| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/15/1998 | US5807104 Test socket for detachable IC chip |
| 09/15/1998 | US5807066 IC tray handling apparatus and method |
| 09/15/1998 | US5806781 Winding apparatus and method |
| 09/11/1998 | WO1998039663A1 Method and device for identifying the system parameters stator resistance and rotor resistance of a transmitter-free induction machine operated in a field-oriented manner |
| 09/10/1998 | DE19737838A1 DRAM for write and read-out of data |
| 09/09/1998 | EP0863611A1 A short-circuit detecting device |
| 09/09/1998 | EP0863598A1 Balanced battery charger |
| 09/09/1998 | EP0832438A4 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 09/09/1998 | CN2290860Y Automatic monitor for accumulator |
| 09/09/1998 | CN1192534A Semiconductor device testing apparatus |
| 09/09/1998 | CN1192533A Semiconductor device testing apparatus |
| 09/08/1998 | US5805794 Method for programming an integrated circuit device |
| 09/08/1998 | US5805792 Emulation devices, systems, and methods |
| 09/08/1998 | US5805611 Method and apparatus for testing high-frequency integrated circuits using a lower-frequency tester |
| 09/08/1998 | US5805610 Virtual channel data distribution system for integrated circuit tester |
| 09/08/1998 | US5805609 Method and apparatus for testing a megacell in an ASIC using JTAG |
| 09/08/1998 | US5805608 Clock generation for testing of integrated circuits |
| 09/08/1998 | US5805607 Method for user-controlled I/O switching during in-circuit programming of CPLDs through the IEEE 1149.1 test access port |
| 09/08/1998 | US5805605 Semiconductor integrated device |
| 09/08/1998 | US5805514 Method for testing a semiconductor memory device and a semiconductor memory device |
| 09/08/1998 | US5805472 Test handler for semiconductor devices |
| 09/08/1998 | US5805471 Driver board apparatus having SRAM and burn-in system and method using host computer |
| 09/08/1998 | US5805397 Arcing fault detector with multiple channel sensing and circuit breaker incorporating same |
| 09/08/1998 | US5805278 Particle detection method and apparatus |
| 09/08/1998 | US5805069 Battery pack |
| 09/08/1998 | US5804996 Low-power non-resetable test mode circuit |
| 09/08/1998 | US5804983 Probe apparatus with tilt correction mechanisms |
| 09/08/1998 | US5804982 Miniature probe positioning actuator |
| 09/08/1998 | US5804980 Method and system for testing an interconnection in a semiconductor integrated circuit |
| 09/08/1998 | US5804977 Transmission line pulser discharge circuit |
| 09/08/1998 | US5804975 Detecting breakdown in dielectric layers |
| 09/08/1998 | US5804973 Control device in an electric vehicle |
| 09/08/1998 | US5804972 Partial-discharge measuring device |
| 09/08/1998 | US5804960 Circuits for testing the function circuit modules in an integrated circuit |
| 09/08/1998 | US5804894 Low voltage battery pack monitoring circuit with adjustable set points |
| 09/08/1998 | US5802699 Methods of assembling microelectronic assembly with socket for engaging bump leads |
| 09/03/1998 | WO1998038812A2 Wireless secondary interface for data storage device |
| 09/03/1998 | WO1998038721A1 Power supply device |
| 09/03/1998 | WO1998038677A1 Method for manufacturing semiconductor device |
| 09/03/1998 | DE19807237A1 Semiconductor component test instrument for testing semiconductor component elements |
| 09/03/1998 | DE19708289A1 Sorting arrangement in integrated circuit handling instrument |
| 09/02/1998 | EP0862268A2 Flip flop circuit for scan test |
| 09/02/1998 | EP0862256A2 Battery and charging system for a rechargeable battery |
| 09/02/1998 | EP0862233A2 Monitoring a fuel cell with polymer electrolyte by comparing the behaviour patterns of an auxiliaire cell |
| 09/02/1998 | EP0862116A2 A smart debug interface circuit |
| 09/02/1998 | EP0862115A1 Trigger sequencing controller |
| 09/02/1998 | EP0862099A1 Rechargeable electronic device |
| 09/02/1998 | EP0862063A1 Control of a test interface |
| 09/02/1998 | EP0862062A2 Circuit board inspection apparatus and method |
| 09/02/1998 | EP0862061A2 Circuit board inspection apparatus and method |
| 09/02/1998 | EP0861443A1 Variable voltage component tester |
