| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/07/1999 | US5999012 Method and apparatus for testing an electrically conductive substrate |
| 12/07/1999 | US5999011 Method of fast testing of hot carrier effects |
| 12/07/1999 | US5999008 Integrated circuit tester with compensation for leakage current |
| 12/07/1999 | US5999007 Burn-in apparatus outputting a precise, stable burn-in voltage |
| 12/07/1999 | US5999006 Method of and apparatus for conducting analysis of buried oxides |
| 12/07/1999 | US5999005 Voltage and displacement measuring apparatus and probe |
| 12/07/1999 | US5999003 Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification |
| 12/07/1999 | US5999002 Contact check for remote sensed measurement |
| 12/07/1999 | US5998984 Method and apparatus to test electric circuits |
| 12/07/1999 | US5998974 Charge/discharge control circuit and chargeable electric power source apparatus |
| 12/07/1999 | US5998971 Apparatus and method for coulometric metering of battery state of charge |
| 12/07/1999 | US5998970 Battery charging operation and a detection of a fully charged condition of the charged battery |
| 12/07/1999 | US5998958 Method for estimating resistance values of stator and rotor of induction motor |
| 12/07/1999 | US5998887 Battery test circuit for optical network and method of operation thereof |
| 12/07/1999 | US5998864 Stacking semiconductor devices, particularly memory chips |
| 12/07/1999 | US5998853 Methods and apparatus for electrical marking of integrated circuits to record manufacturing test results |
| 12/07/1999 | US5998751 Sorting system for computer chips |
| 12/07/1999 | US5998228 Method of testing semiconductor |
| 12/07/1999 | US5996996 Method of sorting computer chips |
| 12/07/1999 | US5996399 Method of using a test liquid for checking the efficiency of electrical power station components |
| 12/07/1999 | CA2038063C Monitoring system for step-type switching transformer |
| 12/02/1999 | WO1999062286A1 Gsm transceiver unit equipped for time of arrival measurements |
| 12/02/1999 | WO1999061929A1 Means for estimating charged state of battery and method for estimating degraded state of battery |
| 12/02/1999 | WO1999061927A1 Method for detecting the position of defective shielding of a coaxial cable or connector in a coaxial cable network |
| 12/02/1999 | WO1999049622A8 Method of forming information transmission channel, apparatus for forming information transmission channel, structure for forming information transmission channel, connector for forming information transmission channel, and connector tester |
| 12/02/1999 | DE19919157A1 Defect analysis apparatus for the inspection of an integrated circuit (IC) such as a dynamic random access memory (DRAM) |
| 12/02/1999 | DE19908521A1 Static compaction method for test vectors |
| 12/02/1999 | DE19849493C1 Method of detecting residual accumulator charge for electrically powered vehicle |
| 12/02/1999 | DE19833970A1 Rapid programming of memory component ICs by boundary scan chain |
| 12/02/1999 | DE19823943A1 Circuit arrangement for burn in system for testing chips using board |
| 12/02/1999 | CA2333520A1 Method for detecting the position of defective shielding of a coaxial cable or connector in a coaxial cable network |
| 12/01/1999 | EP0961383A1 Method and device for testing the capacity of a storage capacitor in a passenger safety system |
| 12/01/1999 | EP0961130A1 Method and apparatus for early detection of faulty rotors in asynchronous machines |
| 12/01/1999 | EP0961129A1 Test circuit with time-limited fault current for a protection device |
| 12/01/1999 | EP0961128A2 Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipment |
| 12/01/1999 | EP0961127A2 Adjustable fast press with PCB shuttle and modular expansion capabilities |
| 12/01/1999 | EP0961126A1 Monitoring of low currents through a low-side driven DMOS by modulating its internal resistance |
| 12/01/1999 | EP0961125A2 Device for identifying the phase relation of medium voltage cables |
| 12/01/1999 | EP0872070A4 Signal distribution system |
| 12/01/1999 | CN2351767Y Insulation resistance automatic display device for electric machine |
| 12/01/1999 | CN2351766Y Testing probe and guide wire coupling structure |
| 12/01/1999 | CN1237245A Tester for semiconductor devices and test tray used for the same |
| 12/01/1999 | CN1237032A Method for estimating resistance values of stator and rotor of induction motor |
| 12/01/1999 | CN1237024A Controlling system, protection controlling system for power system and storage medium for storing program |
| 12/01/1999 | CN1236894A Battery tester |
| 12/01/1999 | CA2233765A1 Device for identifying a telecommunications cable |
| 11/30/1999 | US5996102 Assembly and method for testing integrated circuit devices |
