Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/1999
04/21/1999CN2315574Y Device for discriminating fault direction of transmission line
04/21/1999CN1214546A Probe-type test handler, IC test method using the same, and IC
04/20/1999US5896552 Bus analyzer for capturing bus signals at a predetermined rate and upon assertion of a data valid signal
04/20/1999US5896494 Diagnostic module dispatcher
04/20/1999US5896401 Fault simulator for digital circuitry
04/20/1999US5896398 Flash memory test system
04/20/1999US5896396 Method and apparatus for scan test of SRAM for microprocessors without full scan capability
04/20/1999US5896324 Overvoltage detection circuit for generating a digital signal for a semiconductor memory device in parallel test mode
04/20/1999US5896257 Two sensor for over-current protection and current sensing configuration motor control
04/20/1999US5896086 Failure diagnostic apparatus
04/20/1999US5896057 Diagnostic power driver circuit
04/20/1999US5896040 Configurable probe pads to facilitate parallel testing of integrated circuit devices
04/20/1999US5896039 Configurable probe pads to facilitate parallel testing of integrated circuit devices
04/20/1999US5896038 Method of wafer level burn-in
04/20/1999US5896036 Carrier for testing semiconductor dice
04/20/1999US5896035 Electric field measuring apparatus
04/20/1999US5895989 Power supply unit and connector connection failure detection method
04/20/1999US5895972 Method and apparatus for cooling the backside of a semiconductor device using an infrared transparent heat slug
04/20/1999US5895962 Structure and a method for storing information in a semiconductor device
04/20/1999US5895440 Battery monitor and cycle status indicator
04/20/1999US5894659 Method for inspecting lead frames in a tape lead bonding system
04/20/1999CA2092333C Built-in self-test control network
04/15/1999WO1999018764A1 Burn-in board capable of high power dissipation
04/15/1999WO1999018448A1 Electro-chemical deterioration test method and apparatus
04/15/1999WO1999018447A1 Burn-in board with adaptable heat sink device
04/15/1999WO1999004277A9 Zero voltage wrist strap monitor
04/15/1999DE19846907A1 Graphic user interface processing system to control test equipment to test device
04/15/1999DE19824208A1 Fault analysis method for defect detection in semiconductor device
04/15/1999DE19819240A1 Semiconductor device with noise elimination circuit
04/14/1999EP0909114A2 Method and apparatus for indicating speaker faults
04/14/1999EP0909037A1 Method and device for compressing and expanding data pattern
04/14/1999EP0909001A2 Method and device for detecting a state of charge of a battery assembly, and battery assembly charge and discharge control device
04/14/1999EP0908944A1 Electrical characterisation of an insulating layer on a conductive or semiconductive substrate
04/14/1999EP0908889A2 Semiconductor integrated circuit device
04/14/1999EP0908737A2 Battery charge level detecting device
04/14/1999EP0908734A2 Electro-optic sampling oscilloscope
04/14/1999EP0908733A2 Electro-optic sampling oscilloscope
04/14/1999EP0908732A2 Electro-optic sampling oscilloscope
04/14/1999EP0908731A1 Process for characterisation and automatic setting of a photocell
04/14/1999EP0907893A1 A method of testing and fitting electronic surface-mounted components
04/14/1999EP0904546A3 Measurement system including antenna
04/14/1999CN2314384Y Multifunctional tester for A. C. generator of vehicle
04/14/1999CN2314383Y Switching board for testing instruments of printed board circuits
04/14/1999CN2314382Y Multifunctional small-size dynamic signal tester
04/14/1999CN1213888A Fault diagnosis circuit
04/14/1999CN1213799A Semiconductor integrated circuit
04/14/1999CN1213780A Test circuit for macro
04/14/1999CN1042907C Method for expressing rest capacity of battery used in electrically driven vehicle
04/13/1999US5894548 Semiconductor device having test circuit
04/13/1999US5894484 Integrated circuit tester with distributed instruction processing
04/13/1999US5894483 Integrated circuit arrangement
04/13/1999US5894482 Semiconductor integrated circuit with a testable block
04/13/1999US5894445 Semiconductor memory device
04/13/1999US5894425 Wireless secondary interface for data storage device