| 09/02/1998 | EP0861442A2 Current measurement in turbogenerators |
| 09/02/1998 | EP0861130A1 Electrical circuit component handler |
| 09/02/1998 | EP0781419A4 Method and device for making connection |
| 09/02/1998 | CN2290059Y Insulation detector |
| 09/02/1998 | CN1192275A Low cost CMOS tester |
| 09/02/1998 | CN1192042A Semiconductor device testing apparatus |
| 09/02/1998 | CN1191976A Auto-lock type continuity check unit |
| 09/02/1998 | CN1039665C Universal small current grounding system single-phase grounding selecting and locating apparatus |
| 09/01/1998 | US5802379 Battery depletion management in portable computing devices having PCMCIA card loading |
| 09/01/1998 | US5802354 Method and apparatus for synchronizing selected logical partitions of a partitioned information handling system to a test datesource |
| 09/01/1998 | US5802348 Logic analysis system for logic emulation systems |
| 09/01/1998 | US5802270 Integrated circuit having an embedded digital signal processor and externally testable signal paths |
| 09/01/1998 | US5802269 Method of operating a computer system |
| 09/01/1998 | US5802075 Distributed test pattern generation |
| 09/01/1998 | US5802007 Semiconductor device having redundancy controlling circuit for selectively connecting signal paths to pin |
| 09/01/1998 | US5802001 Burn-in checking apparatus for semiconductor memory device |
| 09/01/1998 | US5801980 Testing of an analog memory using an on-chip digital input/output interface |
| 09/01/1998 | US5801972 Individual test program producing system |
| 09/01/1998 | US5801965 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices |
| 09/01/1998 | US5801958 Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including interactive system for hierarchical display of control and dataflow information |
| 09/01/1998 | US5801953 Of optical and/or electrical signals |
| 09/01/1998 | US5801952 Apparatus and method for power disturbance analysis and storage of unique impulses |
| 09/01/1998 | US5801764 Monitor device and monitor method |
| 09/01/1998 | US5801543 For electrical circuits |
| 09/01/1998 | US5801542 Display panel inspection socket |
| 09/01/1998 | US5801541 Stacked test board apparatus with matched impedance for use in electronic device test equipment |
| 09/01/1998 | US5801540 Electronic circuit tester and method of testing electronic circuit |
| 09/01/1998 | US5801536 Test method for power integrated devices |
| 09/01/1998 | US5801528 Semiconductor element evaluating apparatus |
| 09/01/1998 | US5801527 Apparatus and method for testing semiconductor device |
| 09/01/1998 | US5801526 To indicate occurrences of a fault current in an electrical conductor |
| 09/01/1998 | US5801461 Device for monitoring the operation safety of power switches |
| 09/01/1998 | US5801394 Structure for wiring reliability evaluation test and semiconductor device having the same |
| 09/01/1998 | US5800205 Contact mechanism for IC testing |
| 09/01/1998 | US5800194 IC socket |
| 09/01/1998 | US5800185 Adapter for use with an electrical component |
| 09/01/1998 | US5800184 High density electrical interconnect apparatus and method |
| 09/01/1998 | US5800043 Illuminated fuse extracting and installing tool and tester |
| 08/27/1998 | WO1998037630A1 Power device with a short-circuit detector |
| 08/27/1998 | WO1998037581A2 Power semiconductor devices with a temperature sensor circuit |
| 08/27/1998 | WO1998037428A1 Semiconductor tester with data serializer |
| 08/27/1998 | WO1998037427A1 Method and device for detecting and locating irregularities in a dielectric |
| 08/27/1998 | WO1998025153A3 Measurement instrument amplitude calibration |
| 08/27/1998 | DE19745646A1 Transport device for multiple semiconductor tester |
| 08/27/1998 | DE19707315A1 Circuit arrangement for conversion of optic signal in electric signal |
| 08/27/1998 | CA2282605A1 Method and device for detecting and locating irregularities in a dielectric |
| 08/26/1998 | EP0860705A2 Method and apparatus for measuring critical current value of superconducting wire |
| 08/26/1998 | EP0860704A2 Method and apparatus for inspecting semiconductor integrated circuits, and contactor incorporated in the apparatus |
| 08/26/1998 | EP0860703A2 Auto-lock type continuity check unit |