| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/23/1998 | WO1998022830A3 Battery management system and battery simulator |
| 07/23/1998 | DE19737837A1 DRAM with memory cell array in matrix of lines and columns for DRAM testing |
| 07/23/1998 | DE19702139A1 Matching error determination of load connected to signal source |
| 07/23/1998 | DE19701703A1 Microscope system for determining emission distribution of light emitting samples e.g. in semiconductor ICs |
| 07/22/1998 | EP0854583A1 Portable device battery technique |
| 07/22/1998 | EP0854426A2 Apparatus and method for analyzing electronic circuit and storage device storing electronic circuit analysis program |
| 07/22/1998 | EP0854366A1 Histogram based testing of analog signals |
| 07/22/1998 | EP0854365A2 Numerical comparator |
| 07/22/1998 | EP0853657A1 Storage device for objects, storage station, and air-conditioned cabinet |
| 07/22/1998 | EP0759220B1 Detector for monitoring the integrity of a ground connection to an electrical appliance |
| 07/22/1998 | EP0722570B1 Device for regulating operating parameters and/or conditions in electrical factory equipment |
| 07/22/1998 | EP0535222B1 Digital battery capacity warning device |
| 07/22/1998 | CN1188346A Universal input data sampling circuit and method thereof |
| 07/22/1998 | CN1188238A Semiconductor device testing apparatus |
| 07/22/1998 | CN1039260C Method and device for monitoring rotor break-rod of cage asynchronous motor |
| 07/21/1998 | US5784663 System for supervising an image forming apparatus from a remote computer via a communication control unit |
| 07/21/1998 | US5784299 Method for measuring electronic devices under test with a network analyzer |
| 07/21/1998 | US5784295 Method and apparatus for determining residual battery voltage |
| 07/21/1998 | US5783998 Battery pack, method and electronic device for controlling its operation device |
| 07/21/1998 | US5783960 Integrated circuit device with improved clock signal control |
| 07/21/1998 | US5783959 High precision clock signal generator |
| 07/21/1998 | US5783947 Semiconductor integrated circuit |
| 07/21/1998 | US5783835 For locating defect sites in an integral circuit specimens |
| 07/21/1998 | CA2195587A1 D.i.s. k.v. tester |
| 07/16/1998 | WO1998031099A1 Timing signal generator |
| 07/16/1998 | WO1998031087A1 Integrated circuit device for monitoring power supply |
| 07/16/1998 | WO1998031046A2 Testing station for semiconductor wafers or wafer fragments |
| 07/16/1998 | WO1998031019A1 High-speed test system for a memory device |
| 07/16/1998 | WO1998030916A1 A diagnostic method and apparatus for detecting high electrical harness resistance |
| 07/16/1998 | WO1998021596A3 Lightning test method and apparatus |
| 07/16/1998 | DE4126767C2 Anordnung zur Erzeugung von Signalmustern Arrangement for the generation of signal patterns |
| 07/16/1998 | DE19800461A1 Test clamping device for electronic circuit boards used to mount integrated circuits for burn-in testing |
| 07/16/1998 | DE19737777A1 Decision circuit for switching to back-up power supply e.g. for sequence or run-off control unit, counter etc |
| 07/16/1998 | DE19701152A1 Vorrichtungen und Verfahren zur Detektion von Leiterbahnunterbrechungen bei Solarmodulen Devices and methods for detection of open circuits for solar modules |
| 07/16/1998 | DE19700839A1 Teststation für Halbleiterwafer bzw. Bruchstücke von Halbleiterwafern Test station for semiconductor wafers or fragments of semiconductor wafers |
| 07/16/1998 | CA2278329A1 Integrated circuit device for monitoring power supply |
| 07/15/1998 | EP0853280A2 Timing verification method and device |
| 07/15/1998 | EP0853276A2 Artificial random-number pattern generating circuit |
| 07/15/1998 | EP0853244A2 Testing tool for medium or high voltage cell |
| 07/15/1998 | EP0853243A2 Method and apparatus for detecting defects in wafers |
| 07/15/1998 | EP0853242A1 Method for testing printed-circuit boards |
| 07/15/1998 | EP0852730A1 Parallel processing integrated circuit tester |
| 07/15/1998 | EP0852710A1 Arrangement for sensing the temperature of the armature of a direct current motor |
| 07/15/1998 | CN2286317Y Testing line for battery properties and protector element connection apparatus |
| 07/15/1998 | CN1187688A Simulation method in lithographic process |
| 07/14/1998 | US5781766 Programmable compensating device to optimize performance in a DRAM controller chipset |
| 07/14/1998 | US5781759 Emulator probe mountable to a target board at different orientation angles |
| 07/14/1998 | US5781721 Method and apparatus for testing cache RAM residing on a microprocessor |
