| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/02/1997 | CN1153556A Method and device for monitoring power-supply networks |
| 07/02/1997 | CN1153308A IC test handler |
| 07/02/1997 | CN1153307A Under-voltage timing method and under-voltage timing device thereby |
| 07/01/1997 | US5644609 Apparatus and method for reading and writing remote registers on an integrated circuit chip using a minimum of interconnects |
| 07/01/1997 | US5644581 Method and apparatus for converting logic test vectors to memory test patterns |
| 07/01/1997 | US5644580 Boundary-scan testable system and method |
| 07/01/1997 | US5644578 Failure memory device |
| 07/01/1997 | US5644542 Stress test for memory arrays in integrated circuits |
| 07/01/1997 | US5644417 Automated system, and corresponding method, for measuring transmitter data-dependent jitter of electro-optic modules |
| 07/01/1997 | US5644398 Hole burning effect measurement system |
| 07/01/1997 | US5644331 Flat panel display device and method of inspection of same |
| 07/01/1997 | US5644261 Adjustable precise delay circuit |
| 07/01/1997 | US5644251 Switchable pull-ups and pull-downs for IDDQ testing of integrated circuits |
| 07/01/1997 | US5644250 Structure for externally identifying an internal state of a semiconductor device |
| 07/01/1997 | US5644248 Test head cooling system |
| 07/01/1997 | US5644247 For testing unpackaged semiconductor ships |
| 07/01/1997 | US5644245 Probe apparatus for inspecting electrical characteristics of a microelectronic element |
| 07/01/1997 | US5644242 Armature winding and winding connection test methods |
| 07/01/1997 | US5644223 Uniform density charge deposit source |
| 07/01/1997 | US5644212 Traction battery management system |
| 07/01/1997 | US5644140 Apparatus for checking semiconductor wafers with complementary light sources and two cameras |
| 06/26/1997 | WO1997022916A1 Timing signal generator |
| 06/26/1997 | WO1997022887A2 Method for displaying a 'low battery' state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a 'low battery' state |
| 06/26/1997 | WO1997022886A1 Generic interface test adapter |
| 06/26/1997 | WO1997022885A1 High impedance test mode for jtag |
| 06/26/1997 | WO1997022873A1 Method of measuring an object's response to a physical influence and a suitable device |
| 06/26/1997 | DE19630746A1 Associative memory circuit device, e.g. content addressable memory |
| 06/26/1997 | DE19548277A1 Field source for electromagnetic compatibility testing of electronic appts. |
| 06/25/1997 | EP0780767A2 Method and apparatus for pseudorandom boundary-scan testing |
| 06/25/1997 | EP0780696A1 IC test handler |
| 06/25/1997 | EP0780695A2 Hybrid scanner for use in a tester |
| 06/25/1997 | EP0780694A1 Fabrication of a reference sample for a device for determination of the implanted dose |
| 06/25/1997 | EP0780693A2 Process and means for producing and receiving electromagnet waves for testing purposes |
| 06/25/1997 | EP0780037A2 A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing |
| 06/25/1997 | EP0780028A1 Ball grid array socket |
| 06/25/1997 | CN2257024Y Detector for spark grade of locomotive tracting motor |
| 06/25/1997 | CN2257023Y DC system grounding monitor and seeking apparatus |
| 06/25/1997 | CN1152782A Circuit for producing scan path |
| 06/25/1997 | CN1152754A Device conveyer and rechecking method for IC processing apparatus |
| 06/24/1997 | US5642487 Integrated circuit and method of operation |
| 06/24/1997 | US5642432 Probe device |
| 06/24/1997 | US5642364 Contactless testing of inputs and outputs of integrated circuits |
| 06/24/1997 | US5642363 Method and apparatus for testing of electronic assemblies |
| 06/24/1997 | US5642362 Logic circuit |
| 06/24/1997 | US5642158 Method and apparatus to detect capillary indentations |
| 06/24/1997 | US5642056 Probe apparatus for correcting the probe card posture before testing |
| 06/24/1997 | US5642052 Hand-held tester for receptacle ground fault circuit interrupters |
| 06/24/1997 | US5642038 Method of detecting partial discharge using frequency spectrum analyzer |
| 06/24/1997 | US5640762 Method and apparatus for manufacturing known good semiconductor die |
| 06/23/1997 | CA2192867A1 Method and apparatus for pseudorandom boundary-scan testing |
| 06/19/1997 | WO1997022014A1 Apparatus with rechargeable batteries and a device for calculating and indicating the number of remaining use sessions of the apparatus |
| 06/19/1997 | WO1997022013A1 Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
| 06/19/1997 | DE19652789A1 Connection contacts test method for flip chip during mfr. |
| 06/19/1997 | DE19547019A1 Verfahren zum Anzeigen des Zustands "Energiespeicher erschöpft" in Elektro-Geräten mit Elektro-Energiespeichern und Elektro-Geräten mit Elektro-Energiespeichern zum Anzeigen des Zustands "Energiespeicher erschöpft" A method for displaying the state "low energy store" in electrical appliances with electric-energy storage and electric appliances with electric energy storage devices for indicating the state "low energy store" |
