| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 05/06/1998 | EP0840134A1 A test access port (TAP) controller and a method of effecting communication using the same |
| 05/06/1998 | EP0840133A2 Probe card integrated with dummy components equivalent to parasitic components coupled to bare chip sealed in package |
| 05/06/1998 | EP0840131A2 Loaded-board guided-probe test fixture |
| 05/06/1998 | EP0840130A2 Standard- and limited-access hybrid test fixture |
| 05/06/1998 | EP0839325A1 Measuring circuit for detecting and locating incursions of water in pipe or cable installations |
| 05/06/1998 | EP0839323A1 Microelectronic spring contact elements |
| 05/06/1998 | EP0839322A1 Microelectronic contact structure and method of making same |
| 05/06/1998 | EP0839321A1 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 05/06/1998 | CN2280918Y Clamp for testing electronic device |
| 05/06/1998 | CN1180933A Integrated circuit and fabricating method and evaluating method of integrated circuit |
| 05/06/1998 | CN1180930A Decision method for semiconductor integrated circuit whether or not qualified and semiconductor integrated circuit |
| 05/06/1998 | CN1180644A Control system for use with semiconductor device transporting and handling apparatus |
| 05/06/1998 | CN1038276C High-intelligent cable fault scintillation detector |
| 05/05/1998 | US5748875 Digital logic simulation/emulation system |
| 05/05/1998 | US5748846 Neural engineering utility with adaptive algorithms |
| 05/05/1998 | US5748647 Low cost testing method for register transfer level circuits |
| 05/05/1998 | US5748646 Design-for-testability method for path delay faults and test pattern generation method for path delay faults |
| 05/05/1998 | US5748645 Clock scan design from sizzle global clock and method therefor |
| 05/05/1998 | US5748644 Method and apparatus for producing self-diagnostic information from a circuit board |
| 05/05/1998 | US5748643 Fast scan GRA cell circuit |
| 05/05/1998 | US5748642 Parallel processing integrated circuit tester |
| 05/05/1998 | US5748641 Test circuit of semiconductor memory device having data scramble function |
| 05/05/1998 | US5748639 Multi-bit test circuits for integrated circuit memory devices and related methods |
| 05/05/1998 | US5748533 Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell |
| 05/05/1998 | US5748497 System and method for improving fault coverage of an electric circuit |
| 05/05/1998 | US5748463 Generating apparatus for vehicle |
| 05/05/1998 | US5748427 Method and system for detecting relay failure |
| 05/05/1998 | US5748124 Analog channel for mixed-signal-VLSI tester |
| 05/05/1998 | US5748017 Method and apparatus for determining linearity of a ramp signal |
| 05/05/1998 | US5748012 Methodology to test pulsed logic circuits in pseudo-static mode |
| 05/05/1998 | US5748008 Electrical integrity test system for boats |
| 05/05/1998 | US5748006 High-frequency-transmission printed wiring board, probe card, and probe apparatus |
| 05/05/1998 | US5747999 Feed control element used in substrate inspection and method and apparatus for inspecting substrates |
| 05/05/1998 | US5747994 Board exchange mechanism for semiconductor test system |
| 05/05/1998 | US5747984 Switching component for detecting contact erosion |
| 05/05/1998 | US5747892 Galvanic isolator fault monitor |
| 05/05/1998 | US5747818 Thermoelectric cooling in gas-assisted FIB system |
| 05/05/1998 | US5747803 Method for preventing charging effect and thermal damage in charged-particle microscopy |
| 05/05/1998 | US5747365 Method for preparing semiconductor chip as SEM specimen |
| 05/05/1998 | US5747189 Smart battery |
| 05/05/1998 | CA2162433C Tool condition monitoring system |
| 05/05/1998 | CA2103278C Multi-layer female component for refastenable fastening device and method of making the same |
| 05/05/1998 | CA2073385C Monitoring diagnosis device for electrical appliance |
| 04/30/1998 | WO1998018134A1 Overvoltage detection circuit for test mode selection |
| 04/30/1998 | WO1998018133A1 Memory tester |
| 04/30/1998 | WO1998018077A1 Method and system for identifying tested path-delay faults |
| 04/30/1998 | WO1998018066A2 Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
| 04/30/1998 | WO1998018015A1 Apparatus for testing of printed circuit boards |
| 04/30/1998 | WO1998018014A1 Switching arrangement for monitoring leakage current |
| 04/30/1998 | WO1997047980A3 Method for testing digital circuits within synchronously sampled data detection channel |
| 04/30/1998 | DE19746302A1 Test device for semiconductor memory, DRAM |
| 04/30/1998 | DE19746113A1 Voltage supply circuit with feedback voltage source |
