Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/1999
03/23/1999US5886530 Test contact connection checking method and circuit
03/23/1999US5886527 Method and device for monitoring deterioration of battery
03/23/1999US5886515 Power semiconductor devices with a temperature sensor circuit
03/23/1999US5886510 Circuit for diagnosing the state of an electrical load
03/23/1999US5886503 Back-up battery management apparatus for charging and testing individual battery cells in a string of battery cells
03/23/1999US5886488 Swing support apparatus
03/23/1999US5886429 Voltage sag/swell testing station
03/23/1999US5886363 Semiconductor device and pattern including varying transistor patterns for evaluating characteristics
03/23/1999US5886344 Corona detector with narrow-band optical filter
03/23/1999US5885846 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
03/23/1999US5884398 Mounting spring elements on semiconductor devices
03/23/1999CA2053552C Method and apparatus for determining phase correlation of a stereophonic signal
03/18/1999WO1999013475A1 Low cost, highly parallel memory tester
03/18/1999WO1999013349A1 Method and device for charging integrated circuits and structures with a pulsed heavy current
03/18/1999WO1999013348A1 Method and device for determining a capacitor ageing condition
03/18/1999WO1999013345A1 Sensor device
03/18/1999WO1998055826A3 Measuring surface flatness using shadow moire technology and phase-stepping image processing
03/18/1999WO1998053330A3 Test head structure for integrated circuit tester
03/18/1999DE19819253A1 Test circuit board for semiconductor device
03/18/1999DE19813197A1 DC test circuit for LSI circuit arrangement
03/17/1999EP0902521A2 Battery rental system
03/17/1999EP0902520A2 Electric vehicle
03/17/1999EP0902298A2 Testing method and testing apparatus of electronic circuit
03/17/1999EP0902297A2 Adapter devices for testing printed circuit boards
03/17/1999EP0902296A1 Adapter devices for testing printed circuit boards
03/17/1999EP0902295A2 Procedure for determining the load capacity of an AC network
03/17/1999EP0902230A2 Circuit arrangement for automatic adjustment of safe operating condition
03/17/1999EP0901695A1 Connectors for microelectronic elements
03/17/1999EP0901637A1 Method for testing electronic components
03/17/1999EP0882991B1 Decompression circuit
03/17/1999EP0666537B1 Digital processing circuit with test registers
03/17/1999EP0662661B1 Circuit device to prepare analog signals for a boundary scan test procedure
03/17/1999CN2311004Y Circuit board test connection device
03/17/1999CN1211351A Encased arrangement
03/17/1999CN1211323A I/O toggle test method using JTAG
03/17/1999CN1211322A Jig for inspecting male terminal of connector
03/17/1999CN1211069A Apparatus and method for inspecting leads of IC
03/17/1999CN1211044A 半导体装置 Semiconductor device
03/17/1999CN1211043A Semiconductor memory device having selection circuit
03/17/1999CN1211007A Apparatus checking method and apparatus to which same is applied
03/17/1999CN1210983A Quick screening classifying and short circuit repairing device for battery
03/16/1999US5884236 Calibration method of IC tester
03/16/1999US5884202 Modular wireless diagnostic test and information system
03/16/1999US5884065 Logic circuit apparatus and method for sequentially performing one of a fault-free simulation and a fault simulation through various levels of a logic circuit
03/16/1999US5883906 Pattern data compression and decompression for semiconductor test system
03/16/1999US5883905 Pattern generator with extended register programming
03/16/1999US5883844 Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof
03/16/1999US5883843 Built-in self-test arrangement for integrated circuit memory devices
03/16/1999US5883811 Method for electric leaf cell circuit placement and timing determination
03/16/1999US5883809 Behavioral language models for testing and verification of digital electronic circuits
03/16/1999US5883524 Low overhead memory designs for IC terminals
03/16/1999US5883523 Coherent switching power for an analog circuit tester
