| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/23/1998 | WO1998016362A1 Plant for obtaining sheets with optical effects |
| 04/23/1998 | DE19745218A1 Steuerschaltung und Verfahren zur Steuerung des Schaltens von MOS-Gate-gesteuerten Leistungshalbleiterbauteilen Control circuit and method for controlling the switching of MOS-gated power semiconductor components |
| 04/23/1998 | DE19717283C1 Method of contact free longitudinal and transversal homogeneity examination of critical current density in strip supraconductors |
| 04/23/1998 | DE19642639A1 Device for checking connections of measurement conductor pairs |
| 04/23/1998 | CA2239625A1 Plant for obtaining sheets with optical effects |
| 04/22/1998 | EP0837336A2 A method and apparatus for scan testing of electrical circuits |
| 04/22/1998 | EP0837335A1 Method and apparatus for temperature control of a device during testing |
| 04/22/1998 | EP0837333A2 Apparatus for aligning a semiconductor wafer with an inspection contactor |
| 04/22/1998 | EP0837310A2 Quality test system for electric appliances |
| 04/22/1998 | EP0836966A2 Electric energy supplying device |
| 04/22/1998 | EP0805986A4 System and method for locating faults in electric power cables |
| 04/22/1998 | EP0783703A4 Fault sensor device with radio transceiver |
| 04/22/1998 | CN2279714Y Safety grounding power socket with monitoring device |
| 04/22/1998 | CN2279615Y Comprehensive testing instrument for on-load tap changer of power transformer |
| 04/22/1998 | CN2279614Y LED line testing device independently operated by single person |
| 04/22/1998 | CN1179640A Battery charging apparatus |
| 04/22/1998 | CN1179623A Specific part searching method and device for memory LSI |
| 04/21/1998 | US5742658 Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer |
| 04/21/1998 | US5742617 Controller for implementing scan testing |
| 04/21/1998 | US5742522 Adaptive, on line, statistical method and apparatus for detection of broken bars in motors by passive motor current monitoring and digital torque estimation |
| 04/21/1998 | US5742513 Methods and systems for automatic testing of a relay |
| 04/21/1998 | US5742487 IC carrier |
| 04/21/1998 | US5742395 Method for checking semiconductor wafers and apparatuses for carrying out the method |
| 04/21/1998 | US5742230 Apparatus for triggering a warning device |
| 04/21/1998 | US5742216 Contact making and breaking device and system for measuring low current |
| 04/21/1998 | US5742188 Universal input data sampling circuit and method thereof |
| 04/21/1998 | US5742177 Method for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperatures |
| 04/21/1998 | US5742176 Method of measuring a Fe-B concentration of a silicon wafer |
| 04/21/1998 | US5742175 Method of evaluating a density of oxygen-precipitation defects in a silicon wafer |
| 04/21/1998 | US5742169 Apparatus for testing interconnects for semiconductor dice |
| 04/21/1998 | US5742158 IC test handler having a planet rotating mechanism for cooling or heating ICs |
| 04/21/1998 | US5742148 Charge/discharge control circuit and chargeable electric power source apparatus |
| 04/21/1998 | US5741985 Electronic assembly pallet |
| 04/21/1998 | US5740600 Electric motor stator winding bonding apparatus and method therefore |
| 04/21/1998 | CA2049832C Optical magnetic-field sensor and method of producing the same |
| 04/21/1998 | CA2004563C Current monitoring |
| 04/18/1998 | CA2219003A1 Method and system for testing performance of refrigeration units |
| 04/16/1998 | WO1998015844A1 Method for inspecting an integrated circuit |
| 04/16/1998 | WO1998015843A1 Modular, semiconductor reliability test system |
| 04/16/1998 | WO1998015840A2 System for monitoring the condition of a plurality of lamps |
| 04/16/1998 | WO1998015821A1 Midpoint battery monitoring |
| 04/16/1998 | DE4418892C2 Mikrocomputer Microcomputer |
| 04/15/1998 | EP0836273A1 Semiconductor device |
| 04/15/1998 | EP0836197A2 Method for accelerated test of semiconductor devices |
| 04/15/1998 | EP0836196A2 Improvements in or relating to non-volatile memory devices |
| 04/15/1998 | EP0836098A2 Height stage for positioning apparatus |
| 04/15/1998 | EP0780028B1 Ball grid array socket |
| 04/15/1998 | EP0585870B1 Dynamic random access memory with voltage stress applying circuit |
| 04/15/1998 | CN2278942Y High voltage ac and dc insulation tester |
| 04/15/1998 | CN1179006A Probe card and tester using said card |
| 04/15/1998 | CN1178909A Integrated circuit tester |
| 04/15/1998 | CN1038075C Nonlosable semiconductor memory |
| 04/14/1998 | US5740429 E10 reporting tool |
