G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1997
10/29/1997	EP0803702A2 Micro needle probe apparatus
10/29/1997	EP0803128A1 Device for measuring voltages along solid-insulated bus bars in medium-voltage switchgear
10/29/1997	EP0803068A1 Device for detecting errors in a sensor
10/29/1997	CN2266136Y Capacitance self-excitation frequency doubling induction high-voltage holding tester
10/29/1997	CN2266135Y Low voltage leakage tester
10/29/1997	CN1163475A Mixed packing semiconductor integrate circuit device of controller mass storage and measuring method
10/28/1997	USRE35644 Voltage transmission link for testing EMI susceptibility of a device or circuits
10/28/1997	US5682472 Semiconductor device testing apparatus
10/28/1997	US5682393 For adjusting a delay time of a memory device to be tested
10/28/1997	US5682392 Method and apparatus for the automatic generation of boundary scan description language files
10/28/1997	US5682391 Apparatus and method for high speed shifting of test data through an integrated circuit
10/28/1997	US5682390 Pattern generator in semiconductor test system
10/28/1997	US5682352 Integrated circuit
10/28/1997	US5682337 High speed three-state sampling
10/28/1997	US5682104 Electron beam tester and testing method using the same
10/28/1997	US5682102 Electrostatic capacity measuring instrument for stator winding of electric rotating machine
10/28/1997	US5682100 System and method for locating faults in electric power cables
10/28/1997	US5682064 Repairable wafer scale integration system
10/28/1997	US5682031 Smart card and smart card locking process therefor
10/28/1997	US5681987 Resonance contact scanning force microscope
10/28/1997	US5681666 Waterproofing protective coatings comprising alternated layers of water insoluble inorganic compound, silicon dioxide and organic material
10/28/1997	US5680936 Printed circuit board sorting device
10/28/1997	CA2079068C Method and apparatus for testing self-commutative electric power conversion device
10/24/1997	CA2197815A1 Increasing testability by clock transformation
10/23/1997	DE19640248A1 Bicycle with electric motor providing auxiliary pedal power for rider if needed
10/23/1997	DE19615674A1 Meßvorrichtung für integrierte Schaltkreise A measuring device for integrated circuits
10/23/1997	DE19615203A1 Einrichtung zur Erkennung von elektromagnetischen Einstreuungen Means for detecting electromagnetic interference
10/23/1997	DE19610123C1 Burn-in-board and electrical component testing method
10/22/1997	EP0802602A2 Apparatus for detecting and responding to series arcs in AC electrical systems
10/22/1997	EP0802494A2 Parallel programming of in-system (ISP) programmable devices using an automatic tester
10/22/1997	EP0802484A1 Method for metal delay testing in semiconductor devices
10/22/1997	EP0802422A2 Measurement circuit
10/22/1997	EP0802421A1 Microwave sensor
10/22/1997	EP0802419A2 Probe card and method of forming the same
10/22/1997	EP0802418A2 Method for high-speed testing a semiconductor device
10/22/1997	EP0792450A4 Variable volume test chamber
10/22/1997	EP0759221B1 Circuitry for detecting earth leakages in energy transmission cables
10/22/1997	EP0755520B1 Use of a test liquid for checking the efficiency of electric power station components
10/22/1997	EP0584739B1 Semiconductor integrated circuit operative in different modes
10/22/1997	EP0560500B1 Method and apparatus for testing edge connector I/O connections for circuit boards using boundary scan
10/22/1997	EP0513826B1 Method for measuring AC specifications of microprocessor
10/22/1997	CN1162997A IC conveyor, IC posture changer and IC takeout apparatus
10/22/1997	CN1162820A Signal generator
10/22/1997	CN1162746A Microwave sensor
10/21/1997	US5680543 Method and apparatus for built-in self-test with multiple clock circuits
10/21/1997	US5680407 Device for testing multiple pulling resistor connections using a single test point
10/21/1997	US5680406 Integrated semiconductor circuit having scan flip-flops at predetermined intervals and testing method thereof
10/21/1997	US5680332 Measurement of digital circuit simulation test coverage utilizing BDDs and state bins
10/21/1997	US5680316 Method for estimating discharge capability of zinc oxide power element, method for screening the element and systems for carrying out these methods
10/21/1997	US5680059 Abnormality detecting method and apparatus for electric equipment, particularly for a rotating electric machine