03/16/1999US5883521 Glitch noise producing semiconductor device for testing semiconductor components
03/16/1999US5883517 Device for locating defects in underwater telecommunication links
03/16/1999US5883498 Battery-powered electrical device
03/16/1999US5883497 Battery fuel gauge
03/16/1999US5883493 Battery pack having memory
03/16/1999US5883492 Battery pack having memory
03/16/1999US5883489 High speed deep well pump for residential use
03/16/1999US5883293 Conformationally constrained backbone cyclized peptide analogs
03/16/1999US5883008 Integrated circuit die suitable for wafer-level testing and method for forming the same
03/16/1999US5882719 Solid tantalum capacitor test
03/16/1999CA2109261C Filled copper monitoring system
03/11/1999WO1999012121A1 Method of checking the authenticity of an electric circuit arrangement
03/11/1999WO1999012048A1 Fault detection apparatus and method of detecting faults in an electrical distribution network
03/11/1999WO1999012045A2 Apparatus for measuring minority carrier lifetimes in semiconductor materials
03/11/1999WO1999012044A2 Battery charge indicator
03/11/1999WO1998040693A3 Time interval measurement system incorporating a linear ramp generation circuit
03/11/1999DE19819252A1 Semiconductor memory device
03/11/1999DE19813740A1 Semiconductor memory device
03/11/1999DE19805658A1 Verfahren zur Erkennung von Fehlschaltungen eines ersten Relais Method for detecting faulty operation of a first relay
03/11/1999DE19738408A1 X-ray fluorescence dispersive radiation analysis for semiconductor wafers
03/11/1999DE19735163A1 Integrated electronic component with hardware fault input for testing
03/11/1999CA2302213A1 Fault detection apparatus and method of detecting faults in an electrical distribution network
03/10/1999EP0901204A2 Inspection unit of a connector inspection apparatus
03/10/1999EP0901088A2 Framework for rules checking
03/10/1999EP0900695A2 Lamp burnout detecting unit with branch connection function
03/10/1999CN1210628A Metal-encased switchgear
03/10/1999CN1210388A Method for fabricating rotor and apparatus for testing coil of such rotor used therein
03/10/1999CN1210269A Method and apparatus for inspecting network communication products with multiple I/O ports
03/10/1999CN1210268A Method for insulation inspecting and ground protecting for windings of D. C. motor armature
03/10/1999CN1042456C Ignitor of IC engine
03/09/1999US5881068 Decode register with scan functionality
03/09/1999US5881067 Flip-flop design and technique for scan chain diagnosis
03/09/1999US5881052 Line signal analyzing method for use in an electronic switching system
03/09/1999US5880993 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells particularly flash cells
03/09/1999US5880971 Methodology for deriving executable low-level structural descriptions and valid physical implementations of circuits and systems from semantic specifications and descriptions thereof
03/09/1999US5880936 PC card test and configuration connector
03/09/1999US5880772 Machine vision image data acquisition system
03/09/1999US5880595 IC having memoried terminals and zero-delay boundary scan
03/09/1999US5880592 Modular design for an IC testing burn-in oven
03/09/1999US5880590 Apparatus and method for burn-in and testing of devices with solder bumps or preforms
03/09/1999US5880589 Method and apparatus for making diagnosis of electrolytic capacitor in operation
03/09/1999US5880575 Charge-discharge control circuit, over-charge prevention circuit, and over-discharge prevention circuit
03/09/1999US5880540 Switching apparatus with current limiting circuit
03/09/1999US5878486 Method of burning-in semiconductor devices
03/09/1999US5878485 Method for fabricating a carrier for testing unpackaged semiconductor dice
03/09/1999CA2246388A1 Method for determining the load capacity of an ac network
03/04/1999WO1999010854A1 Battery capacity monitoring system
03/04/1999WO1999010780A1 Method for detecting malfunctions of a first relay
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