| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/07/1999 | CN1213455A Memory test set |
| 04/07/1999 | CN1213143A Semiconductor device with plural power supply circuits, plural internal circuit, and single external terminal |
| 04/06/1999 | USH1793 Thermal transient test system |
| 04/06/1999 | US5892949 ATE test programming architecture |
| 04/06/1999 | US5892947 Test support tool system and method |
| 04/06/1999 | US5892779 Scan test apparatus |
| 04/06/1999 | US5892778 Boundary-scan circuit for use with linearized impedance control type output drivers |
| 04/06/1999 | US5892776 Semiconductor memory and test method incorporating selectable clock signal modes |
| 04/06/1999 | US5892686 Wafer prober system |
| 04/06/1999 | US5892539 Portable emission microscope workstation for failure analysis |
| 04/06/1999 | US5892450 Circuit arrangement for testing the operation of a current monitoring circuit for a power transistor |
| 04/06/1999 | US5892430 Self-powered powerline sensor |
| 04/06/1999 | US5892408 Method and system for calibrating a crystal oscillator |
| 04/06/1999 | US5892368 Semiconductor integrated circuit device having failure detection circuitry |
| 04/06/1999 | US5892367 Thermal box for a semiconductor test system |
| 04/06/1999 | US5892366 Adjustable tooling pin for a card test fixture |
| 04/06/1999 | US5892357 Electro-optic voltage sensor for sensing voltage in an E-field |
| 04/06/1999 | US5892342 Self-test circuit for a shorted diode protection panel in a diesel electric locomotive |
| 04/06/1999 | US5892225 Method of preparing a plan-view sample of an integrated circuit for transmission electron microscopy, and methods of observing the sample |
| 04/06/1999 | US5891746 Semiconductor wafer testing method and apparatus |
| 04/06/1999 | US5890390 Method and apparatus for mounting, inspecting and adjusting probe card needles |
| 04/06/1999 | CA2120928C Improved unitized test system with bi-directional transport feature |
| 04/01/1999 | WO1999016159A1 Ground safety device for medical ultrasound probes |
| 04/01/1999 | WO1999016158A2 Time-domain circuit modeller |
| 04/01/1999 | WO1999015910A1 Device for testing circuit boards |
| 04/01/1999 | WO1999015909A1 Method for building a testing infrastructure for a system on a semiconductor chip |
| 04/01/1999 | WO1999000004A3 Apparatus for monitoring temperature of a power source |
| 04/01/1999 | WO1998059250A3 Electrical tester for small motor vehicles |
| 04/01/1999 | DE19739903A1 Sensorvorrichtung Sensor device |
| 03/31/1999 | EP0905776A1 Semiconductor device comprising two ground contact pads connected to a ground connection lead and testing procedure for the device |
| 03/31/1999 | EP0905502A2 A probe apparatus and a method for polishing a probe |
| 03/31/1999 | EP0905491A2 Device for the analysis of wavelength dispersion of fluorescent rays |
| 03/31/1999 | EP0904636A1 Power device with a short-circuit detector |
| 03/31/1999 | EP0904549A1 Method and device for testing differential protection relays or differential protection relay systems |
| 03/31/1999 | EP0904548A1 Test system and test method |
| 03/31/1999 | EP0904547A1 Digital logic simulation/emulation system |
| 03/31/1999 | EP0904546A2 Measurement system including antenna |
| 03/31/1999 | EP0428681B1 Improved electrical connectors and ic chip tester embodying same |
| 03/31/1999 | CN1212465A Design for testability method selectively employing two methods for forming scan paths in circuit |
| 03/31/1999 | CN1212437A Floating bitline test mode with digitally controllable bitline equalizers |
| 03/31/1999 | CN1212397A Apparatus and method for analyzing circuit test results and recording medium storing analytical program therefor |
| 03/31/1999 | CN1212373A Method for detecting residual capacitance of storage battery |
| 03/31/1999 | CN1042766C Method and apparatus for detecting storage battery |
| 03/30/1999 | US5890100 Chip temperature monitor using delay lines |
| 03/30/1999 | US5889936 High speed asynchronous digital testing module |
| 03/30/1999 | US5889835 Method and system for testing a transmission line in a non-addressable network for continuity |
| 03/30/1999 | US5889789 Fault mode estimating system using abnormal current and V-I characteristics |
| 03/30/1999 | US5889788 Wrapper cell architecture for path delay testing of embedded core microprocessors and method of operation |
| 03/30/1999 | US5889787 Circuit including structural testing means with no dedicated test pad for testing |
| 03/30/1999 | US5889786 Memory testing device |
