Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1998
11/24/1998US5841284 Apparatus for monitoring power of battery to supply electric power to load
11/24/1998US5841271 Test mode power circuit for integrated-circuit chip
11/24/1998US5841265 Charge/discharge control circuit and chargeable electric power source apparatus
11/24/1998US5841255 Flux detector system
11/24/1998US5841164 Test structure for dielectric film evaluation
11/24/1998US5840592 Method of improving the spectral response and dark current characteristics of an image gathering detector
11/24/1998US5839914 Connector for detecting incomplete insertion of terminal
11/24/1998CA2137982C Lan cable identifier for testing local area network cables
11/24/1998CA2136403C Cable crosstalk measurement system
11/24/1998CA2122776C Electrochemical generator monitoring and managing system
11/24/1998CA2102880C System using induced current for contactless testing of wiring networks
11/24/1998CA2009597C Electronic circuit breaker using digital circuitry having instantaneous trip capability
11/24/1998CA2008898C Method for detecting partial discharge in an insulation of an electric power apparatus
11/19/1998WO1998052286A2 Swept frequency device test
11/19/1998WO1998052250A1 Socket for positioning an integrated circuit chip on a flexible connector sheet
11/19/1998WO1998052223A1 Method and apparatus for cooling a semiconductor die
11/19/1998WO1998052218A1 Connector and probing system
11/19/1998WO1998052061A1 Battery monitoring in metering systems
11/19/1998WO1998052060A1 Wrist strap test mode circuitry
11/19/1998WO1998052059A1 Circuit handling method and apparatus
11/19/1998WO1998052058A1 Measurement of microwave radiation
11/19/1998WO1998038812A3 Wireless secondary interface for data storage device
11/19/1998DE19729795A1 Automobile lighting equipment
11/19/1998CA2288860A1 Measurement of microwave radiation
11/19/1998CA2288799A1 Battery monitoring in metering systems
11/19/1998CA2237809A1 Computer system, apparatus and method for calculating demand usage
11/18/1998EP0878841A2 Method and apparatus for imaging semiconductor devices
11/18/1998EP0878769A2 Method for verification of combinational circuits using a filtering oriented approach
11/18/1998EP0878763A1 Means for virtual deskewing of high/intermediate/low DUT data
11/18/1998EP0878762A1 Method and apparatus for converting test signals
11/18/1998EP0878761A1 Method and apparatus for diagnosing failure occurrence position
11/18/1998EP0878043A1 Method of determining the position of a switching device
11/18/1998EP0878042A1 Metal-encased switchgear with partial discharge detection
11/18/1998EP0878041A1 Encased arrangement
11/18/1998EP0878040A1 Metal-encased switchgear
11/18/1998EP0877948A1 Method of detecting a fault in a monitored section of an electric transmission line using distance protection techniques
11/18/1998EP0877946A1 Method of detecting an abrupt variation in an electrical alternating quantity
11/18/1998CN1199467A Condition tester for battery
11/17/1998US5839093 System for locating faults and estimating fault resistance in distribution networks with tapped loads
11/17/1998US5839092 Arcing fault detection system using fluctuations in current peaks and waveforms
11/17/1998US5838894 Logical, fail-functional, dual central processor units formed from three processor units
11/17/1998US5838694 Dual source data distribution system for integrated circuit tester
11/17/1998US5838693 Partial scan logic
11/17/1998US5838628 In a two-dimensional array
11/17/1998US5838626 Non-volatile memory
11/17/1998US5838568 Device for generating digital signals for controlling a computer system
11/17/1998US5838171 Low power real-time clock circuit having system and battery power arbitration
11/17/1998US5838164 Method of measuring the threshold voltage of metal-oxide semiconductor field-effect transistors
11/17/1998US5838163 Testing and exercising individual, unsingulated dies on a wafer
11/17/1998US5838161 Semiconductor interconnect having test structures for evaluating electrical characteristics of the interconnect
11/17/1998US5838159 Chip carrier to allow electron beam probing and FIB modifications
