| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/07/1998 | US5736936 Method and apparatus for predicting peak voltage of a cable conveyed tool |
| 04/07/1998 | US5736863 Abatement of electron beam charging distortion during dimensional measurements of integrated circuit patterns with scanning electron microscopy by the utilization of specially designed test structures |
| 04/07/1998 | US5736862 System for detecting faults in connections between integrated circuits and circuit board traces |
| 04/07/1998 | US5736861 Circuit breaker tester |
| 04/07/1998 | US5736851 Ringing preventive circuit for removing noise in an electronics transmission on path of semiconductor testing apparatus |
| 04/07/1998 | US5736849 Semiconductor device and test method for connection between semiconductor devices |
| 04/07/1998 | US5736655 Method for evaluating a remaining life of a rotating machine coil |
| 04/02/1998 | WO1998013885A1 Thermochromic battery tester |
| 04/02/1998 | WO1998013702A1 Test device for an electronic tripping device |
| 04/02/1998 | WO1998013701A1 Impulse voltage generator circuit |
| 04/02/1998 | WO1998013700A1 Automatic fault location in cabling systems |
| 04/02/1998 | WO1998013695A1 Grid array package test contactor |
| 04/02/1998 | DE19743010A1 Oscillator and supply units connection detector laser |
| 04/02/1998 | DE19741390A1 Steuersystem zur Verwendung bei einer Transport- und Handhabungseinrichtung für Halbleiterbauelemente A control system for use in a transport and handling apparatus for semiconductor devices |
| 04/02/1998 | DE19640340A1 Short-circuit detection for three-phase power transmission conductor |
| 04/02/1998 | DE19640120A1 Circuit for checking switching matrix |
| 04/02/1998 | DE19639607A1 Instruction buffer cache memory testing method |
| 04/02/1998 | DE19634268C1 Electronic circuit for calibrating charge condition indication of storage battery |
| 04/02/1998 | CA2238485A1 Thermochromic battery tester |
| 04/01/1998 | EP0833436A2 AC motor control for a high speed deep well pump |
| 04/01/1998 | EP0833348A1 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells, particlarly flash cells |
| 04/01/1998 | EP0833166A2 Device for functional testing of individual magnets in an electromagnetic apparatus |
| 04/01/1998 | EP0833165A2 Test device for motor vehicles at the final checking or final assembly stage |
| 04/01/1998 | EP0833164A2 Contact device for testing electrical components in mounting machines |
| 04/01/1998 | EP0832439A1 Battery gauge |
| 04/01/1998 | EP0832438A1 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 04/01/1998 | EP0817974A4 Reflectometry methods for insulated pipes |
| 04/01/1998 | CN1178041A Temperature-compensated driver circuit |
| 04/01/1998 | CN1178009A Delay time measuring method and pulse generator for measuring delay time for use in said measuring method |
| 04/01/1998 | CN1178008A Comparator for semiconductor testing device |
| 03/31/1998 | US5734876 Analyzer for capturing elapsed time values if predetermined conditions have occurred or capturing maximum time value upon counter rollover if predetermined conditions have not occurred |
| 03/31/1998 | US5734868 Efficient in-system programming structure and method for non-volatile programmable logic devices |
| 03/31/1998 | US5734863 In a computer system |
| 03/31/1998 | US5734662 Period generating device |
| 03/31/1998 | US5734661 Method and apparatus for providing external access to internal integrated circuit test circuits |
| 03/31/1998 | US5734660 Scan test circuit for use in semiconductor integrated circuit |
| 03/31/1998 | US5734615 Memory testing apparatus for microelectronic integrated circuit |
| 03/31/1998 | US5734575 Method and apparatus for detecting high-impedance faults in electrical power systems |
| 03/31/1998 | US5734318 Electronic device |
| 03/31/1998 | US5734274 Fuse-programmable method and apparatus for preventing a semiconductor device from operating at speed greater than an approved speed |
| 03/31/1998 | US5734270 In an automatic handler test station |
| 03/31/1998 | US5734269 Bridge circuit fault monitoring apparatus using an output signal level from a bridge circuit and a power source current level to determine faults |
| 03/31/1998 | US5734175 Insulated-gate semiconductor device having a position recognizing pattern directly on the gate contact area |
| 03/31/1998 | US5734099 Potential travel distance estimation system for electric automobiles |
| 03/31/1998 | US5734094 Ion current detector device for use in an internal combustion engine |
| 03/31/1998 | US5733133 Pin socket connector for print circuit board |
| 03/27/1998 | CA2216415A1 Method for accelerated test of semiconductor devices |
