Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/1999
06/09/1999EP0920715A1 Socket for positioning and installing an integrated circuit chip on a flexible connector sheet
06/09/1999EP0920636A1 Cable fault monitoring system
06/09/1999EP0920635A1 Diagnostic procedure for electrical appliances
06/09/1999EP0920446A1 Conformationally constrained backbone cyclized somatostatin analogs
06/09/1999EP0498534B1 Artificial random-number pattern generating circuit
06/09/1999CN2323378Y Wide band failure discharge coupler
06/09/1999CN1219241A High impedance test mode for JTAG standard
06/09/1999CN1218962A Method and apparatus for detecting multiple cluster memory device with multiple memory clusters
06/09/1999CN1218961A Method for detecting memory unit
06/09/1999CN1043591C Current surge indicator
06/08/1999US5911039 Integrated circuit device comprising a plurality of functional modules each performing predetermined function
06/08/1999US5910958 Automatic generation of test vectors for sequential circuits
06/08/1999US5910901 Logic simulator
06/08/1999US5910895 Low cost, easy to use automatic test system software
06/08/1999US5910727 Electrical inspecting apparatus with ventilation system
06/08/1999US5910723 System for monitoring the charging of a modular set of electrochemical cells connected in series and a corresponding cell measurement module
06/08/1999CA2157113C An improved method and system for predicting steady state conditions of a product from transient monotonic or cyclic data
06/08/1999CA2057046C Computer-aided engine diagnostic system
06/03/1999WO1999027628A1 Battery monitoring system
06/03/1999WO1999027549A1 Method for monitoring the erosion of a contact point
06/03/1999WO1999027473A1 Network configuration of programmable circuits
06/03/1999WO1999027472A1 Method and apparatus for automatically testing the design of a simulated integrated circuit
06/03/1999WO1999027378A1 A method and apparatus for scan testing dynamic circuits
06/03/1999WO1999027377A1 Diagnostic device for recognizing short circuits or line interruptions of an inductive sensor
06/03/1999WO1999027376A1 Ic testing method and ic testing device using the same
06/03/1999WO1999027375A1 Ic testing device
06/03/1999WO1999027374A1 Remote resistivity measurement
06/03/1999WO1999026827A1 Protective circuit for a controlling element and method for testing the control circuit of a controlling element
06/02/1999EP0919916A2 Embedded logic analyzer
06/02/1999EP0919823A2 System for verifying signal timing accuracy on a digital testing device
06/02/1999EP0919822A2 System for verifying signal voltage level accuracy on a digital testing device
06/02/1999EP0919820A2 Circuit board testing apparatus and method
06/02/1999EP0919817A2 Improved method and apparatus for direct probe sensing
06/02/1999EP0919099A1 Circuit for motion estimation in digitised video sequence encoders
06/02/1999EP0919078A1 Process and device for monitoring and/or controlling charging of a modular battery, particularly in a battery powered vehicle
06/02/1999EP0918998A1 Method and apparatus for testing the insulating ability of an insulation on an electric conductor
06/02/1999EP0918714A1 Method and apparatus for loading electronic components
06/02/1999DE19852775A1 Varistor testing and sorting method
06/02/1999DE19829292A1 Integrated circuit defect detection
06/02/1999DE19826236A1 Electromagnetic field strength calculation device
06/02/1999DE19819472A1 Monitoring device for oil-filled electrical transformer
06/02/1999DE19753033A1 Verfahren und Vorrichtung zur Messung der Elektromagnetischen Verträglichkeit Method and device for measuring electromagnetic compatibility
06/02/1999DE19752278A1 Steuerung für ein Kraftfahrzeug mit Fernbedienung oder Transponder Control for a motor vehicle with a remote control or transponder
06/02/1999DE19749842A1 Vorrichtung zur Überprüfung eines elektrischen Antriebs Apparatus for checking an electrical drive
06/02/1999CN2322151Y Valve controlled sealed lead-acid accumulator assembling pressure measuring machine
06/02/1999CN1218572A Circuit arrangement with test circuit
06/02/1999CN1218555A Method and apparatus for space-charge measurement in cables using pulsed electroacoustic method
06/02/1999CN1218285A Probe card for testing integrated circuit chip
06/02/1999CN1218183A Semiconductor integrated circuit testing apparatus
