproof connector
12/30/1997US5701667 Method of manufacture of an interconnect stress test coupon
12/30/1997US5701666 Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer
12/30/1997US5701645 Acoustic wave device manufacturing method
12/30/1997CA2062126C Starting and operating circuit for arc discharge lamp
12/29/1997EP0814395A2 Overcurrent sensing circuit for power mos field effect transistor
12/29/1997EP0792462A4 Probe card assembly and kit, and methods of using same
12/29/1997EP0754304B1 Device for checking the insulation condition of alternating-current-carrying lines or cables