11/17/1998US5838143 Automatic battery polarity identification circuit having electrode plates, capacitor and relays
11/17/1998US5838141 Method for generating a continuously variable reference signal for controlling battery cell charging
11/17/1998US5838139 Portable device battery technique
11/17/1998US5838122 Motor initialization method and apparatus
11/17/1998US5838023 Integrated circuit device
11/17/1998US5836504 From a transmission image applying radiating x-rays
11/17/1998US5836156 Driving device of sensors and actuators
11/12/1998WO1998050954A1 Stacked semiconductor devices, particularly memory chips
11/12/1998WO1998050953A1 Electronic component having resilient contact elements at areas remote from corresponding terminals
11/12/1998WO1998050784A1 Process and circuitry for inspecting welding points
11/12/1998WO1998029910A3 Apparatus for detecting cell reversal in rechargeable batteries
11/12/1998DE19820442A1 Memory testing method for customer final check
11/12/1998CA2289721A1 Process and circuitry for inspecting welding points
11/11/1998EP0877330A2 Circuit verification process for semiconductor devices
11/11/1998EP0877258A2 Prober and probe method
11/11/1998EP0876620A1 Method of detecting and locating a high-resistance earth fault in an electric power network
11/11/1998EP0876619A1 Machine for the electric test of printed circuits with adjustable position of the sound needles
11/11/1998EP0859686A4 Fabricating interconnects and tips using sacrificial substrates
11/11/1998EP0827608B1 Process for the computer-assisted measurement and testing of electric circuits, especially electronic modules, and testing station for implementing the process
11/11/1998CN1198849A Method for measuring fault currents in an inverter and inverter with controlled semiconductor switches
11/11/1998CN1198534A Picking up and putting on device of mechanic finger system for testing semiconductor device
11/11/1998CN1198533A Apparatus and method for testing non-componented printed circuit boards
11/10/1998US5835997 Wafer shielding chamber for probe station
11/10/1998US5835969 Address test pattern generator for burst transfer operation of a SDRAM
11/10/1998US5835927 Special test modes for a page buffer shared resource in a memory device
11/10/1998US5835891 Device modeling using non-parametric statistical determination of boundary data vectors
11/10/1998US5835551 Variable rate output pulse generator
11/10/1998US5835506 For carrying out a sequence of test activities at terminals
11/10/1998US5835503 Method for programming an integrated circuit device
11/10/1998US5835501 Built-in test scheme for a jitter tolerance test of a clock and data recovery unit
11/10/1998US5835428 Method of testing semiconductor memory and apparatus for carrying out the method
11/10/1998US5835327 ESD protection continuous monitoring device
11/10/1998US5834953 High speed current sense amplifier
11/10/1998US5834946 Integrated circuit test head
11/10/1998US5834944 Safety interlock system for a wafer prober testing device
11/10/1998US5834941 Mobile charge measurement using corona charge and ultraviolet light
11/10/1998US5834940 Arcing fault detector testing and demonstration system
11/10/1998US5834838 Pin array set-up device
11/10/1998US5834773 Method and apparatus for testing the function of microstructure elements
11/10/1998US5834364 Method of implementing of a reference sample for use in a device for characterizing implanted doses
11/10/1998US5833479 Surface mount test point enabling hands-free diagnostic testing of electronical circuits
11/10/1998US5833365 Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
11/10/1998US5832601 Method of making temporary connections between electronic components
11/10/1998CA2162653C Method and apparatus for automatically testing semiconductor diodes
11/10/1998CA2058728C Batteries with tester label
11/05/1998WO1998049576A1 Logic circuit and its test method
11/05/1998WO1998049575A1 Integrated circuit tester including at least one quasi-autonomous test instrument
11/05/1998WO1998049574A1 Single pass doublet mode intergrated circuit tester
11/05/1998WO1998049573A1 Virtual channel data distribution system for integrated circuit tester
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