| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/21/1999 | US5955869 Battery pack and a method for monitoring remaining capacity of a battery pack |
| 09/21/1999 | US5955868 Battery charging apparatus having battery attachment sections for charging batteries at different rates or timing |
| 09/21/1999 | US5955866 Car battery charger/tester |
| 09/21/1999 | US5955865 Control system for a vehicle-mounted battery |
| 09/21/1999 | US5955860 Method of determining electrical angle and apparatus for the same |
| 09/21/1999 | US5954832 Method and system for performing non-standard insitu burn-in testings |
| 09/21/1999 | US5954831 Method for testing a memory device |
| 09/21/1999 | US5954824 Test mode matrix circuit for an embedded microprocessor core |
| 09/21/1999 | US5954205 Circuit board handling and testing apparatus |
| 09/21/1999 | US5953812 To remove parts from a tray carrying a plurality of parts |
| 09/21/1999 | CA2049591C Direction indicating fault indicator |
| 09/16/1999 | WO1999046778A2 High speed memory test system with intermediate storage buffer and method of testing |
| 09/16/1999 | WO1999046609A1 Fault location in a medium-voltage network |
| 09/16/1999 | WO1999021021A3 Semiconductor material characterizing method and apparatus |
| 09/16/1999 | DE19908858A1 CMOS-Bildsensor mit Prüfschaltung für das Verifizieren seiner Funktion CMOS image sensor test circuit for verifying its function |
| 09/16/1999 | DE19900974A1 Critical path searching for large scale integration circuits using semiconductor device |
| 09/16/1999 | DE19854697A1 Automated test method for integrated circuits on wafer |
| 09/16/1999 | DE19807905A1 Circuit for testing logic circuit networks on single module |
| 09/16/1999 | DE19804171A1 Tracking method of faulty integrated circuits on surface mounted devices using flying probe test arrangement |
| 09/16/1999 | DE19732113C2 Vorrichtung zur Erfassung von Platinenverdrahtungsfehlern The device for detecting errors board wiring |
| 09/16/1999 | CA2347549A1 High speed memory test system with intermediate storage buffer and method of testing |
| 09/15/1999 | EP0942466A1 Process for manufacturing semiconductor device and semiconductor component |
| 09/15/1999 | EP0942292A2 Method of and apparatus for detecting cable oversheath faults and installations in which they are used |
| 09/15/1999 | EP0942291A2 Measuring device of the capacitance of electrical conductors |
| 09/15/1999 | EP0942288A2 Method and apparatus for assigning pins for electrical testing of printed circuit boards |
| 09/15/1999 | EP0941481A1 Measuring instrument for a loaded dc/dc converter |
| 09/15/1999 | EP0941480A1 Measurement instrument amplitude calibration |
| 09/15/1999 | EP0758454B1 Test system for equipped and unequipped printed circuit boards |
| 09/15/1999 | EP0753138A4 Optical corona monitoring system |
| 09/15/1999 | CN2338753Y Digital and multi-function type instrument for testing accumulators |
| 09/15/1999 | CN1228645A Remaining battery capacity display device |
| 09/15/1999 | CN1228540A Monitoring technique for accurately determining residual capacity of battery |
| 09/15/1999 | CN1228539A Method of generating test pattern for integrated circuit |
| 09/14/1999 | US5953684 Methods and apparatus for integrated storage of test environment context information |
| 09/14/1999 | US5953579 In-line test of contact opening of semiconductor device |
| 09/14/1999 | US5953306 Micro needle probe apparatus having probes cantilevered over respective electronic circuits, moving medium memory device including same and method of making same |
| 09/14/1999 | US5953273 Semiconductor integrated circuit device having confirmable self-diagnostic function |
| 09/14/1999 | US5953272 Data invert jump instruction test for built-in self-test |
| 09/14/1999 | US5953086 Liquid crystal display device with protection circuit for electrostatic break down |
| 09/14/1999 | US5952931 Checker box of wrist-strap monitoring |
| 09/14/1999 | US5952852 Fast wide decode in an FPGA using probe circuit |
| 09/14/1999 | US5952844 Apparatus for testing semiconductor IC (integrated circuit) |
| 09/14/1999 | US5952842 Test head cooling system |
| 09/14/1999 | US5952841 Bare chip prober device |
| 09/14/1999 | US5952840 Apparatus for testing semiconductor wafers |
| 09/14/1999 | US5952839 Method and apparatus for a pin-configurable integrated circuit tester board |
| 09/14/1999 | US5952838 For testing portions of a semiconductor device |
| 09/14/1999 | US5952837 Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen |
| 09/14/1999 | US5952836 In a rotor strap of a helicopter |
| 09/14/1999 | US5952833 Programmable voltage divider and method for testing the impedance of a programmable element |
| 09/14/1999 | US5952832 Diagnostic circuit and method for predicting fluorescent lamp failure by monitoring filament currents |
| 09/14/1999 | US5952821 Load circuit for integrated circuit tester |
| 09/14/1999 | US5952803 Structural enclosure for machine sensors |
| 09/14/1999 | US5952674 Topography monitor |
