Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1998
12/23/1998CN1202631A Liquid-crystal display panel and method of inspecting liquid-crystal display panel
12/23/1998CN1202625A High precision program-controlled charging and discharging detector
12/23/1998CA2294144A1 Battery testing and classification
12/22/1998US5852796 Computerized testing method and system for wire harnesses
12/22/1998US5852619 Pattern generator circuit for semiconductor test system
12/22/1998US5852618 Multiple bit test pattern generator
12/22/1998US5852617 Jtag testing of buses using plug-in cards with Jtag logic mounted thereon
12/22/1998US5852616 On-chip operating condition recorder
12/22/1998US5852364 System and method for testing integrated circuits connected together
12/22/1998US5852351 Machine monitor
12/22/1998US5851925 Staining technique for semiconductor device for sem exposure
12/22/1998US5851143 Disk drive test chamber
12/17/1998WO1998057415A1 A device for supervising a high voltage converter station
12/17/1998WO1998057406A1 A device for supervising in a high voltage converter station
12/17/1998WO1998057283A1 Concurrent hardware-software co-simulation
12/17/1998WO1998057187A1 Low cost, easy to use automatic test system software
12/17/1998DE19742448C1 Diagnostic module for electric automation circuits for overall system diagnosis
12/17/1998DE19723456A1 Fault detection device for electrical load
12/17/1998CA2293678A1 Concurrent hardware-software co-simulation
12/16/1998EP0884689A1 Apparatus for defining properties in finite-state machines
12/16/1998EP0884680A1 ROM testing circuit
12/16/1998EP0884674A2 Arithmetic and logic unit with accumulator and parallel register
12/16/1998EP0884673A2 Method and system for determining Min/Max values
12/16/1998EP0884600A2 Device and method for monitoring the state of charge of a battery
12/16/1998EP0884599A1 Programming mode selection with jtag circuits
12/16/1998EP0884598A1 Integrated circuit with serial test interface and logic for loading a functional register using said interface
12/16/1998EP0884597A2 Method and apparatus for testing frequency dependent electrical circuits
12/16/1998EP0884596A2 Circuit board misalignment detection apparatus and method
12/16/1998EP0883915A1 Method for producing a connection of data transmission lines, and plug connector
12/16/1998EP0883816A1 Method of and circuit for testing an electrical actuator drive stage
12/16/1998EP0848826A4 Condition tester for a battery
12/16/1998EP0817973B1 Interface apparatus for automatic test equipment
12/16/1998CN2300919Y Electric quantity indicator for accumulator
12/16/1998CN1201908A Circuit verification process for semiconductor devices
12/16/1998CN1041253C Probe-type test handler, IC test method using the same and IC components
12/15/1998US5850513 Processor path emulation system providing fast readout and verification of main memory by maintenance controller interface to maintenance subsystem
12/15/1998US5850404 Fault block detecting system using abnormal current
12/15/1998US5850402 Test pattern generator
12/15/1998US5850355 System for characterization of multiple-input circuits
12/15/1998US5850209 Computer system having remotely operated interactive display
12/15/1998US5850150 Final stage clock buffer in a clock distribution network
12/15/1998US5850147 Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
12/15/1998US5850146 Probe apparatus for electrical inspection of printed circuit board assembly
12/15/1998US5850145 Apparatus and method for soft error comparison testing
12/15/1998US5850088 Teg for carrier lifetime evaluation
12/15/1998US5849046 Electrochromic thin film state-of-charge detector for on-the-cell application
12/15/1998US5848705 Method and apparatus for automatic loading and unloading of printed circuit boards on machines for electrical testing
12/15/1998CA2137191C Instrument and method for testing local area network cables
12/10/1998WO1998056059A1 Method for detecting capacity of battery, battery package, and electronic equipment system
12/10/1998WO1998055927A1 Boundary scanning element and communication equipment using the same
12/10/1998WO1998055926A1 Boundary scan element and communication device made by using the same
12/10/1998WO1998055925A1 Communication equipment
