| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/02/1997 | US5663656 System and method for executing on board diagnostics and maintaining an event history on a circuit board |
| 09/02/1997 | US5663654 For testing an array of semiconductor dice located on a wafer |
| 09/02/1997 | US5663653 Wafer probe station for low-current measurements |
| 09/02/1997 | US5663652 Method for measuring current distribution in an integrated circuit by detecting magneto-optic polarization rotation in an adjacent magneto-optic film |
| 09/02/1997 | US5663651 Method of separately determining plug resistor and interfacial resistor and test pattern for the same |
| 09/02/1997 | US5662289 Winding apparatus for coils formed of wire and film in which strips of films are held at each end by respective chucks |
| 09/02/1997 | US5661900 Method of fabricating an ultrasonically welded plastic support ring |
| 08/28/1997 | WO1997031272A1 Fault meter |
| 08/28/1997 | WO1997031255A1 Real time/off line applications testing system |
| 08/28/1997 | DE19708037A1 Test unit for testing unencapsulated semiconductor integrated circuit |
| 08/28/1997 | DE19633856C1 Indicating current converter saturation for measuring current in distribution network |
| 08/28/1997 | DE19606512A1 System with coupling in unit for coupling in test signal at any position in object |
| 08/28/1997 | CA2198660A1 Apparatus for triggering alarms and waveform capture in an electronic power system |
| 08/27/1997 | EP0792019A1 A wired-or multiplexer device |
| 08/27/1997 | EP0792001A2 Charging device |
| 08/27/1997 | EP0791934A2 Semiconductor memory device |
| 08/27/1997 | EP0791836A1 Electronic assembly identification device |
| 08/27/1997 | EP0791835A2 Laboratory test device for isolation testing of a load connected for testing purposes |
| 08/27/1997 | EP0791179A1 Method of locating a fault in a predetermined monitoring region of a miltiphase electrical power transmission system |
| 08/27/1997 | EP0791167A1 Method and device for quantitatively determining the setting of an alternator |
| 08/27/1997 | CN1158172A A voltage preference apparatus, a voltameter, a battery voltage detection apparatus, and a wireless communication device |
| 08/27/1997 | CN1158012A Battery pack |
| 08/27/1997 | CN1157926A A method for detecting fault of uninterrupted power source in fire-fighting equipment |
| 08/26/1997 | US5661733 Automatic test insertion |
| 08/26/1997 | US5661664 One-terminal data fault location system and process for locating a fault |
| 08/26/1997 | US5661658 Electrical system monitoring apparatus with programmable custom display |
| 08/26/1997 | US5661626 Excess current detection and control circuit for power source in semiconductor test system |
| 08/26/1997 | US5661520 Energy resolved emission microscopy system and method |
| 08/26/1997 | US5661481 A/D converter using resistor ladder network and method of testing the same |
| 08/26/1997 | US5661463 D.C. battery plant alarm monitoring remote apparatus |
| 08/26/1997 | US5661410 Method and apparatus for the detection of the current distribution in a conductor of an electric machine |
| 08/26/1997 | US5661409 Field programmable printed circuit board |
| 08/26/1997 | US5661408 Real-time in-line testing of semiconductor wafers |
| 08/26/1997 | US5661407 Integrated circuit probe testing device and method |
| 08/26/1997 | US5661386 Method for assessing in-service motor efficiency and in-service motor/load efficiency |
| 08/26/1997 | US5661330 Fabrication, testing and repair of multichip semiconductor structures having connect assemblies with fuses |
| 08/26/1997 | US5661042 Process for electrically connecting electrical devices using a conductive anisotropic material |
| 08/26/1997 | US5660672 In-situ monitoring of conductive films on semiconductor wafers |
| 08/21/1997 | WO1997030359A1 Method and apparatus for diagnosing bearing insulation impedance of a rotating electrical apparatus |
| 08/21/1997 | WO1997029856A1 Simm/dimm board handler |
| 08/21/1997 | DE19629781C1 Bridge terminating stage impedance testing method |
| 08/21/1997 | DE19605554A1 Function element testing unit in vehicle electrical system e.g. for drive-away protection lock |
| 08/20/1997 | EP0790690A2 Battery measurement module |
| 08/20/1997 | EP0790504A1 Connector detecting device |
| 08/20/1997 | EP0679262B1 Non-contact current injection apparatus and method for use with linear bipolar circuits |
| 08/20/1997 | CN2260332Y Multi-function test pencil |
| 08/20/1997 | CN1035710C Device for driving brushless DC motor and method of idntification of falt thereof |
| 08/19/1997 | US5659680 PC compatible modular based diagnostic system |
| 08/19/1997 | US5659554 Used for verifying operations of an object |
