| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/04/1999 | WO1999010754A1 Programmable formatter circuit for integrated circuit tester |
| 03/04/1999 | WO1999010753A1 Method for the location of a high-resistance earth fault in a power distribution system on the basis of current measurements |
| 03/04/1999 | WO1999010752A1 Load circuit for integrated circuit tester |
| 03/04/1999 | WO1999010749A1 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
| 03/04/1999 | DE19738302A1 Method for optimizing solar module output |
| 03/04/1999 | DE19737693A1 Verfahren zur Überprüfung der Unverfälschtheit einer elektrischen Schaltung Procedures to verify the authenticity of an electrical circuit |
| 03/04/1999 | DE19736481A1 Motor winding testing device e.g. for testing windings of motor vehicle commutator type servo-motor |
| 03/04/1999 | DE19732677A1 Anordnung und Verfahren zum Testen einer Schaltungsvorrichtung, die zum Steuern eines Insassenschutzmittels eines Kraftfahrzeugs vorgesehen ist Arrangement and method for testing a circuit apparatus provided for controlling an occupant protection means of a motor vehicle |
| 03/04/1999 | CA2301604A1 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
| 03/03/1999 | EP0899864A1 Induction motor controller |
| 03/03/1999 | EP0899740A2 Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal |
| 03/03/1999 | EP0899554A1 Method for observing a reaction process by transmission electron microscopy |
| 03/03/1999 | EP0898715A1 Fast vector loading for automatic test equipment |
| 03/03/1999 | EP0898714A1 Bus system and method of diagnosing subscribers interconnected via said bus-system |
| 03/03/1999 | EP0898712A2 Wafer-level burn-in and test |
| 03/03/1999 | EP0724790B1 Apparatus comprising transient voltage suppression means |
| 03/03/1999 | EP0654738B1 Diagnostic system |
| 03/03/1999 | CN2309574Y Portable intelligent stray current measuring apparatus |
| 03/03/1999 | CN1209911A Metal-encased switchgear with partial discharge detector |
| 03/03/1999 | CN1209631A Semiconductor storage device having circuit making electric characteristics changed |
| 03/02/1999 | USRE36123 Circuit for the generation of a scanning clock in an operational analysis device of the serial type for an integrated circuit |
| 03/02/1999 | US5878383 Quantifying circuit performance |
| 03/02/1999 | US5878055 Method and apparatus for verifying a single phase clocking system including testing for latch early mode |
| 03/02/1999 | US5878054 Method and apparatus for test data generation |
| 03/02/1999 | US5878051 Assembly-level bist using field-programmable gate array |
| 03/02/1999 | US5877961 Electronic support work station and method of operation |
| 03/02/1999 | US5877891 Scanning probe microscope having a single viewing device for on-axis and oblique optical views |
| 03/02/1999 | US5877648 Integrated circuit having a control circuit for controlling connection of monitor points to electrode pads |
| 03/02/1999 | US5877631 Evaluation of the quality of wiring formed in a test semiconductor device |
| 03/02/1999 | US5877630 System and method for protecting an electronic device from electromagnetic radiation interference |
| 03/02/1999 | US5877628 Warning device for detecting RTC electrical cell |
| 03/02/1999 | US5877622 Connector examination device for determining a connection in a connector |
| 03/02/1999 | US5877563 Fuse device for a cable in motor vehicles |
| 03/02/1999 | US5877419 Method for estimating the service life of a power semiconductor component |
| 03/02/1999 | US5876870 Battery residual amount display circuit |
| 03/02/1999 | US5875768 Method and arrangement for determining the sensitivity of a hydrocarbon sensor for an internal combustion engine |
| 03/02/1999 | CA2152694C Method for identifying untestable faults in logic circuits |
| 03/02/1999 | CA2113752C Inspection system for cross-sectional imaging |
| 02/25/1999 | WO1999009792A1 Automated auditing system |
| 02/25/1999 | WO1999009637A1 Machine monitor |
| 02/25/1999 | WO1999009623A1 Circuit board arrangement |
| 02/25/1999 | WO1999009558A1 Method for monitoring the operating condition of an integrated circuit |
| 02/25/1999 | WO1999009426A1 Method and system for monitoring the condition of a battery pack in a defibrillator |
| 02/25/1999 | WO1999009425A1 Integrated circuit tester having multiple period generators |
| 02/25/1999 | WO1999009424A1 Electric arc monitoring systems |
| 02/25/1999 | WO1999009423A1 Static actuator tester and method |
| 02/25/1999 | WO1999009422A1 Electric arc monitoring systems |
| 02/25/1999 | WO1999009420A1 Battery storage state indicator |
| 02/25/1999 | WO1998053335A3 Condition monitoring system for batteries |
