| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/07/2000 | US6035430 Semiconductor integrated circuit device with restoring circuit |
| 03/07/2000 | US6035421 System for testing a computer built into a control device |
| 03/07/2000 | US6035265 System to provide low cost excitation to stator winding to generate impedance spectrum for use in stator diagnostics |
| 03/07/2000 | US6035262 Real time observation serial scan test architecture |
| 03/07/2000 | US6035114 Method for constructing fault classification tables of analog circuits |
| 03/07/2000 | US6035112 Cell library generating method and apparatus |
| 03/07/2000 | US6034948 System for testing repeating installation |
| 03/07/2000 | US6034907 Semiconductor integrated circuit device with built-in test circuit for applying stress to timing generator in burn-in test |
| 03/07/2000 | US6034906 High and negative voltage compare |
| 03/07/2000 | US6034905 Apparatus for testing semiconductor memory device |
| 03/07/2000 | US6034904 Semiconductor memory device having selection circuit for arbitrarily setting a word line to selected state at high speed in test mode |
| 03/07/2000 | US6034612 Circuitry and process for testing non-intermittent signal generators |
| 03/07/2000 | US6034611 Electrical isolation device |
| 03/07/2000 | US6034592 Process for producing signals identifying faulty loops in a polyphase electrical power supply network |
| 03/07/2000 | US6034535 Method utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor material |
| 03/07/2000 | US6034531 Monitoring of the wear of sliding electrical contacts and its application to the state-dependent and/or predictive maintenance of a device having sliding electrical contacts |
| 03/07/2000 | US6034530 Apparatus and method for measuring a movable electric charge induced in a conductive member |
| 03/07/2000 | US6034527 Method and measuring apparatus for a contactless longitudinal and transversal homogeneity examination of critical current density in superconductor tape |
| 03/07/2000 | US6034524 Apparatus and method for testing flexible circuit substrates |
| 03/07/2000 | US6034509 Battery-powered electrical device with improved calculation of discharge termination |
| 03/07/2000 | US6033798 Method for predicting discharge capacity and operating voltage of lithium rechargeable battery using lithium manganese spinel cathode material |
| 03/07/2000 | US6033235 Socket apparatus particularly adapted for BGA type semiconductor devices |
| 03/07/2000 | US6033233 Electrical connecting device, and semiconductor device testing method |
| 03/07/2000 | US6032724 Temperature control apparatus for sample susceptor |
| 03/07/2000 | US6032356 Wafer-level test and burn-in, and semiconductor process |
| 03/02/2000 | WO2000011920A1 Printed circuit plate used for testing electric components |
| 03/02/2000 | WO2000011678A1 Memory supervision |
| 03/02/2000 | WO2000011676A1 An embedded dram architecture with local data drivers and programmable number of data read and data write lines |
| 03/02/2000 | WO2000011674A1 Method and apparatus for built-in self test of integrated circuits |
| 03/02/2000 | WO2000011566A1 Automatic generation of user definable memory bist circuitry |
| 03/02/2000 | WO2000011488A1 An apparatus for performing electrical and environmental tests on electronic semiconductor devices |
| 03/02/2000 | WO2000011487A1 Equipment for performing electrical and environmental tests on semiconductor electronic devices |
| 03/02/2000 | WO2000011486A1 Semiconductor integrated circuit |
| 03/02/2000 | WO2000011485A1 Test device for testing a module for a data carrier intended for contactless communication |
| 03/02/2000 | WO2000011484A1 Thermographic wiring inspection |
| 03/02/2000 | WO2000011483A1 Method and apparatus for electromagnetic emissions testing |
| 03/02/2000 | WO2000011454A1 Inspection of printed circuit boards using color |
| 03/02/2000 | DE19940633A1 IC-Gehäuse IC package |
| 03/02/2000 | DE19837933A1 Earth connection detection method for multi-phase supply network e.g. for polysilicon production plant, compares phase angle of current or voltage at transformer star node with phase angle of supply current or voltage phases |
| 03/02/2000 | DE19834976A1 Integrierte Schaltung mit eingebautem Baugruppentest Integrated circuit with built-in module test |
| 03/02/2000 | DE19828656A1 Integrated circuit design layout |
| 03/02/2000 | DE19824157C1 Verfahren zur Ermittlung der Position einer defekten Schirmung eines Koaxialkabels oder Steckverbinders in einem Koaxialkabelnetz Method for determining the position of a defective shield of a coaxial cable or connector in a coaxial cable |
| 03/01/2000 | EP0982594A1 Method and apparatus for electromagnetic emissions testing |
| 03/01/2000 | EP0981758A1 Battery monitoring in metering systems |
| 03/01/2000 | EP0981757A4 Wrist strap test mode circuitry |
| 03/01/2000 | EP0981757A1 Wrist strap test mode circuitry |
| 03/01/2000 | EP0965148A4 Apparatus for detecting cell reversal in rechargeable batteries |
| 03/01/2000 | EP0909421B1 Computer-assisted process for determining a system consistency function |
| 03/01/2000 | CN2366858Y Multi-functional radio testing and reparing instrument |
| 03/01/2000 | CN1246215A Power supply monitoring IC and battery pack |
| 03/01/2000 | CN1246214A Power supply monitoring integrated circuit device and battery pack |
