G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1997
11/18/1997	US5689192 Method for simulating a controlled voltage for testing circuits for electromagnetic susceptibility
11/18/1997	US5689191 Terminal-in-connector checking device
11/18/1997	US5688715 Excimer laser dopant activation of backside illuminated CCD's
11/18/1997	US5688319 Method for testing electrical properties of silicon single crystal
11/18/1997	US5688269 Electrosurgical apparatus for laparoscopic and like procedures
11/18/1997	US5688128 Detachable socket for an IC chip
11/13/1997	WO1997042515A1 Methods and systems for increased numbers of test points on printed circuit boards
11/13/1997	WO1997042514A1 Systems for determining fault location on power distribution lines
11/13/1997	WO1997042513A1 Method and apparatus for throttle position sensor testing
11/13/1997	WO1997042512A1 Abnormality detection apparatus and abnormality detection method
11/13/1997	DE19718870A1 Test unit for multiple unencapsulated semiconductor chips in MCM
11/13/1997	DE19714941A1 Measuring card on which device to be tested can be set for input-output connection test
11/13/1997	DE19714756A1 Data processing circuit structure for describing or modelling of digital circuit
11/13/1997	DE19713986A1 Semiconductor component element test unit with test and handling sections
11/13/1997	DE19644094A1 System determining mechanical and-or rheological material properties of test body
11/13/1997	DE19620141A1 Protection device for detecting earth shorts in energising circuit for electrical machine
11/13/1997	DE19618897A1 Circuit for determining insulation resistance of accumulator battery in sole use
11/13/1997	CA2253879A1 Method and apparatus for throttle position sensor testing
11/13/1997	CA2253336A1 Methods and systems for increased numbers of test points on printed circuit boards
11/12/1997	EP0806678A2 Laser voltage probe methods and apparatus
11/12/1997	EP0806677A1 Method for detecting partial discharge
11/12/1997	EP0806676A1 Use of detecting electrode to measure partial discharge in a wire
11/12/1997	EP0806323A1 Method of testing the functioning of an output stage of a triggering circuit of a safety device
11/12/1997	EP0806072A1 Smart battery algorithm for reporting battery parameters to an external device
11/12/1997	EP0805986A1 System and method for locating faults in electric power cables
11/12/1997	EP0805978A1 Condition tester for a battery
11/12/1997	EP0805977A1 Composite film moisture barrier for on-cell tester
11/12/1997	EP0795200A4 Mounting electronic components to a circuit board
11/12/1997	CN2267507Y Intelligent testing and controlling device with speech function
11/12/1997	CN2267467Y Intelligent instrument for monitoring the performance of accumulator
11/12/1997	CN2267465Y Multi-function electrician test pencil
11/12/1997	CN2267336Y Device for testing high voltage ignition of automobile
11/12/1997	CN1164895A Semiconductor device transferring apparatus
11/12/1997	CN1164762A Integrated circuit tester for semiconductor
11/12/1997	CN1164649A Output resistance tester for driver integrated circuit and testing method thereof
11/12/1997	CN1036419C Method and apparatus for automatically measuring distance of fault in power cable
11/11/1997	US5687312 Method and apparatus for processor emulation
11/11/1997	US5687180 Method and circuit for checking operation of input buffers of a semiconductor circuit
11/11/1997	US5687179 Serial data input/output method and apparatus
11/11/1997	US5687178 Method and apparatus for testing a static RAM
11/11/1997	US5686897 Self-testing electronic grounding device
11/11/1997	US5686843 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module
11/11/1997	US5686840 Method and apparatus for throttle position sensor testing
11/11/1997	US5686839 Equipment and method for detecting electrical leakage in electric vehicle
11/11/1997	US5686834 Handling system
11/11/1997	US5686833 Load board enhanced for differential pressure retention in an IC test head
11/11/1997	US5686815 Method and apparatus for controlling the charging of a rechargeable battery to ensure that full charge is achieved without damaging the battery
11/11/1997	US5686317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die