| 11/30/1999 | US5996101 Test pattern generating method and test pattern generating system |
| 11/30/1999 | US5996100 System and method for the injection and cancellation of a bias voltage in an attenuated circuit |
| 11/30/1999 | US5996099 Method and apparatus for automatically testing electronic components in parallel utilizing different timing signals for each electronic component |
| 11/30/1999 | US5996098 Memory tester |
| 11/30/1999 | US5996091 CPLD serial programming with extra read register |
| 11/30/1999 | US5995915 Method and apparatus for the functional verification of digital electronic systems |
| 11/30/1999 | US5995912 Database and method for measurement correction for cross-sectional carrier profiling techniques |
| 11/30/1999 | US5995744 Network configuration of programmable circuits |
| 11/30/1999 | US5995740 Method for capturing ASIC I/O pin data for tester compatibility analysis |
| 11/30/1999 | US5995647 Method of producing clear potential contrast image through scanning with electron beam for diagnosis of semiconductor device and electron beam testing system used therein |
| 11/30/1999 | US5995588 Tone location device for locating faults in a paired line |
| 11/30/1999 | US5995428 Circuit for burn-in operation on a wafer of memory devices |
| 11/30/1999 | US5995425 Design of provably correct storage arrays |
| 11/30/1999 | US5995424 Synchronous memory test system |
| 11/30/1999 | US5995348 Ground safety device for medical ultrasound probes |
| 11/30/1999 | US5995232 Method of and device for inspecting a PCB |
| 11/30/1999 | US5994915 Reduced terminal testing system |
| 11/30/1999 | US5994914 Semiconductor testing device with redundant circuits |
| 11/30/1999 | US5994912 Fault tolerant selection of die on wafer |
| 11/30/1999 | US5994910 Apparatus, and corresponding method, for stress testing wire bond-type semi-conductor chips |
| 11/30/1999 | US5994909 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
| 11/30/1999 | US5994905 Frequency domain reflectometer and method of suppressing harmonics |
| 11/30/1999 | US5994894 Testboard for IC tester |
| 11/30/1999 | US5994878 Method and apparatus for charging a rechargeable battery |
| 11/30/1999 | US5994877 Method for detecting working condition of non-aqueous electrolyte secondary batteries |
| 11/30/1999 | US5994876 Battery capacity measurement circuit |
| 11/30/1999 | US5994716 Integrated circuit and fabricating method and evaluating method of integrated circuit |
| 11/30/1999 | US5994715 Semiconductor device and method for discriminating bad semiconductor devices from good ones |
| 11/30/1999 | CA2146908C Contactless sheet resistant measurement method and apparatus |
| 11/25/1999 | WO1999060624A1 System for testing semiconductor device formed on semiconductor wafer |
| 11/25/1999 | WO1999060623A1 Aligner |
| 11/25/1999 | WO1999060417A1 Method for testing overhead power lines, measuring device and use of same |
| 11/25/1999 | WO1999059843A1 Method and device for checking an electric circuit, especially an ignition circuit of a motor vehicle occupant protection system |
| 11/25/1999 | DE19923243A1 Semiconductor test system for multiplex channel mode drive |
| 11/25/1999 | DE19921756A1 Memory tester with data-selecting circuit for packet system storage components |
| 11/25/1999 | DE19914776A1 Integrated circuit transfer mechanism for inspection purpose |
| 11/25/1999 | DE19825009C1 Semiconductor chip bond pad testing device |
| 11/25/1999 | DE19822808A1 Verfahren und Vorrichtung zur Erkennung und Überprüfung eines IT-Netzes Method and apparatus for the detection and verification of an IT network |
| 11/25/1999 | DE19822571A1 Battery monitoring arrangement during use by large users e.g. In hospitals |
| 11/25/1999 | DE19822000A1 Holder for testing IC wafer |
| 11/25/1999 | DE19819264A1 Verfahren zum Testen einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür A method for testing an integrated circuit device and integrated circuitry for this purpose |
| 11/24/1999 | EP0959362A1 Device for measuring a physical value related to the rotation of a body |
| 11/24/1999 | EP0959361A2 Method and apparaturs for the identification and monitoring of an IT-network |
| 11/24/1999 | EP0958984A1 Railway vehicle bogie |
| 11/24/1999 | EP0958632A1 Battery operating system |
| 11/24/1999 | EP0793862A4 Smart battery device |
| 11/24/1999 | CN2350775Y Test arrangement for testing integrated circuit |
| 11/24/1999 | CN2350774Y Distribution network failure detection probe |
| 11/24/1999 | CN1236185A Integrated circuit test socket |
| 11/24/1999 | CN1236108A DC brushless fan checking circuit |
| 11/24/1999 | CN1236091A Method of probing substrate |
| 11/24/1999 | CN1046830C Fiber optic cable monitoring system |
| 11/23/1999 | US5991909 Parallel decompressor and related methods and apparatuses |