| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/16/1999 | US5872796 Method for interfacing boundary-scan circuitry with linearized impedance control type output drivers |
| 02/16/1999 | US5872795 Method and apparatus for scan testing of multi-phase logic |
| 02/16/1999 | US5872793 Fast bist architecture with flexible standard interface |
| 02/16/1999 | US5872724 Simulation apparatus and simulation method for semiconductor integrated circuit |
| 02/16/1999 | US5872610 Liquid-crystal display panel and method for inspecting the same |
| 02/16/1999 | US5872565 Motherboard |
| 02/16/1999 | US5872460 Automotive supplemental inflatable restraint system |
| 02/16/1999 | US5872458 Method for electrically contacting semiconductor devices in trays and test contactor useful therefor |
| 02/16/1999 | US5872457 Method and apparatus for separating and analyzing composite AC/DC waveforms |
| 02/16/1999 | US5872456 Apparatus for directly measuring component values within an RF circuit |
| 02/16/1999 | US5872455 In a static electrical discharge dissipation system |
| 02/16/1999 | US5872453 Battery remaining capacity measuring apparatus |
| 02/16/1999 | US5872449 Circuit die for use in an environmental test chamber and with a tester |
| 02/16/1999 | US5872448 Integrated circuit architecture having an array of test cells providing full controlability for automatic circuit verification |
| 02/16/1999 | US5872360 Method and apparatus using an infrared laser based optical probe for measuring electric fields directly from active regions in an integrated circuit |
| 02/16/1999 | US5871858 Anti-theft battery |
| 02/16/1999 | CA2152831C Time-domain reflectometer for testing coaxial cables |
| 02/11/1999 | WO1999007129A1 Fault location in the access network |
| 02/11/1999 | WO1999006847A1 Device for measuring partial discharges in gas-insulated high voltage facilities |
| 02/11/1999 | WO1999006844A2 Magnetic current sensing and short circuit detection in plate structure |
| 02/11/1999 | WO1999006245A2 System and method for testing a circuit device for controlling an automobile passenger protection mechanism |
| 02/11/1999 | WO1998048288A3 Procedure for supervising the operation of a contact circuit in an elevator |
| 02/11/1999 | DE19808349A1 Sensor for physical parameters, e.g. speed, acceleration or pressure |
| 02/11/1999 | DE19801557A1 Semiconductor device with contact test circuit |
| 02/11/1999 | DE19740518C1 Bus system signal fault detection method |
| 02/10/1999 | EP0896227A2 Harness control system for civil electric plants, in particular for intercom or video intercom systems |
| 02/10/1999 | EP0895633A1 Method of manufacturing a liquid crystal display module |
| 02/10/1999 | EP0895607A1 Anti-vibration stabilizer for a portable emission microscope |
| 02/10/1999 | EP0895598A1 Apparatus for performing logic and leakage current tests on a digital logic circuit |
| 02/10/1999 | EP0640920B1 Boundary-scan-based system and method for test and diagnosis |
| 02/10/1999 | CN2307300Y Controller for 37E electric locomotive |
| 02/10/1999 | CN1207595A Inspection unit of connector inspection apparatus |
| 02/10/1999 | CN1207500A Method and system for detecting failure in distribution network |
| 02/09/1999 | US5870411 Method and system for testing self-timed circuitry |
| 02/09/1999 | US5870410 Diagnostic interface system for programmable logic system development |
| 02/09/1999 | US5870409 Method and apparatus for testing a relatively slow speed component of an intergrated circuit having mixed slow speed and high speed components |
| 02/09/1999 | US5870408 Method and apparatus for on die testing |
| 02/09/1999 | US5870043 Pla dac circuit employing a test function |
| 02/09/1999 | US5870025 Power-supply apparatus and its mounting-completion indication method |
| 02/09/1999 | US5869980 Programming programmable transistor devices using state machines |
| 02/09/1999 | US5869977 Defect insertion testability mode for IDDQ testing methods |
| 02/09/1999 | US5869976 Fine alignment IC handler and method for assembling same |
| 02/09/1999 | US5869975 System for evaluating probing networks that have multiple probing ends |
| 02/09/1999 | US5869974 Micromachined probe card having compliant contact members for testing semiconductor wafers |
| 02/09/1999 | US5869961 Smart IC-test receptacle having holes adapted for mounting capacitors arranged adjacent to pin positions |
| 02/09/1999 | US5869958 Method of and apparatus for determining a response characteristic |
| 02/09/1999 | US5869952 Battery charge indicator having improved resolution |
| 02/09/1999 | US5869951 Battery management system for electric vehicle |
| 02/09/1999 | US5869950 Method for equalizing the voltage of traction battery modules of a hybrid electric vehicle |
| 02/04/1999 | WO1999005766A1 Fault-tolerant battery system employing intra-battery network architecture |
| 02/04/1999 | WO1999005745A1 Battery tester having printed electronic components |