| 04/30/1998 | DE19723262A1 Halbleiterschaltungsvorrichtung, die eine sicherungsprogrammierbare Bestanden/Durchgefallen- Identifizierungsschaltung aufweist, und Bestanden/Durchgefallen-Bestimmungsverfahren für dieselbe A semiconductor circuit device having a fuse programmable pass / Durchgefallen- identification circuit, and pass / fail determination method for the same |
| 04/30/1998 | DE19644181A1 Schaltungsanordnung zur Leckstromüberwachung Circuit arrangement for leakage current monitoring |
| 04/30/1998 | DE19639685C1 Burn-in circuit board testing method |
| 04/29/1998 | EP0838836A2 Thermoelectric cooling in gas-assisted focused ion beam (FIB) system |
| 04/29/1998 | EP0838772A2 Method and apparatus for design verification using emulation and simulation |
| 04/29/1998 | EP0838760A2 Multiple on-chip IDDQ monitors |
| 04/29/1998 | EP0838689A2 Test of circuits with Schmitt inputs |
| 04/29/1998 | EP0838688A2 Device and procedure for testing printed circuit boards |
| 04/29/1998 | EP0838687A1 Abnormality detection apparatus and abnormality detection method |
| 04/29/1998 | EP0838669A2 Method and means for noise measurement of electric machines and apparatus |
| 04/29/1998 | EP0838192A1 Cover arrangement for a vacuum cleaner housing |
| 04/29/1998 | EP0837801A1 Device for the recognition of electromagnetic interference |
| 04/29/1998 | EP0748450B1 Printed circuit board test set with test adapter and method for setting the latter |
| 04/29/1998 | EP0627083B1 Method and apparatus for electronic meter testing |
| 04/29/1998 | CN1180412A Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
| 04/29/1998 | CN1180409A Condition tester for battery |
| 04/29/1998 | CN1180171A IC transporting device |
| 04/28/1998 | US5745593 Method and system for inspecting integrated circuit lead burrs |
| 04/28/1998 | US5745501 Apparatus and method for generating integrated circuit test patterns |
| 04/28/1998 | US5745500 Built-in self testing for the identification of faulty integrated circuit chips in a multichip module |
| 04/28/1998 | US5745498 Rapid compare of two binary numbers |
| 04/28/1998 | US5745430 Circuit and method to externally adjust internal circuit timing |
| 04/28/1998 | US5745415 Circuit for SRAM test mode isolated bitline modulation |
| 04/28/1998 | US5745409 Non-volatile memory with analog and digital interface and storage |
| 04/28/1998 | US5745386 Timing diagram method for inputting logic design parameters to build a testcase for the logic diagram |
| 04/28/1998 | US5745003 Driver circuits for IC tester |
| 04/28/1998 | US5744979 Programmable integrated circuit |
| 04/28/1998 | US5744975 Enhanced defect elimination process for electronic assemblies via application of sequentially combined multiple stress processes |
| 04/28/1998 | US5744974 Test head interface with vacuum-activated interconnection components |
| 04/28/1998 | US5744969 Analog and mixed signal device tester |
| 04/28/1998 | US5744967 Apparatus for detecting intermittent and continuous faults in multiple conductor wiring and terminations for electronic systems |
| 04/28/1998 | US5744966 Inspection apparatus for screening connectors with accessories |
| 04/28/1998 | US5744965 System for continuously monitoring the integrity of an electrical contact connection |
| 04/28/1998 | US5744964 Method and apparatus for electrical test of wiring patterns formed on a printed circuit board |
| 04/28/1998 | US5744963 Battery residual capacity measuring apparatus and method for measuring open-circuit voltages as the battery starts and stops supplying power |
| 04/28/1998 | US5744962 Automated data storing battery tester and multimeter |
| 04/28/1998 | US5744949 Analog test cell circuit |
| 04/28/1998 | US5744946 Printed circuit board fault injection circuit |
| 04/28/1998 | US5744938 Method and apparatus for testing a vehicle charge storage system |
| 04/28/1998 | US5744932 Apparatus and method for monitoring backup battery flow charge |
| 04/28/1998 | US5744931 Battery remaining capacity measuring apparatus |
| 04/28/1998 | CA2133864C Apparatus for detecting the amplitude and phase of an a.c. signal |
| 04/28/1998 | CA2090707C Battery operated computer having improved battery gauge and system for measuring battery charge |
| 04/23/1998 | WO1998017086A1 Method and apparatus for seating printed circuit boards with electrical sockets in a chamber |
| 04/23/1998 | WO1998016933A1 Memory tester and method of switching the tester to ram test mode and rom test mode |
| 04/23/1998 | WO1998016881A1 Method for testing and for generating a mapping for an electronic device |
| 04/23/1998 | WO1998016840A1 A test probe |
| 04/23/1998 | WO1998016781A1 Expandable panel for environmentally controllable chamber |