Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1998
11/05/1998WO1998049572A1 Logic circuit device and method of testing the same
11/05/1998WO1998049571A1 Coherent switching power supply for an analog circuit tester
11/05/1998WO1998049570A1 Computer monitoring system
11/05/1998WO1998049569A1 Manipulator with expanded range of motion
11/05/1998WO1998049568A1 Multi-signal generator
11/05/1998WO1998049565A1 Integrated circuit tester with compensation for leakage current
11/05/1998WO1998049526A1 Cable tray assembly for testing device
11/05/1998WO1998032181A3 Signalling system
11/05/1998WO1998031046A3 Testing station for semiconductor wafers or wafer fragments
11/05/1998DE19718398A1 Handling mechanism for semiconductor wafer testing system
11/05/1998DE19717951A1 Contact test arrangement, e.g. for testing integrated circuits
11/05/1998DE19717136A1 Measuring ohmic armature resistances of coil windings of DC motor with commutator
11/04/1998EP0875977A2 Improved smart battery selector
11/04/1998EP0875953A2 Electrical accumulator
11/04/1998EP0875833A1 Module-configurable, full-chip power profiler
11/04/1998EP0875767A2 Device and procedure for testing naked circuit boards
11/04/1998EP0875766A2 Circuit device and method for inspecting the connection of a switch or push button
11/04/1998EP0874997A1 Computerized testing method and system
11/04/1998EP0632385B1 Semiconductor integrated circuit including test circuit
11/04/1998CN1198234A Enhanced security semiconductor, semiconductor circuit arrangement, and method of production thereof
11/03/1998US5832396 Hybrid vehicle including means for maintaining residual charge capacity based on destination information
11/03/1998US5831998 Processor implemented method for generating testcases to test a system
11/03/1998US5831997 Pattern generating apparatus
11/03/1998US5831996 Digital circuit test generator
11/03/1998US5831994 Semiconductor device testing fixture
11/03/1998US5831993 On a semiconductor device
11/03/1998US5831992 Methods and apparatus for fault diagnosis in self-testable systems
11/03/1998US5831991 Methods and apparatus for electrically verifying a functional unit contained within an integrated cirucuit
11/03/1998US5831990 Test-mode control for dynamic logic gates
11/03/1998US5831989 Memory testing apparatus
11/03/1998US5831868 Test ready compiler for design for test synthesis
11/03/1998US5831807 Overload and short circuit protection device for a power semiconductor circuit
11/03/1998US5831538 Electrical fire hazard detector
11/03/1998US5831463 MOS master-slave flip-flop with reduced number of pass gates
11/03/1998US5831445 Wafer scale burn-in apparatus and process
11/03/1998US5831444 Apparatus for performing a function on an integrated circuit
11/03/1998US5831438 Device for testing a connector having multiple terminals therein
11/03/1998US5831437 For generating digital and analog test patterns for a mixed circuit
11/03/1998US5831436 Intravehicular auto harness integrity tester
11/03/1998US5831435 Battery tester for JIS Standard
11/03/1998US5831425 Bus bar structure for electrical junction box
11/03/1998US5831412 System for executing charge control of a secondary battery and detecting the capacitance thereof
11/03/1998US5830596 Method for producing battery tester label and resulting label and battery assembly
11/03/1998US5830595 Battery capacity prediction method and apparatus using natural logarithm
11/03/1998US5830565 High planarity and low thermal coefficient of expansion base for semi-conductor reliability screening
11/03/1998US5829128 Method of mounting resilient contact structures to semiconductor devices
11/03/1998US5829126 Method of manufacturing probe card
10/1998
10/29/1998WO1998048290A1 Monitoring battery condition
10/29/1998WO1998048289A2 Method for making a digital circuit testable via scan test
10/29/1998WO1998048288A2 Procedure for supervising the operation of a contact circuit in an elevator
10/29/1998WO1998048268A1 Method for carrying out the electrical breakdown of a gaseous dielectric in a highly non-uniform field
10/29/1998WO1998047948A1 Multifunctional polymeric tissue coatings
10/29/1998WO1998035237A3 Arcing fault detection system
