| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/29/1998 | US5813876 Pressure actuated zero insertion force circuit board edge connector socket |
| 09/29/1998 | US5813869 IC socket and guide member |
| 09/24/1998 | WO1998042171A2 Method and device for gauging a device for producing electrical components |
| 09/24/1998 | WO1998042137A1 Circuit for motion estimation in digitised video sequence encoders |
| 09/24/1998 | WO1998041879A2 Measurement system including antenna |
| 09/24/1998 | WO1998041850A1 Probing with backside emission microscopy |
| 09/24/1998 | DE19811603A1 Cooler for several electric components on circuit board |
| 09/24/1998 | DE19809830A1 Device for transporting flat printed material and making it wavy |
| 09/24/1998 | DE19744651A1 Test device for measuring supply current of semiconductor device |
| 09/24/1998 | DE19721296C1 Circuit simulation method using VHDL |
| 09/24/1998 | DE19710808A1 Device for determining resistance of electric and electronic operating devices to interference |
| 09/24/1998 | DE19710463A1 Verfahren zur automatischen Differentiation auf einem Rechner insbesondere zur Simulation elektronischer Schaltungen A method of automatic differentiation to a particular computer simulation of electronic circuits |
| 09/24/1998 | DE19710028A1 Monitoring arrangement for magnetic valve |
| 09/24/1998 | DE19709596A1 Method of identifying electric induction motor |
| 09/24/1998 | DE19709594A1 Determining load on electric induction motor |
| 09/24/1998 | DE19709296A1 Verfahren und Vorrichtung zur Identifikation der Systemparameter Statorwiderstand und Rotorwiderstand einer geberlosen, feldorientiert betriebenen Drehfeldmaschine Method and apparatus for identification of system parameters stator and rotor resistance of a sensor-less, field-oriented induction machine |
| 09/24/1998 | CA2283756A1 Probing with backside emission microscopy |
| 09/24/1998 | CA2232963A1 Measuring method for detecting a short-circuit between the turns of a coil integrated on a chip, and integrated circuit structure adapted to such a measuring method |
| 09/23/1998 | EP0866339A1 Method and circuit to regulate a motor |
| 09/23/1998 | EP0782747A4 Memory with stress circuitry for detecting defects |
| 09/23/1998 | EP0604032B1 Scan testing of integrated circuits |
| 09/23/1998 | CN1193827A Connector for display inspection of liquid crystal display panel and method for the preparation thereof |
| 09/22/1998 | US5812830 Debug system with raw mode trigger capability |
| 09/22/1998 | US5812563 Circuit board testing |
| 09/22/1998 | US5812562 Low cost emulation scheme implemented via clock control using JTAG controller in a scan environment |
| 09/22/1998 | US5812561 Scan based testing of an integrated circuit for compliance with timing specifications |
| 09/22/1998 | US5812557 Power line communications analyzer |
| 09/22/1998 | US5812479 Programmable logic array integrated circuits |
| 09/22/1998 | US5812424 Relay control circuit |
| 09/22/1998 | US5812378 Microelectronic connector for engaging bump leads |
| 09/22/1998 | US5812352 Circuit breaker tester |
| 09/22/1998 | US5812102 Vital monitoring system for seven-segment display used in railroad applications |
| 09/22/1998 | US5812062 Glass coated pipe system and testing method |
| 09/22/1998 | US5811983 Test ring oscillator |
| 09/22/1998 | US5811980 Test system for determining the orientation of components on a circuit board |
| 09/22/1998 | US5811979 Protective grounding jumper cable tester |
| 09/22/1998 | US5811978 Diagnostic circuit for checking capacity of condenser |
| 09/22/1998 | US5811977 Device for electrically testing an electrical connection member |
| 09/22/1998 | US5811976 Method and apparatus to determine the location and resistance of an electrical leak within a battery without measuring individual battery cells |
| 09/22/1998 | US5811890 Charge control apparatus |
| 09/22/1998 | US5811884 Automotive onboard load control apparatus and method |
| 09/22/1998 | US5811751 Multi-wavelength laser system, probe station and laser cutter system using the same |
| 09/22/1998 | US5811668 Method of measuring characteristics of a DC motor, apparatus for implementing the method, and method of calculating inductive voltage thereof |
| 09/22/1998 | US5811655 To adjust signal propagation delay times in signal paths to constant value |
| 09/22/1998 | US5811392 Conformationally constrained backbone cyclized peptide analogs |
| 09/19/1998 | CA2231763A1 High precision reference voltage generator |
| 09/17/1998 | WO1998040951A1 Method for determining state-of-health using an intelligent system |
| 09/17/1998 | WO1998040925A1 A method for determining state-of-charge using an intelligent system |
