| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/13/1998 | US5821529 Measuring board having an optically driven switch and I/O terminal testing system using the same |
| 10/13/1998 | US5821505 Temperature control system for an electronic device which achieves a quick response by interposing a heater between the device and a heat sink |
| 10/13/1998 | US5821440 Cable tray assembly for testing device |
| 10/13/1998 | US5819868 Electric motor powered stand device for a vehicle |
| 10/13/1998 | US5819864 Battery low capacity alarm device for use in an electric vehicle |
| 10/13/1998 | US5819410 Method for manufacturing a pin and pipe assembly for a bare chip testing socket |
| 10/13/1998 | CA2119507C Method and apparatus for all code testing |
| 10/08/1998 | WO1998044563A1 Photoelectric conversion integrated circuit device |
| 10/08/1998 | WO1998044357A1 A method for application of weighted random patterns to partial scan designs |
| 10/08/1998 | WO1998044356A1 Method and device for detecting partial discharges |
| 10/08/1998 | WO1998044354A1 Flexible shielded laminate beam for electrical contacts |
| 10/08/1998 | WO1998015840A3 System for monitoring the condition of a plurality of lamps |
| 10/08/1998 | DE19815391A1 Diagnosis device for passenger protection system in car |
| 10/08/1998 | DE19814866A1 Test arrangement for electric testing of electrical systems |
| 10/08/1998 | DE19811850A1 IC testing method |
| 10/08/1998 | DE19713932A1 Testsystem und Testverfahren Test System and method |
| 10/08/1998 | DE19713748A1 Verfahren und Vorrichtung zur Prüfung von Differentialschutzrelais/-systemen Method and apparatus for testing differential protective relay / systems |
| 10/07/1998 | EP0869417A1 Control unit for vehicle |
| 10/07/1998 | EP0869371A2 Testing unit for connector testing |
| 10/07/1998 | EP0869370A1 Means for testing a gate oxide |
| 10/07/1998 | EP0869352A1 Method for detecting metallic contaminants in submicron silicon surface layers of a semiconductor wafer |
| 10/07/1998 | EP0868694A1 Method for setting the operating mode of an integrated circuit and an integrated circuit |
| 10/07/1998 | EP0868687A1 Timing signal generator |
| 10/07/1998 | EP0868667A1 High impedance test mode for jtag |
| 10/07/1998 | EP0797833B1 True hysteresis window comparator |
| 10/07/1998 | CN1195325A Controller for on-vehicle battery |
| 10/07/1998 | CN1195324A Controller for on-vehicle battery |
| 10/07/1998 | CN1195109A Testing unit for connector testing |
| 10/06/1998 | US5819208 Quantifying circuit performance |
| 10/06/1998 | US5819205 Signal delay computing method |
| 10/06/1998 | US5819204 Apparatus and method for power disturbance analysis and selective disturbance storage deletion based on quality factor |
| 10/06/1998 | US5819203 Apparatus and method for power disturbance analysis and storage |
| 10/06/1998 | US5819025 Method of testing interconnections between integrated circuits in a circuit |
| 10/06/1998 | US5818850 Speed coverage tool and method |
| 10/06/1998 | US5818849 IC testing apparatus |
| 10/06/1998 | US5818574 Method and apparatus for vehicle wheel alignment testing |
| 10/06/1998 | US5818384 Apparatus for and method of controlling and calibrating the phase of a coherent signal |
| 10/06/1998 | US5818333 Of a starter mechanism |
| 10/06/1998 | US5818286 Integrated circuit device capable of making a burn-in setting and test mode setting to run a burn-in and a test mode operation |
| 10/06/1998 | US5818268 Circuit for detecting leakage voltage of MOS capacitor |
| 10/06/1998 | US5818252 Reduced output test configuration for tape automated bonding |
| 10/06/1998 | US5818251 Apparatus and method for testing the connections between an integrated circuit and a printed circuit board |
| 10/06/1998 | US5818250 Apparatus and method for determining the speed of a semiconductor chip |
| 10/06/1998 | US5818249 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits |
| 10/06/1998 | US5818248 Loaded board test fixture with integral translator fixture for testing closely spaced test sites |
| 10/06/1998 | US5818247 Method and apparatus for testing internal circuit |
| 10/06/1998 | US5818246 Automatic multi-probe PWB tester |
| 10/06/1998 | US5818239 Simplified contactless test of MCM thin film I/O nets using a plasma |
| 10/06/1998 | US5818238 Apparatus for measuring current and other parameters of an electornic device in response to an applied voltage |
| 10/06/1998 | US5818237 Apparatus for envelope detection of low current arcs |
| 10/06/1998 | US5818236 Method and apparatus for checking insulation of ungrounded power source |