| 02/25/1999 | DE19808338A1 Semiconductor memory with circuit for testing (AB) normal safety blow-out |
| 02/25/1999 | DE19735282C1 Functional testing method for antenna conductor on glass sheet |
| 02/25/1999 | DE19724892A1 Testing method for digital circuit |
| 02/25/1999 | CA2300162A1 Circuit board arrangement |
| 02/24/1999 | EP0898284A2 Semiconductor memory having a test circuit |
| 02/24/1999 | EP0898283A2 Semiconductor component and method of testing and operating the semiconductor component |
| 02/24/1999 | EP0898282A2 Semiconductor integrated circuit and method for designing the same |
| 02/24/1999 | EP0898173A1 A device for detecting faults in a electric line of a vehicle, in particular a commercial vehicle |
| 02/24/1999 | EP0898172A1 Testing printed circuit assemblies |
| 02/24/1999 | CN2308904Y 3.3KV high voltage insulation detector |
| 02/24/1999 | CN2308903Y Universal purpose test pencil |
| 02/24/1999 | CN1209221A Electrochemical cell label with integrated tester |
| 02/24/1999 | CN1208936A Semi-conductor assembly and method for testing and operating semi-conductor assembly |
| 02/24/1999 | CN1208859A Method and arrangement for testing dry cell constant-resistance discharge properties |
| 02/24/1999 | CN1208858A Semiconductor device test system with operation loss reduced |
| 02/24/1999 | CN1042262C Instrument supporting for detecting motor having stator and rotator and method for detection therefor |
| 02/23/1999 | US5875353 Circuit with switch controller that signals switch control input to close switch upon completing request acknowledgment of connection request from data transfer port |
| 02/23/1999 | US5875213 GMSK communication device test system |
| 02/23/1999 | US5875198 Semiconductor device testing apparatus |
| 02/23/1999 | US5875197 Addressable serial test system |
| 02/23/1999 | US5875196 Deriving signal constraints to accelerate sequential test generation |
| 02/23/1999 | US5875153 Internal/external clock option for built-in self test |
| 02/23/1999 | US5875087 Circuit breaker with integrated control features |
| 02/23/1999 | US5874835 High impedance detecting circuit and interface circuit |
| 02/23/1999 | US5874827 Voltage supply circuit for a load absorbing high tentative peak current |
| 02/23/1999 | US5874529 Conformationally constrained backbone cyclized peptide analogs |
| 02/18/1999 | WO1999008360A1 Memorizing the first operating time of a stand-by battery and/or indicating the end of a stand-by battery lifetime |
| 02/18/1999 | WO1999008212A1 System and method for automated design verification |
| 02/18/1999 | WO1999008125A1 Low cost cmos tester with high channel density |
| 02/18/1999 | WO1999008124A1 Tester with fast refire recovery time |
| 02/18/1999 | WO1999008123A1 Timing generator |
| 02/18/1999 | WO1999008116A2 A memory test system with a means for test sequence optimisation and a method of its operation |
| 02/18/1999 | WO1998052286A3 Swept frequency device test |
| 02/18/1999 | DE19735022A1 Determining active power of asynchronous electric motor |
| 02/18/1999 | DE19734552A1 Vorrichtung zur Messung von Teilentladungen in gasisolierten Hochspannungsanlagen Device for measuring partial discharges in gas-insulated high voltage facilities |
| 02/18/1999 | DE19733352A1 Circuit for measuring equivalent derived currents, especially for test appliance connectable to earth |
| 02/18/1999 | DE19733113A1 Testing electronic assembly with integrated circuit connections soldered with PCB conductor paths |
| 02/17/1999 | EP0897117A1 Apparatus for the detection of insulation faults in a hybrid electric vehicle |
| 02/17/1999 | EP0896673A1 Methods and systems for increased numbers of test points on printed circuit boards |
| 02/17/1999 | CN2308095Y Intelligence safety property tester |
| 02/17/1999 | CN1208469A Method for displaying a 'low battery' state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a 'low battery' state |
| 02/17/1999 | CN1208368A Fabricating interconnects and tips using sacrificial substrates |
| 02/17/1999 | CN1208265A Pressing-in contact element |
| 02/17/1999 | CN1208258A Horizontal transfer test handler |
| 02/17/1999 | CN1208235A Semiconductor integrated circuit device capable of externally monitoring internal voltage |
| 02/17/1999 | CN1042178C Method and apparatus for testing a static RAM |
| 02/17/1999 | CN1042173C Transformer winding damage testing system and hot-line examination |
| 02/16/1999 | US5872952 Integrated circuit power net analysis through simulation |
| 02/16/1999 | US5872908 IC with isolated analog signal path for testing |
| 02/16/1999 | US5872862 Electron beam tester |
| 02/16/1999 | US5872797 Burn-in signal pattern generator |