Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1998
08/26/1998EP0859963A1 Method for determining the charge status of a storage battery
08/26/1998EP0859962A1 Method and apparatus for high-speed scanning of electromagnetic emission levels
08/26/1998EP0859960A1 Device and method to monitor sensors in vehicles
08/26/1998EP0859953A1 Process and circuit arrangement for testing solder joints
08/26/1998EP0859686A1 Fabricating interconnects and tips using sacrificial substrates
08/26/1998EP0795222B1 Process for detecting a ground fault in an electric energy transmission line
08/26/1998CN2289249Y Communication cable failure detector
08/26/1998CN1191500A Ribbon-like core interconnection elements
08/26/1998CN1191346A Method for real-time measuring memory chip divided into unit field in running of computer
08/26/1998CN1191316A Circuit and test method
08/26/1998CN1191315A High-voltage overhead line on-line failure distance finding method and instrument installation
08/25/1998US5799021 In an integrated circuit
08/25/1998US5798934 Battery remaining capacity measuring device
08/25/1998US5798830 Method of establishing thresholds for image comparison
08/25/1998US5798702 Bicycle
08/25/1998US5798690 Monitoring circuit for an ABS warning lamp
08/25/1998US5798662 Low-side driver with gate leakage detection circuitry
08/25/1998US5798654 For testing a printed circuit board
08/25/1998US5798653 Burn-in system for reliable integrated circuit manufacturing
08/25/1998US5798651 Probe system
08/25/1998US5798649 Method for detecting defects in semiconductor insulators
08/25/1998US5798648 Apparatus and method for inspecting an electrolytic capacitor in an inverter circuit containing transistor switching elements
08/25/1998US5798647 For testing the integrity of an engine controller module of a vehicle
08/25/1998US5798646 Apparatus for measuring remaining capacity of a battery
08/25/1998US5798638 Apparatus for testing of printed circuit boards
08/25/1998US5798629 Apparatus for diagnosing low voltage battery
08/25/1998US5798565 For integrating diced integrated circuits
08/25/1998US5798464 Method of measuring extraction forces
08/25/1998CA2229241A1 Method and apparatus for measuring critical current value of superconducting wire
08/20/1998WO1998036421A1 Ecological method for determining the protection level required for electrical circuits in devices and appliances of various installations against the effect of external electromagnetical fields
08/20/1998WO1998036340A1 Power supply circuit of an electronic component in a test machine
08/20/1998DE19806821A1 Determination of faults in solenoid valve e.g. for vehicle electronic braking control system
08/20/1998DE19806564A1 IC testing device applying test signals with automatic IC handling
08/20/1998DE19805718A1 Integrated circuit component testing device
08/20/1998DE19746955A1 Semiconductor element testing system for burn-in test of semiconductor components
08/20/1998DE19707325A1 Testing component(s) on wafer using capacitive probe
08/20/1998DE19707312A1 Reliability increasing circuit for integrated circuit testing
08/20/1998DE19705368A1 Testing method for automobile passenger restraint release device
08/19/1998EP0859473A2 Method for efficient calculation of power sum cross-talk loss
08/19/1998EP0859367A2 Pattern generator with extended register programming
08/19/1998EP0859318A1 Optimized memory organization in a multi-channel architecture
08/19/1998EP0859239A2 A method and device for correcting misalignment between test needles and test points during electrical testing of printed circuit boards, particularly during multiple tests
08/19/1998EP0859238A2 EMS testing system
08/19/1998EP0859237A1 Method and device for monitoring at least one antenna-branch, in particular in a car
08/19/1998EP0858689A1 System for equalizing the level of charge in batteries
08/19/1998EP0858605A1 Systems for determining fault location on power distribution lines
08/19/1998EP0858604A1 Source of waveform distortion discrimination circuit and method
08/19/1998EP0800676B1 Method and equipment for the automatic testing of electronic components
08/19/1998EP0774124A4 Ac power outlet ground integrity and wire test circuit device
