| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 01/28/1999 | WO1999004273A1 Probe station with multiple adjustable probe supports |
| 01/28/1999 | DE19806874A1 Electronic circuit simulator |
| 01/28/1999 | DE19731043A1 Complex digitial integrated circuit design method |
| 01/28/1999 | DE19725679A1 Detecting electrical inhomogeneities of semiconductors |
| 01/28/1999 | DE19725611A1 Überwachungsverfahren und Überwachungsgerät für ein Kabel Monitoring method and monitoring device for a cable |
| 01/27/1999 | EP0893869A2 Circuit for causing a voltage step in a multi-cell battery |
| 01/27/1999 | EP0893698A1 Programmable simulator |
| 01/27/1999 | EP0893697A2 Dispositif de test diagnostique pour des unités de commande électronique dans différents types de véhicules automobiles |
| 01/27/1999 | EP0893223A1 Plant for obtaining sheets with optical effects |
| 01/27/1999 | EP0893002A1 Method and device for determining short-circuit power in an electric power network |
| 01/27/1999 | CN2305784Y Socket with automatically displaying electrical leakage |
| 01/27/1999 | CN2305680Y Photo electric recordor for transmission line inspection tour |
| 01/27/1999 | CN2305679Y Detection and classifying device for disc type electronic element |
| 01/27/1999 | CN2305678Y Descriminator for fault cable |
| 01/27/1999 | CN2305677Y Insulation monitor for electric net to earth |
| 01/27/1999 | CN2305676Y Multifunctional maintenance instrument |
| 01/27/1999 | CN1206511A Conductive contactor |
| 01/27/1999 | CN1206467A 集成电路设备测试器 IC device tester |
| 01/27/1999 | CN1206466A Antenna adapter |
| 01/27/1999 | CN1206316A Device and method for monitoring battery in mobile communication terminal |
| 01/27/1999 | CN1206260A Self-checking circuit in microwave equipment |
| 01/27/1999 | CN1206115A IC testing method and apparatus |
| 01/27/1999 | CN1206113A Apparatus for controlling quality of resistance spot weld and method therefor |
| 01/27/1999 | CN1206111A Power supply circuit for electricity meter |
| 01/26/1999 | USRE36063 Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal |
| 01/26/1999 | US5864783 Apparatus for testing snow removal equipment |
| 01/26/1999 | US5864707 Superscalar microprocessor configured to predict return addresses from a return stack storage |
| 01/26/1999 | US5864602 Qualifying telephone line for digital transmission service |
| 01/26/1999 | US5864566 In a semiconductor device |
| 01/26/1999 | US5864565 Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
| 01/26/1999 | US5864564 Control circuit for deterministic stopping of an integrated circuit internal clock |
| 01/26/1999 | US5864510 Semiconductor memory device having a bit compressed test mode and a check mode selecting section |
| 01/26/1999 | US5864394 For detecting anomalies on a surface |
| 01/26/1999 | US5864237 Battery condition detection method |
| 01/26/1999 | US5864176 Electro-mechnical subassembly having a greatly reduced thermal resistance between two mating faces by including a film of liquid, that evaporates without leaving any residue, between the faces |
| 01/26/1999 | CA2159036C Method for identifying untestable & redundant faults in sequential logic circuits |
| 01/26/1999 | CA2156655C Method and apparatus for testing a digital rf system |
| 01/26/1999 | CA2002263C Microcomputer controlled resistance fault locator circuit |
| 01/25/1999 | CA2243803A1 A circuit for causing a voltage step in a multi-cell battery |
| 01/21/1999 | WO1999003217A2 Apparatus and method for restoring fiber optic communications network connections |
| 01/21/1999 | WO1999003130A1 Heat-transfer enhancing features for semiconductor carriers and devices |
| 01/21/1999 | WO1999002999A1 Spreading resistance profiling system |
| 01/21/1999 | WO1998048289A3 Method for making a digital circuit testable via scan test |
| 01/21/1999 | WO1998047009A3 Statistical pattern analysis methods of partial discharge measurments in high voltage insulation |
| 01/21/1999 | WO1998045822A3 An electrical insulation testing device and method for electrosurgical instruments |
| 01/21/1999 | DE19831573A1 Testing arrangement for integrated circuits |
| 01/21/1999 | DE19831381A1 Electrical drive |
| 01/21/1999 | DE19829840A1 Battery charging method with detection of fully charged state |
| 01/21/1999 | DE19728596A1 Potentiometer monitoring method |