| 03/30/1999 | US5889702 Read circuit for memory adapted to the measurement of leakage currents |
| 03/30/1999 | US5889680 Device simulation method for use in numerical analyses of a semiconductor device |
| 03/30/1999 | US5889651 Circuit board cooling apparatus |
| 03/30/1999 | US5889435 On-chip PLL phase and jitter self-test circuit |
| 03/30/1999 | US5889409 Leakage tracking device sample for IDDQ measurement and defect resolution |
| 03/30/1999 | US5889408 Delta IDDQ testing |
| 03/30/1999 | US5889407 Press assembly for electrically testing a printed circuit board having an exchangeable lower adapter |
| 03/30/1999 | US5889406 Inductance-change detection apparatus |
| 03/30/1999 | US5889388 Circuitry for dynamically controlling capacitor charge based on battery capacity |
| 03/30/1999 | US5889386 Battery conditioning system having communication with battery parameter memory means in conjunction with battery conditioning |
| 03/30/1999 | US5889382 Charging device for commonly charging various kinds of battery |
| 03/30/1999 | US5889270 Bar code decoding using moving averages to break the (N.K.) code barrier for UPC, EAN, code 128 and others |
| 03/30/1999 | US5888837 Chip burn-in and test structure and method |
| 03/30/1999 | US5887302 Circuit for providing jog pulse, jog-off high limit, and low battery detect |
| 03/25/1999 | WO1999014612A1 Method for monitoring end of life for battery |
| 03/25/1999 | WO1999014611A1 Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| 03/25/1999 | WO1999014610A1 System for storing and searching named device parameter data in a test system for testing an integrated circuit |
| 03/25/1999 | WO1999014609A1 Production interface for an integrated circuit test system |
| 03/25/1999 | WO1999014608A1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
| 03/25/1999 | WO1998053382A3 Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
| 03/25/1999 | DE19826742A1 Burning-in tray for integrated circuits |
| 03/25/1999 | DE19818045A1 Test circuit for integrated circuit on same chip |
| 03/25/1999 | DE19741780A1 Conductor break detection method for inductive sensor user to detect rotating shaft speed |
| 03/25/1999 | DE19739923A1 Verfahren und Vorrichtung zur gepulsten Hochstrombelastung integrierter Schaltungen und Strukturen Method and apparatus for pulsed high-current load of integrated circuits and structures |
| 03/25/1999 | DE19738967A1 Usability test method for electrical coils |
| 03/25/1999 | CA2303095A1 Method for monitoring end of life for battery |
| 03/24/1999 | EP0903755A2 Ciruit and method to externally adjust internal circuit timing |
| 03/24/1999 | EP0903587A2 Test method for an electronic circuit |
| 03/24/1999 | EP0903586A2 Design for testability method selectively employing two methods for forming scan paths in a circuit |
| 03/24/1999 | EP0902896A1 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 03/24/1999 | EP0845107B1 Measurement system for electric disturbances in a high-voltage switchboard plant |
| 03/24/1999 | EP0834081A4 Method and apparatus for testing a megacell in an asic using jtag |
| 03/24/1999 | EP0776481A4 Addressable serial test system |
| 03/24/1999 | CN2311782Y Field effect (FET) VP and VT tester |
| 03/24/1999 | CN2311781Y Vehicle and motorcycle fault testing and repairing electronic pen |
| 03/24/1999 | CN1212084A Method for producing connection of data transmission lines, and plug connector |
| 03/24/1999 | CN1211844A Battery leasing system |
| 03/24/1999 | CN1211800A Semiconductor integrated circuit device |
| 03/24/1999 | CN1211737A IC chip tester and method for testing IC chip using the tester |
| 03/23/1999 | US5887004 Isolated scan paths |
| 03/23/1999 | US5887003 Apparatus and method for comparing a group of binary fields with an expected pattern to generate match results |
| 03/23/1999 | US5887002 Preprogramming testing in a field programmable gate array |
| 03/23/1999 | US5887001 Boundary scan architecture analog extension with direct connections |
| 03/23/1999 | US5886935 High and negative voltage compare |
| 03/23/1999 | US5886901 Flip-flop for scan test chain |
| 03/23/1999 | US5886783 Apparatus for isolating light signals from adjacent fiber optical strands |
| 03/23/1999 | US5886557 Redundant clock signal generating circuitry |
| 03/23/1999 | US5886536 Semiconductor tester synchronized with external clock |
| 03/23/1999 | US5886535 Wafer level burn-in base unit substrate and assembly |
| 03/23/1999 | US5886531 Method and appparatus for detecting an electrical connection defect between a connector and a shield cable |