| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 08/11/1998 | US5794165 Control unit for vehicle and total control system therefor |
| 08/11/1998 | US5794007 System and method for programming programmable electronic components using board-level automated test equipment |
| 08/11/1998 | US5793778 Method and apparatus for testing analog and digital circuitry within a larger circuit |
| 08/11/1998 | US5793777 System and method for testing internal nodes of an integrated circuit at any predetermined machine cycle |
| 08/11/1998 | US5793776 Circuit test method |
| 08/11/1998 | US5793775 Low voltage test mode operation enable scheme with hardware safeguard |
| 08/11/1998 | US5793642 Method for determining characteristics of an electrical signal |
| 08/11/1998 | US5793380 Fitting parameter determination method |
| 08/11/1998 | US5793220 Fixture for testing and prepping light-emitting diodes |
| 08/11/1998 | US5793219 Testing of semiconductor integrated circuits |
| 08/11/1998 | US5793218 Generic interface test adapter |
| 08/11/1998 | US5793212 Method of measuring the breakdown charge of a dielectric film |
| 08/11/1998 | US5793211 Battery remaining capacity measuring system for electric motor vehicles |
| 08/11/1998 | US5793117 Semiconductor device and method of fabricating the same |
| 08/11/1998 | US5793051 Method for obtaining three-dimensional data from semiconductor devices in a row/column array and control of manufacturing of same with data to eliminate manufacturing errors |
| 08/11/1998 | US5793041 Method for correcting astigmatism and focusing in charged particle optical lens-barrel |
| 08/11/1998 | US5791934 Probeless fixture for adapter card testing |
| 08/11/1998 | CA2104685C Serial testing of removable circuit boards on a backplane bus |
| 08/06/1998 | WO1998034316A1 Power supply monitoring integrated circuit device and battery pack |
| 08/06/1998 | WO1998034123A1 Method and system for calibrating a crystal oscillator |
| 08/06/1998 | WO1998034101A1 Infrared screening and inspection system |
| 08/06/1998 | DE19732103A1 Indicating direction of current short circuit to earth in MV 3 phase AC network |
| 08/06/1998 | DE19703982A1 Testing of PCBs using system working with test fingers |
| 08/06/1998 | DE19703514A1 Adjusting resistance value of photoresistors |
| 08/06/1998 | CA2279193A1 Power supply monitoring integrated circuit device and battery pack |
| 08/05/1998 | EP0856795A2 A processor for determining the operation of an integrated circuit |
| 08/05/1998 | EP0856794A1 Method and apparatus for performing operative testing on an integrated circuit |
| 08/05/1998 | EP0856740A1 PCB testing system |
| 08/05/1998 | EP0856739A1 Method for detecting short-circuit conditions and device which uses this method |
| 08/05/1998 | EP0856207A1 Power management system |
| 08/05/1998 | EP0856160A1 Arrangement for controlling a load connected to the secondary side of a transformer |
| 08/05/1998 | EP0806072A4 Smart battery algorithm for reporting battery parameters to an external device |
| 08/05/1998 | EP0717837B1 Fluid leak detection cable |
| 08/05/1998 | CN2287309Y Computer timing instrument for measuring melting time of fuse of voltage inducer |
| 08/05/1998 | CN1189731A Multiconnector-terminated multi-segment line cord with strain relief attachment for telephone test set |
| 08/05/1998 | CN1189621A Method for performing test mode of electric device |
| 08/04/1998 | US5790776 Apparatus for detecting divergence between a pair of duplexed, synchronized processor elements |
| 08/04/1998 | US5790771 Apparatus and method for configuring a reconfigurable electronic system having defective resources |
| 08/04/1998 | US5790565 CMOS integrated circuit failure diagnosis apparatus and diagnostic method |
| 08/04/1998 | US5790563 Self test of core with unpredictable latency |
| 08/04/1998 | US5790561 Fault isolation system for observing a functional block |
| 08/04/1998 | US5790560 Apparatus and method for timing self-timed circuitry |
| 08/04/1998 | US5790559 Semiconductor memory testing apparatus |
| 08/04/1998 | US5790479 Method for characterizing interconnect timing characteristics using reference ring oscillator circuit |
| 08/04/1998 | US5790438 Radio navigation testing method and device using standard signal measuring and generating equipment |
| 08/04/1998 | US5790411 Equipment for testing electronic circuitry |
| 08/04/1998 | US5789958 Apparatus for controlling timing of signal pulses |
| 08/04/1998 | US5789935 Motor evaluation data generating method with response delay compensation |
| 08/04/1998 | US5789934 Test circuit including a power supply with a current transformer to monitor capacitor output current |