06/02/1999CN1218182A Apparatus and methods for testing variable resistors
06/01/1999USRE36217 Top load socket for ball grid array devices
06/01/1999US5909661 Method and apparatus for decomposing drive error signal noise sources
06/01/1999US5909660 Signal conditioning module for sensing multiform field voltage signals
06/01/1999US5909657 Semiconductor device testing apparatus
06/01/1999US5909453 Lookahead structure for fast scan testing
06/01/1999US5909452 Method for avoiding contention during boundary scan testing
06/01/1999US5909451 System and method for providing scan chain for digital electronic device having multiple clock domains
06/01/1999US5909450 Method for testing a device under test
06/01/1999US5909448 Memory testing apparatus using a failure cell array
06/01/1999US5909397 Method and system for testing and adjusting threshold voltages in flash eeproms
06/01/1999US5909375 Buffer for identification of pin contentions in circuit design and simulation
06/01/1999US5909348 To detect a fault current on a supply line of an electronic circuit
06/01/1999US5909186 Methods and apparatus for testing analog-to-digital and digital-to-analog device using digital testers
06/01/1999US5909181 Method and apparatus for indicating electrical connection
06/01/1999US5909142 Semiconductor integrated circuit device having burn-in test capability and method for using the same
06/01/1999US5909123 Method for performing reliability screening and burn-in of semi-conductor wafers
06/01/1999US5909122 Integrated circuit package pin marking system
06/01/1999US5909121 Method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort
06/01/1999US5909113 Inductive amplifier having recessed butt set leads
06/01/1999US5909112 Configuration and test process for semiconductor overcurrent detecting circuit
06/01/1999US5909034 Electronic device for testing bonding wire integrity
06/01/1999US5908471 Diagnostic arrangement for digital computer system
05/1999
05/27/1999WO1999026356A1 Method and system for testing a transmission line in a non-addressable network for continuity
05/27/1999WO1999026330A2 Universal power supply
05/27/1999WO1999026076A1 Apparatus for and method of monitoring the status of the insulation on the wire in a winding
05/27/1999WO1999026075A1 Method and device for measuring electromagnetic compatibility
05/27/1999WO1999012045A3 Apparatus for measuring minority carrier lifetimes in semiconductor materials
05/27/1999DE19826685A1 Circuit arrangement for adjustment element e.g. electrically controllable brake force amplifier of motor vehicle
05/27/1999DE19751987A1 Equalizing the state of charge of an accumulator battery
05/27/1999DE19751654A1 Circuit for voltage state detection and indication, e.g. for medium and high voltage switching systems
05/27/1999CA2317560A1 Universal power supply
05/26/1999EP0918363A1 Method and device for monitoring a selected group of fuel cells of a high temperature fuel cell stack
05/26/1999EP0918227A2 Automatic circuit tester having a waveform acquisition mode of operation
05/26/1999EP0918224A2 Signal processing circuit for electro-optic probe
05/26/1999EP0917765A2 Swept frequency device test
05/26/1999EP0917753A1 A device for supervising in a high voltage converter station
05/26/1999CN2321111Y Vacuum diode with coaxial current divider
05/26/1999CN2321012Y Portable leakage protecting system detector
05/26/1999CN1217832A Power supply device
05/26/1999CN1217547A Internal-circuit timed external regulation circuit and method therefor
05/26/1999CN1217546A Synchronous semiconductor storage device having timed circuit of controlling activation/non-activation of word line
05/26/1999CN1217545A Synchronous semiconductor storage device having circuit capable of reliably resetting detection means
05/26/1999CN1217473A Expert diagnostic method for fault of dc. motor
05/25/1999US5907714 Method for pipelined data processing with conditioning instructions for controlling execution of instructions without pipeline flushing
05/25/1999US5907562 Testable integrated circuit with reduced power dissipation
05/25/1999US5907515 Semiconductor memory device
05/25/1999US5907507 Microcomputer and multi-chip module
05/25/1999US5907283 Method for detecting a voltage level
05/25/1999US5907247 Test system and process with microcomputers and serial interface
05/25/1999US5907245 Semiconductor device tester and handler interface