Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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04/21/1999 | CN2315574Y Device for discriminating fault direction of transmission line |
04/21/1999 | CN1214546A Probe-type test handler, IC test method using the same, and IC |
04/20/1999 | US5896552 Bus analyzer for capturing bus signals at a predetermined rate and upon assertion of a data valid signal |
04/20/1999 | US5896494 Diagnostic module dispatcher |
04/20/1999 | US5896401 Fault simulator for digital circuitry |
04/20/1999 | US5896398 Flash memory test system |
04/20/1999 | US5896396 Method and apparatus for scan test of SRAM for microprocessors without full scan capability |
04/20/1999 | US5896324 Overvoltage detection circuit for generating a digital signal for a semiconductor memory device in parallel test mode |
04/20/1999 | US5896257 Two sensor for over-current protection and current sensing configuration motor control |
04/20/1999 | US5896086 Failure diagnostic apparatus |
04/20/1999 | US5896057 Diagnostic power driver circuit |
04/20/1999 | US5896040 Configurable probe pads to facilitate parallel testing of integrated circuit devices |
04/20/1999 | US5896039 Configurable probe pads to facilitate parallel testing of integrated circuit devices |
04/20/1999 | US5896038 Method of wafer level burn-in |
04/20/1999 | US5896036 Carrier for testing semiconductor dice |
04/20/1999 | US5896035 Electric field measuring apparatus |
04/20/1999 | US5895989 Power supply unit and connector connection failure detection method |
04/20/1999 | US5895972 Method and apparatus for cooling the backside of a semiconductor device using an infrared transparent heat slug |
04/20/1999 | US5895962 Structure and a method for storing information in a semiconductor device |
04/20/1999 | US5895440 Battery monitor and cycle status indicator |
04/20/1999 | US5894659 Method for inspecting lead frames in a tape lead bonding system |
04/20/1999 | CA2092333C Built-in self-test control network |
04/15/1999 | WO1999018764A1 Burn-in board capable of high power dissipation |
04/15/1999 | WO1999018448A1 Electro-chemical deterioration test method and apparatus |
04/15/1999 | WO1999018447A1 Burn-in board with adaptable heat sink device |
04/15/1999 | WO1999004277A9 Zero voltage wrist strap monitor |
04/15/1999 | DE19846907A1 Graphic user interface processing system to control test equipment to test device |
04/15/1999 | DE19824208A1 Fault analysis method for defect detection in semiconductor device |
04/15/1999 | DE19819240A1 Semiconductor device with noise elimination circuit |
04/14/1999 | EP0909114A2 Method and apparatus for indicating speaker faults |
04/14/1999 | EP0909037A1 Method and device for compressing and expanding data pattern |
04/14/1999 | EP0909001A2 Method and device for detecting a state of charge of a battery assembly, and battery assembly charge and discharge control device |
04/14/1999 | EP0908944A1 Electrical characterisation of an insulating layer on a conductive or semiconductive substrate |
04/14/1999 | EP0908889A2 Semiconductor integrated circuit device |
04/14/1999 | EP0908737A2 Battery charge level detecting device |
04/14/1999 | EP0908734A2 Electro-optic sampling oscilloscope |
04/14/1999 | EP0908733A2 Electro-optic sampling oscilloscope |
04/14/1999 | EP0908732A2 Electro-optic sampling oscilloscope |
04/14/1999 | EP0908731A1 Process for characterisation and automatic setting of a photocell |
04/14/1999 | EP0907893A1 A method of testing and fitting electronic surface-mounted components |
04/14/1999 | EP0904546A3 Measurement system including antenna |
04/14/1999 | CN2314384Y Multifunctional tester for A. C. generator of vehicle |
04/14/1999 | CN2314383Y Switching board for testing instruments of printed board circuits |
04/14/1999 | CN2314382Y Multifunctional small-size dynamic signal tester |
04/14/1999 | CN1213888A Fault diagnosis circuit |
04/14/1999 | CN1213799A Semiconductor integrated circuit |
04/14/1999 | CN1213780A Test circuit for macro |
04/14/1999 | CN1042907C Method for expressing rest capacity of battery used in electrically driven vehicle |
04/13/1999 | US5894548 Semiconductor device having test circuit |
04/13/1999 | US5894484 Integrated circuit tester with distributed instruction processing |
04/13/1999 | US5894483 Integrated circuit arrangement |
04/13/1999 | US5894482 Semiconductor integrated circuit with a testable block |
04/13/1999 | US5894445 Semiconductor memory device |
