| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/03/1998 | WO1998054649A1 Distributed logic analyzer for use in a hardware logic emulation system |
| 12/03/1998 | WO1998054589A1 Solar power supply apparatus |
| 12/03/1998 | WO1998054588A1 Battery-powered electrical device |
| 12/03/1998 | WO1998054587A1 Method and device for testing electronic equipment |
| 12/03/1998 | WO1998054586A1 Broadband impedance matching probe |
| 12/03/1998 | WO1998042171A3 Method and device for gauging a device for producing electrical components |
| 12/03/1998 | DE19824513A1 Charged=particle=beam tester |
| 12/03/1998 | DE19823729A1 Semiconductor wafer contact pin position determination method |
| 12/03/1998 | DE19807052A1 Testchipschaltung für die On-Chip-Zeitcharakterisierung Chip test circuit for the on-chip time characterization |
| 12/03/1998 | DE19722267A1 IC engine tester |
| 12/03/1998 | DE19722022A1 Semiconductor component production process |
| 12/03/1998 | DE19722017A1 Electrical circuit with earthed electrical component and control apparatus, e.g for vehicle ABS system |
| 12/03/1998 | DE19721453A1 Test device for checking conductors of n=core cables |
| 12/03/1998 | CA2291738A1 Emulation system with time-multiplexed interconnect |
| 12/03/1998 | CA2291257A1 Distributed logic analyzer for use in a hardware logic emulation system |
| 12/02/1998 | EP0881626A1 Noise measurement in data storage devices |
| 12/02/1998 | EP0881573A1 Semiconductor device with test circuit |
| 12/02/1998 | EP0881572A2 Permanent failure monitoring in complex systems |
| 12/02/1998 | EP0881502A2 Device for testing safety and functionality of electrical apparatus |
| 12/02/1998 | EP0881501A2 Functional testing device for an electronically controlled regulation system in a motor vehicle after a production process |
| 12/02/1998 | EP0880710A2 Battery management system and battery simulator |
| 12/02/1998 | EP0880709A1 Method and apparatus for diagnosing bearing insulation impedance of a rotating electrical apparatus |
| 12/02/1998 | EP0880708A1 I/o toggle test method using jtag |
| 12/02/1998 | EP0880706A1 Arrangement for the testing of semiconductor structures |
| 12/02/1998 | EP0702227B1 Terminated cable portion inspection device for stripped terminal crimping machine |
| 12/02/1998 | EP0577810B1 Battery charge monitor and fuel gauge |
| 12/02/1998 | EP0561765B1 Novel method of making, testing and test device for integrated circuits |
| 12/02/1998 | CA2206738A1 Fault modeling and simulation for mixed-signal circuits and systems |
| 12/01/1998 | US5845234 System and method for efficiently generating testing program code for use in automatic test equipment |
| 12/01/1998 | US5845231 Apparatus and method for power disturbance analysis and dynamic adaptation of impulse memory storage size |
| 12/01/1998 | US5845142 Portable terminal to control communication based on residual battery capacity |
| 12/01/1998 | US5844921 Method and apparatus for testing a hybrid circuit having macro and non-macro circuitry |
| 12/01/1998 | US5844917 In a computer system |
| 12/01/1998 | US5844916 Built in access time comparator |
| 12/01/1998 | US5844914 Test circuit and method for refresh and descrambling in an integrated memory circuit |
| 12/01/1998 | US5844913 Current mode interface circuitry for an IC test device |
| 12/01/1998 | US5844909 Test pattern selection method for testing of integrated circuit |
| 12/01/1998 | US5844884 Battery monitoring |
| 12/01/1998 | US5844853 Memory regulator control method with flexibility for a wide change in supply voltage |
| 12/01/1998 | US5844850 Apparatus for analyzing a failure in a semiconductor wafer and method thereof |
| 12/01/1998 | US5844803 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 12/01/1998 | US5844429 Of a semiconductor device |
| 12/01/1998 | US5844419 Method for testing semiconductor packages using decoupling capacitors to reduce noise |
| 12/01/1998 | US5844418 Carrier having interchangeable substrate used for testing of semiconductor dies |
| 12/01/1998 | US5844416 For analyzing a semiconductor integrated circuit |
| 12/01/1998 | US5844414 Method and a system for moving a measuring means above a test object |
| 12/01/1998 | US5844412 Board test apparatus and method for fast capacitance measurement |
| 12/01/1998 | US5844411 Diagnostic detection for hall effect digital gear tooth sensors and related method |
| 12/01/1998 | US5844331 Process for monitoring the wear of at least one contact in a switching device and switching device designed thereof |
