| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/12/1997 | US5657240 Testing and removal of redundancies in VLSI circuits with non-boolean primitives |
| 08/12/1997 | US5656953 Low overhead memory designs for IC terminals |
| 08/12/1997 | US5656945 Apparatus for testing a nonpackaged die |
| 08/12/1997 | US5656944 Burn-in voltage detection circuit for semiconductor chip |
| 08/12/1997 | US5656943 Apparatus for forming a test stack for semiconductor wafer probing and method for using the same |
| 08/12/1997 | US5656942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane |
| 08/12/1997 | US5656932 Non-contact type wave signal observation apparatus |
| 08/12/1997 | US5656931 Fault current sensor device with radio transceiver |
| 08/12/1997 | US5656919 Accurate battery state-of-charge monitoring and indicating apparatus and method |
| 08/12/1997 | US5655926 Socket for semiconductor device |
| 08/12/1997 | US5655749 Process and device for the contactless electronic control of the flow of water in a plumbing unit |
| 08/12/1997 | CA2074358C Method and detector for identifying insulator flashover |
| 08/07/1997 | WO1997028591A1 Metal-encased switchgear |
| 08/07/1997 | WO1997028590A1 Method of determining the position of a switching device |
| 08/07/1997 | WO1997028589A1 Encased arrangement |
| 08/07/1997 | WO1997028588A1 Metal-encased switchgear with partial discharge detection |
| 08/07/1997 | WO1997028574A1 On-line battery monitoring system |
| 08/07/1997 | WO1997028454A1 Method of detecting a fault in a monitored section of an electric transmission line using distance protection techniques |
| 08/07/1997 | WO1997028453A1 Method of detecting an abrupt variation in an electrical alternating quantity |
| 08/07/1997 | WO1997020219A3 Process for producing signals identifying faulty loops in a polyphase electrical power supply network |
| 08/07/1997 | DE19630913A1 Burn-in sensor circuit for semiconductor memory |
| 08/07/1997 | DE19605023A1 Verfahren zum Erfassen einer sprunghaften Änderung einer elektrischen Wechselgröße A method for detecting an abrupt change in an electrical change size |
| 08/07/1997 | DE19605022A1 Verfahren zum Erfassen eines Fehlers auf einem zu überwachenden Leitungsabschnitt einer elektrischen Übertragungsleitung nach dem Distanzschutzprinzip A method for detecting a fault on a line to be monitored portion of an electrical transmission line according to the distance protection principle |
| 08/07/1997 | DE19604203A1 Process for in operation monitoring of HV switches |
| 08/07/1997 | DE19603461A1 Verfahren zur Stellungserfassung eines Schaltgeräts A method for position detection of a switching device |
| 08/06/1997 | EP0788116A1 Overvoltage detection circuit for mode selection |
| 08/06/1997 | EP0787996A1 Apparatus for detecting discontinuity of ground conductor and leak detector having function of detecting discontinuity of ground conductor |
| 08/06/1997 | EP0787306A1 Process for determining the state of charge of an accumulator |
| 08/06/1997 | EP0787305A1 Switching device with monitoring the wear of at least one contact |
| 08/06/1997 | EP0787304A1 Numerical comparator |
| 08/06/1997 | EP0723668B1 Arrangement for testing a gate oxide |
| 08/06/1997 | CN2258994Y Voice-frequency short-circuit tester for line |
| 08/06/1997 | CN1156347A Power generating equipment for vehicle |
| 08/05/1997 | US5654971 Electronic circuit or board tester and method of testing an electronic device |
| 08/05/1997 | US5654970 Array with redundant integrated self-testing scan drivers |
| 08/05/1997 | US5654896 Performance prediction method for semiconductor power modules and ICS |
| 08/05/1997 | US5654863 Integrated circuit having a gate oxide |
| 08/05/1997 | US5654657 Accurate alignment of clocks in mixed-signal tester |
| 08/05/1997 | US5654655 Driver circuit for semiconductor test system |
| 08/05/1997 | US5654647 Multiple lead voltage probe and method of making same |
| 08/05/1997 | US5654646 Apparatus for testing printed circuit boards |
| 08/05/1997 | US5654642 System and method of use for conducting a neutral corrosion survey |
| 08/05/1997 | US5654641 Method and device for testing the effectiveness of a lighting ground system |
| 08/05/1997 | US5654640 Cell tester device employing a printed transparent electrically conductive electrode |
| 08/05/1997 | US5654632 Method for inspecting semiconductor devices on a wafer |
| 08/05/1997 | US5654631 Vacuum lock handler and tester interface for semiconductor devices |
| 08/05/1997 | US5654623 Electronic apparatus, battery management system, and battery management method |
| 08/05/1997 | US5654588 Semiconductor wafer |
| 08/05/1997 | US5654564 Interconnect structure with programmable IC for interconnecting electronic components, including circuitry for controlling programmable IC |
| 08/05/1997 | US5654537 Image sensor array with picture element sensor testability |
