| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/05/1999 | US5963010 Battery controller for controlling batteries of different kinds and including battery monitoring means for calculating remaining operation time and an information processing apparatus including such battery controller |
| 10/05/1999 | US5962953 Piezoelectric transformer with monitor electrodes for sensing unbalanced vibration of the transformer |
| 10/05/1999 | US5962934 Arrangement for electrical power supply |
| 10/05/1999 | US5962868 Semiconductor device having contact check circuit |
| 10/05/1999 | US5962867 Test device |
| 10/05/1999 | US5962157 Intelligent battery device |
| 10/05/1999 | US5961728 The present invention relates to the field of semiconductor testing equipment and, more specifically, to the field of probe cards and probers for semiconductor test systems. |
| 10/05/1999 | US5961653 Processor based BIST for an embedded memory |
| 10/05/1999 | US5961026 Apparatus and method for removing known good die using hot shear process |
| 10/05/1999 | US5960536 Method for the preparation of a wiring circuit board for mounting of a semiconductor |
| 09/30/1999 | WO1999049622A1 Method of forming information transmission channel, apparatus for forming information transmission channel, structure for forming information transmission channel, connector for forming information transmission channel, and connector tester |
| 09/30/1999 | WO1999049552A1 Electronic device, method of controlling electronic device, method of estimating charge in rechargeable battery, and method of charging rechargeable battery |
| 09/30/1999 | WO1999049330A1 Compensating for the effects of round-trip delay in automatic test equipment |
| 09/30/1999 | WO1999049328A1 Device, assembly and method for testing electronic components, and calibrating method therefor |
| 09/30/1999 | WO1999049327A1 Universal and ecological measuring device for determining the resistance of technical systems to the action of external electro-magnetic fields |
| 09/30/1999 | WO1999038197A3 Test head structure for integrated circuit tester |
| 09/30/1999 | WO1999035547A3 Power contact for testing a power source |
| 09/30/1999 | WO1999003217A3 Apparatus and method for restoring fiber optic communications network connections |
| 09/30/1999 | DE19912417A1 Integrated circuit test device for semiconductor elements |
| 09/30/1999 | DE19832330A1 Test holder for integrated circuit with solder ball connections serving as test points |
| 09/30/1999 | DE19819219C1 Electrode line monitoring method for bipolar HV DC transmission installation |
| 09/30/1999 | DE19813922A1 Verfahren zum Betreiben eines über eine Busleitung vernetzten Rückhaltesystems bei einem Kurzschluß A method for operating a networked via a bus line restraint system if a short circuit |
| 09/30/1999 | DE19813331A1 Microphone cable tester for troubleshooting in audio studio environment |
| 09/30/1999 | DE19813112A1 Motor current measuring method for electric motor |
| 09/30/1999 | DE19813103A1 Verfahren und Vorrichtung zur Ansteuerung eines Verbrauchers Method and device for controlling a consumer |
| 09/30/1999 | DE19812307A1 Diagnostic device for giant magnetoresistive sensor |
| 09/30/1999 | DE19807907A1 Method of monitoring and preventing short circuits or short circuit-like states in electronic equipment connected to mains |
| 09/29/1999 | EP0945950A2 Method and apparatus for controlling a load |
| 09/29/1999 | EP0945949A2 Plug-in multifunction tester for ac electrical distribution system |
| 09/29/1999 | EP0945948A2 Test circuit for verifying operation of an arc fault detector |
| 09/29/1999 | EP0945804A2 Integrated circuit and method for its testing |
| 09/29/1999 | EP0945735A2 Appliance for detecting contact faults during testing integrated circuits |
| 09/29/1999 | EP0945733A2 Method for nondestructive measurement of minority carrier diffusion length and minority carrier lifetime in semiconductor devices |
| 09/29/1999 | EP0944840A1 Probe card for high speed testing |
| 09/29/1999 | EP0944824A1 Device and method for testing electrosurgical instruments |
| 09/29/1999 | EP0859963B1 Method for determining the charge status of a storage battery |
| 09/29/1999 | EP0589553B1 Register to enable and disable built-in testing logic |
| 09/29/1999 | CN2341159Y Optical separation intellectual line distributor |
| 09/29/1999 | CN1230012A Method for generating direct drawing data for charged particle beam direct drawing, and method and apparatus for direct drawing |
| 09/29/1999 | CN1229925A Semiconductor integrated circuit |
| 09/29/1999 | CN1229924A IC testing apparatus |
| 09/29/1999 | CN1229921A Method and apparatus for electronic meter testing |
| 09/29/1999 | CN1045334C Clamp for detecting characteriztic of semiconductor and manufacture and application of same |
| 09/28/1999 | US5960372 Method of monitoring electrical wear on selector switch disconnectors in a high voltage station |
| 09/28/1999 | US5960255 Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it |
