Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/1998
02/03/1998US5715170 Apparatus for forming input data for a logic simulator
02/03/1998US5715168 Auto-handler system preventing delivery of integrated circuits to defective sockets
02/03/1998US5714888 Method and apparatus for testing electronic circuitry in a manufacturing environment
02/03/1998US5714885 Method and apparatus for locating faluts in buried conductors
02/03/1998US5714877 Apparatus for detecting the amplitude and phase of an A.C. signal
02/03/1998US5714870 Method for measuring suspend-time power consumption in a battery-powered electronic device
02/03/1998US5714756 Scanning probe microscope having a single viewing device for on-axis and oblique angle views
02/03/1998US5713751 IC socket
02/03/1998US5713643 Control circuit for automotive vehicle motion control systems
02/03/1998CA2061670C Detection system for abnormal cable connections in communications apparatuses
02/02/1998CA2182420A1 Power indicating plug, cord, switch or receptacle
02/01/1998CA2211958A1 Probe positioning assembly for armature tester
01/1998
01/29/1998WO1998004044A1 Coherent sampling digitizer system
01/29/1998WO1998003979A1 Semiconductor memory tester with redundancy analysis
01/29/1998WO1998003879A1 Process for testing a product and equipment for carrying out the process
01/29/1998DE4336883C2 Ausgangstreiberschaltung Output driver circuit
01/29/1998DE19631550A1 Disclosure of defects in railway track-mounted wheel detectors
01/29/1998DE19630316A1 Electronic component contacting device for function testing
01/29/1998DE19630027A1 Anordnung zur Erfassung der Temperatur des Ankers eines Gleichstrommotors Arrangement for detecting the temperature of the armature of a DC motor
01/28/1998EP0821443A1 Device for checking a plug-type connector provided with cables
01/28/1998EP0821243A2 Test method of an impedance linked to a bridge output stage and appartatus related
01/28/1998EP0820631A1 Circuit for sram test mode isolated bitline modulation
01/28/1998EP0820613A1 Automatic parallel electronic component testing method and equipment
01/28/1998EP0820600A1 Distance measurement process
01/28/1998EP0820588A1 Multilayer moisture barrier for electrochemical cell tester
01/28/1998EP0820391A1 Arrangement for triggering a personal protection system
01/28/1998EP0654739B1 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device
01/28/1998CN1171353A Moped
01/28/1998CA2211490A1 Corona detector with optical filter
01/27/1998US5712883 Clock signal distribution system
01/27/1998US5712882 Signal distribution system
01/27/1998US5712859 Semiconductor integrated circuit
01/27/1998US5712858 Test methodology for exceeding tester pin count for an asic device
01/27/1998US5712857 Methods and apparatus for correlating stuck-at fault test coverage and current leakage fault test coverage
01/27/1998US5712855 Apparatus for testing and measuring electronic device and method of calibrating its timing and voltage level
01/27/1998US5712796 Method for evaluating the faulted sections and states in a power transmission line
01/27/1998US5712795 Power management system
01/27/1998US5712633 Conversion characteristic test circuit for analog/digital converter and method thereof
01/27/1998US5712584 Synchronous stress test control
01/27/1998US5712582 Test signal generator having timing calibration circuit
01/27/1998US5712576 Semiconductor integrated circuit device having input circuit without influence on reliability of diagnosis
01/27/1998US5712575 Super-voltage circuit with a fast reset
01/27/1998US5712572 Insulation state measurement method, insulation state judgement apparatus, and dispersion type power generating system using the same
01/27/1998US5712571 Apparatus and method for detecting defects arising as a result of integrated circuit processing
01/27/1998US5712570 Method for checking a wire bond of a semiconductor package
01/27/1998US5712569 Tester for testing correct assembly of terminals in connector housings
01/27/1998US5712568 Battery voltage measurement system
01/27/1998US5712492 Transistor for checking radiation-hardened transistor