| 03/26/1998 | WO1998012707A1 Method and apparatus for providing external access to internal integrated circuit test circuits |
| 03/26/1998 | WO1998012706A1 Device and method for testing integrated circuit dice in an integrated circuit module |
| 03/26/1998 | WO1998012705A1 Memory test circuit |
| 03/26/1998 | WO1998012569A1 Circuit to measure resistance and leakage |
| 03/26/1998 | WO1998012568A1 Process for producing semiconductor device and semiconductor device |
| 03/26/1998 | WO1998012566A1 Wire pair identification method |
| 03/26/1998 | DE19732229A1 Vorrichtung und Verfahren zur Steuerung des Anstriebsstrangs eines Kraftfahrzeugs Apparatus and method for controlling the Anstriebsstrangs a motor vehicle |
| 03/26/1998 | DE19640341A1 Device for detecting wire contacts in rail-vehicle monitoring systems |
| 03/26/1998 | DE19639023A1 Impulsspannungsgeneratorschaltung Voltage pulse generator circuit |
| 03/26/1998 | DE19638816A1 Tester for semiconductor arrangement |
| 03/25/1998 | EP0831621A2 Communication control apparatus |
| 03/25/1998 | EP0831334A2 Method for detecting electrical connection between antenna and receiver for a motor vehicle |
| 03/25/1998 | EP0831332A1 Adapter for testing electric circuit boards |
| 03/25/1998 | EP0831324A2 Impurity control |
| 03/25/1998 | EP0740795B1 Reversible chip contacting device |
| 03/25/1998 | EP0536028B1 Method to automatically compensate the time uncertainties of an electronic system tested by an automatic tester |
| 03/25/1998 | CN2277077Y Wire breakage position inferring meter |
| 03/25/1998 | CN2277076Y Multipurpose test pencil |
| 03/25/1998 | CN2276714Y Immediately sensing processing device for broken circuit or power failure of aquatic product breeding machinery |
| 03/25/1998 | CN1177228A Circuit for detecting overcharging and overdischarging |
| 03/25/1998 | CN1177188A Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and head circuit for semiconductor memory circuit |
| 03/25/1998 | CN1177187A System for testing hard disk drives |
| 03/24/1998 | US5732407 Configurable random access memory for programmable logic devices |
| 03/24/1998 | US5732277 Graphical system for modelling a process and associated method |
| 03/24/1998 | US5732246 Programmable array interconnect latch |
| 03/24/1998 | US5732209 Self-testing multi-processor die with internal compare points |
| 03/24/1998 | US5732091 Self initializing and correcting shared resource boundary scan with output latching |
| 03/24/1998 | US5732047 Timing comparator circuit for use in device testing apparatus |
| 03/24/1998 | US5731992 Method of reducing the time for adjusting and electronic function in an article that presents dispersion from one article to another |
| 03/24/1998 | US5731984 Vector-based waveform acquisition and display |
| 03/24/1998 | US5731983 Method for synthesizing a sequential circuit |
| 03/24/1998 | US5731708 Unpackaged semiconductor testing using an improved probe and precision X-Y table |
| 03/24/1998 | US5731706 Method for efficient calculation of power sum cross-talk loss |
| 03/24/1998 | US5731701 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
| 03/24/1998 | US5731700 Quiescent power supply current test method and apparatus for integrated circuits |
| 03/24/1998 | US5731698 Apparatus for detecting the amplitude and phase of an a.c. signal |
| 03/24/1998 | US5731525 Extraction force tester |
| 03/24/1998 | US5730634 Inspection method and inspection apparatus for field-emission cold cathode |
| 03/24/1998 | US5730243 Assist device for use in electric vehicles |
| 03/19/1998 | WO1998011646A1 Battery-powered electrical device |
| 03/19/1998 | WO1998011599A1 Integrated circuit tray with flexural bearings |
| 03/19/1998 | WO1998011449A1 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof |
| 03/19/1998 | WO1998011448A1 Methods and apparatus for detection of fault direction |
| 03/19/1998 | WO1998011445A1 Probe structure having a plurality of discrete insulated probe tips |
| 03/19/1998 | WO1998011444A1 Method of checking electrical components and device for carrying out this method |
| 03/18/1998 | EP0829731A2 Ultra high reliability electrical contacts |
| 03/18/1998 | EP0829730A1 A circuit for diagnosing the state of an electric load |
| 03/18/1998 | EP0829729A1 Measuring apparatus and method for the adjustment of test/measurement parameters |
| 03/18/1998 | EP0829015A1 Monitoring process for a capacitor lead-through and a monitoring system therefor |
| 03/18/1998 | EP0748535A4 Improved supply voltage detection circuit |
| 03/18/1998 | CN1176696A Composite film moisture barrier for on-cell tester |
| 03/18/1998 | CN1176695A Multilayer moisture barrier for electrochemical cell tester |
| 03/18/1998 | CN1176510A Electric Power apparatus |