| 04/14/1998 | US5740403 Process circuit & system for protecting an integrated circuit against fraudulent use |
| 04/14/1998 | US5740352 Liquid-crystal display test system and method |
| 04/14/1998 | US5740272 Inspection apparatus of wiring board |
| 04/14/1998 | US5740255 High fidelity audio cable comparator and method therefor |
| 04/14/1998 | US5740219 Digital counter test circuit |
| 04/14/1998 | US5740182 Method and apparatus for testing a circuit with reduced test pattern constraints |
| 04/14/1998 | US5740181 Method and apparatus for at speed observability of pipelined circuits |
| 04/14/1998 | US5740180 Circuit and test method for testing input cells |
| 04/14/1998 | US5740132 Electronic timepiece and method of charging the same |
| 04/14/1998 | US5740086 Semiconductor test system linked to cad data |
| 04/14/1998 | US5739846 Method of inspecting component placement accuracy for each first selected circuit board to be assembled of a batch |
| 04/14/1998 | US5739698 Machine fault detection using slot pass frequency flux measurements |
| 04/14/1998 | US5739696 Probe and apparatus for testing electronic components |
| 04/14/1998 | US5739695 Method for dynamically testing radio systems for the motor vehicle environment |
| 04/14/1998 | US5739694 Apparatus for testing operation of a display panel adapted to be connected to a drive mechanism by an electrical cable of predetermined connector configuration |
| 04/14/1998 | US5739693 Method for detecting ground faults on the conductors of an electrical machine |
| 04/14/1998 | US5739674 Method of transmitting and receiving signal indicative of remaining capacity of storage battery for propelling electric vehicle |
| 04/14/1998 | US5739671 Device for accurate detection of remaining discharge capacities of a plurality of batteries |
| 04/14/1998 | US5739670 Method for diagnosing battery condition |
| 04/14/1998 | US5739649 Fail check device and method for AC motor control circuit |
| 04/14/1998 | US5739054 Process for forming an encapsulated electronic component having an integral resin projection |
| 04/14/1998 | US5738267 Apparatus and method for removing known good die using hot shear process |
| 04/14/1998 | CA2129390C Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults |
| 04/09/1998 | WO1998014954A1 Memory tester |
| 04/09/1998 | WO1998014790A1 Fault warning in electronic sensors |
| 04/09/1998 | DE3690173C2 Battery tester having layers of liq. crystal and conducting materials |
| 04/09/1998 | DE19743707A1 Large capacity memory tester for flash-memory |
| 04/09/1998 | DE19717369A1 Probe card and probe device using such probe card |
| 04/09/1998 | DE19642065A1 Arrangement for electrical monitoring of short circuit connection between opposing wheels of railway vehicle without common axle |
| 04/09/1998 | DE19640821A1 Earth fault identification process for power distribution network |
| 04/09/1998 | DE19612441C2 Schaltungsanordnung mit einer Testschaltung A circuit arrangement with a testing circuit |
| 04/08/1998 | EP0834124A1 Parallel testing of cpu cache and instruction units |
| 04/08/1998 | EP0834082A1 Performance driven bist technique |
| 04/08/1998 | EP0834081A1 Method and apparatus for testing a megacell in an asic using jtag |
| 04/08/1998 | CN2278224Y Automatic monitoring instrument for accumulator |
| 04/08/1998 | CN2278223Y Instrument for testing surface insulating property of insulator |
| 04/08/1998 | CN1178582A Manufacturing defect analyzer with improved fault coverage |
| 04/07/1998 | US5737711 Diagnosis system for motor vehicle |
| 04/07/1998 | US5737622 Method and apparatus for more efficient function synchronization in a data flow program |
| 04/07/1998 | US5737512 Fast vector loading for automatic test equipment |
| 04/07/1998 | US5737342 Method for in-chip testing of digital circuits of a synchronously sampled data detection channel |
| 04/07/1998 | US5737341 Method of generating test sequence and apparatus for generating test sequence |
| 04/07/1998 | US5737340 Multi-phase test point insertion for built-in self test of integrated circuits |
| 04/07/1998 | US5737233 VLSI circuit layout method based on spreading functions and simulated annealing heuristics to minimize area |
| 04/07/1998 | US5737199 Fail Check Device and method for switching signal lines |
| 04/07/1998 | US5737114 Label having an incorporated electrochromic state-of-charge indicator for an electrochemical cell |
| 04/07/1998 | US5737082 Method of electro-optical measurement for vector components of electric fields and an apparatus thereof |