| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 09/07/1999 | US5949724 Burn-in stress circuit for semiconductor memory device |
| 09/07/1999 | US5949701 Memory circuit with a connection layout and a method for testing and a wiring design apparatus |
| 09/07/1999 | US5949694 Method and system for extracting high current parasitic bipolar transistor parameters of an MOS device during overvoltage events |
| 09/07/1999 | US5949692 Into an integrated circuit design |
| 09/07/1999 | US5949691 Logic circuit verification device to verify the logic circuit equivalence and a method therefor |
| 09/07/1999 | US5949682 Heated circuit assembly tester and method |
| 09/07/1999 | US5949343 Supervisory apparatus for oil-filled electrical equipment |
| 09/07/1999 | US5949247 Method and apparatus for automatically testing and evaluating electric generator sets |
| 09/07/1999 | US5949246 Test head for applying signals in a burn-in test of an integrated circuit |
| 09/07/1999 | US5949243 Translator fixture for use in circuit board testing |
| 09/07/1999 | US5949242 Method and apparatus for testing unpackaged semiconductor dice |
| 09/07/1999 | US5949241 Method for testing interconnects and semiconductor dice |
| 09/07/1999 | US5949238 Method and apparatus for probing large pin count integrated circuits |
| 09/07/1999 | US5949236 Frequency domain reflectometer and method of compensating for transmission line attenuation |
| 09/07/1999 | US5949235 System and method for detection and control of ungrounded parts in a production coating line |
| 09/07/1999 | US5949233 Circuit for detecting overcharging and overdischarging |
| 09/07/1999 | US5949230 Non-contact voltage probe apparatus |
| 09/07/1999 | US5949219 Optical state-of-charge monitor for batteries |
| 09/07/1999 | US5949217 Method to determine remaining capacity of a rechargeable battery |
| 09/07/1999 | US5949129 Wafer comprising optoelectronic circuits and method of verifying this wafer |
| 09/07/1999 | US5949090 MOS TEG structure |
| 09/07/1999 | US5949002 Manipulator for automatic test equipment with active compliance |
| 09/07/1999 | US5948115 Event phase modulator for integrated circuit tester |
| 09/07/1999 | US5948114 Integrated circuit binary data output interface for multiplexed output of internal binary information elements from input/output pads |
| 09/07/1999 | US5947258 Integrated circuit boat retrieval mechanism |
| 09/07/1999 | CA2170539C Accident detection circuit of a voltage-type self-excited power converter |
| 09/07/1999 | CA2127192C Shaping ate bursts, particularly in gallium arsenide |
| 09/02/1999 | WO1999044230A1 Underfilling material for flip-chip fitted printed circuit boards, a printed circuit board equipped therewith, and a method for filling ratio verification of chips which are underfilled therewith |
| 09/02/1999 | DE19906215A1 Data processing system for an IC test equipment for semiconductors |
| 09/02/1999 | DE19805722A1 Method and appliance for monitoring electric leads for short circuits between parallel signal leads |
| 09/01/1999 | EP0939493A2 Digital-to-analog converter accurately testable without complicated circuit configuration and testing method for the same |
| 09/01/1999 | EP0939475A2 Electric network for a motor vehicle |
| 09/01/1999 | EP0939372A1 Devise for production testing of the dynamic characteristics of components using serial transmission |
| 09/01/1999 | EP0939321A1 High speed serial test and measurement equipment interface and system using same |
| 09/01/1999 | EP0939320A2 Test method and device for a semiconductor integrated circuit |
| 09/01/1999 | CN2336369Y Power line failure detection locating arrangement |
| 09/01/1999 | CN2336368Y Integral operation tester for electric energy metering device |
| 09/01/1999 | CN2336367Y Multifunctional radio service apparatus |
| 09/01/1999 | CN2336356Y Reference electrode of fuel battery |
| 09/01/1999 | CN1227675A Device for detecting residual capacity of battery |
| 09/01/1999 | CN1227351A Test head for microstructures with interface |
| 09/01/1999 | CN1044953C Method for assessment of lifetime and capacity of a power-storage device |
| 09/01/1999 | CN1044950C High density and high current capacity pado-to-pad connector comprising of spring connector elements (SCE) |
| 08/31/1999 | US5946553 Process for manufacturing a semiconductor package with bi-substrate die |
| 08/31/1999 | US5946546 Chip burn-in and test structure and method |
| 08/31/1999 | US5946483 Devices, systems and methods for conditional instructions |
| 08/31/1999 | US5946332 Laser having a connection detector for monitoring a connection between separated oscillator and power units |
| 08/31/1999 | US5946250 Memory testing apparatus |