| 08/04/1998 | US5789933 Method and apparatus for determining IDDQ |
| 08/04/1998 | US5789932 Integrated circuit |
| 08/04/1998 | US5789931 Quantitative mobility spectrum analysis for magnetic field dependent hall and resistivity data |
| 08/04/1998 | US5789930 Apparatus and method to test for known good die |
| 08/04/1998 | US5789928 Circuit and method for discriminating the source of waveform distortion in an electric power generation and distribution system |
| 08/04/1998 | US5789926 Method of detecting arcing in cathode ray tubes |
| 08/04/1998 | US5789924 Method of calculating rechargeable battery charge capacity |
| 08/04/1998 | US5789923 Battery remaining capacity measuring device |
| 08/04/1998 | US5789914 Onboard digital locomotive horsepower multimeter |
| 08/04/1998 | US5789913 Method for analyzing and equalizing signals |
| 08/04/1998 | US5789912 High frequency switch and method of testing H-F apparatus |
| 08/04/1998 | US5789903 Method and apparatus for processing batteries |
| 08/04/1998 | US5789901 Apparatus with rechargeable batteries and a device for calculating and indicating the number of remaining use sessions of the apparatus |
| 08/04/1998 | US5789899 Smart battery system with an A/D converter that converts both positive and negative analog input signals |
| 08/04/1998 | US5789100 Battery with strength indicator |
| 08/04/1998 | US5788526 Integrated circuit test socket having compliant lid and mechanical advantage latch |
| 08/04/1998 | US5788084 Automatic testing system and method for semiconductor devices |
| 08/04/1998 | CA2119226C Partial-scan built-in self-testing circuit having improved testability |
| 07/30/1998 | WO1998033257A1 Power supply monitoring ic and battery pack |
| 07/30/1998 | WO1998033163A1 Method of manufacturing a liquid crystal display module |
| 07/30/1998 | DE19756466A1 Test head for integrated circuit testing device |
| 07/30/1998 | DE19707191A1 Battery charger for repeat charge or rechargeable batteries |
| 07/29/1998 | EP0855654A2 Hierarchical connection method apparatus and protocol |
| 07/29/1998 | EP0855651A2 Method of design for testability and method of test sequence generation |
| 07/29/1998 | EP0855102A1 Compensated delay locked loop timing vernier |
| 07/29/1998 | EP0855071A1 Enhanced security semiconductor device, semiconductor circuit arrangement, and method of production thereof |
| 07/29/1998 | EP0855038A1 Network component diagnosis, using modelling by bands |
| 07/29/1998 | EP0855037A1 Loaded board drop pin fixture |
| 07/29/1998 | EP0764275B1 Fault detection circuit for sensing leakage currents between power source and chassis |
| 07/29/1998 | EP0514700B1 An implementation of the IEEE 1149.1 boundary-scan architecture |
| 07/29/1998 | CN2286882Y POD examining-repairing instrument |
| 07/29/1998 | CN1188896A Memory testing apparatus |
| 07/28/1998 | US5787191 Wiring pattern inspection apparatus for printed circuit board |
| 07/28/1998 | US5787098 Complete chip I/O test through low contact testing using enhanced boundary scan |
| 07/28/1998 | US5787092 Test chip circuit for on-chip timing characterization |
| 07/28/1998 | US5786716 Signal generator for generating test mode signals |
| 07/28/1998 | US5786708 Self-tuning and compensating turn fault detector |
| 07/28/1998 | US5786707 Method of detecting possible defect of liquid crystal panel |
| 07/28/1998 | US5786705 Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems |
| 07/28/1998 | US5786704 Metallic tray unit for testing a semiconductor device |
| 07/28/1998 | US5786703 Method and device for testing of an integrated circuit |
| 07/28/1998 | US5786702 Method for detecting defects in integrated-circuit arrays |
| 07/28/1998 | US5786700 Method for determining interconnection resistance of wire leads in electronic packages |
| 07/28/1998 | US5786699 Test method and apparatus for testing a protective relay system |
| 07/28/1998 | US5786697 Capacitive open-circuit and short-circuit tests of component connections to circuit boards |
| 07/28/1998 | US5786689 Apparatus including a measurement time counting device for measuring an electrical characteristic of semiconductor |
| 07/28/1998 | US5786641 Failure detection system for detecting a failure in a power converter |
| 07/28/1998 | US5786640 Generator control system for a hybrid vehicle driven by an electric motor and an internal combustion engine |
| 07/23/1998 | WO1998032181A2 Signalling system |
| 07/23/1998 | WO1998032025A1 Internal testability system for microprocessor-based integrated circuit |
| 07/23/1998 | WO1998032024A1 Device and method for detecting conductor breaks in solar modules |