Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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02/03/1998 | US5715170 Apparatus for forming input data for a logic simulator |
02/03/1998 | US5715168 Auto-handler system preventing delivery of integrated circuits to defective sockets |
02/03/1998 | US5714888 Method and apparatus for testing electronic circuitry in a manufacturing environment |
02/03/1998 | US5714885 Method and apparatus for locating faluts in buried conductors |
02/03/1998 | US5714877 Apparatus for detecting the amplitude and phase of an A.C. signal |
02/03/1998 | US5714870 Method for measuring suspend-time power consumption in a battery-powered electronic device |
02/03/1998 | US5714756 Scanning probe microscope having a single viewing device for on-axis and oblique angle views |
02/03/1998 | US5713751 IC socket |
02/03/1998 | US5713643 Control circuit for automotive vehicle motion control systems |
02/03/1998 | CA2061670C Detection system for abnormal cable connections in communications apparatuses |
02/02/1998 | CA2182420A1 Power indicating plug, cord, switch or receptacle |
02/01/1998 | CA2211958A1 Probe positioning assembly for armature tester |
01/29/1998 | WO1998004044A1 Coherent sampling digitizer system |
01/29/1998 | WO1998003979A1 Semiconductor memory tester with redundancy analysis |
01/29/1998 | WO1998003879A1 Process for testing a product and equipment for carrying out the process |
01/29/1998 | DE4336883C2 Ausgangstreiberschaltung Output driver circuit |
01/29/1998 | DE19631550A1 Disclosure of defects in railway track-mounted wheel detectors |
01/29/1998 | DE19630316A1 Electronic component contacting device for function testing |
01/29/1998 | DE19630027A1 Anordnung zur Erfassung der Temperatur des Ankers eines Gleichstrommotors Arrangement for detecting the temperature of the armature of a DC motor |
01/28/1998 | EP0821443A1 Device for checking a plug-type connector provided with cables |
01/28/1998 | EP0821243A2 Test method of an impedance linked to a bridge output stage and appartatus related |
01/28/1998 | EP0820631A1 Circuit for sram test mode isolated bitline modulation |
01/28/1998 | EP0820613A1 Automatic parallel electronic component testing method and equipment |
01/28/1998 | EP0820600A1 Distance measurement process |
01/28/1998 | EP0820588A1 Multilayer moisture barrier for electrochemical cell tester |
01/28/1998 | EP0820391A1 Arrangement for triggering a personal protection system |
01/28/1998 | EP0654739B1 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device |
01/28/1998 | CN1171353A Moped |
01/28/1998 | CA2211490A1 Corona detector with optical filter |
01/27/1998 | US5712883 Clock signal distribution system |
01/27/1998 | US5712882 Signal distribution system |
01/27/1998 | US5712859 Semiconductor integrated circuit |
01/27/1998 | US5712858 Test methodology for exceeding tester pin count for an asic device |
01/27/1998 | US5712857 Methods and apparatus for correlating stuck-at fault test coverage and current leakage fault test coverage |
01/27/1998 | US5712855 Apparatus for testing and measuring electronic device and method of calibrating its timing and voltage level |
01/27/1998 | US5712796 Method for evaluating the faulted sections and states in a power transmission line |
01/27/1998 | US5712795 Power management system |
01/27/1998 | US5712633 Conversion characteristic test circuit for analog/digital converter and method thereof |
01/27/1998 | US5712584 Synchronous stress test control |
01/27/1998 | US5712582 Test signal generator having timing calibration circuit |
01/27/1998 | US5712576 Semiconductor integrated circuit device having input circuit without influence on reliability of diagnosis |
01/27/1998 | US5712575 Super-voltage circuit with a fast reset |
01/27/1998 | US5712572 Insulation state measurement method, insulation state judgement apparatus, and dispersion type power generating system using the same |
01/27/1998 | US5712571 Apparatus and method for detecting defects arising as a result of integrated circuit processing |
01/27/1998 | US5712570 Method for checking a wire bond of a semiconductor package |
01/27/1998 | US5712569 Tester for testing correct assembly of terminals in connector housings |
01/27/1998 | US5712568 Battery voltage measurement system |
01/27/1998 | US5712492 Transistor for checking radiation-hardened transistor |