| 08/31/1999 | US5946248 Method for burn-in operation on a wafer of memory devices |
| 08/31/1999 | US5946247 Semiconductor memory testing device |
| 08/31/1999 | US5946245 Memory array test circuit and method |
| 08/31/1999 | US5946179 Electronically controlled circuit breaker with integrated latch tripping |
| 08/31/1999 | US5946174 Process for detecting a ground fault in an electric power transmission line |
| 08/31/1999 | US5945853 Current sensing circuit with automatic offset compensation |
| 08/31/1999 | US5945839 Method and apparatus for measurement of current-voltage characteristic curves of solar panels |
| 08/31/1999 | US5945837 Interface structure for an integrated circuit device tester |
| 08/31/1999 | US5945836 Loaded-board, guided-probe test fixture |
| 08/31/1999 | US5945834 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method |
| 08/31/1999 | US5945833 Method for testing semiconductor devices which measures internal potential distribution, internal electric field, and internal doping profile |
| 08/31/1999 | US5945829 Midpoint battery monitoring |
| 08/31/1999 | US5945823 Pin electronics card having ringing preventive circuit for removing noise in an electronics transmission path of a semiconductor testing apparatus |
| 08/31/1999 | US5945822 Programmable load circuit |
| 08/31/1999 | US5945808 Hybrid electric vehicle with battery management |
| 08/31/1999 | US5945805 Cell evaluating method and cell evaluating apparatus |
| 08/31/1999 | US5945802 Ground fault detection and protection method for a variable speed ac electric motor |
| 08/31/1999 | US5945797 Motor controller having dead ended winding detection capability on all windings |
| 08/31/1999 | US5945229 Pattern recognition monitoring of PEM fuel cell |
| 08/31/1999 | US5944847 Method and system for identifying failure point |
| 08/31/1999 | US5944846 Method and apparatus for selectively testing identical pins of a plurality of electronic components |
| 08/31/1999 | US5944845 Circuit and method to prevent inadvertent test mode entry |
| 08/26/1999 | WO1999043066A1 Zone arc fault detection |
| 08/26/1999 | WO1999043004A1 Circuit and method for testing a digital semi-conductor circuit |
| 08/26/1999 | WO1999042851A1 Structure of test fixture interface |
| 08/26/1999 | WO1999042850A1 Method and device for testing printed circuit boards |
| 08/26/1999 | WO1999042849A1 Device for testing the electromagnetic compatibility of systems having large dimensions |
| 08/26/1999 | WO1999042845A1 Method and apparatus for monitoring ac circuits |
| 08/26/1999 | DE19818777A1 Contact device for test needle card, for testing logic devices and memory chips |
| 08/26/1999 | CA2503472A1 Electrical fault detection system |
| 08/25/1999 | EP0937992A1 Procedure and system for monitoring the state of charge of a motor vehicle |
| 08/25/1999 | EP0937991A2 System and method for determining the delay makeup of a circuit |
| 08/25/1999 | EP0937990A2 System and method for compressing and analyzing time-resolved optical data obtained from operating integrated circuits |
| 08/25/1999 | EP0937989A2 Using time resolved light emission from VLSI circuit devices for navigation on complex systems |
| 08/25/1999 | EP0937986A2 Single cable, single point, stimulus and response probing system and method |
| 08/25/1999 | EP0937541A2 Probe end cleaning sheet |
| 08/25/1999 | EP0937312A1 Antenna adapter |
| 08/25/1999 | EP0817975B1 Process and circuit for monitoring a data processing circuit |
| 08/25/1999 | CN2335150Y Tester for electric circuit board property |
| 08/25/1999 | CN2335149Y Power transformer terminal and polarity tester |
| 08/25/1999 | CN1226758A Testing IC socket |
| 08/25/1999 | CN1226683A Real time monitering and displaying system for current of brushless magnet excited generator rotor |
| 08/25/1999 | CN1044835C Control system and device for contactor apparatus |
| 08/24/1999 | US5943551 Apparatus and method for detecting defects on silicon dies on a silicon wafer |
| 08/24/1999 | US5943490 Distributed logic analyzer for use in a hardware logic emulation system |
| 08/24/1999 | US5943485 Method for testing and for generating a mapping for an electronic device |
| 08/24/1999 | US5943346 Fault point estimating system using abnormal current and potential contrast images |
| 08/24/1999 | US5943277 Apparatus and method for recognizing the state of connection of terminals |
| 08/24/1999 | US5943237 Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
| 08/24/1999 | US5942982 System for detecting open circuits with a measurement device |
| 08/24/1999 | US5942981 Low battery detector for a wireless sensor |
| 08/24/1999 | US5942922 Inhibitable, continuously-terminated differential drive circuit for an integrated circuit tester |