Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1999
10/14/1999WO1999052203A1 Inhibitable, continuously-terminated, differential drive circuit for an integrated circuit tester
10/14/1999WO1999052170A1 Battery having a built-in controller
10/14/1999WO1999052163A1 Battery having a built-in controller
10/14/1999WO1999052139A1 Probe device
10/14/1999WO1999052034A1 Integrated circuit architecture having an array of test cells providing full controllability for automatic circuit verification
10/14/1999WO1999052033A1 Semiconductor device
10/14/1999WO1999051993A1 Battery parameter measurement
10/14/1999DE19911099A1 Test circuit for testing logic system consisting of existing macro and newly created circuit arranged on PCB
10/14/1999DE19816140A1 Verfahren und Schaltungsanordnung zur Sicherheitsüberprüfung einer Hochspannungsversorgungsanlage Method and circuit arrangement for security verification of a high voltage supply system
10/14/1999DE19814312A1 Vorrichtung zum automatischen Testen von Komponenten An apparatus for automatic testing of components
10/14/1999DE19808664A1 Integrierte Schaltung und Verfahren zu ihrer Prüfung Integrated circuit and method for its examination
10/13/1999EP0949735A2 Method and circuit arrangement for safety control of a high voltage supply system
10/13/1999EP0948793A1 High-speed test system for a memory device
10/13/1999EP0948747A2 Scalable tester architecture with i-cached simd technology
10/13/1999EP0880708A4 I/o toggle test method using jtag
10/13/1999EP0856160B1 Arrangement for controlling a load connected to the secondary side of a transformer
10/13/1999EP0565079B1 Semiconductor device including voltage stress test shunting circuit
10/13/1999CN2343594Y Battery capacity tester
10/13/1999CN2343593Y Dynamic aging measurer for linear circuit
10/13/1999CN2343592Y Intelligent fault tester for electric boosting vehicle
10/13/1999CN1231729A Impulse valtage generator circuit
10/13/1999CN1231672A Conformationally constrained backbone cyclized somatostatin analogs
10/13/1999CN1231482A Semiconductor IC device with internal testing circuit
10/13/1999CN1231427A Device for detecting contact fault in IC test
10/13/1999CN1231426A Device for measuring capacitance of electrical wires
10/13/1999CN1045693C Contact structure for interconnections, interposer, semiconductor assembly and method
10/12/1999US5966675 Method and device for monitoring power supply networks
10/12/1999US5966593 Method of forming a wafer level contact sheet having a permanent z-axis material
10/12/1999US5966523 Method of estimating power consumption of semiconductor integrated circuit
10/12/1999US5966521 For integrated circuits
10/12/1999US5966388 Semiconductor memory device
10/12/1999US5966335 Semiconductor memory device having circuit for changing electrical characteristics
10/12/1999US5966280 Modular, distributed equipment leakage circuit interrupter
10/12/1999US5966025 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
10/12/1999US5966024 Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle
10/12/1999US5966022 Wafer level burn-in system
10/12/1999US5966021 Apparatus for testing an integrated circuit in an oven during burn-in
10/12/1999US5966020 Printed circuit board
10/12/1999US5966019 System and method for measuring properties of a semiconductor substrate in a fabrication line
10/12/1999US5966015 Test fixture for circuit component
10/12/1999US5966014 System for simultaneously testing a plurality of batteries for multiple operating specifications
10/12/1999US5965997 Battery monitoring circuit with storage of charge and discharge accumulation values accessible therefrom
10/12/1999US5965991 Control system for a vehicle-mounted battery
10/12/1999US5965957 Switching apparatus, in particular for systems under test
10/12/1999US5965902 Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
10/12/1999US5964894 IC test equipment, measurement method in the IC test equipment, and storage medium of the same
10/12/1999US5964835 Storage access validation to data messages using partial storage address data indexed entries containing permissible address range validation for message source
10/12/1999US5964813 Vehicle diagnostic data storing system
10/12/1999CA2058591C Computerized remote resistance measurement system with fault detection
10/07/1999WO1999050947A1 Process and apparatus for modulating terminal voltage of battery