10/29/1998DE19750648A1 Inductance alteration detection system for determining inductance alteration in coils
10/29/1998DE19717596A1 Fault and error location device e.g. for electric power transmission system
10/29/1998DE19716963A1 Verfahren zur Ermittlung des Ortes einer Teilentladung Method for determining the location of a partial discharge
10/28/1998EP0874370A1 Sense amplifier control of a memory device
10/28/1998EP0874315A1 Method of design for testability, test sequence generation method and semiconductor integrated circuit
10/28/1998EP0874294A1 Electronic timepiece
10/28/1998EP0874246A2 Method and apparatus for contactless longitudinal and vertical homogeneity measurements of the critical current density jc in superconducting tape
10/28/1998EP0874243A2 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
10/28/1998EP0873908A2 Current detecting resistor and car-borne unit
10/28/1998EP0873522A1 Apparatus and method for electrical system measurement
10/28/1998CN2296015Y Multifunctional communication cable fault inspector
10/28/1998CN1197514A Microelectronic contact structure and method of making same
10/28/1998CN1197294A Semiconductor device and method for controlling the same
10/28/1998CN1197287A Circuit board for screening detection and mfg. method of known qualified tube core
10/28/1998CN1197213A Internally-arranged device for preventing integrated circuit errorly going into testing mode
10/28/1998CN1040474C Process for determing the backup time of a battery
10/28/1998CN1040473C Integrated electric leakage warning system
10/28/1998CN1040472C Ground detecting method for inverter device
10/27/1998US5829054 Devices and systems with parallel logic unit operable on data memory locations
10/27/1998US5828985 Semiconductor test system
10/27/1998US5828828 Method for inserting test points for full-and-partial-scan built-in self-testing
10/27/1998US5828827 Integrated circuit
10/27/1998US5828825 Method and apparatus for pseudo-direct access to embedded memories of a micro-controller integrated circuit via the IEEE test access port
10/27/1998US5828824 Method for debugging an integrated circuit using extended operating modes
10/27/1998US5828674 Semiconductor test system
10/27/1998US5828673 Logical check apparatus and method for semiconductor circuits and storage medium storing logical check program for semiconductor circuits
10/27/1998US5828579 Scan segment processing within hierarchical scan architecture for design for test applications
10/27/1998US5828578 Microprocessor with a large cache shared by redundant CPUs for increasing manufacturing yield
10/27/1998US5828577 Method of manufacturing circuit assemblies
10/27/1998US5828309 Power source miswiring detection apparatus
10/27/1998US5828298 Device and method for sensing when exterior vehicle lights are on
10/27/1998US5828243 Method for detecting clock failure and switching to backup clock
10/27/1998US5828229 Programmable logic array integrated circuits
10/27/1998US5828227 Abnormality detecting apparatus for electric equipment, particularly for a rotating electric machine
10/27/1998US5828225 Semiconductor wafer probing apparatus
10/27/1998US5828224 Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit
10/27/1998US5828223 Universal chip tester interface device
10/27/1998US5828222 Quick DC compressive strength test method and the related apparatus
10/27/1998US5828220 Method and system utilizing radio frequency for testing the electromagnetic shielding effectiveness of an electromagnetically shielded enclosure
10/27/1998US5828218 Method of estimating residual capacity of battery
10/27/1998US5828209 Voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device
10/27/1998US5828128 Semiconductor device having a bump which is inspected from outside and a circuit board used with such a semiconductor device
10/27/1998US5828081 Integrated semiconductor device
10/27/1998US5827967 Semiconductor accelerometer including strain gauges forming a wheatstone bridge and diffusion resistors
10/27/1998CA2122173C Alarm system
10/27/1998CA2032048C Diagnosis system for a digital control apparatus
10/22/1998WO1998047292A1 A method of and a system for processing digital information
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