01/27/1998 | US5712420 On/off and modulated/duty-cycled solenoid tester |
01/23/1998 | CA2181758A1 Rf probe for emi diagnostics |
01/22/1998 | WO1998002933A1 Battery operating system |
01/22/1998 | WO1998002756A2 Method of and device for inspecting a pcb |
01/22/1998 | WO1998002755A1 A device for reducing the time for measuring on a cable |
01/22/1998 | WO1998002370A1 Method and apparatus for loading electronic components |
01/22/1998 | DE19629569A1 Sulphuric acid concentration determination method for batteries |
01/22/1998 | DE19629483A1 Monitoring system for electrical machine star-connected stator windings |
01/22/1998 | DE19627777A1 Quality control method of material for capacitor, e.g. tantalum capacitor |
01/22/1998 | CA2259571A1 A device for reducing the time for measuring on a cable |
01/21/1998 | EP0820138A2 Charging apparatus |
01/21/1998 | EP0819947A2 Resistive fault location |
01/21/1998 | EP0819946A2 Appliance for detecting noise radiation |
01/21/1998 | EP0819275A1 Method and system for testing memory programming devices |
01/21/1998 | CN1171167A Composite intermediate connecting element of microelectronic device and its production method |
01/21/1998 | CN1170973A Connector |
01/21/1998 | CN1170970A Battery leakage sensing system |
01/21/1998 | CN1170936A Semiconductor integrated circuit having test circuit |
01/21/1998 | CN1170877A Measuring method for micro controller function |
01/20/1998 | US5710779 Real time data observation method and apparatus |
01/20/1998 | US5710744 Timing generator for IC testers |
01/20/1998 | US5710737 Semiconductor memory device |
01/20/1998 | US5710711 Method and integrated circuit adapted for partial scan testability |
01/20/1998 | US5710701 Method and apparatus for power supply testing |
01/20/1998 | US5710517 Accurate alignment of clocks in mixed-signal tester |
01/20/1998 | US5710515 Non-volatile memory in power and linear integrated circuits |
01/20/1998 | US5710513 Circuit breaker testing apparatus having adjustable inductor for controlling magnitude of current flow |
01/20/1998 | US5710512 Structure and production process for secondary voltage detector for engine |
01/20/1998 | US5710503 On-line battery monitoring system with defective cell detection capability |
01/20/1998 | US5710501 Battery pack having a processor controlled battery operating system |
01/20/1998 | US5710430 Method and apparatus for terahertz imaging |
01/20/1998 | US5710052 Scanning spreading resistance probe |
01/20/1998 | US5709962 Color change |
01/20/1998 | US5709336 Method of forming a solderless electrical connection with a wirebond chip |
01/20/1998 | US5709025 Apparatus for wiring a connector |
01/15/1998 | WO1998001976A1 Method and system for characterizing terminations in a local area network |
01/15/1998 | WO1998001944A1 Method for diagnosing abnormality of circuit member of inverter driving controller for driving and controlling motor |
01/15/1998 | WO1998001917A2 Accumulator and charging set for an accumulator |
01/15/1998 | WO1998001906A1 Floating lateral support for ends of elongate interconnection elements |
01/15/1998 | WO1998001812A1 Computer-assisted process for determining a system consistency function |
01/15/1998 | WO1998001745A1 Automatic semiconductor wafer sorter/prober with extended optical inspection |
01/15/1998 | DE19728253A1 Bicycle with electrical auxiliary drive |
01/15/1998 | DE19625408A1 Earth monitoring circuit for preventing electrocution currents in electrical equipment |
01/15/1998 | CA2259902A1 Method and system for characterizing terminations in a local area network |
01/14/1998 | EP0818866A2 Abnormality detecting device for a phase advancing capacitor |
01/14/1998 | EP0818687A1 Method and device for monitoring deterioration of battery |
01/14/1998 | EP0818686A1 Device for switching, in particular a system under test |
01/14/1998 | EP0818685A1 Device for testing electronic boards under special temperature or treatment conditions |
01/14/1998 | EP0818079A1 Timing generator for automatic test equipment operating at high data rates |
01/14/1998 | EP0818002A1 System and method for generating pseudo-random instructions for design verification |
01/14/1998 | EP0817975A1 Process and circuit for monitoring a data processing circuit |
01/14/1998 | EP0817974A1 Reflectometry methods for insulated pipes |