10/07/1999WO1999050680A1 Analyzing an integrated circuit from the backside
10/07/1999WO1999050677A1 Burn-in test socket
10/07/1999WO1999050676A1 Test socket lattice
10/07/1999WO1999050102A2 Method for operating a restraint system connected by a bus line in case of a short circuit
10/07/1999WO1999030172A3 Wideband isolation system
10/07/1999WO1999028833A8 Method and system for improving a transistor model
10/07/1999WO1999022572A3 Method for producing and controlling electronic components
10/07/1999DE19900833A1 Vacuum test-fixture for testing of printed circuit board (PCB)
10/07/1999DE19839807C1 Production and testing method for integrated circuit
10/07/1999DE19821539C1 Switching arrangement, and method for recognition and control, of attached electrical load
10/07/1999DE19814035A1 Container for testing high voltage switches in transformer oil
10/07/1999CA2324257A1 Process and apparatus for modulating terminal voltage of battery
10/06/1999EP0947994A2 Reduced signal test for dynamic random access memory
10/06/1999EP0947845A2 Apparatus for automatic testing of components
10/06/1999EP0947844A2 Method and apparatus for remotely changing signal characteristics of a signal generator
10/06/1999EP0947837A2 Method for emphasizing infrequent events in a digital oscilloscope having variable intensity or color display
10/06/1999EP0947039A2 Time-domain circuit modeller
10/06/1999EP0946973A1 Integrated circuit tray with flexural bearings
10/06/1999EP0946956A1 Method and system for detecting relay failure
10/06/1999EP0946914A1 Methods and devices relating to circuit board constructions
10/06/1999EP0946882A1 Method and device for controlling a motor vehicle electric circuit
10/06/1999EP0627134B1 Method and apparatus for monitoring battery capacity with charge control
10/06/1999EP0620518B1 Methods and apparatus for generating linear-feedback-shift-register sequences
10/06/1999EP0599488B1 Method and apparatus for testing an interface board
10/06/1999CN2342377Y Fault monitor for high voltage power supply cable network earthing
10/06/1999CN1230691A IC testing device
10/06/1999CN1230690A Method for generating three-pole short-circuit signal on three-phase transmission line
10/05/1999US5963889 Process for the computer-assisted measurement and testing of electric circuits, especially electronic modules, and testing station for implementing the process
10/05/1999US5963850 Method and apparatus for verifying the operability of a balanced diode mixer and local oscillator combination
10/05/1999US5963779 Integrated circuit using a back gate voltage for burn-in operations
10/05/1999US5963566 Application specific integrated circuit chip and method of testing same
10/05/1999US5963565 Apparatus and method for external supervision of electronic test equipment operating parameters
10/05/1999US5963490 Static semiconductor memory device having a variable power supply voltage applied to a memory cell depending on the state in use and method of testing the same
10/05/1999US5963410 Insulation testing method and apparatus therefor
10/05/1999US5963364 Multi-wavelength variable attenuator and half wave plate
10/05/1999US5963314 Laser imaging system for inspection and analysis of sub-micron particles
10/05/1999US5963140 Remaining battery energy indicating instrument
10/05/1999US5963070 Stretch cycle generator
10/05/1999US5963046 Method for detecting and locating open-circuit defects within digital CMOS integrated circuits
10/05/1999US5963045 Method for testing circuit board assemblies
10/05/1999US5963044 Method for acquiring measured values by comparison with a stepped ramp voltage
10/05/1999US5963041 Device and method for testing surgical instruments
10/05/1999US5963040 Method and apparatus for detecting pin-holes in a passivation layer
10/05/1999US5963039 Testing attachment reliability of devices
10/05/1999US5963038 Method of testing a connection which includes a conductor in an integrated circuit
10/05/1999US5963027 For probing a test device
10/05/1999US5963017 Calibration of the battery device for a portable computer system
10/05/1999US5963016 Battery residual capacity measuring system and battery residual capacity measuring for electric vehicles
10/05/1999US5963013 Storage battery charging apparatus and methods
10/05/1999US5963012 Wireless battery charging system having adaptive parameter sensing
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