Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1997
10/08/1997EP0800091A2 Apparatus and method for testing semiconductor element and semiconductor device
10/08/1997EP0800090A1 Connecting condition examination apparatus, portable electronic equipment and connecting condition examination method
10/08/1997EP0799424A1 Method and apparatus for semiconductor die testing
10/08/1997EP0649582A4 Margin test apparatus for integrated services digital networks.
10/08/1997EP0469721B1 Mode switching for a memory system with diagnostic scan
10/08/1997CN2264376Y Battery Characteristic automatic detector
10/08/1997CN2264375Y Symmetrical surface-sealing integrated circuit base pin tester
10/08/1997CN2264374Y High voltage network short-circuit fault indicator
10/08/1997CN1161749A Method for monitoring wear of at least one contact in a switching device and switching device designed therefor
10/08/1997CN1161748A AC power outlet ground integrity and wire test circuit device
10/08/1997CN1161632A Transfer apparatus
10/08/1997CN1161580A Battery discriminating method dry battery cell pack, and electronic device
10/08/1997CN1161455A Handler contact checking device and method of testing integrated circuit devices
10/07/1997US5675807 Interrupt message delivery identified by storage location of received interrupt data
10/07/1997US5675728 Apparatus and method identifying false timing paths in digital circuits
10/07/1997US5675589 Programmable scan chain testing structure and method
10/07/1997US5675588 Testing apparatus for transmission system
10/07/1997US5675579 Method for verifying responses to messages using a barrier message
10/07/1997US5675546 On-chip automatic procedures for memory testing
10/07/1997US5675523 Waveform data generating apparatus
10/07/1997US5675522 Method and system for dividing analyzing region in device simulator
10/07/1997US5675499 Optimal probe point placement
10/07/1997US5675497 Method for monitoring an electric motor and detecting a departure from normal operation
10/07/1997US5675482 Accident detection circuit of a voltage-type self-excited power converter
10/07/1997US5675465 Field ground fault detector and field ground fault relay for detecting ground fault corresponding to DC component extracted from ground fault current
10/07/1997US5675274 Semiconductor clock signal generation circuit
10/07/1997US5675265 Method of measuring delay time in semiconductor device
10/07/1997US5675260 For testing different shaped structures
10/07/1997US5675258 Apparatus for detecting battery pack deterioration during discharge mode and method for inhibiting deterioration detection of a significantly drained battery pack during charging mode
10/07/1997US5675247 Dual head armature processing method and apparatus
10/07/1997US5675236 Low battery power state determination apparatus and method for secondary battery
10/07/1997US5675137 Bar code decoding using moving averages to break the (n,k) code barrier for UPC, EAN Code 128 and others
10/07/1997US5673799 Machine for testing and sorting capacitor chips and method of operating same
10/07/1997CA2079286C Partial-scan built-in self-test technique
10/04/1997CA2199900A1 Solder connection testing between electronic components and substrates carrying the components
10/03/1997CA2173268A1 Automatic multi-function testing machine for electric appliances
10/02/1997WO1997036399A1 Process for determining potential shifts between electronic modules in a wire bus network
10/02/1997WO1997036232A1 System for testing a computer built into a control device
10/02/1997WO1997036184A1 Process for testing the ground contact of parts of a networked system
10/02/1997WO1997036183A1 Process for testing and ensuring the availability of a networked system
10/02/1997WO1997036182A1 Energy device analysis and evaluation
10/02/1997DE19612891A1 Method of testing one or more interconnected electronic loads, esp. loads with frequency dependent impedances
10/02/1997DE19612713A1 Semiconductor processing device, esp. for IC(s)
10/02/1997DE19612441A1 Schaltungsanordnung mit einer Testschaltung A circuit arrangement with a testing circuit
10/02/1997DE19612336A1 Test device with measurement contact for coil winding of coil body
10/02/1997DE19612259A1 Integrated circuit component with cooling arrangement for high pin count package
10/01/1997EP0798895A1 Integrated circuit for coupling a microcontrolled controlling device to a two-wire bus
10/01/1997EP0798739A2 Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell
10/01/1997EP0798620A2 Method and apparatus for enhancing security in and discouraging theft of VLSI and ULSI devices
10/01/1997EP0797889A1 A method and apparatus for testing lines in a telecommunications network
10/01/1997EP0797833A1 True hysteresis window comparator
10/01/1997EP0797802A2 Digital trimming of on-chip analog components
10/01/1997EP0797794A1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device
10/01/1997EP0797763A1 Scanning system for inspecting anomalies on surfaces
10/01/1997EP0706663B1 Electrical test instrument
10/01/1997CN2263795Y Apparatus for testing black and white kinescope service life
10/01/1997CN1161084A Process for determining the state of charge of an accumulator
09/1997
09/30/1997US5673277 Scan test circuit using fast transmission gate switch
09/30/1997US5673276 Boundary-scan-compliant multi-chip module
09/30/1997US5673275 Accelerated mode tester timing
09/30/1997US5673274 Test method for semiconductor device
09/30/1997US5673272 Apparatus and method for performing digital signal processing in an electronic circuit tester
09/30/1997US5673271 High speed pattern generator
09/30/1997US5673229 Dynamic random access memory
09/30/1997US5673228 Integrated circuit having an EEPROM, semiconductor wafer provided with such integrated circuits, and method of testing such a semiconductor wafer
09/30/1997US5673194 Recording system for a production line
09/30/1997US5673028 Electronic component failure indicator
09/30/1997US5672982 Semiconductor integrated circuit
09/30/1997US5672981 Universal power interface adapter for burn-in board
09/30/1997US5672980 Method and apparatus for testing integrated circuit chips
09/30/1997US5672977 For examining an electrical characteristic of an object
09/30/1997US5672973 Apparatus for monitoring battery residual capacity in mulitple modes
09/30/1997US5672966 High speed post-programming net packing method
09/30/1997US5672965 Evaluation board for evaluating electrical characteristics of an IC package
09/30/1997US5672958 Method and apparatus for modifying feedback sensing for a redundant power supply system
09/30/1997US5672951 Determination and control of battery state
09/30/1997US5672917 Semiconductor power switch system
09/30/1997US5672440 Changes its visible appearance when reduced upon application of a power source
09/25/1997DE19611520A1 System zum Test eines in einem Steuergerät eingebauten Rechners A system for testing a control unit installed in a computer
09/25/1997DE19611194A1 Timing generator for multi standard oscillator used in semiconductor tester
09/25/1997DE19610986A1 Earthing cables testing method, for use on enclosed production equipment
09/24/1997EP0797101A1 Process and apparatus for detecting an electrical connection fault between a connector and a screened cable
09/24/1997EP0797100A2 Method and apparatus for measurement of current-voltage characteristic curves of solar panels
09/24/1997EP0797099A1 Counter and a revolution stop detection apparatus using the counter
09/24/1997EP0796435A1 Method and device for locating partial discharges in an electric high-voltage apparatus
09/24/1997EP0796434A1 Device for locating defects in underwater telecommunication links
09/24/1997EP0713580B1 Process and device for monitoring the temperature of an electric generator
09/24/1997EP0706407B1 Fault-tolerant elective replacement indication for implantable medical device
09/24/1997CN1160208A Continuous scan recording method capable of monitoring plurality of batteries simultaneously
09/23/1997US5671281 For altering the parameters of a data processing system
09/23/1997US5671234 Programmable input/output buffer circuit with test capability
09/23/1997US5671233 Integrated circuit incorporating a test circuit
09/23/1997US5671183 Method for programming permanent calibration information at final test without increasing pin count
09/23/1997US5671150 System and method for modelling integrated circuit bridging faults
09/23/1997US5671148 Apparatus and method for checking logic circuit
09/23/1997US5670972 Self-diagnosis arrangement for a video display and method of implementing the same
09/23/1997US5670892 Apparatus and method for measuring quiescent current utilizing timeset switching
09/23/1997US5670890 Switchable pull-ups and pull-downs for IDDQ testing of integrated circuits
09/23/1997US5670889 Probe card for maintaining the position of a probe in high temperature application
09/23/1997US5670888 Method for transporting and testing wafers