| 09/17/1998 | WO1998040828A1 Method for automatic differentiation in a computer, specially to simulate electronic circuits |
| 09/17/1998 | WO1998040756A1 A device for sensing electric discharges in test object, preferably a cable joint |
| 09/17/1998 | WO1998040755A1 Analysis of noise in repetitive waveforms |
| 09/17/1998 | WO1998040752A1 Peripherally leaded package test contactor |
| 09/17/1998 | WO1998040693A2 Time interval measurement system incorporating a linear ramp generation circuit |
| 09/17/1998 | DE4313594C2 Mikroprozessor Microprocessor |
| 09/17/1998 | DE19754641A1 Circuit arrangement with microcontroller for monitoring contact of pulse transmitter |
| 09/17/1998 | DE19716914C1 Proximity switch with coil wire break recognition circuit |
| 09/17/1998 | CA2283123A1 A device for sensing electric discharges in test object, preferably a cable joint |
| 09/16/1998 | EP0864977A1 Memory latency compensation |
| 09/16/1998 | EP0864877A1 Method and device for charging or discharging an accumulator of unknown construction and/or capacity used in an electrical or electronic device |
| 09/16/1998 | EP0864876A1 Device and method for estimating remaining life of battery |
| 09/16/1998 | EP0864875A2 Method for testing a safety circuit |
| 09/16/1998 | EP0864874A2 Method and device for testing circuit boards |
| 09/16/1998 | EP0864872A2 Dual-laser voltage probing of IC's |
| 09/16/1998 | EP0864870A2 Method of making an integrated circuit testing device |
| 09/16/1998 | EP0864195A1 Battery-powered electrical device |
| 09/16/1998 | EP0864168A2 Method and device for monitoring consumption of contact elements in a switching device |
| 09/16/1998 | EP0864153A1 Device and method for programming high impedance states upon select input/output pads |
| 09/16/1998 | EP0864100A1 Fault warning in electronic sensors |
| 09/16/1998 | EP0864099A2 Process and device for testing electric drives |
| 09/16/1998 | EP0864097A1 Device for carrying out measurements on communication lines |
| 09/16/1998 | EP0864096A2 Process for producing signals identifying faulty loops in a polyphase electrical power supply network |
| 09/16/1998 | CN1193240A Detection-digital-signal processor in digital videl-disk reproducing device |
| 09/16/1998 | CN1193221A Bistable trigger-action circuit for scanning test |
| 09/16/1998 | CN1193184A Wafer comprising optoelectronic circuits and method of verifying this wafer |
| 09/16/1998 | CN1193114A On-line detection method for function of operational amplifier |
| 09/15/1998 | US5809449 Computing apparatus |
| 09/15/1998 | US5809310 Trace input device with remaining power informing function and method therefor |
| 09/15/1998 | US5809228 Method and apparatus for combining multiple writes to a memory resource utilizing a write buffer |
| 09/15/1998 | US5809040 Testable circuit configuration having a plurality of identical circuit blocks |
| 09/15/1998 | US5809039 Semiconductor integrated circuit device with diagnosis function |
| 09/15/1998 | US5809037 Integrated circuit testing |
| 09/15/1998 | US5809036 Boundary-scan testable system and method |
| 09/15/1998 | US5809034 Apparatus and method for operating electronic device testing equipment in accordance with a known overall timing accuracy parameter |
| 09/15/1998 | US5808947 Integrated circuit that supports and method for wafer-level testing |
| 09/15/1998 | US5808919 Diagnostic system |
| 09/15/1998 | US5808896 Method and system for creating a netlist allowing current measurement through a sub-circuit |
| 09/15/1998 | US5808877 Multichip package having exposed common pads |
| 09/15/1998 | US5808852 Chain mail ground for electromagnetic testing platform |
| 09/15/1998 | US5808735 Method for characterizing defects on semiconductor wafers |
| 09/15/1998 | US5808476 Built-in current sensor for IDDQ monitoring |
| 09/15/1998 | US5808473 Electric signal measurement apparatus using electro-optic sampling by one point contact |
| 09/15/1998 | US5808470 Ground fault detection for CATV devices |
| 09/15/1998 | US5808469 Battery monitor for electric vehicles |
| 09/15/1998 | US5808462 Apparatus for detecting the amplitude and phase of an a.c. signal |
| 09/15/1998 | US5808445 Method for monitoring remaining battery capacity |
| 09/15/1998 | US5808415 Apparatus for sensing RF current delivered to a plasma with two inductive loops |
| 09/15/1998 | US5808351 Programmable/reprogramable structure using fuses and antifuses |
| 09/15/1998 | US5808303 Infrared screening and inspection system |
| 09/15/1998 | US5808259 Thick film apparatus and method for customizing IC test PCB |
| 09/15/1998 | US5807763 Electric field test of integrated circuit component |