| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 07/13/1999 | US5923148 On-line battery monitoring system with defective cell detection capability |
| 07/13/1999 | US5923130 Repetitive and constant energy impulse current generator |
| 07/13/1999 | US5923098 Driver board having stored calibration data |
| 07/13/1999 | US5923097 Integrated circuit |
| 07/13/1999 | US5923086 Apparatus for cooling a semiconductor die |
| 07/13/1999 | US5923048 Semiconductor integrated circuit device with test element |
| 07/13/1999 | US5923047 Semiconductor die having sacrificial bond pads for die test |
| 07/13/1999 | US5923041 Overlay target and measurement procedure to enable self-correction for wafer-induced tool-induced shift by imaging sensor means |
| 07/13/1999 | US5922079 Automated analysis of a model based diagnostic system |
| 07/13/1999 | US5921786 Flexible shielded laminated beam for electrical contacts and the like and method of contact operation |
| 07/13/1999 | CA2174784C Automatic multi-probe pwb tester |
| 07/13/1999 | CA2174709C Electrostatic capacity measuring instrument for stator winding of electric rotating machine |
| 07/13/1999 | CA2162654C Method and apparatus for determining and selectively displaying valid measurement information |
| 07/13/1999 | CA2108915C A system and method for automatic optical inspection |
| 07/08/1999 | WO1999034386A1 Fiber-optics based micro-photoluminescence system |
| 07/08/1999 | WO1999034227A1 Device and method for testing an electronic chip sensitive element |
| 07/08/1999 | WO1999034226A1 Leakage current correction circuit |
| 07/08/1999 | WO1999034225A1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 07/08/1999 | WO1999034224A1 Electrical parameter monitoring system |
| 07/08/1999 | WO1999034174A1 Electrode integrity checking |
| 07/08/1999 | WO1999034159A1 Temperature control system for a workpiece chuck |
| 07/08/1999 | DE19757823A1 Plug connector testing equipment |
| 07/08/1999 | CA2315678A1 Electrical parameter monitoring system |
| 07/07/1999 | EP0927981A2 Arrangement for data and/or energy transmission with separation unit |
| 07/07/1999 | EP0927888A1 Automatically adapting forward or reversed biased photodiode detection circuit |
| 07/07/1999 | EP0927422A1 Method and apparatus for providing external access to internal integrated circuit test circuits |
| 07/07/1999 | EP0927359A1 Circuit to measure resistance and leakage |
| 07/07/1999 | EP0927358A1 Impulse voltage generator circuit |
| 07/07/1999 | EP0927356A1 Method of checking electrical components and device for carrying out this method |
| 07/07/1999 | EP0791167B1 Method and device for quantitatively determining the setting of an alternator |
| 07/07/1999 | CN2328019Y Monitor for commutator sparks |
| 07/07/1999 | CN2328018Y Instrument for positioning bonding iron for electric circuits of vehicle |
| 07/07/1999 | CN1222001A Equipment power supply system and evaluation method to service life and accumulation capacity of accumulating device |
| 07/07/1999 | CN1221883A Automatically adapting forward or reversed biased photodiode detection circuit |
| 07/06/1999 | US5920830 Methods and apparatus for generating test vectors and validating ASIC designs |
| 07/06/1999 | US5920765 IC wafer-probe testable flip-chip architecture |
| 07/06/1999 | US5920608 Measurement device for communication |
| 07/06/1999 | US5920575 VLSI test circuit apparatus and method |
| 07/06/1999 | US5920574 Method for accelerated test of semiconductor devices |
| 07/06/1999 | US5920490 Integrated circuit test stimulus verification and vector extraction system |
| 07/06/1999 | US5920201 Circuit for testing pumped voltage gates in a programmable gate array |
| 07/06/1999 | US5920192 Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function |
| 07/06/1999 | US5920064 Multi-channel electromagnetically transparent voltage waveform monitor link |
| 07/06/1999 | US5919270 Programmable formatter circuit for integrated circuit tester |
| 07/06/1999 | US5919024 Parts handling apparatus |
| 07/06/1999 | US5918665 Method of thermal coupling an electronic device to a heat exchange member while said electronic device is being tested |
| 07/01/1999 | WO1999033109A1 Bga connector with heat activated connection and disconnection means |
| 07/01/1999 | WO1999032975A1 Process for repairing integrated circuits |
| 07/01/1999 | WO1999032895A1 Apparatus and method for testing a device |
| 07/01/1999 | WO1999032894A1 Location of fault on series-compensated power transmission lines |