12/10/1998WO1998055880A1 Method for parallel analog and digital circuit fault simulation and test set specification
12/10/1998WO1998055879A1 Method and apparatus for test generation during circuit design
12/10/1998WO1998055878A1 Diagnostic device for monitoring a sub-system in a motor vehicle
12/10/1998WO1998055826A2 Measuring surface flatness using shadow moire technology and phase-stepping image processing
12/10/1998DE19825275A1 Test station for investigating semiconducting test element
12/10/1998DE19825274A1 Test station for semiconducting component testing
12/10/1998DE19823931A1 Test pattern generator circuit for integrated circuits and components
12/10/1998DE19823503A1 Method for performing semiconductor component test system
12/10/1998DE19723831A1 Diagnose-Vorrichtung zum Überprüfen eines Teilsystems eines Kraftfahrzeuges Diagnostic apparatus for inspecting a subsystem of a motor vehicle
12/10/1998DE19723217A1 Testing method for charge redistribution type D=A and A=D converters
12/10/1998DE19723080A1 Test method for semiconducting component for crystal defect detection
12/10/1998CA2485309A1 Boundary scan element and communication device made by using the same
12/10/1998CA2269914A1 Method for parallel analog and digital circuit fault simulation and test set specification
12/09/1998EP0882994A1 Method and device for the characterization of a network
12/09/1998EP0882993A2 Apparatus for acquiring waveform data from a metallic transmission cable
12/09/1998EP0882992A2 Fault location
12/09/1998EP0882991A1 Decompression circuit
12/09/1998EP0882239A1 Assembly and method for testing integrated circuit devices
12/09/1998EP0882238A1 Fault meter
12/09/1998EP0799424B1 Method and apparatus for semiconductor die testing
12/09/1998EP0556826B1 Microprocessor with self-diagnostic test function
12/09/1998CN1201562A System for equalizing level of charge in batteries
12/09/1998CN1201149A Semiconductor integrated circuit device having exact self-diagnosis function
12/09/1998CN1041149C Known good die array and mfg. method thereof
12/08/1998US5848380 Method and system for estimation of cell discharge stop voltage
12/08/1998US5848236 Object-oriented development framework for distributed hardware simulation
12/08/1998US5848235 Boundary scan test method and apparatus
12/08/1998US5848122 Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers
12/08/1998US5848075 Test device employing scan path having circuitry at switches between a scan in signal transmitted and previously held at a predetermined clock timing
12/08/1998US5848074 Method and device for testing content addressable memory circuit and content addressable memory circuit with redundancy function
12/08/1998US5848016 Merged Memory and Logic (MML) integrated circuits and methods including serial data path comparing
12/08/1998US5848008 Floating bitline test mode with digitally controllable bitline equalizers
12/08/1998US5848005 Programmable logic array integrated circuits
12/08/1998US5847913 Trip indicators for circuit protection devices
12/08/1998US5847595 Semiconductor device having controllable internal potential generating circuit
12/08/1998US5847590 Delay device and delay time measurement device using a ring oscillator
12/08/1998US5847574 Method and apparatus for testing encapsulated circuits
12/08/1998US5847573 Method and apparatus for structure characterization of layered semiconductors
12/08/1998US5847566 Battery capacity calculation method
12/08/1998US5847561 Method of operating an integrated circuit
12/08/1998US5847557 Wire pair identification method
12/08/1998US5847546 System and apparatus for generating a continuosly variable reference signal for controlling battery cell charging
12/08/1998US5847542 Circuit for preventing overdischarge of rechargeable battery pack consisting of a plurality of rechargeable batteries
12/08/1998US5847366 For cooling the surface of a heat generating device
12/08/1998US5847293 Test handler for DUT's
12/08/1998US5847274 On/off and modulated/duty-cycled solenoid tester
12/08/1998US5846848 Polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures with improved sensitivity
12/03/1998WO1998054664A1 Emulation system with time-multiplexed interconnect
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