| 02/04/1999 | WO1999005564A1 Liquid crystal display and battery label including a liquid crystal display |
| 02/04/1999 | WO1999005539A1 Thermochromic battery testers |
| 02/04/1999 | WO1999005538A1 Instantaneous capacity indication of a secondary element |
| 02/04/1999 | WO1999005537A2 In-situ fault detection apparatus and method for an encased energy storing device |
| 02/04/1999 | WO1999005536A1 Electrical circuit interrupter device locator |
| 02/04/1999 | WO1999005535A1 Instrument for measuring and sorting resistors and method therefor |
| 02/04/1999 | WO1999005532A1 Measurement system |
| 02/04/1999 | DE3727723C2 Verfahren zur Prüfung eines Trägers mit mehreren integrierten Digitalschaltungen, geeignete integrierte Schaltung zum Anbringen auf einem auf diese Weise zu prüfenden Träger und Träger mit mehreren derartigen integrierten Schaltungen A method for testing a substrate with several integrated digital circuits, integrated circuit suitable for mounting on a support in this manner to be tested and support having a plurality of such integrated circuits |
| 02/04/1999 | DE19832960A1 DRAM semiconductor memory with burn-in function |
| 02/04/1999 | DE19746574C1 Method of functional monitoring of step switches |
| 02/04/1999 | DE19728961A1 Überspannungsableiter für Hoch- oder Mittelspannung Surge arresters for high or medium voltage |
| 02/04/1999 | DE19727986A1 Circuit for determining residual operating life of electrical switching equipment |
| 02/04/1999 | CA2297964A1 In-situ fault detection apparatus and method for an encased energy storing device |
| 02/04/1999 | CA2297327A1 Measurement system |
| 02/04/1999 | CA2296722A1 Battery tester having printed electronic components |
| 02/04/1999 | CA2295695A1 Liquid crystal display and battery label including a liquid crystal display |
| 02/04/1999 | CA2294234A1 Thermochromic battery testers |
| 02/03/1999 | EP0895330A1 Test method and apparatus for testing a protective relay system |
| 02/03/1999 | EP0895245A2 Synchronous semiconductor memory device |
| 02/03/1999 | EP0895091A2 Method and circuit for monitoring the integrity of conductors in an arrangement of circuits connected in a matrix |
| 02/03/1999 | EP0894271A1 Device for inserting at least one semiconductor component into a receptacle |
| 02/03/1999 | EP0846371A4 Cmos buffer circuit having power-down feature |
| 02/03/1999 | EP0760104B1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device |
| 02/03/1999 | EP0702868B1 Fading simulator |
| 02/03/1999 | EP0674265B1 Method and apparatus to generate tests for electronic boards |
| 02/03/1999 | CN2306605Y Excess current limiting wire-selecting apparatus for ground point of electric network |
| 02/03/1999 | CN1207176A Method of detecting and locating a high-resistance earth fault in an electric power network |
| 02/02/1999 | US5867809 Electric appliance, printed circuit board, remained life estimation method, and system thereof |
| 02/02/1999 | US5867507 Testable programmable gate array and associated LSSD/deterministic test methodology |
| 02/02/1999 | US5867505 Method and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuit |
| 02/02/1999 | US5867501 Encoding for communicating data and commands |
| 02/02/1999 | US5867399 System and method for creating and validating structural description of electronic system from higher-level and behavior-oriented description |
| 02/02/1999 | US5867050 Timing generator circuit |
| 02/02/1999 | US5867036 Domino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuits |
| 02/02/1999 | US5867034 Non-destructive method and apparatus for monitoring carrier lifetime of a semiconductor sample during fabrication |
| 02/02/1999 | US5867033 Circuit for testing the operation of a semiconductor device |
| 02/02/1999 | US5867032 Process for testing a semiconductor device |
| 02/02/1999 | US5867030 Transmission path structure for measuring propagation delay time thereof |
| 02/02/1999 | US5867029 Method of nondestructive insulation test and a nondestructive insulation testing apparatus |
| 02/02/1999 | US5867006 Battery charger |
| 02/02/1999 | US5866956 Apparatus for and method of monitoring and controlling a power system |
| 02/02/1999 | US5865639 Burn-in test socket apparatus |
| 02/02/1999 | US5865319 Automatic test handler system for IC tester |
| 02/02/1999 | US5864946 Method of making contact tip structures |
| 02/02/1999 | CA2168676C Failure detection system for detecting a failure in a power converter |
| 02/02/1999 | CA2139068C Abnormality detecting method and apparatus for electric equipment, particularly for a rotating electric machine |
| 02/02/1999 | CA2135680C Method and apparatus for controlling the testing of a plurality of systems via a boundary-scan port during testing |
| 01/28/1999 | WO1999004327A2 Synchronous memory test system |
| 01/28/1999 | WO1999004277A1 Zero voltage wrist strap monitor |