| 03/01/2000 | CN1246180A Infrared screening and inspection system |
| 03/01/2000 | CN1245901A Sealed lead-acid battery detection method |
| 03/01/2000 | CN1245900A Current integrating value detection device and current detection device and battery adopting them |
| 03/01/2000 | CN1245899A Test method of electronic element and its testing equipment |
| 03/01/2000 | CN1245898A Diagnosis method of earth screen corrosion and breakpoint of electric substation and its measurement and diagnosis system |
| 03/01/2000 | CN1049855C Accessories indexing mechanism |
| 02/29/2000 | US6032282 Timing edge forming circuit for IC test system |
| 02/29/2000 | US6032281 Test pattern generator for memories having a block write function |
| 02/29/2000 | US6032279 Boundary scan system with address dependent instructions |
| 02/29/2000 | US6032278 Method and apparatus for performing scan testing |
| 02/29/2000 | US6032275 Test pattern generator |
| 02/29/2000 | US6032268 Processor condition sensing circuits, systems and methods |
| 02/29/2000 | US6032107 Calibrating test equipment |
| 02/29/2000 | US6032088 Method for checking vehicle component systems in motor vehicles |
| 02/29/2000 | US6031985 Method, apparatus and system for analyzing failure of measured device |
| 02/29/2000 | US6031777 Fast on-chip current measurement circuit and method for use with memory array circuits |
| 02/29/2000 | US6031700 Ground detector for a static grounding system |
| 02/29/2000 | US6031486 Method and apparatus for integration and testing of satellites |
| 02/29/2000 | US6031387 Semiconductor test system with integrated test head manipulator and device handler |
| 02/29/2000 | US6031386 Apparatus and method for defect testing of integrated circuits |
| 02/29/2000 | US6031385 Method and apparatus for testing compensated buffer circuits |
| 02/29/2000 | US6031384 IC testing method and apparatus |
| 02/29/2000 | US6031383 Probe station for low current, low voltage parametric measurements using multiple probes |
| 02/29/2000 | US6031382 Functional tester for integrated circuits |
| 02/29/2000 | US6031370 Semiconductor testing apparatus |
| 02/29/2000 | US6031360 Regulator for a polyphase alternator for a motor vehicle |
| 02/29/2000 | US6031354 On-line battery management and monitoring system and method |
| 02/29/2000 | US6031282 High performance integrated circuit chip package |
| 02/29/2000 | US6031246 Method of producing semiconductor devices and method of evaluating the same |
| 02/29/2000 | US6030254 Edge connector interposing probe |
| 02/29/2000 | US6029344 Composite interconnection element for microelectronic components, and method of making same |
| 02/29/2000 | CA2019216C Apparatus for impact testing for electric generator stator wedge tightness |
| 02/24/2000 | WO2000010219A1 Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 02/24/2000 | WO2000010021A1 Method and fixture for evaluating stator core quality in production |
| 02/24/2000 | WO2000010020A1 Method for measuring two-dimensional potential distribution in cmos semiconductor components |
| 02/24/2000 | WO2000009993A1 Device for inspecting printed boards |
| 02/24/2000 | WO2000009992A2 Device for measuring work pieces using an image processing system |
| 02/24/2000 | DE19939068A1 Method to test groups of electronic structural elements; involves using response output signal following input of test signal in integrated circuit to be tested with common test signal entered in electronic structural elements of group |
| 02/24/2000 | DE19937232A1 Development and evaluation system for integrated semiconductor circuits containing region for electronic development automization for developing large scale integration |
| 02/24/2000 | DE19933792A1 Memory test unit for applying preset test pattern signal to semiconductor memory; has sections to produce two time control pulses and two nonreturn to zero waveforms |
| 02/24/2000 | DE19930273A1 High speed system to evaluate patterns under test; has large scale integration test unit simulator to produce test pattern and compares desired pattern suitable for testing specimen with output signal of specimen triggered by test pattern |
| 02/24/2000 | DE19837796A1 Verfahren zur Ermittlung des Pumpenzustandes Method for determining the pump condition |
| 02/24/2000 | DE19837169A1 Method for testing printed and unprinted circuit board assemblies aligning a focused, high-frequency electromagnetic transmission beam to irradiate a component to be tested and produce a spectral measuring signal. |
| 02/24/2000 | DE19836734A1 Verfahren zur Funktionsprüfung eines Zündkreises eines Insassenschutzsystems sowie Prüfschaltung Method for testing the function of an ignition circuit of an occupant protection system and the test circuit |
| 02/24/2000 | DE19836588A1 Method for testing quality of cast conducting structures |
| 02/24/2000 | DE19831088A1 Schaltungsanordnung zur Überprüfung einer Tri-State-Erkennungsschaltung A circuit arrangement for checking a tri-state detection circuit |
| 02/24/2000 | CA2340207A1 Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 02/24/2000 | CA2305419A1 Method and fixture for evaluating stator core quality in production |
| 02/23/2000 | EP0981193A2 Apparatus sensitive to arc amplitude for envelope detection of low current arcs |