| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/13/1999 | EP0890110A1 Process for testing the ground contact of parts of a networked system |
| 01/13/1999 | EP0890109A1 Process for testing and ensuring the availability of a networked system |
| 01/13/1999 | CN2304131Y Comprehensive detecting instrument for loaded tap-switch characteristics of electric transformer |
| 01/13/1999 | CN1205083A Device and method for estimating remaining life of battery |
| 01/13/1999 | CN1041677C Fault detecting circuit for voltage-type self-excitation power converter |
| 01/12/1999 | US5859860 Low overhead input and output boundary scan cells |
| 01/12/1999 | US5859657 Led printhead and driver chip for use therewith having boundary scan test architecture |
| 01/12/1999 | US5859590 Fault sensor device |
| 01/12/1999 | US5859540 Constant temperature chamber in a handler for semiconductor device testing apparatus |
| 01/12/1999 | US5859539 For testing multiple semiconductor devices |
| 01/12/1999 | US5859538 Method and apparatus for connecting a ball grid array device to a test instrument to facilitate the monitoring of individual signals or the interruption of individual signals or both |
| 01/12/1999 | US5859521 Variable speed controller for an AC motor |
| 01/12/1999 | US5859442 For an operations circuit |
| 01/12/1999 | US5859409 Oven for testing peripheral storage devices |
| 01/12/1999 | US5858570 Communication apparatus, electronic apparatus, and battery management method |
| 01/12/1999 | US5857258 Electrical test structure and method for measuring the relative locations of conductive features on an insulating substrate |
| 01/07/1999 | WO1999000882A1 Method and device for managing an electronic component with complementary mos transistors functioning under radiation |
| 01/07/1999 | WO1999000721A1 Packed battery tester |
| 01/07/1999 | WO1999000667A1 Instrument performance verification system |
| 01/07/1999 | WO1999000004A2 Apparatus for monitoring temperature of a power source |
| 01/07/1999 | WO1998045717A3 Remote home monitoring system |
| 01/07/1999 | EP0889687A2 Misinsert sensing in pick and place tooling |
| 01/07/1999 | EP0889593A1 Programmable logic module for field programmable gate array device |
| 01/07/1999 | EP0889411A2 On-chip PLL phase and jitter self-test circuit |
| 01/07/1999 | EP0889306A1 Device for projecting a defined light beam onto a photosensitive area |
| 01/07/1999 | DE19730516A1 Leiterplattenprüfvorrichtung A circuit board |
| 01/07/1999 | DE19723130A1 Leakage current display arrangement for electrical conductors in house |
| 01/06/1999 | CN2303306Y Instrument for testing comprehensive parameters of transistor |
| 01/06/1999 | CN2303305Y Portable electric faults locating arrangement for automobile, motor cycle |
| 01/06/1999 | CN1204127A Test method of high speed memory devices in which limit conditions for clock signals are defined |
| 01/06/1999 | CN1204125A Test method for high speed memory devices by using clock modulation technique |
| 01/06/1999 | CN1204059A Measuring apparatus and method for measuring characteristic of solar cell |
| 01/06/1999 | CN1204058A Test method of integrated circuit devices by using dual edge clock technique |
| 01/06/1999 | CN1204057A System and method for automatically creating and transmitting test conditions of integrated circuit devices |
| 01/06/1999 | CN1204056A Method for detecting operational errors of tester for semiconductor devices |
| 01/06/1999 | CN1203884A Apparatus for removing and storing semiconductor device trays |
| 01/05/1999 | US5856985 For generating expected value data to carry out logical comparison |
| 01/05/1999 | US5856737 Fast battery charging system and method |
| 01/05/1999 | CA2150171C Method and portable testing apparatus for safely testing an autotransformer for power distribution lines |
| 01/05/1999 | CA2117166C Multicell battery monitoring system with single sensor wire |
| 12/30/1998 | WO1998059294A1 Jitter reduction module |
| 12/30/1998 | WO1998059250A2 Electrical tester for small motor vehicles |
| 12/30/1998 | WO1998045674A3 Probe tile and platform for large area wafer probing |
| 12/30/1998 | EP0887883A2 Press-fit terminal |
| 12/30/1998 | EP0887733A2 Model-based diagnostic system with automated procedures for next test selection |
| 12/30/1998 | EP0887654A2 Method for detecting working condition of non-aqueous electrolyte secondary batteries |
| 12/30/1998 | EP0887653A1 Functional test method and circuit containing means for implementing said method |