11/11/1997	US5685761 Multi-purpose lamp fixture tool
11/11/1997	CA2123847C Low frequency discriminator circuit
11/06/1997	WO1997041479A1 Anti-vibration stabilizer for a portable emission microscope
11/06/1997	WO1997041460A2 Combined laser/flir optics system
11/06/1997	WO1997041448A1 Battery capacity measuring device
11/06/1997	DE19714575A1 Evaluation of mains feedback from test object
11/06/1997	DE19616542A1 Light emitting diode (LED) type battery monitor for multi-block batteries
11/06/1997	CA2226841A1 Battery capacity measuring device
11/05/1997	EP0805538A2 Overcurrent and short-circuit protection
11/05/1997	EP0805526A1 Shielded banana plug with double shroud and input receptacle
11/05/1997	EP0805460A1 Integrated circuit having a built-in selft-test arrangement
11/05/1997	EP0805458A1 An electronic circuit or board tester with compressed data-sequences
11/05/1997	EP0805356A2 Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry
11/05/1997	EP0805355A2 Procedure and apparatus for determining the distance to a cable fault
11/05/1997	EP0804741A1 Process for checking parts of motor vehicle systems
11/05/1997	EP0804722A1 Surface inspection system
11/05/1997	EP0804468A1 Conformationally constrained backbone cyclized peptide analog
11/05/1997	EP0417905B1 System scan path architecture
11/05/1997	CN2266741Y Multifunction electronic test pencil
11/05/1997	CN1164028A Apparatus and method for measuring PC board
11/04/1997	US5684808 System and method for satisfying mutually exclusive gating requirements in automatic test pattern generation systems
11/04/1997	US5684748 Circuit for testing reliability of chip and semiconductor memory device having the circuit
11/04/1997	US5684726 Firing method & apparatus for random ESD testing
11/04/1997	US5684724 Flashback simulator
11/04/1997	US5684721 Electronic systems and emulation and testing devices, cables, systems and methods
11/04/1997	US5684718 Method and apparatus for monitoring the operation of an electric generator
11/04/1997	US5684465 Method and means for supervision of valve units
11/04/1997	US5684421 Compensated delay locked loop timing vernier
11/04/1997	US5684406 Electromagnetic acoustic transducer fault detection circuit
11/04/1997	US5684405 Wet/dry hot stick tester
11/04/1997	US5684404 System and method of measuring a battery lifetime
11/04/1997	US5684384 Apparatus and method for discharging and charging a multiple battery arrangement
11/04/1997	US5684383 Regenerative charge control system estimating allowable regenerative power
11/04/1997	US5684371 Drive circuit for a bidirectional flow control valve
11/04/1997	US5684304 Structure for testing integrated circuits
11/04/1997	US5684301 For measuring geometrical characteristics of features on a substrate
11/04/1997	US5683261 Removable coupling module for mechanically multiplexing conductors
11/04/1997	CA2086641C Method and apparatus for detecting stator faults in rotary dynamoelectric machines
11/04/1997	CA2026477C Power supply testing system for non-utility power generators
10/1997
10/30/1997	WO1997040394A1 Apparatus for performing logic and leakage current tests on a digital logic circuit
10/30/1997	WO1997040393A1 Device for inserting at least one semiconductor component into a receptacle
10/30/1997	WO1997039929A1 Device for the recognition of electromagnetic interference
10/30/1997	WO1997029381A3 Process and device for determining a cable run in a cable carrier system of a technical installation and detector used therein
10/30/1997	DE19716366A1 Pattern generator for semiconductor testing system
10/30/1997	DE19713421A1 Semiconductor memory test apparatus with memory unit for DRAM
10/30/1997	DE19710196A1 Device for analysing gas in vacuum tube, e.g. cathode ray tube, lamp or fluorescent display
10/29/1997	EP0803959A2 Battery monitoring
10/29/1997	EP0803957A2 A battery charging system
10/29/1997	EP0803902A2 Semiconductor device with on-board memory areas for test purposes
10/29/1997	EP0803814A1 Increasing testability by clock transformation
10/29/1997	EP0803741A1 Method and apparatus for electronic testing of electricity meters
10/29/1997	EP0803735A1 Multi-chip module

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