| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 07/07/1998 | US5777479 Lighting test method and apparatus |
| 07/07/1998 | US5777454 Back-up battery management system for a DC power supply |
| 07/07/1998 | US5777383 Semiconductor chip package with interconnect layers and routing and testing methods |
| 07/07/1998 | CA2135583C Coil monitoring device |
| 07/07/1998 | CA2024242C Battery-powered fault indicator |
| 07/02/1998 | WO1998028688A1 Methods and devices relating to circuit board constructions |
| 07/02/1998 | WO1998028629A1 Method and device for controlling a motor vehicle electric circuit |
| 07/02/1998 | WO1998028091A1 Method for sorting ic-components |
| 07/02/1998 | DE19757273A1 Test device for integrated circuit components |
| 07/02/1998 | DE19756916A1 Thermistor-based monitoring system as watchdog for electrical loads |
| 07/02/1998 | DE19756900A1 Semiconductor element testing device for IC tester |
| 07/02/1998 | DE19653780A1 Verfahren zum Sortieren von IC-Bauelementen A method for sorting of IC devices |
| 07/02/1998 | DE19648421C1 Contact device for testing integrated circuits (ICs) |
| 07/02/1998 | CA2275572A1 Methods and devices relating to circuit board constructions |
| 07/01/1998 | EP0851235A2 Circuit and method to externally adjust internal circuit timing |
| 07/01/1998 | EP0851234A2 Adapter arrangement for electrically testing printed circuit boards |
| 07/01/1998 | EP0850490A1 Process and device for testing a chip |
| 07/01/1998 | EP0850420A2 Method of and device for inspecting a pcb |
| 07/01/1998 | EP0648018B1 Circuit indicating the phase relations between plural signals of the same frequency and its application in a circuit for adjusting the phase differences between these signals |
| 07/01/1998 | EP0515577B1 Making and testing an integrated circuit using high density probe points |
| 07/01/1998 | CN1186244A Method for leading from interior of coils of electric appliance |
| 06/30/1998 | US5774646 Method for detecting faulty elements of a redundancy semiconductor memory |
| 06/30/1998 | US5774545 Method and apparatus for enhancing security in and discouraging theft of VLSI and ULSI devices |
| 06/30/1998 | US5774477 Method and apparatus for pseudorandom boundary-scan testing |
| 06/30/1998 | US5774476 Timing apparatus and timing method for wrapper cell speed path testing of embedded cores within an integrated circuit |
| 06/30/1998 | US5774475 Testing scheme that re-uses original stimulus for testing circuitry embedded within a larger circuit |
| 06/30/1998 | US5774474 Pipelined scan enable for fast scan testing |
| 06/30/1998 | US5774473 Scan latch and test method therefore |
| 06/30/1998 | US5774358 Method and apparatus for generating instruction/data streams employed to verify hardware implementations of integrated circuit designs |
| 06/30/1998 | US5774228 Deterioration diagnosis method and device of electrical machine and apparatus |
| 06/30/1998 | US5773990 Integrated circuit test power supply |
| 06/30/1998 | US5773989 Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer |
| 06/30/1998 | US5773988 For electrically connecting limited-access test targets |
| 06/30/1998 | US5773987 Method for probing a semiconductor wafer using a motor controlled scrub process |
| 06/30/1998 | US5773986 Semiconductor wafer contact system and method for contacting a semiconductor wafer |
| 06/30/1998 | US5773985 One port complex transmission and group delay measurements |
| 06/30/1998 | US5773983 Electrical transfer switch and related method |
| 06/30/1998 | US5773982 Process for checking the efficiency of an electric power station component |
| 06/30/1998 | US5773981 Method of detecting linear solenoid inter-terminal short of electronic control type automatic transmission |
| 06/30/1998 | US5773980 One-terminal fault location system that corrects for fault resistance effects |
| 06/30/1998 | US5773978 Battery impedance monitor |
| 06/30/1998 | US5773977 Method of testing an electric storage battery by determining a bounce-back voltage after a load has been removed |
| 06/30/1998 | US5773972 Transition detection circuit for detecting transitions in the state of an object of detection |
| 06/30/1998 | US5773962 Battery energy monitoring circuits |
| 06/30/1998 | US5773961 Dynamic load controller for a battery |
| 06/30/1998 | US5773958 Apparatus for detecting cell reversal in rechargeable batteries |
| 06/30/1998 | US5773880 Non-contact IC card having insulated exposed leads |
| 06/30/1998 | US5773780 Method of severing bond wires and forming balls at their ends |
| 06/30/1998 | US5773764 Printed circuit board panel |
