| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 02/26/1998 | WO1998008146A1 Rechargeable electronic device |
| 02/26/1998 | WO1998008104A1 Cable fault monitoring system |
| 02/26/1998 | WO1998008103A1 Diagnostic procedure for electrical appliances |
| 02/26/1998 | DE19633785A1 Diagnoseverfahren für elektrische Geräte Diagnostic methods for electrical appliances |
| 02/26/1998 | DE19633549A1 Integrierte Schaltung Integrated circuit |
| 02/25/1998 | EP0825615A2 System and method for testing audio RAM memories |
| 02/25/1998 | EP0825614A2 Arrangement and method of measuring the speed of memory unit in an integrated circuit |
| 02/25/1998 | EP0825069A2 Method of determining a measured value |
| 02/25/1998 | EP0824776A1 Method and apparatus for detecting arcing in ac power systems by monitoring high frequency noise |
| 02/25/1998 | EP0704064B1 Magnetic screen |
| 02/25/1998 | CN2275250Y Measurer for short circuit between layers |
| 02/25/1998 | CN1174609A Apparatus with rechargeable batteries and device for calculating and indicating the number of remaining use sessions of the apparatus |
| 02/25/1998 | CN1174441A Cell evaluating method and cell evaluating apparatus |
| 02/25/1998 | CN1174440A Charge/discharge control circuit and charging type power-supply unit |
| 02/25/1998 | CN1174439A Charging device for commonly charging various kinds of battery |
| 02/25/1998 | CN1174436A Earthleakage-current protection device |
| 02/25/1998 | CN1174434A Cable conduction detecting apparatus for switchgear |
| 02/25/1998 | CN1174425A Pin connector, pin connector holder and packaging board for mounting electronic component |
| 02/25/1998 | CN1174420A Intelligent battery device |
| 02/24/1998 | US5721740 Flip-flop controller for selectively disabling clock signal |
| 02/24/1998 | US5721695 Simulation by emulating level sensitive latches with edge trigger latches |
| 02/24/1998 | US5721688 Apparatus and method for electrical system measurements including battery condition, resistance of wires and connections, total electrical system quality and current flow |
| 02/24/1998 | US5721496 Method and apparatus for leak checking unpackaged semiconductor dice |
| 02/24/1998 | US5721495 Circuit for measuring quiescent current |
| 02/24/1998 | US5721493 Apparatus for locating failures in detonation devices |
| 02/24/1998 | US5721482 Intelligent battery and method for providing an advance low battery warning for a battery powered device such as a defibrillator |
| 02/24/1998 | US5721159 Method for manufacturing and testing a nonvolatile memory device |
| 02/19/1998 | WO1998007226A1 Process and device for monitoring and/or controlling charging of a modular battery, particularly in a battery powered vehicle |
| 02/19/1998 | WO1998007162A1 Memory testing apparatus |
| 02/19/1998 | WO1998007106A1 Implementation of half-path joining in a system for global performance analysis of a latch-based design |
| 02/19/1998 | WO1998007040A1 Membrane probing system with local contact scrub |
| 02/19/1998 | WO1998007039A1 Method and apparatus for testing the insulating ability of an insulation on an electric conductor |
| 02/18/1998 | CN2274778Y Pre-determining device for interphase short cut |
| 02/17/1998 | US5719952 Inspection system for cross-sectional imaging |
| 02/17/1998 | US5719881 Test pattern generating apparatus and method |
| 02/17/1998 | US5719879 Integrated circuit device |
| 02/17/1998 | US5719878 Scannable storage cell and method of operation |
| 02/17/1998 | US5719877 Scan test |
| 02/17/1998 | US5719876 Scan latch using half latches |
| 02/17/1998 | US5719504 Semiconductor device having a scan path |
| 02/17/1998 | US5719503 Detection of surface anomalies in elongate conductive members by pulse propagation analysis |
| 02/17/1998 | US5719489 Apparatus for determining load currents |
| 02/17/1998 | US5718603 Inspection device for connectors and connector |
| 02/17/1998 | US5718595 Socket apparatus |
| 02/17/1998 | CA2010845C Connection testing system of conductor ends in a connector and automatic connection facility equipped with said system |
| 02/12/1998 | WO1998006159A1 Device for detecting residual capacity of battery |
| 02/12/1998 | WO1998006103A1 System for optimizing memory repair time using test data |
| 02/12/1998 | WO1998005753A1 Storage device for objects, storage station, and air-conditioned cabinet |
| 02/12/1998 | DE19734047A1 Parasitic metal-insulator-metal structures analysing method for silicon semiconductor device |
| 02/12/1998 | DE19633527A1 Remote protection/branch protection method for power transmission line arc shorting |
| 02/12/1998 | DE19633526A1 Remote protection/branch protection for power transmission line shorting |
| 02/11/1998 | EP0823765A1 Process for monitoring short-circuits |