| 08/05/1997 | US5654528 Flexible printed circuit |
| 08/05/1997 | US5654204 Die sorter |
| 08/05/1997 | US5654127 Forming cavities in substrate, lining and covering with flexible layer, metal layer, second flexible layer, removing substrate to expose flexible material, removing to expose metal, forming metal tip, removing rest of substrate |
| 07/31/1997 | WO1997027495A1 Method and device for monitoring deterioration of battery |
| 07/31/1997 | WO1997027494A1 Delay time measuring method and pulse generator for measuring delay time for use in said measuring method |
| 07/31/1997 | WO1997027493A1 Comparator for semiconductor testing device |
| 07/31/1997 | WO1997027492A1 Method for mounting bare chip and bare chip carrier |
| 07/31/1997 | WO1997027491A1 Test head for semiconductor tester |
| 07/31/1997 | WO1997027490A1 Performing an operation on an integrated circuit |
| 07/31/1997 | WO1997027489A1 Improved method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort |
| 07/31/1997 | WO1997022887A3 Method for displaying a 'low battery' state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a 'low battery' state |
| 07/31/1997 | DE19628918C1 Arrangement for detecting HF noise signal on board aircraft esp. passenger aircraft |
| 07/31/1997 | DE19617537C1 Functional test and measurement device for transponders e.g. as used for motor vehicle access verification systems |
| 07/30/1997 | EP0786780A1 Data output control circuit of semiconductor memory device having pipeline structure |
| 07/30/1997 | EP0786667A2 Method and apparatus for testing integrated circuits |
| 07/30/1997 | EP0786170A1 Mos master-slave flip-flop with reduced number of pass gates |
| 07/30/1997 | EP0786094A1 System and method for making electromagnetic measurements using a transverse electromagnetic cell |
| 07/30/1997 | EP0692116A4 Power line communications analyzer |
| 07/30/1997 | CN1155938A Memory with stress circuitry for detecting defects |
| 07/30/1997 | CN1035532C Computer universal detection control apparatus |
| 07/29/1997 | US5652910 Devices and systems with conditional instructions |
| 07/29/1997 | US5652909 Computer implemented method for improved debugging of a data flow program |
| 07/29/1997 | US5652722 System and method for controlling voltage and current characteristics of bit lines in a memory array |
| 07/29/1997 | US5652721 Testing an integrated circuit device |
| 07/29/1997 | US5652712 Method and apparatus for calibration of digital test equipment |
| 07/29/1997 | US5652668 Automated system, and corresponding method, for determining average optical output power of electro-optic modules |
| 07/29/1997 | US5652527 Input-output circuit for increasing immunity to voltage spikes |
| 07/29/1997 | US5652526 For performing high and low voltage tests on an electric induction machine |
| 07/29/1997 | US5652524 Built-in load board design for performing high resolution quiescent current measurements of a device under test |
| 07/29/1997 | US5652523 For providing an electric connection |
| 07/29/1997 | US5652502 Battery pack having a processor controlled battery operating system |
| 07/29/1997 | US5652498 Electronic battery monitoring device for a battery |
| 07/29/1997 | US5652069 Battery power monitoring apparatus for vehicle |
| 07/29/1997 | US5651493 Applying dye solution and allowing it to penetrate any interstices to identify any structural failure by visual analysis |
| 07/24/1997 | WO1997026635A1 A networked, distributed fire alarm system |
| 07/24/1997 | WO1997020224A3 Process and device for testing electric drives |
| 07/24/1997 | DE19601636A1 Boundary scan test device for testing electronic components such as integrated circuit |
| 07/24/1997 | DE19601562A1 Electrical check for firm connection between plug halves |
| 07/23/1997 | EP0785513A1 CMOS integrated circuit failure diagnosis apparatus and diagnostic method |
| 07/23/1997 | EP0785441A2 Method of producing clear potential contrast image through scanning with electron beam for diagnosis of semiconductor device and electron beam testing system used therein |
| 07/23/1997 | EP0785105A2 Automotive onboard load control apparatus and method |
| 07/23/1997 | EP0784834A1 Method and apparatus for detecting fault conditions in a vehicle data recording device |
| 07/23/1997 | EP0784799A1 Bus for sensitive analog signals |
| 07/23/1997 | CN2258281Y Residential electrical equipment detector |
| 07/23/1997 | CN1155357A Detector for monitoring integrity of ground connection of electrical appliance |
| 07/23/1997 | CN1155161A Hand connect/disconnect machine |
| 07/23/1997 | CN1155082A Passive-element testing circuit for printed circuit |
| 07/22/1997 | US5651128 Programmable integrated circuit memory comprising emulation means |
| 07/22/1997 | US5651040 Dynamic division system and method for improving testability of a counter |
| 07/22/1997 | US5651014 Rate generator circuit for semiconductor test system |