| 06/19/1997 | DE19546877A1 Testing system for cable with very low frequency cosine square-wave voltage |
| 06/18/1997 | EP0539358B1 EEPROM including reference cell |
| 06/18/1997 | CN2256539Y Electric quantity display and disharge lighting device for hand held telephone set cell |
| 06/18/1997 | CN2256538Y Tester for electromagnetic wire breakdown voltage |
| 06/18/1997 | CN1152355A Monitoring of internal partial discharges on power transformer |
| 06/17/1997 | US5640697 Wideband multiple conversion receiver system with means for avoiding receiver spurs by combined switching of multiple local oscillator frequencies |
| 06/17/1997 | US5640626 Battery voltage detection device using pulse width modulation control |
| 06/17/1997 | US5640539 IC analysis system having charged particle beam apparatus for improved contrast image |
| 06/17/1997 | US5640521 Addressable shadow port and protocol with remote I/O, contol and interrupt ports |
| 06/17/1997 | US5640433 Conversion of synchronous/asynchronous signals |
| 06/17/1997 | US5640404 Limited probes device testing for high pin count digital devices |
| 06/17/1997 | US5640403 Fault diagnosis method for a sequential circuit |
| 06/17/1997 | US5640402 Fast flush load of LSSD SRL chains |
| 06/17/1997 | US5640328 Method for electric leaf cell circuit placement and timing determination |
| 06/17/1997 | US5640154 Insulation monitoring system for insulated high voltage apparatus |
| 06/17/1997 | US5640150 Resettable state-of-charge indicator for rechargeable batteries |
| 06/17/1997 | US5640103 Radial basis function neural network autoassociator and method for induction motor monitoring |
| 06/17/1997 | US5640102 Pin test circuit for semiconductor test system |
| 06/17/1997 | US5640101 Probe system and probe method |
| 06/17/1997 | US5640099 Method and apparatus for detecting short circuit point between wiring patterns |
| 06/17/1997 | US5640098 IC fault analysis system having charged particle beam tester |
| 06/17/1997 | US5640097 Test pattern for separately determining plug resistance and interfactial resistance |
| 06/17/1997 | US5640095 Circuit arrangement for leakage-resistance testing of a circuit point |
| 06/17/1997 | US5640093 Automobile electronic circuit analyzer for detecting shorted ECM loads, including a pulsating power supply and load sensing cell |
| 06/17/1997 | US5640081 Method and apparatus for monitoring discharge of a battery device based on battery self-discharge and discharge over time |
| 06/17/1997 | US5639390 Conductor pattern check apparatus for locating and repairing open circuits |
| 06/17/1997 | US5639254 Apparatus for testing a plug |
| 06/12/1997 | WO1997021234A2 Method and device for monitoring consumption of contact elements in a switching device |
| 06/12/1997 | WO1997021222A1 Device and method for programming high impedance states upon select input/output pads |
| 06/12/1997 | WO1997021107A1 Partial scan logic |
| 06/12/1997 | WO1997021093A1 Device and method for testing electrosurgical instruments |
| 06/12/1997 | WO1997021085A2 Electric monitoring of cables and the like for detecting damages thereof |
| 06/12/1997 | WO1997007385A3 A bidirectional load and source cycler |
| 06/12/1997 | DE19610125C1 Semiconductor mfr. device, e.g. tape and reel handler, esp. for integrated circuit |
| 06/12/1997 | DE19605481C1 On-line battery measurement module for block voltage measurement of several block batteries |
| 06/12/1997 | DE19542529C1 Fixed choke arrangement for testing HV systems e.g. gas-insulated switchgear or cables |
| 06/12/1997 | DE19541147C1 Circuit testing method for low voltage circuits contg. switching and control devices for power circuits and connectors for control current circuits |
| 06/11/1997 | EP0778647A2 High side current sense amplifier |
| 06/11/1997 | EP0778627A1 Battery pack |
| 06/11/1997 | EP0778584A1 Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip, and method of testing the device |
| 06/11/1997 | EP0778582A2 Efficient parallel programming of data chunk in a multi-state implementation |
| 06/11/1997 | EP0778469A1 Method and device for testing radio navigation instruments with devices for measuring and generating standard signals |
| 06/11/1997 | EP0778467A2 Circuit for monitoring grounding and protection against dangerous currents through the human body, especially for devices with potential equalisation in star-star networks |
| 06/11/1997 | EP0777862A1 System for detecting faults in connections between integrated circuits and circuit board traces |
| 06/11/1997 | EP0725994B1 Device for measuring the time element of a power switch |
| 06/11/1997 | EP0592715B1 Checking design for testability rules with a VHDL simulator |