| 06/30/1998 | US5772451 Sockets for electronic components and methods of connecting to electronic components |
| 06/30/1998 | US5772387 Device transfer apparatus and device reinspection method for IC handler |
| 06/30/1998 | US5772325 Apparatus for providing surface images and method for making the apparatus |
| 06/30/1998 | US5772040 Workpiece conveying apparatus used with workpiece inspection device |
| 06/30/1998 | US5771567 Methods of fabricating continuous transverse stub radiating structures and antennas |
| 06/30/1998 | US5771556 Acoustic wave device and manufacturing method |
| 06/30/1998 | CA2125026C Electric arc detector |
| 06/30/1998 | CA2119284C Logic simulator |
| 06/30/1998 | CA2046680C Optical fiber laying structure for electric power cable line trouble occurrence location detecting system |
| 06/25/1998 | WO1998027566A1 Method and system for detecting relay failure |
| 06/25/1998 | WO1998027556A1 Memory test set |
| 06/25/1998 | DE19747448A1 Device and method of detecting test mode |
| 06/25/1998 | DE19654504A1 Electrical testing of multiple ICs integrated esp. on semiconductor wafer |
| 06/24/1998 | EP0849743A2 Built-in self test memory devices |
| 06/24/1998 | EP0849678A2 A system and method for testing electronic devices |
| 06/24/1998 | EP0849675A2 Volatile memory chip with non-volatile memory locations for storing quality information |
| 06/24/1998 | EP0849671A2 A method for utilizing a multi-word instruction register during debugging of a data processing system |
| 06/24/1998 | EP0849605A1 Method of determining the current state of charge of an electrical energy storage unit |
| 06/24/1998 | EP0849604A1 Procedure for detecting damage to rotors of asynchronous machines and appliance for using the procedure |
| 06/24/1998 | EP0849603A2 Connector for display inspection of a liquid crystal display panel and method for the preparation thereof |
| 06/24/1998 | EP0849599A1 Apparatus for contacting semiconductor die |
| 06/24/1998 | EP0848826A2 Condition tester for a battery |
| 06/24/1998 | EP0792519A4 Interconnection elements for microelectronic components |
| 06/24/1998 | EP0792517A4 Electrical contact structures from flexible wire |
| 06/24/1998 | EP0792463A4 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 06/24/1998 | EP0729652A4 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 06/24/1998 | EP0705529A4 Method and apparatus for non-conductively interconnecting integrated circuits |
| 06/24/1998 | EP0670552B1 Design automation method for digital electronic circuits |
| 06/24/1998 | EP0511752B1 High-speed integrated circuit testing with JTAG |
| 06/24/1998 | CN2284963Y Portable multi-functional and expandable digital circuit tester |
| 06/24/1998 | CN1185588A 电机测试装置 Motor testing device |
| 06/24/1998 | CN1185587A Method for generating self-diagnosis information from circuitboard and apparatus thereof |
| 06/24/1998 | CN1185586A Testing device for semi-conductor device |
| 06/23/1998 | US5771474 Method for testing electronic control devices |
| 06/23/1998 | US5771243 Method of identifying redundant test patterns |
| 06/23/1998 | US5771241 Method and apparatus for embedding operand synthesizing sequences in randomly generated tests |
| 06/23/1998 | US5771240 Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin |
| 06/23/1998 | US5771191 Method and system for inspecting semiconductor memory device |
| 06/23/1998 | US5771179 Measurement analysis software system and method |
| 06/23/1998 | US5771068 Apparatus and method for display panel inspection |
| 06/23/1998 | US5770964 Arrangement enabling pin contact test of a semiconductor device having clamp protection circuit, and method of testing a semiconductor device |
| 06/23/1998 | US5770955 Integrated circuit with capacitor-charging circuit for use in signal responsive devices |
| 06/23/1998 | US5770947 Arrangement for testing a gate oxide |
| 06/23/1998 | US5770946 Photon assisted sub-tunneling electrical probe, probe tip, and probing method |
| 06/23/1998 | US5770687 Comformationally constrained backbone cyclized somatostatin analogs |
| 06/23/1998 | CA2117387C Detection of location of faults in cables |
| 06/18/1998 | WO1998026301A1 Integrated circuit comprising a first and a second clock domain and a method for testing such a circuit |
| 06/18/1998 | WO1998026300A1 Probe card for high speed testing |
| 06/18/1998 | WO1998026299A1 Device to detect the state of n power capacitors forming part of a high-voltage power capacitor bank |
| 06/18/1998 | WO1998026297A2 Method for testing semiconductor devices |
| 06/18/1998 | DE19731944A1 Charge-carrier lifetimes determining circuit for semiconductor wafer |