| 01/21/1999 | CA2265781A1 Apparatus and method for restoring fiber optic communications network connections |
| 01/20/1999 | EP0892439A1 Integrated photosensor comprising a test circuit |
| 01/20/1999 | EP0892344A2 Data processing device with context switching capability |
| 01/20/1999 | EP0892275A2 Method and apparatus for testing semiconductor and integrated circuit structures |
| 01/20/1999 | EP0892274A2 A system and method for easily inspecting a bonded state of a BGA/CSP type electronic part to a board |
| 01/20/1999 | EP0892273A1 Supply circuit for an electricity meter |
| 01/20/1999 | EP0891623A1 Circuit arrangement with a test circuit |
| 01/20/1999 | EP0891559A1 Apparatus and method for providing a programmable delay |
| 01/20/1999 | EP0891558A1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 01/20/1999 | EP0891272A1 Control device for a windshield wiper motor |
| 01/20/1999 | CN2304916Y Multifunctional secondary testing instrument |
| 01/20/1999 | CN1205774A Machine for electric test of printed circuits with adjustable position of sound needles |
| 01/20/1999 | CN1205524A Semiconductor memory testing apparatus |
| 01/20/1999 | CN1205522A Semiconductor device having contact check circuit |
| 01/19/1999 | US5862515 Battery tester |
| 01/19/1999 | US5862455 Fading simulator |
| 01/19/1999 | US5862152 Hierarchically managed boundary-scan testable module and method |
| 01/19/1999 | US5862149 Method of partitioning logic designs for automatic test pattern generation based on logical registers |
| 01/19/1999 | US5862147 Semiconductor device on semiconductor wafer having simple wirings for test and capable of being tested in a short time |
| 01/19/1999 | US5862146 Process of testing memory parts and equipment for conducting the testing |
| 01/19/1999 | US5862088 Apparatus and method for testing a memory |
| 01/19/1999 | US5862040 For a personal computer during post-assembly testing |
| 01/19/1999 | US5861909 Apparatus for automated optical inspection objects |
| 01/19/1999 | US5861898 Apparatus for detecting battery voltage |
| 01/19/1999 | US5861882 Integrated test and measurement means employing a graphical user interface |
| 01/19/1999 | US5861774 Apparatus and method for automated testing of a progammable analog gain stage |
| 01/19/1999 | US5861743 Hybrid scanner for use in an improved MDA tester |
| 01/19/1999 | US5861731 Device and method for detecting and displaying charge capacity of a battery |
| 01/19/1999 | US5861730 Battery charging apparatus |
| 01/19/1999 | US5861728 Method for measuring motor parameters of induction motor and control apparatus |
| 01/19/1999 | US5861660 Integrated-circuit die suitable for wafer-level testing and method for forming the same |
| 01/19/1999 | CA2164620C Method of predicting voltages in telephone line measurement |
| 01/19/1999 | CA2094014C Arc detection system |
| 01/19/1999 | CA2048469C High speed timing generator |
| 01/17/1999 | CA2242799A1 Power supply circuit for an electricity meter |
| 01/15/1999 | CA2242512A1 Integrated photosensor |
| 01/14/1999 | WO1999001918A2 Device and system for management of battery back up power source |
| 01/14/1999 | WO1999001877A1 Overvoltage protector for high or medium voltage |
| 01/14/1999 | WO1999001871A1 Memory characterisation means and method |
| 01/14/1999 | WO1999001776A1 Tester for semiconductor devices and test tray used for the same |
| 01/14/1999 | WO1999001775A1 Carrier and system for testing bumped semiconductor components |
| 01/14/1999 | WO1999001774A1 Diagnostic device for detecting errors in an induction sensor |
| 01/14/1999 | WO1999001772A1 Printed circuit board testing device |
| 01/14/1999 | WO1999001724A1 Device for projecting a defined light beam onto a photosensitive area |
| 01/14/1999 | WO1998041879A3 Measurement system including antenna |
| 01/14/1999 | CA2288711A1 Device for projecting a defined light beam onto a photosensitive area |
| 01/13/1999 | EP0890956A2 Semiconductor device having a security circuit for preventing illegal access |
| 01/13/1999 | EP0890846A2 The monitoring of earth leakage faults |
| 01/13/1999 | EP0890843A2 Test socket assembly |
| 01/13/1999 | EP0890242A1 Process for determining potential shifts between electronic modules in a wire bus network |
| 01/13/1999 | EP0890112A1 Testing electrical installations |