| 09/14/1999 | US5952565 Device for checking the function of an electronically controlled regulating system in a motor vehicle following a manufacturing process |
| 09/14/1999 | US5951720 IC mounting/demounting system and mounting/demounting head therefor |
| 09/14/1999 | US5951705 Integrated circuit tester having pattern generator controlled data bus |
| 09/14/1999 | US5951704 Test system emulator |
| 09/14/1999 | US5951703 System and method for performing improved pseudo-random testing of systems having multi driver buses |
| 09/10/1999 | WO1999045667A1 Method and apparatus for combined stuck-at fault and partial-scanned delay-fault built-in self test |
| 09/10/1999 | WO1999045404A1 Method of and apparatus for estimating the charge in a battery |
| 09/10/1999 | WO1999045403A1 Ic test apparatus |
| 09/10/1999 | WO1999045400A1 Coaxial probe interface for automatic test equipment |
| 09/10/1999 | WO1999028755A9 Electronic circuits for detecting the earthing system and for testing the efficiency of residual current circuit-breakers connected to phase, neutral and earth of electrical users |
| 09/09/1999 | DE19908456A1 Power consumption estimation method for large scale integrated circuit e.g. for LSI chip design |
| 09/09/1999 | DE19855488A1 Test pattern generation method for automatic test equipment for integrated circuit testing device |
| 09/09/1999 | DE19851812A1 Adjusting setup equipment under test for electromagnetic compatibility testing |
| 09/09/1999 | DE19811576C1 Connection test device for testing electric connections between chips or chip modules |
| 09/09/1999 | DE19808516A1 Unterfüllmaterial für Flip-Chip-bestückte Leiterplatten, damit ausgerüstete Leiterplatte sowie Verfahren zur Füllgradüberprüfung von damit unterfüllten Chips Underfill material for flip-chip assembled printed circuit boards, printed circuit board equipped therewith, and methods for Füllgradüberprüfung of so underfilled chips |
| 09/09/1999 | DE19806696A1 EMV-Prüfeinrichtung für große räumlich ausgedehnte Systeme EMC test facility for large spatially extended systems |
| 09/09/1999 | DE19601862C2 Vorrichtung und Verfahren zur Entdeckung von fehlerhaften Logikteilschaltungen mittels eines anomalen Ruheversorgungsstroms Apparatus and method for detection of faulty logic subcircuits by an abnormal resting supply current |
| 09/08/1999 | EP0940901A2 Control system, method of protectively controlling electric power system and storage medium storing program code |
| 09/08/1999 | EP0940683A2 Printed circuit board testing system with page scanner |
| 09/08/1999 | EP0940309A2 Connection of a control circuit for an antitheft battery |
| 09/08/1999 | EP0940308A2 Connection of power supply to a control circuit for an antitheft battery |
| 09/08/1999 | EP0939997A1 Back-up battery management system for an uninterruptible dc power supply |
| 09/08/1999 | EP0939908A2 Combined laser/flir optics system |
| 09/08/1999 | EP0939903A1 Device and method for analysing faults on networks |
| 09/08/1999 | EP0791179B1 Method of locating a fault in a predetermined monitoring region of a multiphase electrical power transmission system |
| 09/08/1999 | EP0749628B1 Device for monitoring the operation safety of power switches (diagnosis apparatus) |
| 09/08/1999 | EP0745293B1 Optical time domain reflectometry |
| 09/08/1999 | CN2337568Y Apparatus for measuring dielectric loss anomalous frequency of high-voltage electric appliance |
| 09/08/1999 | CN2337567Y Electric appliance line testing and repairing instrument for vehicle |
| 09/08/1999 | CN1228161A Cable fault monitoring system |
| 09/08/1999 | CN1228160A Probe card |
| 09/08/1999 | CN1227923A Circuit board for testing semiconductor device |
| 09/08/1999 | CN1227760A Automatic ground wire testing method of electrostatic potential loading device for treating |
| 09/08/1999 | CN1227759A Wire breaking arc testing circuit for physiotherapeutic apparatus |
| 09/07/1999 | USRE36292 Operational analysis device of the scan path type having a single scanning clock and a single output phase for an integrated circuit |
| 09/07/1999 | US5950181 Apparatus and method for detecting and assessing a spatially discrete dot pattern |
| 09/07/1999 | US5950149 Method for testing vehicle electrical system during manufacturing |
| 09/07/1999 | US5950148 Apparatus and method for maintaining and controlling electronic apparatus provided with communication function |
| 09/07/1999 | US5950145 Low voltage test mode operation enable scheme with hardware safeguard |
| 09/07/1999 | US5950144 Method for data transfer in vehicle electrical test system |
| 09/07/1999 | US5949987 Efficient in-system programming structure and method for non-volatile programmable logic devices |
| 09/07/1999 | US5949986 Chip connectivity verification program |
| 09/07/1999 | US5949900 Fine pattern inspection device capable of carrying out inspection without pattern recognition |
| 09/07/1999 | US5949798 Integrated circuit fault testing system based on power spectrum analysis of power supply current |
| 09/07/1999 | US5949797 Microcontroller test circuit |
| 09/07/1999 | US5949731 Semiconductor memory device having burn-in mode operation stably accelerated |