| 02/11/1998 | EP0823764A2 Process for checking the operation and for determining the trip current of residual current breakers responsive to dc or any current |
| 02/11/1998 | EP0823089A1 Automatic parallel electronic component testing method and equipment |
| 02/11/1998 | EP0823088A1 Automatic parallel electronic component testing method and equipment |
| 02/11/1998 | EP0823057A2 Process for monitoring a three-phase mains for a change in the tuning of the arc supression coil |
| 02/11/1998 | EP0800652A4 Cable partial discharge location pointer |
| 02/11/1998 | CN2274349Y Multipurpose electrical penlike detector |
| 02/10/1998 | US5717704 Test system including a local trigger signal generator for each of a plurality of test instruments |
| 02/10/1998 | US5717702 Scan testing digital logic with differing frequencies of system clock and test clock |
| 02/10/1998 | US5717701 Apparatus and method for testing interconnections between semiconductor devices |
| 02/10/1998 | US5717700 Method for creating a high speed scan-interconnected set of flip-flop elements in an integrated circuit to enable faster scan-based testing |
| 02/10/1998 | US5717699 Method and apparatus for accessing internal integrated circuit signals |
| 02/10/1998 | US5717698 Method and apparatus for testing a network with a programmable logic matrix |
| 02/10/1998 | US5717696 Circuit for testing a semiconductor chip having embedded arrays intermixed with logic |
| 02/10/1998 | US5717695 Output pin for selectively outputting one of a plurality of signals internal to a semiconductor chip according to a programmable register for diagnostics |
| 02/10/1998 | US5717694 Fail analysis device for semiconductor memory test system |
| 02/10/1998 | US5717652 Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester |
| 02/10/1998 | US5717357 Output circuit for selectively outputting a signal at one of two voltage levels |
| 02/10/1998 | US5717353 Clock signal generating circuit |
| 02/10/1998 | US5717352 Wave formatter circuit for semiconductor test system |
| 02/10/1998 | US5717340 Circuit for testing pumped voltage gates in a programmable gate array |
| 02/10/1998 | US5717338 Method and apparatus for testing television yokes and flyback transformers |
| 02/10/1998 | US5717336 Method and apparatus for determining the charge condition of an electrochemical cell |
| 02/10/1998 | US5717335 Electric bulb short detection apparatus for traffic signal controller |
| 02/10/1998 | US5717329 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
| 02/10/1998 | US5717312 Charging device providing a stable display of the residual charge in a battery |
| 02/10/1998 | US5717310 Power supply control device for electric vehicle |
| 02/10/1998 | US5717256 Power supply apparatus and electronic appliance equipped with the power supply apparatus |
| 02/10/1998 | US5716218 Process for manufacturing an interconnect for testing a semiconductor die |
| 02/05/1998 | WO1998005059A2 Automatic semiconductor part handler |
| 02/05/1998 | WO1998004927A1 Loaded board drop pin fixture |
| 02/05/1998 | WO1998004910A1 Method and apparatus for auditing a battery test |
| 02/05/1998 | WO1998004893A1 Arrangement for sensing the temperature of the armature of a direct current motor |
| 02/05/1998 | WO1998004583A1 Conformationally constrained backbone cyclized somatostatin analogs |
| 02/05/1998 | DE19727639A1 Battery charger for hand operated apparatus |
| 02/05/1998 | DE19636416A1 Method and appliance for determining sensitivity of internal combustion engine methane sensor |
| 02/04/1998 | EP0822671A2 Method and apparatus for measuring near-end cross-talk in patch cords |
| 02/04/1998 | EP0822497A2 Boundary scan cell |
| 02/04/1998 | EP0822419A1 Testable integrated circuit with reduced power dissipation |
| 02/04/1998 | EP0822418A2 Sensor diagnostic apparatus and method thereof |
| 02/04/1998 | EP0822417A2 Probe positioning assembly for armature tester |
| 02/04/1998 | EP0672257B1 Method and apparatus for determining characteristic electrical properties of semi-conducting materials |
| 02/04/1998 | CN1172348A Package for mounting semiconductor package |
| 02/04/1998 | CN1172262A Device for distinguishing interference radiation |
| 02/03/1998 | US5715256 Method and apparatus for handling multiplexer contention during scan |
| 02/03/1998 | US5715255 Low overhead memory designs for IC terminals |
| 02/03/1998 | US5715254 Very low overhead shared resource boundary scan design |
| 02/03/1998 | US5715172 Method for automatic clock qualifier selection in reprogrammable hardware emulation systems |
| 02/03/1998 | US5715171 Logical synthesizing device, logical synthesizing method, and semiconductor integrated circuit |