| 09/28/1999 | US5960191 Emulation system with time-multiplexed interconnect |
| 09/28/1999 | US5960052 Low power scannable counter |
| 09/28/1999 | US5960008 Test circuit |
| 09/28/1999 | US5959915 Test method of integrated circuit devices by using a dual edge clock technique |
| 09/28/1999 | US5959912 ROM embedded mask release number for built-in self-test |
| 09/28/1999 | US5959911 Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices |
| 09/28/1999 | US5959910 Sense amplifier control of a memory device |
| 09/28/1999 | US5959713 Liquid-crystal display panel and method for inspecting the same |
| 09/28/1999 | US5959583 Antenna adapter |
| 09/28/1999 | US5959487 Integrated circuit with speed detector |
| 09/28/1999 | US5959463 Semiconductor test apparatus for measuring power supply current of semiconductor device |
| 09/28/1999 | US5959462 Test structure for enabling burn-in testing on an entire semiconductor wafer |
| 09/28/1999 | US5959459 Defect monitor and method for automated contactless inline wafer inspection |
| 09/28/1999 | US5959458 Method and apparatus for measuring electrical waveforms using atomic force microscopy |
| 09/28/1999 | US5959435 Method and system for monitoring battery |
| 09/28/1999 | US5958077 Method for testing asynchronous circuits |
| 09/28/1999 | US5958076 Semiconductor integrated circuit |
| 09/28/1999 | US5958075 Efficient on-pitch scannable sense amplifier |
| 09/28/1999 | US5957704 Socket for electrical connection of an electrical component |
| 09/28/1999 | CA2172321C Method and apparatus for testing rf devices |
| 09/23/1999 | WO1999048194A1 Electric motor monitoring circuit |
| 09/23/1999 | WO1999048147A1 Process for manufacturing semiconductor device |
| 09/23/1999 | WO1999048103A1 Cyclic redundancy checking of a field programmable gate array having an sram memory architecture |
| 09/23/1999 | WO1999047941A2 Connection testing device for testing the electric connection between chips or chip modules |
| 09/23/1999 | WO1999047937A2 Flexible test environment for automatic test equipment |
| 09/23/1999 | WO1999039218A3 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
| 09/23/1999 | WO1999038209A3 Method and apparatus for temperature control of a semiconductor electrical-test contactor assembly |
| 09/23/1999 | DE19912514A1 Semiconductor testing system for testing semiconductor circuits e.g. IC's and LSI's |
| 09/23/1999 | DE19908882A1 Digital comparator for semiconductor device inspection system |
| 09/23/1999 | DE19811384A1 Generator protection device testing method for synchronous generator in 3-phase network or system |
| 09/22/1999 | EP0944153A2 Power tool charging system having a charge level indicator and charge control functions |
| 09/22/1999 | EP0944134A1 Component for making an electric or electronic testing device |
| 09/22/1999 | EP0943926A1 Instrument for measuring voltages of cells |
| 09/22/1999 | EP0943925A2 Electro-optic sampling oscilloscope |
| 09/22/1999 | EP0943924A2 Loaded-board, guided-probe test fixture |
| 09/22/1999 | EP0943127A1 Method for testing and for generating a mapping for an electronic device |
| 09/22/1999 | EP0943100A1 Internal testability system for microprocessor-based integrated circuit |
| 09/22/1999 | EP0943099A1 Protective pipe element for sheathed cable for controlling the integrity of the sheath |
| 09/22/1999 | EP0943083A1 Method and apparatus for inspecting spark plug while spark plug is installed in engine |
| 09/22/1999 | EP0820631B1 Circuit for sram test mode isolated bitline modulation |
| 09/22/1999 | EP0755504A4 Programmable cable adaptor |
| 09/22/1999 | CN2339996Y Cell internal-resistance nondestructive testing instrument |
| 09/22/1999 | CN1229195A Cell voltage detection circuit, and method of detecting cell votage |
| 09/21/1999 | US5956567 Semiconductor chip and semiconductor wafer having power supply pads for probe test |
| 09/21/1999 | US5956478 Method for generating random test cases without causing infinite loops |
| 09/21/1999 | US5956384 Apparatus and method for automatically detecting defective lines in a cable and for automatically switching from the defective line to an extra line |
| 09/21/1999 | US5956350 Built in self repair for DRAMs using on-chip temperature sensing and heating |
| 09/21/1999 | US5956280 Contact test method and system for memory testers |
| 09/21/1999 | US5956252 Method and apparatus for an integrated circuit that is reconfigurable based on testing results |
| 09/21/1999 | US5955901 Wave shaping circuit of semiconductor testing apparatus |
| 09/21/1999 | US5955890 Backmatch resistor structure for an integrated circuit tester |
| 09/21/1999 | US5955888 Apparatus and method for testing ball grid array packaged integrated circuits |
| 09/21/1999 | US5955885 Battery power supply device characteristic measuring apparatus and measuring method |
| 09/21/1999 | US5955877 Method and apparatus for automatically positioning electronic dice within component packages |
| 09/21/1999 | US5955876 Board positioning apparatus |