04/13/1999US5894424 Semiconductor testing apparatus
04/13/1999US5894226 IC testing apparatus
04/13/1999US5894225 Test fixture
04/13/1999US5894224 Method of testing a connection which includes a conductor in an integrated circuit
04/13/1999US5894223 Non-intrusive cable tester
04/13/1999US5894222 Battery testing method for individually testing secondary batteries by charging and discharging the batteries
04/13/1999US5894218 Method and apparatus for automatically positioning electronic dice within component packages
04/13/1999US5894217 Test handler having turn table
04/13/1999US5894213 Semiconductor integrated circuit having a plurality of flip-flops
04/13/1999US5894212 Discharge monitoring and isolating system for batteries
04/13/1999US5894176 Flexible reset scheme supporting normal system operation, test and emulation modes
04/13/1999US5894161 Interconnect with pressure sensing mechanism for testing semiconductor wafers
04/13/1999US5894081 Method and apparatus for adjusting output signals from a semiconductor device to fulfill a timing specification
04/13/1999CA2036877C Apparatus for inspecting printed circuit boards
04/08/1999WO1999017418A1 Method and apparatus for charging a rechargeable battery
04/08/1999WO1999017392A1 Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate
04/08/1999WO1999017354A1 A system for identifying defective electronic devices
04/08/1999WO1999017353A1 Multiplexed test circuit on a semiconductor chip
04/08/1999WO1999017262A1 Digital output unit with means for detecting wire breakage
04/08/1999WO1999017179A1 Multiple output programmable reference voltage source
04/08/1999WO1999017176A1 Module for diagnosing electrically controlled systems and total system diagnosing device
04/08/1999WO1999017128A1 Method for detecting a motor vehicle battery failure
04/08/1999WO1999017127A1 Method and device for determining the operating temperature of engines
04/08/1999WO1999017126A1 Method and device for monitoring shaft currents or shaft voltages in a generator shaft
04/08/1999WO1999017125A1 Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die
04/08/1999WO1999017123A1 Instrument for measuring voltages of cells
04/08/1999WO1999017121A2 Format sensitive timing calibration for an integrated circuit tester
04/08/1999WO1999016697A1 Diagnosing malfunctions in materials handling vehicles
04/08/1999WO1999006844A3 Magnetic current sensing and short circuit detection in plate structure
04/08/1999WO1999006245A3 System and method for testing a circuit device for controlling an automobile passenger protection mechanism
04/08/1999WO1999004327A3 Synchronous memory test system
04/08/1999DE19816192A1 Electromagnetic wave analysis instrument to analyze electromagnetic wave expanding from multilayer substrate
04/08/1999DE19745678A1 Manufacture of multi integrated circuit chip modules in COB (Chip On Board) form
04/08/1999DE19743632A1 Method to detect faulty power semiconductor switch in power converter circuit
04/08/1999DE19743263A1 Impulse voltage generation circuit arrangement
04/08/1999DE19742622A1 Verfahren und Vorrichtung zur Überwachung von Wellenströmen und Wellenspannungen in einer Generatorwelle Method and apparatus for monitoring shaft currents and shaft voltages in a generator shaft
04/08/1999DE19742055A1 Vorrichtung zum Testen von Schaltungsplatinen An apparatus for testing circuit boards
04/07/1999EP0907311A1 Sucked material detector, sucked material detecting method using the same detector, shift detecting method using the same detector, and cleaning method using the same detector
04/07/1999EP0907185A2 Floating bitline test mode with digitally controllable bitline equalizers
04/07/1999EP0907184A2 Apparatus and method for implementing a bank interlock scheme and related test mode for multi-bank memory devices
04/07/1999EP0907085A1 A method for measuring electromigration-induced resistance changes
04/07/1999EP0868667A4 High impedance test mode for jtag
04/07/1999EP0815459B1 Circuitry and process for testing non-intermittent signal generators
04/07/1999EP0808461A4 Jtag testing of buses using plug-in cards with jtag logic mounted thereon
04/07/1999CN2313231Y Field detecting instrument for electric actuator
04/07/1999CN1213463A Method of determining position of switching device