| 07/14/1998 | US5781718 Method for generating test pattern sets during a functional simulation and apparatus |
| 07/14/1998 | US5781560 System testing device and method using JTAG circuit for testing high-package density printed circuit boards |
| 07/14/1998 | US5781559 Testable circuit |
| 07/14/1998 | US5781558 Diagnostic memory access |
| 07/14/1998 | US5781485 Apparatus and method for controlling operating mode in semiconductor memory device |
| 07/14/1998 | US5781448 Control system and control method for uninterruptible power supply |
| 07/14/1998 | US5781425 Method and device for control of a converter installation |
| 07/14/1998 | US5781059 Driver circuit for semiconductor test system |
| 07/14/1998 | US5781038 High speed phase locked loop test method and means |
| 07/14/1998 | US5781025 Method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing |
| 07/14/1998 | US5781024 Instrument performance verification system |
| 07/14/1998 | US5781023 For performing tests on an electrical device |
| 07/14/1998 | US5781022 Substrate having self limiting contacts for establishing an electrical connection with a semiconductor die |
| 07/14/1998 | US5781021 Universal fixtureless test equipment |
| 07/14/1998 | US5781017 Capacitive charge generation apparatus and method for testing circuits |
| 07/14/1998 | US5781015 Extension cord with integral monitoring system |
| 07/14/1998 | US5781013 Battery management system for electric vehicle |
| 07/14/1998 | US5780866 Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection |
| 07/14/1998 | US5779864 Apparatus for adjusting sectional area ratio of metal-covered electric wire |
| 07/14/1998 | US5779428 Carrier cart |
| 07/14/1998 | US5779327 Pressure supply system having a malfunction detection device |
| 07/14/1998 | US5778692 Allocation of compressors to cooling chambers |
| 07/14/1998 | US5778485 Probe card cleaning apparatus, probe apparatus with the cleaning apparatus, and probe card cleaning method |
| 07/14/1998 | CA2124757C Aircraft communication headset tester |
| 07/09/1998 | WO1998029910A2 Apparatus for detecting cell reversal in rechargeable batteries |
| 07/09/1998 | WO1998029898A2 Scalable tester architecture with i-cached simd technology |
| 07/09/1998 | WO1998029752A1 System for locating faults and estimating fault resistance in distribution networks with tapped loads |
| 07/09/1998 | WO1998029750A2 Method and apparatus for testing encapsulated circuits |
| 07/09/1998 | CA2276370A1 Apparatus for detecting cell reversal in rechargeable batteries |
| 07/09/1998 | CA2246599A1 Method of calibrating the trip point of an overload relay |
| 07/08/1998 | EP0852354A1 Improvements in or relating to integrated circuit |
| 07/08/1998 | EP0852353A2 Method of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test points |
| 07/08/1998 | EP0852107A2 Method of detecting the position and displacement of layers on multilayered circuit boards |
| 07/08/1998 | EP0852015A1 Battery capacity measuring device |
| 07/08/1998 | EP0676091B1 Tab testing of area array interconnected chips |
| 07/08/1998 | EP0589974B1 A method and a system for testing capacitive acoustic transducers |
| 07/08/1998 | CN2285904Y Control circuit analog arrangement for high voltage breaker |
| 07/08/1998 | CN1187244A Method and apparatus for testing a megacell in an ASIC using JTAG |
| 07/08/1998 | CN1186960A Method for detecting fraudulent use of electricity by short connection |
| 07/07/1998 | US5778326 Hybrid vehicle with battery charge control relative to a driving route |
| 07/07/1998 | US5778004 Vector translator |
| 07/07/1998 | US5777930 Semiconductor device |
| 07/07/1998 | US5777885 Devices and systems with protective terminal configuration, and methods |
| 07/07/1998 | US5777873 Automated test fixture control system |
| 07/07/1998 | US5777841 Method of qualification testing of DC-DC converters |
| 07/07/1998 | US5777550 High reliability instrument system |
| 07/07/1998 | US5777489 Field programmable gate array with integrated debugging facilities |
| 07/07/1998 | US5777487 Method for detecting failures in electric circuits and tester, liquid crystal for use therewith |
| 07/07/1998 | US5777486 Electromigration test pattern simulating semiconductor components |
| 07/07/1998 | US5777485 Probe method and apparatus with improved probe contact |
| 07/07/1998 | US5777484 Device for testing integrated circuit chips during vibration |
| 07/07/1998 | US5777480 Connector conduction tester, and terminal locking method for connector conduction test |