08/19/1998EP0630529B1 Electromagnetic interference testing apparatus
08/19/1998CN2288454Y Open-phase indicator for three-phase active electric energy meter
08/19/1998CN1191020A Functional test process for a mechanical switching element
08/19/1998CN1191019A Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
08/19/1998CN1190793A Method and device for checking IC device shell pin
08/18/1998US5797114 Method and apparatus for mapping of semiconductor materials
08/18/1998US5796993 Method and apparatus for semiconductor device optimization using on-chip verification
08/18/1998US5796990 Hierarchical fault modeling system and method
08/18/1998US5796963 System and method for converting VXI bus cycles to PCI burst cycles
08/18/1998US5796753 High speed test pattern transfer apparatus for semiconductor test system
08/18/1998US5796752 Method and apparatus for constructing verification test sequences by euler touring a test subsequence graph
08/18/1998US5796751 Technique for sorting high frequency integrated circuits
08/18/1998US5796750 Method for programming a programmable logic device in an automatic tester
08/18/1998US5796749 Delay correction circuit for semiconductor tester
08/18/1998US5796748 Pattern generator in semiconductor test system
08/18/1998US5796746 Device and method for testing integrated circuit dice in an integrated circuit module
08/18/1998US5796636 Apparatus for and method of testing an electrical ground fault circuit interrupt device
08/18/1998US5796287 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
08/18/1998US5796266 Circuit and a method for configuring pad connections in an integrated device
08/18/1998US5796265 Method for metal delay testing in semiconductor devices
08/18/1998US5796264 Apparatus for manufacturing known good semiconductor dice
08/18/1998US5796262 Method and apparatus for diagnosing bearing insulation impedance of a rotating electrical apparatus
08/18/1998US5796261 Method and device for detecting solenoid actuation
08/18/1998US5796260 Parametric test circuit
08/18/1998US5796259 Methods and apparatus for detection of fault direction
08/18/1998US5796257 Detecting faults in power lines
08/18/1998US5796239 Battery pack having a processor controlled battery operating system
08/18/1998US5796238 Battery pack
08/18/1998US5795172 Production printed circuit board (PCB) edge connector test connector
08/18/1998CA2127612C Boundary-scan-based system and method for test and diagnosis
08/17/1998CA2229713A1 Wafer comprising optoelectronic circuits and method of verifying this wafer
08/13/1998WO1998035239A1 Electrical testing kit for school bus
08/13/1998WO1998035238A1 Probe card and system for testing wafers
08/13/1998WO1998035237A2 Arcing fault detection system
08/13/1998WO1998034820A1 Control device for a windshield wiper motor
08/13/1998DE19704807A1 Steuervorrichtung mit einem Wischermotor Control device having a wiper motor
08/13/1998DE19704763A1 Method and equipment for detecting h.f. electromagnetic interference radiation from passenger section of plane
08/13/1998DE19538858C2 Verfahren zum Betrieb einer integrierten Schaltung Method for operating an integrated circuit
08/13/1998CA2733821A1 Integrated protection system for electrical distribution
08/12/1998EP0857305A1 Oscillation-based test strategy for analog and mixed-signal circuits
08/12/1998EP0857304A2 Flexibly suspended heat exchange head for a dut
08/12/1998EP0631235B1 Partial-scan built-in selftesting sequential circuit
08/12/1998CN2287760Y Soft starter of motor
08/12/1998CN2287728Y Reactance method fault measuring distance earthing phase-reversal switch cabinet for power line
08/12/1998CN2287727Y 多功能电路测试器 Multi-function circuit tester
08/12/1998CN1190465A Abnormality detection apparatus and abnormality detection method
08/12/1998CN1190262A Monobrid semiconductor integrated circuit device and checking method thereof
08/12/1998CN1190255A Method and apparatus for performing operative testing on integrated circuit
08/12/1998CN1190254A Mode detecting device and method
08/12/1998CN1190240A 半导体存储器 Semiconductor memory
08/11/1998US5794175 Low cost, highly parallel memory tester