| 12/30/1998 | EP0887652A2 Measuring apparatus and method for measuring characteristic of solar cell |
| 12/30/1998 | EP0887651A2 Procedure and circuit arrangement for localising a short circuit or an open circuit in a bus system |
| 12/30/1998 | EP0887650A1 Robust electrical utility meter |
| 12/30/1998 | EP0887649A2 Procedure and circuit arrangement for testing for line faults in a two wire bus system |
| 12/30/1998 | EP0887623A1 Sensor arrangement |
| 12/30/1998 | EP0886894A2 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 12/30/1998 | EP0886785A1 Method for monitoring of tap changers by acoustic analysis |
| 12/30/1998 | EP0886784A1 Integrated circuit comprising a first and a second clock domain and a method for testing such a circuit |
| 12/30/1998 | EP0886783A1 Fault current recognition circuitry |
| 12/30/1998 | EP0886782A1 Apparatus for measuring parameters of an electronic device |
| 12/30/1998 | EP0636976B1 Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions |
| 12/30/1998 | CN2302525Y Passenger's train insulation testing instrument |
| 12/30/1998 | CN1203667A Programmable interface controller |
| 12/30/1998 | CN1203666A Process for producing signals identifying faulty loops in polyphase electrical power supply network |
| 12/30/1998 | CN1203368A Method for detecting working condition of non-aqueous electrolyte secondary batterles |
| 12/30/1998 | CN1203367A IC testing apparatus |
| 12/29/1998 | US5855011 Method for classifying test subjects in knowledge and functionality states |
| 12/29/1998 | US5854804 Method and apparatus for synchronizing a mode locked laser with a device under test |
| 12/29/1998 | US5854801 Pattern generation apparatus and method for SDRAM |
| 12/29/1998 | US5854798 Multirate generator and multirate generating method |
| 12/29/1998 | US5854797 Tester with fast refire recovery time |
| 12/29/1998 | US5854796 Method of and apparatus for testing semiconductor memory |
| 12/29/1998 | US5854590 For an electric power supply network |
| 12/29/1998 | US5854559 Method and apparatus for testing microwave devices and circuits in a controlled environment |
| 12/29/1998 | US5854558 Test board for testing a semiconductor device and method of testing the semiconductor device |
| 12/29/1998 | US5854556 Measurement system for partial discharges on dielectrics in coaxial cables |
| 12/29/1998 | US5854555 Method and apparatus for detecting an abnormal current in automotive wiring harnesses |
| 12/29/1998 | US5853908 Protective device for secondary batteries |
| 12/29/1998 | US5852871 Method of making raised contacts on electronic components |
| 12/29/1998 | CA2153490C Current surge indicator |
| 12/29/1998 | CA2024243C Circuit status indicator having liquid crystal display |
| 12/29/1998 | CA2024205C Fault indicator |
| 12/24/1998 | DE19826314A1 Semiconductor component test device |
| 12/24/1998 | DE19826028A1 Detecting abnormalities in cables used for automobile equipment |
| 12/24/1998 | DE19726394A1 Method for detecting insulation weak points and faults in coils and coil systems |
| 12/24/1998 | DE19724358A1 Test method for detecting dry joints |
| 12/23/1998 | WO1998058317A1 Communication system |
| 12/23/1998 | WO1998058271A1 Back-up battery management apparatus for charging and testing individual battery cells in a string of battery cells |
| 12/23/1998 | WO1998058270A1 Battery testing and classification |
| 12/23/1998 | WO1998058269A1 Method and device for monitoring a cable |
| 12/23/1998 | WO1998058266A1 Probe card |
| 12/23/1998 | WO1998043361A3 Iddq testable programmable logic array and a method for testing such a circuit |
| 12/23/1998 | EP0886280A1 Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof |
| 12/23/1998 | EP0886214A1 Multi-channel architecture with channel independent clock signals |
| 12/23/1998 | EP0885397A1 Probe for fault actuation devices |
| 12/23/1998 | EP0885380A1 Real time/off line applications testing system |
| 12/23/1998 | EP0826152A4 Method and apparatus for testing semiconductor dice |
| 12/23/1998 | CN2301736Y Multipurpose electrometric device |
| 12/23/1998 | CN2301735Y Flash alarm control unit for signal lamp controller |
| 12/23/1998 | CN2301734Y Electric appliance control system fault detector |
| 12/23/1998 | CN1202979A Method and device for monitoring consumption of contact elements in a switching device |
| 12/23/1998 | CN1202967A Process and device for testing electric devices |
| 12/23/1998 | CN1202730A Chip scale carrier |