10/21/1997	US5680057 Integrated circuit testing assembly and method
10/21/1997	US5680056 Apparatus and method for testing circuit board
10/21/1997	US5680053 Method for testing insulated electrosurgical instruments
10/21/1997	US5680050 Battery condition detection method
10/21/1997	US5680039 Probe apparatus for use in both high and low frequency measurements
10/21/1997	US5680030 Condition managing system of storage battery for a movable body
10/21/1997	US5680027 Battery pack including internal capacity monitor for monitoring groups of battery cells
10/21/1997	US5680025 Proactive motor monitoring for avoiding premature failures and for fault recognition
10/21/1997	US5679987 Method and device for obtaining connectivity information of telecommunication facilities
10/21/1997	US5679609 Fabrication, testing and repair of multichip semiconductor structures having connect assemblies with fuses
10/21/1997	US5678301 Method for forming an interconnect for testing unpackaged semiconductor dice
10/16/1997	WO1997038322A1 Battery gauge
10/16/1997	DE19710687A1 Simulation of electromagnetic fields
10/15/1997	EP0801312A1 Procedure for monitoring the electrical wear of section switches in a high voltage station
10/15/1997	EP0800723A1 Programmable logic module and architecture for field programmable gate array device
10/15/1997	EP0800676A1 Method and equipment for the automatic testing of electronic components
10/15/1997	EP0800652A1 Cable partial discharge location pointer
10/15/1997	EP0678813B1 Floating point multiplier
10/15/1997	CN2264917Y Motor alarm
10/15/1997	CN1162190A Method for preparing integrated circuit plane figure sample for transmission electron microscopy, and observation method thereof
10/15/1997	CN1162160A Circuit for monitoring light siganal
10/15/1997	CN1162150A Data protection circuit
10/14/1997	US5678063 System and method for performing efficient random write operations
10/14/1997	US5678031 Method of testing interconnections of an LSI on a simulator through the use of effective pulse widths
10/14/1997	US5678028 Hardware-software debugger using simulation speed enhancing techniques including skipping unnecessary bus cycles, avoiding instruction fetch simulation, eliminating the need for explicit clock pulse generation and caching results of instruction decoding
10/14/1997	US5678005 Cable connect error detection system
10/14/1997	US5677916 Semiconductor integrated circuit and its application device
10/14/1997	US5677915 Customized method and apparatus for streamlined testing a particular electrical circuit
10/14/1997	US5677914 For an integrated circuit
10/14/1997	US5677853 Product testing by statistical profile of test variables
10/14/1997	US5677839 On-vehicle electronic control device and a method of detecting a failure thereof
10/14/1997	US5677643 Potential detecting circuit which suppresses the adverse effects and eliminates dependency of detected potential on power supply potential
10/14/1997	US5677635 Voltage and displacement measuring apparatus and probe
10/14/1997	US5677634 Apparatus for stress testing capacitive components
10/14/1997	US5677633 Cable test instrument having interchangeable performance modules
10/14/1997	US5677623 Fault powered fault indicator having timed reset
10/14/1997	US5677615 Service-life discriminating feature added to a battery charger
10/14/1997	US5677611 Control apparatus for an electric vehicle
10/14/1997	US5677530 Scanning electron microscope
10/14/1997	US5677479 Method of checking waterproof connectors for waterproofness, and waterproofness checking apparatus and jig
10/14/1997	US5677203 Method for providing known good bare semiconductor die
10/14/1997	US5677077 Sensor circuit for providing maximum and minimum cell voltages of a battery
10/14/1997	US5675957 Device loading/unloading apparatus for semiconductor device handler
10/09/1997	WO1997037418A1 Method and device for determining short-circuit power in an electric power network
10/09/1997	WO1997037357A1 Circuit arrangement with a test circuit
10/09/1997	WO1997037237A1 Testing electrical installations
10/09/1997	WO1997037236A1 Self tuning and compensating turn fault detector
10/09/1997	WO1997037235A1 Apparatus and method for providing a programmable delay
10/09/1997	WO1997037234A1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system
10/09/1997	DE19619629C1 Automatic monitoring method and device for fault-current circuit breakers

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