| 12/01/1998 | US5844317 Consolidated chip design for wire bond and flip-chip package technologies |
| 12/01/1998 | US5844249 Apparatus for detecting defects of wires on a wiring board wherein optical sensor includes a film of polymer non-linear optical material |
| 12/01/1998 | US5844208 Temperature control system for an electronic device in which device temperature is estimated from heater temperature and heat sink temperature |
| 12/01/1998 | US5844199 Conductor pattern check apparatus for locating and repairing short and open circuits |
| 12/01/1998 | US5843844 Probe sheet and method of manufacturing the same |
| 12/01/1998 | US5842579 Electrical circuit component handler |
| 12/01/1998 | CA2090936C Visual inspection support system for printed-circuit board |
| 11/26/1998 | WO1998053382A2 Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
| 11/26/1998 | WO1998053335A2 Condition monitoring system for batteries |
| 11/26/1998 | WO1998053334A1 Partial discharge detector of gas-insulated apparatus |
| 11/26/1998 | WO1998053330A2 Test head structure for integrated circuit tester |
| 11/26/1998 | DE19758077A1 Unit for controlling testing of integrated circuits using multiple testers |
| 11/26/1998 | DE19721366A1 Circuit for testing serial circuit comprising switch and load |
| 11/25/1998 | EP0880172A2 Semiconductor integrated circuit |
| 11/25/1998 | EP0880097A1 Test pattern chaining and looping in ATE circuit tester |
| 11/25/1998 | EP0879484A1 Electrochemical cell label with integrated tester |
| 11/25/1998 | EP0879421A2 Process and device for determining a cable run in a cable carrier system of a technical installation and detector used therein |
| 11/25/1998 | EP0843822A4 A bidirectional load and source cycler |
| 11/25/1998 | EP0829015B1 Monitoring process for a capacitor lead-through and a monitoring system therefor |
| 11/25/1998 | EP0812427B1 Unipolar earth leakage recognition process for three phase mains |
| 11/25/1998 | EP0784799B1 Bus for sensitive analog signals |
| 11/25/1998 | CN2298526Y Rotary automatic formation testing apparatus |
| 11/25/1998 | CN2298525Y Multichannel electrical equipment winding multiple faults testing instrument |
| 11/25/1998 | CN1200177A Method of locating a single-phase ground fault in a power distribution network |
| 11/25/1998 | CN1199931A Control system and method for semiconductor integrated circuit test process |
| 11/25/1998 | CN1040912C Electric arc and radio frequency spectrum detection |
| 11/24/1998 | US5842155 Method and apparatus for adjusting pin driver charging and discharging current |
| 11/24/1998 | US5842061 Apparatus using battery |
| 11/24/1998 | US5842001 Clock signal adjusting method and apparatus |
| 11/24/1998 | US5841968 Processor circuit with testing device |
| 11/24/1998 | US5841967 Method and apparatus for design verification using emulation and simulation |
| 11/24/1998 | US5841965 System and method for automatically determining test point for DC parametric test |
| 11/24/1998 | US5841960 Method of and apparartus for automatically generating test program |
| 11/24/1998 | US5841867 On-chip programming verification system for PLDs |
| 11/24/1998 | US5841792 Processing system having a testing mechanism |
| 11/24/1998 | US5841791 Bypass scan path and integrated circuit device using the same |
| 11/24/1998 | US5841790 Apparatus for testing an adapter card ASIC with reconfigurable logic |
| 11/24/1998 | US5841789 Apparatus for testing signal timing and programming delay |
| 11/24/1998 | US5841788 Methods for backplane interconnect testing |
| 11/24/1998 | US5841787 Loadboard |
| 11/24/1998 | US5841785 Memory testing apparatus for testing a memory having a plurality of memory cell arrays arranged therein |
| 11/24/1998 | US5841714 Supervoltage circuit |
| 11/24/1998 | US5841713 For semiconductor wafers |
| 11/24/1998 | US5841670 Emulation devices, systems and methods with distributed control of clock domains |
| 11/24/1998 | US5841358 Motor current status sensor |
| 11/24/1998 | US5841322 Phase detector using carrier suppression and oscillator using the phase detector |
| 11/24/1998 | US5841307 Delay device and delay time measurement device using a ring oscillator |
| 11/24/1998 | US5841294 Method for measuring leakage current in junction region of semiconductor device |
| 11/24/1998 | US5841293 Method and apparatus for screening integrated circuit chips for latch-up sensitivity |
| 11/24/1998 | US5841287 Mechanism for detecting electronic signals |
| 11/24/1998 | US5841285 Temperature-compensated thermochromic battery tester |