01/27/1998US5712420 On/off and modulated/duty-cycled solenoid tester
01/23/1998CA2181758A1 Rf probe for emi diagnostics
01/22/1998WO1998002933A1 Battery operating system
01/22/1998WO1998002756A2 Method of and device for inspecting a pcb
01/22/1998WO1998002755A1 A device for reducing the time for measuring on a cable
01/22/1998WO1998002370A1 Method and apparatus for loading electronic components
01/22/1998DE19629569A1 Sulphuric acid concentration determination method for batteries
01/22/1998DE19629483A1 Monitoring system for electrical machine star-connected stator windings
01/22/1998DE19627777A1 Quality control method of material for capacitor, e.g. tantalum capacitor
01/22/1998CA2259571A1 A device for reducing the time for measuring on a cable
01/21/1998EP0820138A2 Charging apparatus
01/21/1998EP0819947A2 Resistive fault location
01/21/1998EP0819946A2 Appliance for detecting noise radiation
01/21/1998EP0819275A1 Method and system for testing memory programming devices
01/21/1998CN1171167A Composite intermediate connecting element of microelectronic device and its production method
01/21/1998CN1170973A Connector
01/21/1998CN1170970A Battery leakage sensing system
01/21/1998CN1170936A Semiconductor integrated circuit having test circuit
01/21/1998CN1170877A Measuring method for micro controller function
01/20/1998US5710779 Real time data observation method and apparatus
01/20/1998US5710744 Timing generator for IC testers
01/20/1998US5710737 Semiconductor memory device
01/20/1998US5710711 Method and integrated circuit adapted for partial scan testability
01/20/1998US5710701 Method and apparatus for power supply testing
01/20/1998US5710517 Accurate alignment of clocks in mixed-signal tester
01/20/1998US5710515 Non-volatile memory in power and linear integrated circuits
01/20/1998US5710513 Circuit breaker testing apparatus having adjustable inductor for controlling magnitude of current flow
01/20/1998US5710512 Structure and production process for secondary voltage detector for engine
01/20/1998US5710503 On-line battery monitoring system with defective cell detection capability
01/20/1998US5710501 Battery pack having a processor controlled battery operating system
01/20/1998US5710430 Method and apparatus for terahertz imaging
01/20/1998US5710052 Scanning spreading resistance probe
01/20/1998US5709962 Color change
01/20/1998US5709336 Method of forming a solderless electrical connection with a wirebond chip
01/20/1998US5709025 Apparatus for wiring a connector
01/15/1998WO1998001976A1 Method and system for characterizing terminations in a local area network
01/15/1998WO1998001944A1 Method for diagnosing abnormality of circuit member of inverter driving controller for driving and controlling motor
01/15/1998WO1998001917A2 Accumulator and charging set for an accumulator
01/15/1998WO1998001906A1 Floating lateral support for ends of elongate interconnection elements
01/15/1998WO1998001812A1 Computer-assisted process for determining a system consistency function
01/15/1998WO1998001745A1 Automatic semiconductor wafer sorter/prober with extended optical inspection
01/15/1998DE19728253A1 Bicycle with electrical auxiliary drive
01/15/1998DE19625408A1 Earth monitoring circuit for preventing electrocution currents in electrical equipment
01/15/1998CA2259902A1 Method and system for characterizing terminations in a local area network
01/14/1998EP0818866A2 Abnormality detecting device for a phase advancing capacitor
01/14/1998EP0818687A1 Method and device for monitoring deterioration of battery
01/14/1998EP0818686A1 Device for switching, in particular a system under test
01/14/1998EP0818685A1 Device for testing electronic boards under special temperature or treatment conditions
01/14/1998EP0818079A1 Timing generator for automatic test equipment operating at high data rates
01/14/1998EP0818002A1 System and method for generating pseudo-random instructions for design verification
01/14/1998EP0817975A1 Process and circuit for monitoring a data processing circuit
01/14/1998EP0817974A1 Reflectometry methods for insulated pipes