Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1998
10/22/1998WO1998047213A1 Method for determining the location of a partial discharge
10/22/1998WO1998047175A1 Process for manufacturing semiconductor device and semiconductor component
10/22/1998WO1998047012A1 Thermochromic game piece
10/22/1998WO1998047011A1 Semiconductor device tester
10/22/1998WO1998047010A1 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers
10/22/1998WO1998047009A2 Statistical pattern analysis methods of partial discharge measurments in high voltage insulation
10/22/1998WO1998046982A1 Device for inspecting test objects and the use thereof
10/22/1998WO1998037581A3 Power semiconductor devices with a temperature sensor circuit
10/22/1998WO1998029898A3 Scalable tester architecture with i-cached simd technology
10/22/1998WO1998026297A3 Method for testing semiconductor devices
10/22/1998WO1998025389A3 Emergency telephone with automatic low-battery signaling
10/22/1998DE19817152A1 Electromagnetic screening for cable bundles between electronic unit and peripheral system
10/22/1998DE19817123A1 Semiconductor tablet handling and storage device for IC testing device
10/22/1998DE19744818A1 Signal testing apparatus for large circuits - has cell chain operating in normal mode to supply analog- digital signal to digital circuit and digital-analog signal to analog circuit and in test mode analog circuit is decoupled from digital circuit
10/22/1998DE19716173A1 Process for testing the leakage current of a planar oxygen sensor
10/22/1998CA2285537A1 Thermochromic game piece
10/22/1998CA2230211A1 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
10/21/1998EP0872071A1 Clock signal distribution system
10/21/1998EP0872070A1 Signal distribution system
10/21/1998EP0871931A1 Signal deskewing system for synchronous logic circuit
10/21/1998EP0774125B1 Method of and apparatus for determining a response characteristic
10/21/1998EP0578386B1 Hierarchical connection method, apparatus and protocol
10/21/1998CN2295223Y Device for testing pressure of safety valve for sealed lead-acid accumulator
10/21/1998CN1196796A Battery capacity measuring device
10/21/1998CN1196795A Method for testing digital circuits within synchronously sampled data detection channel
10/20/1998US5826007 Memory data protection circuit
10/20/1998US5826004 Input/output device with self-test capability in an integrated circuit
10/20/1998US5825912 For scanning a sample with an electron beam
10/20/1998US5825787 System and method for accessing a test vector memory
10/20/1998US5825786 Undersampling digital testability circuit
10/20/1998US5825785 Serial input shift register built-in self test circuit for embedded circuits
10/20/1998US5825783 Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device
10/20/1998US5825712 Semiconductor integrated circuit
10/20/1998US5825700 Low voltage test mode operation enable scheme with hardware safeguard
10/20/1998US5825673 Device, method, and software products for extracting circuit-simulation parameters
10/20/1998US5825656 Apparatus and method for power disturbance analysis by display of power quality information
10/20/1998US5825598 Arcing fault detection system installed in a panelboard
10/20/1998US5825500 Unit for transferring to-be-inspected object to inspection position
10/20/1998US5825499 Method for checking wafers having a lacquer layer for faults
10/20/1998US5825196 Method for detecting defects in an active matrix liquid crystal display panel
10/20/1998US5825195 Method and apparatus for testing an unpackaged semiconductor die
10/20/1998US5825194 Method of testing an integrated circuit
10/20/1998US5825193 Semiconductor integrated circuit device
10/20/1998US5825192 For testing the electrical characteristics of an object
10/20/1998US5825191 IC fault location tracing apparatus and method
10/20/1998US5825190 Method and apparatus for measuring a transfer impedance of shielded devices and common mode currents in shieldings
10/20/1998US5825189 Method of locating the position of a fault on a power transmission
10/20/1998US5825174 Device for measuring the voltage of a voltage source
10/20/1998US5825171 Universal burn-in board
10/20/1998US5825156 System for monitoring charging/discharging cycles of a rechargeable battery, and host device including a smart battery