| 07/01/1999 | WO1999032893A1 Wireless test apparatus for integrated circuit die |
| 07/01/1999 | DE19857689A1 Voltage application current measuring circuit for integrated circuit tester |
| 07/01/1999 | DE19831766A1 Semiconductor memory with a test mode |
| 07/01/1999 | DE19758087A1 Method to identify partial discharge and monitor transformer to test insulation |
| 07/01/1999 | DE19758085A1 Digital generating of calibration pulses with superimposed current |
| 07/01/1999 | DE19757445A1 Automatic selector switch for use with measurement recording of data and signal lines |
| 07/01/1999 | DE19756955A1 Model assisted computing of three-phase asynchronous motor torque |
| 07/01/1999 | DE19756744A1 Operating battery management system e.g. for forklift trucks |
| 07/01/1999 | DE19755384A1 Überwachungssystem Monitoring system |
| 07/01/1999 | DE19606637C2 Integrierte Halbleiterschaltungsvorrichtung A semiconductor integrated circuit device |
| 07/01/1999 | CA2316314A1 Process for repairing integrated circuits |
| 06/30/1999 | EP0926930A2 Printed circuit board |
| 06/30/1999 | EP0926799A1 Power supply device |
| 06/30/1999 | EP0926794A1 Electronic device for modelling the temperature of a motor |
| 06/30/1999 | EP0926598A1 A field programmable gate array with integrated debugging facilities |
| 06/30/1999 | EP0926597A1 Method and apparatus for performing fully visible tracing of an emulation |
| 06/30/1999 | EP0926507A2 Method for displaying battery voltage in TDMA radio terminal |
| 06/30/1999 | EP0926506A2 Integrated circuit with latch up prevention during burn in testing |
| 06/30/1999 | EP0926505A1 A device with removable configuration boards for testing integrated circuits |
| 06/30/1999 | EP0926504A2 Surge locating system |
| 06/30/1999 | EP0926503A1 Poly-phase alternator regulator for an automobile |
| 06/30/1999 | EP0926338A1 Device for measuring the ionisation current in a combustion chamber |
| 06/30/1999 | EP0925513A1 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof |
| 06/30/1999 | EP0925509A1 Probe structure having a plurality of discrete insulated probe tips |
| 06/30/1999 | EP0642085B1 Sampling circuit |
| 06/30/1999 | EP0611036B1 Method for automatic open-circuit detection |
| 06/30/1999 | CN2326965Y Filter for generator falt discharge on-line monitoring |
| 06/30/1999 | CN2326964Y Voltage-loss current-cut-off recorder |
| 06/30/1999 | CN1221268A Radio terminal testing device and electrical wave environment testing apparatus for radio terminal testing device |
| 06/30/1999 | CN1221242A Circuit device and method for triggering overvoltage protection unit |
| 06/30/1999 | CN1221190A Semiconductor memory device having test mode |
| 06/30/1999 | CN1221112A Test and burn-in apparatus in-line system using apparatus, and test method using the system |
| 06/30/1999 | CN1043938C Power circuit and method capable of eliminating memory effect of cell |
| 06/30/1999 | CN1043928C Multi-bit test circuit of semiconductor memory device |
| 06/29/1999 | US5918274 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope |
| 06/29/1999 | US5918198 Generating pulses in analog channel of ATE tester |
| 06/29/1999 | US5918107 Method and system for fabricating and testing assemblies containing wire bonded semiconductor dice |
| 06/29/1999 | US5918003 For an integrated circuit |
| 06/29/1999 | US5917935 For detecting mura defects on a substrate for a flat panel display |
| 06/29/1999 | US5917909 System for testing the authenticity of a data carrier |
| 06/29/1999 | US5917834 Integrated circuit tester having multiple period generators |
| 06/29/1999 | US5917833 Testing apparatus for semiconductor device |
| 06/29/1999 | US5917765 Semiconductor memory device capable of burn in mode operation |
| 06/29/1999 | US5917750 Nonvolatile semiconductor memory with a protect circuit |
| 06/29/1999 | US5917707 Flexible contact structure with an electrically conductive shell |
| 06/29/1999 | US5917428 Integrated motor and diagnostic apparatus and method of operating same |
| 06/29/1999 | US5917334 Method and apparatus for decoupling a high-frequency error signal from a high-frequency electromagnetic field in a heavy electrical machine |
| 06/29/1999 | US5917333 Semiconductor integrated circuit device with diagnostic circuit using resistor |
| 06/29/1999 | US5917332 Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer |
| 06/29/1999 | US5917331 Integrated circuit test method and structure |