| 10/06/1998 | US5818235 Electrostatic discharge testing |
| 10/06/1998 | US5818234 Battery tester with power limit detection |
| 10/06/1998 | US5818219 Semiconductor test system having test head connection apparatus |
| 10/06/1998 | US5818061 Apparatus and method for obtaining three-dimensional data from objects in a contiguous array |
| 10/06/1998 | US5816059 Artificial input controller for HVAC system |
| 10/01/1998 | WO1998043361A2 Iddq testable programmable logic array and a method for testing such a circuit |
| 10/01/1998 | WO1998043359A1 Method and device for compressing and expanding data pattern |
| 10/01/1998 | WO1998029750A3 Method and apparatus for testing encapsulated circuits |
| 10/01/1998 | DE19812198A1 Semiconductor memory tester with fault analysis memory |
| 10/01/1998 | DE19811868A1 Delay circuit especially for testing semiconductor components |
| 10/01/1998 | DE19811567A1 Precision voltage generator for generating DC reference voltage |
| 10/01/1998 | DE19751544A1 Fault analyser for analysing origins of semiconductor faults |
| 10/01/1998 | DE19732113A1 Device to identify circuit board wiring errors |
| 10/01/1998 | DE19726538C1 Line fault testing method for 2-wire bus system e.g. for motor vehicle |
| 10/01/1998 | DE19713495A1 Method for testing integrated solid state circuits |
| 10/01/1998 | DE19712342A1 Method of operating a battery-powered load in a motor vehicle |
| 10/01/1998 | DE19708518A1 Method of locating defect position in conductor circuits |
| 09/30/1998 | EP0867999A1 A method and a device for detecting and handling short-circuit phenomena for power semiconductor devices |
| 09/30/1998 | EP0867887A2 Memory access time measurement circuit and method |
| 09/30/1998 | EP0867819A2 Method for designing integrated circuit device based on maximum load capacity |
| 09/30/1998 | EP0867727A2 Probeless testing of pad buffers on a wafer |
| 09/30/1998 | EP0867726A1 Measuring method for detecting of a short circuit between windings of a coil integrated on a chip, and integrated circuit adapted to such a measuring method |
| 09/30/1998 | EP0866980A1 Method for inspecting an integrated circuit |
| 09/30/1998 | EP0866979A2 Method for displaying a "low battery" state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a "low battery" state |
| 09/30/1998 | EP0866978A1 Method for testing digital circuits within synchronously sampled data detection channel |
| 09/30/1998 | EP0866977A1 Generic interface test adapter |
| 09/30/1998 | EP0764276B1 Electric vehicle propulsion system power bridge with built-in test |
| 09/30/1998 | CN2293077Y Selective earthing line device for power distribution network |
| 09/30/1998 | CN1194693A Microelectronic spring contact element |
| 09/30/1998 | CN1194379A Short circuit detector |
| 09/29/1998 | US5815687 Apparatus and method for simulating domino logic circuits using a special machine cycle to validate pre-charge |
| 09/29/1998 | US5815584 Automatic detection of shorted loudspeakers in automotive audio systems |
| 09/29/1998 | US5815513 Test pattern preparation system |
| 09/29/1998 | US5815512 Semiconductor memory testing device |
| 09/29/1998 | US5815511 Semiconductor integrated circuit equipped with test circuit |
| 09/29/1998 | US5815510 Serial programming of instruction codes in different numbers of clock cycles |
| 09/29/1998 | US5815425 Combined digital write and analog rewrite process for non-volatile memory |
| 09/29/1998 | US5815404 Method and apparatus for obtaining and using antifuse testing information to increase programmable device yield |
| 09/29/1998 | US5815357 Device for monitoring a polyphase system connected to a load |
| 09/29/1998 | US5815353 Overvoltage protector |
| 09/29/1998 | US5815105 Analog-to-digital converter with writable result register |
| 09/29/1998 | US5815002 Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs |
| 09/29/1998 | US5815001 Integrated circuit board with built-in terminal connection testing circuitry |
| 09/29/1998 | US5815000 Method for testing semiconductor dice with conventionally sized temporary packages |
| 09/29/1998 | US5814998 Device and method for locating partial discharges with detachable coupling units |
| 09/29/1998 | US5814995 Voltage detector for battery operated device |
| 09/29/1998 | US5814733 Method of characterizing dynamics of a workpiece handling system |
| 09/29/1998 | US5814158 Dipping probe tips in cleaning solution so only ends touch solution |
| 09/29/1998 | US5813881 Programmable cable and cable adapter using fuses and antifuses |