10/20/1998US5825155 Battery set structure and charge/ discharge control apparatus for lithium-ion battery
10/20/1998US5824883 Battery leakage sensing system
10/20/1998US5822847 IC mounting/demounting system and a mounting/demounting head therefor
10/15/1998WO1998046059A1 Temperature control system for an electronic device
10/15/1998WO1998045822A2 An electrical insulation testing device and method for electrosurgical instruments
10/15/1998WO1998045794A1 Method for designing complex, digital and integrated circuits and a circuit structure for carrying out said method
10/15/1998WO1998045722A1 Battery test system
10/15/1998WO1998045721A1 Method and device for testing differential protection relays or differential protection relay systems
10/15/1998WO1998045720A1 Test system and test method
10/15/1998WO1998045719A1 Method for testing and diagnosing mos transistors
10/15/1998WO1998045717A2 Remote home monitoring system
10/15/1998WO1998045674A2 Probe tile and platform for large area wafer probing
10/15/1998DE19814190A1 Phase-locked-loop synchronisation error measuring method
10/15/1998DE19711476A1 Verfahren und Vorrichtung zum Vermessen einer Einrichtung zur Herstellung von elektrischen Baugruppen Method and apparatus for measuring a device for producing electrical assemblies
10/15/1998CA2286663A1 Remote home monitoring system
10/14/1998EP0871179A1 Test method and circuit for semiconductor memory
10/14/1998EP0871037A1 Circuit arrangement for monitoring an electronic circuit
10/14/1998EP0871027A2 Inspection of print circuit board assembly
10/14/1998EP0870338A1 Thermochromic battery tester
10/14/1998EP0870272A1 Reader using moving averages to break the (n,k) code barrier for upc, ean, and others
10/14/1998EP0870218A2 Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products
10/14/1998EP0870201A1 Antenna adapter
10/14/1998EP0819275A4 Method and system for testing memory programming devices
10/14/1998EP0808462B1 Measuring system for enclosed high-voltage switchgear
10/14/1998CN2294478Y Capactive sensor for measuring liquid dielectric coefficient
10/14/1998CN1195964A Electronic device and detecting method thereof
10/14/1998CN1195777A Electric drive test apparatus
10/14/1998CN1195776A Semiconductor test system
10/14/1998CN1195775A Method and device for distinguishing transmission line fault direction
10/14/1998CN1195774A System for testing articles in assembling line of household electric appliance
10/14/1998CN1040252C Microcomputer debugging method with relay protection and device
10/13/1998US5822717 Method and apparatus for automated wafer level testing and reliability data analysis
10/13/1998US5822564 Checkpointing in an emulation system
10/13/1998US5822557 Pipelined data processing device having improved hardware control over an arithmetic operations unit
10/13/1998US5822335 Display of electronic self-test results using gauge dial pointers
10/13/1998US5822228 Method for using built in self test to characterize input-to-output delay time of embedded cores and other integrated circuits
10/13/1998US5822226 Hardware system verification environment tool
10/13/1998US5822218 Systems, methods and computer program products for prediction of defect-related failures in integrated circuits
10/13/1998US5821934 In a computer system
10/13/1998US5821870 Monitored security switch assembly
10/13/1998US5821786 Semiconductor integrated circuit having function for evaluating AC performance
10/13/1998US5821764 Interface apparatus for automatic test equipment
10/13/1998US5821763 For probing an electronic device
10/13/1998US5821762 Semiconductor device, production method therefor, method for testing semiconductor elements, test substrate for the method and method for producing the test substrate
10/13/1998US5821761 Apparatus detecting an IC defect by comparing electron emissions from two integrated circuits
10/13/1998US5821760 Method and apparatus for measuring near-end cross-talk in patch cords
10/13/1998US5821759 Method and apparatus for detecting shorts in a multi-layer electronic package
10/13/1998US5821758 Techniques for non-invasive RF circuit testing and RF signal flow redirection
10/13/1998US5821757 Noise reduction in an on-line battery impedance measurement system
10/13/1998US5821756 Electronic battery tester with tailored compensation for low state-of charge
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