04/13/1999 | US5894425 Wireless secondary interface for data storage device |
04/13/1999 | US5894424 Semiconductor testing apparatus |
04/13/1999 | US5894226 IC testing apparatus |
04/13/1999 | US5894225 Test fixture |
04/13/1999 | US5894224 Method of testing a connection which includes a conductor in an integrated circuit |
04/13/1999 | US5894223 Non-intrusive cable tester |
04/13/1999 | US5894222 Battery testing method for individually testing secondary batteries by charging and discharging the batteries |
04/13/1999 | US5894218 Method and apparatus for automatically positioning electronic dice within component packages |
04/13/1999 | US5894217 Test handler having turn table |
04/13/1999 | US5894213 Semiconductor integrated circuit having a plurality of flip-flops |
04/13/1999 | US5894212 Discharge monitoring and isolating system for batteries |
04/13/1999 | US5894176 Flexible reset scheme supporting normal system operation, test and emulation modes |
04/13/1999 | US5894161 Interconnect with pressure sensing mechanism for testing semiconductor wafers |
04/13/1999 | US5894081 Method and apparatus for adjusting output signals from a semiconductor device to fulfill a timing specification |
04/13/1999 | CA2036877C Apparatus for inspecting printed circuit boards |
04/08/1999 | WO1999017418A1 Method and apparatus for charging a rechargeable battery |
04/08/1999 | WO1999017392A1 Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
04/08/1999 | WO1999017354A1 A system for identifying defective electronic devices |
04/08/1999 | WO1999017353A1 Multiplexed test circuit on a semiconductor chip |
04/08/1999 | WO1999017262A1 Digital output unit with means for detecting wire breakage |
04/08/1999 | WO1999017179A1 Multiple output programmable reference voltage source |
04/08/1999 | WO1999017176A1 Module for diagnosing electrically controlled systems and total system diagnosing device |
04/08/1999 | WO1999017128A1 Method for detecting a motor vehicle battery failure |
04/08/1999 | WO1999017127A1 Method and device for determining the operating temperature of engines |
04/08/1999 | WO1999017126A1 Method and device for monitoring shaft currents or shaft voltages in a generator shaft |
04/08/1999 | WO1999017125A1 Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die |
04/08/1999 | WO1999017123A1 Instrument for measuring voltages of cells |
04/08/1999 | WO1999017121A2 Format sensitive timing calibration for an integrated circuit tester |
04/08/1999 | WO1999016697A1 Diagnosing malfunctions in materials handling vehicles |
04/08/1999 | WO1999006844A3 Magnetic current sensing and short circuit detection in plate structure |
04/08/1999 | WO1999006245A3 System and method for testing a circuit device for controlling an automobile passenger protection mechanism |
04/08/1999 | WO1999004327A3 Synchronous memory test system |
04/08/1999 | DE19816192A1 Electromagnetic wave analysis instrument to analyze electromagnetic wave expanding from multilayer substrate |
04/08/1999 | DE19745678A1 Manufacture of multi integrated circuit chip modules in COB (Chip On Board) form |
04/08/1999 | DE19743632A1 Method to detect faulty power semiconductor switch in power converter circuit |
04/08/1999 | DE19743263A1 Impulse voltage generation circuit arrangement |
04/08/1999 | DE19742622A1 Verfahren und Vorrichtung zur Überwachung von Wellenströmen und Wellenspannungen in einer Generatorwelle Method and apparatus for monitoring shaft currents and shaft voltages in a generator shaft |
04/08/1999 | DE19742055A1 Vorrichtung zum Testen von Schaltungsplatinen An apparatus for testing circuit boards |
04/07/1999 | EP0907311A1 Sucked material detector, sucked material detecting method using the same detector, shift detecting method using the same detector, and cleaning method using the same detector |
04/07/1999 | EP0907185A2 Floating bitline test mode with digitally controllable bitline equalizers |
04/07/1999 | EP0907184A2 Apparatus and method for implementing a bank interlock scheme and related test mode for multi-bank memory devices |
04/07/1999 | EP0907085A1 A method for measuring electromigration-induced resistance changes |
04/07/1999 | EP0868667A4 High impedance test mode for jtag |
04/07/1999 | EP0815459B1 Circuitry and process for testing non-intermittent signal generators |
04/07/1999 | EP0808461A4 Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
04/07/1999 | CN2313231Y Field detecting instrument for electric actuator |
04/07/1999 | CN1213463A Method of determining position of switching device |