| 08/19/1997 | US5659553 Comparison circuit for comparing semiconductor device output by strobe signal timing |
| 08/19/1997 | US5659552 Method and apparatus for verifying test information on a backplane test bus |
| 08/19/1997 | US5659550 Latent defect handling in EEPROM devices |
| 08/19/1997 | US5659549 Memory test system having a pattern generator for a multi-bit test |
| 08/19/1997 | US5659548 Communication control apparatus |
| 08/19/1997 | US5659511 Method for measuring the current leakage of a dynamic random access memory capacitive junction |
| 08/19/1997 | US5659510 Integrated circuit devices with reliable fuse-based mode selection capability and methods of operating same |
| 08/19/1997 | US5659508 Special mode enable transparent to normal mode operation |
| 08/19/1997 | US5659483 System and method for analyzing conductor formation processes |
| 08/19/1997 | US5659474 Diagnostic apparatus for squib line system in vehicular air bag system |
| 08/19/1997 | US5659468 Process for monitoring and/or detecting changes under load of the operating state of an electrical power machine |
| 08/19/1997 | US5659453 Arc burst pattern analysis fault detection system |
| 08/19/1997 | US5659390 Method and apparatus for detecting particles on a surface of a semiconductor wafer having repetitive patterns |
| 08/19/1997 | US5659257 Method and circuit structure for measuring and testing discrete components on mixed-signal circuit boards |
| 08/19/1997 | US5659256 Method and apparatus for testing integrated circuit chips |
| 08/19/1997 | US5659255 Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels |
| 08/19/1997 | US5659252 Apparatus and method for detecting arcing in a CRT |
| 08/19/1997 | US5659245 ESD bypass and EMI shielding trace design in burn-in board |
| 08/19/1997 | US5659244 Electronic circuit tester and method of testing electronic circuit |
| 08/19/1997 | US5659242 Apparatus for comparing two waveforms in real time |
| 08/19/1997 | US5659232 Method of determining the efficiency of asynchronous motors and apparatus for carrying out the method |
| 08/19/1997 | US5658682 Process for detecting remaining capacity of battery |
| 08/19/1997 | US5658153 Socket apparatus |
| 08/14/1997 | WO1997029523A1 Electrochemical cell label with integrated tester |
| 08/14/1997 | WO1997029384A1 Assembly and method for testing integrated circuit devices |
| 08/14/1997 | WO1997029383A1 Method of handling electronic components |
| 08/14/1997 | WO1997029382A1 I/o toggle test method using jtag |
| 08/14/1997 | WO1997029381A2 Process and device for determining a cable run in a cable carrier system of a technical installation and detector used therein |
| 08/14/1997 | WO1997029380A1 Arrangement for the testing of semiconductor structures |
| 08/14/1997 | WO1997029379A1 Carrier for receiving and holding a test base for integrated circuits |
| 08/14/1997 | WO1997028986A1 Monitoring circuit for an abs warning lamp |
| 08/14/1997 | WO1997021234A3 Method and device for monitoring consumption of contact elements in a switching device |
| 08/14/1997 | DE19606896A1 Light signals setting and monitoring circuit, esp. for railway operations |
| 08/14/1997 | DE19604833A1 Anordnung zum Testen von Halbleiterstrukturen Arrangement for the testing of semiconductor structures |
| 08/14/1997 | DE19604781A1 Carrier for receiving and holding test base for integrated circuits |
| 08/14/1997 | DE19604624A1 Electrical tester for multicore cable connections with plugs |
| 08/13/1997 | EP0789462A2 Method and apparatus for processing time domain cross-talk information |
| 08/13/1997 | EP0789249A2 Test method and apparatus for semiconductor element |
| 08/13/1997 | EP0789248A2 Method of and apparatus for monitoring and testing the insulation of electrical components |
| 08/13/1997 | EP0788729A1 Programmable high density electronic testing device |
| 08/13/1997 | EP0536258B1 Faulted circuit detector having isolated indicator |
| 08/13/1997 | EP0531428B1 Test fixture alignment apparatus and method |
| 08/13/1997 | CN1156829A Device transfer mechanism for IC test handler |
| 08/12/1997 | US5657486 Automatic test equipment with pipelined sequencer |
| 08/12/1997 | US5657441 Self-diagnosis program storage unit detachably connected to a programmable device |
| 08/12/1997 | US5657394 Integrated circuit probe card inspection system |
| 08/12/1997 | US5657330 Single-chip microprocessor with built-in self-testing function |
| 08/12/1997 | US5657329 Testing integrated circuits provided on a carrier |
| 08/12/1997 | US5657328 For accessing a target circuit to evaluate operation of the target circuit |
| 08/12/1997 | US5657283 Diagnostic data port for a LSI or VLSI integrated circuit |
| 08/12/1997 | US5657244 Distinguishing power line arcing from RF emissions |