Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1999
11/09/1999US5983137 Method and system for monitoring the condition of a battery pack in a defibrillator
11/09/1999US5983006 Method for analyzing and efficiently eliminating timing problems induced by cross-coupling between signals
11/09/1999US5982827 Means for virtual deskewing of high/intermediate/low DUT data
11/09/1999US5982815 Circuit for setting a device into a test mode by changing a first port to a fixed clock and a second port to a non-fixed clock
11/09/1999US5982685 Semiconductor device for test mode setup
11/09/1999US5982212 Delay difference adjustment circuit and phase adjuster
11/09/1999US5982190 Method to determine pixel condition on flat panel displays using an electron beam
11/09/1999US5982189 Built-in dynamic stress for integrated circuits
11/09/1999US5982188 Test mode control circuit of an integrated circuit device
11/09/1999US5982184 Test head for integrated circuits
11/09/1999US5982182 Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
11/09/1999US5982181 Insulated device diagnosing system for diagnosing device based upon partial discharge signal data analyzed by frequency
11/09/1999US5982166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control
11/09/1999US5982150 Charge/discharge control circuit and chargeable electric power source apparatus
11/09/1999US5982148 Method and apparatus for monitoring the self discharge of a secondary battery upon completion of a charge cycle
11/09/1999US5982147 System for displaying a status condition of a battery
11/09/1999US5981971 Semiconductor ROM wafer test structure, and IC card
11/09/1999US5981967 Method and apparatus for isolating defects in an integrated circuit near field scanning photon emission microscopy
11/09/1999US5980270 Soldering with resilient contacts
11/08/1999CA2271184A1 Integrated circuit device including scan-path testing function
11/04/1999WO1999056396A2 Testable ic having analog and digital circuits
11/04/1999WO1999056190A1 Temperature tracking voltage-to-current converter
11/04/1999WO1999056142A1 Method for generating a shmoo plot contour for integrated circuit tester
11/04/1999WO1999056141A1 A method and a device for functional test of a semiconductor valve
11/04/1999WO1999056140A1 Method and device for monitoring an electrode line of a bipolar high voltage direct current (hvdc) transmission system
11/04/1999WO1999056139A1 Apparatus for detecting trouble with solenoid-operated device
11/04/1999WO1999056137A1 Method and apparatus for testing interconnect networks
11/04/1999WO1999056136A1 Method and apparatus for testing interconnect networks using guided electric currents
11/04/1999WO1999056121A1 Electronic battery tester
11/04/1999WO1999047937A3 Flexible test environment for automatic test equipment
11/04/1999WO1999046778A3 High speed memory test system with intermediate storage buffer and method of testing
11/04/1999WO1999026330A3 Universal power supply
11/04/1999DE19918675A1 Integrated circuit with bus and several bus driver circuits
11/04/1999CA2329781A1 Method and apparatus for testing interconnect networks
11/03/1999EP0954083A2 Arrangement and method for controlling the power supply to a load
11/03/1999EP0953989A2 Static ram circuit for defect analysis
11/03/1999EP0953988A2 Integrated circuit having memory built-in self test (BIST) with programmable characteristics and method of operation
11/03/1999EP0953987A2 Synchronous semiconductor storage device
11/03/1999EP0953892A1 Method of providing clock signals to load circuits in an ASIC device
11/03/1999EP0953846A2 Electro-optic sampling oscilloscope
11/03/1999EP0953844A2 Time domain reflectometry tester for X-Y prober
11/03/1999EP0953154A1 Device and method for detecting conductor breaks in solar modules
11/03/1999EP0615252B1 Semiconductor memory with built-in parallel bit test mode
11/03/1999CN2347182Y Watt-hour meter wiring tester
11/03/1999CN1233886A Device with clock output circuit
11/03/1999CN1233850A Testing of semiconductor device and fabrication process of semiconductor device including testing process
11/03/1999CN1233756A Semiconductor device measuring socket capable of adjusting contact positions, and semiconductordevice mfg. method using the same
11/02/1999US5978949 Failure analysis device for IC tester and memory device measuring device for IC tester
11/02/1999US5978948 Semiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereof
11/02/1999US5978947 Built-in self-test in a plurality of stages controlled by a token passing network and method
11/02/1999US5978945 Tester arrangement comprising a connection module for testing, by way of the boundary scan test method, a carrier provided with a first number of digital ICS with BST logic and a second number of digital ICS without BST logic
11/02/1999US5978944 Method and apparatus for scan testing dynamic circuits
11/02/1999US5978943 Application specified integrated circuit with user programmable logic circuit
11/02/1999US5978942 STAR-I: scalable tester architecture with I-cached SIMD technology
11/02/1999US5978751 Variegated manufacturing process test method and apparatus
11/02/1999US5978727 Method and apparatus for engine analysis by waveform comparison
11/02/1999US5978449 Qualifying telephone line for digital transmission service
11/02/1999US5978294 Memory cell evaluation semiconductor device, method of fabricating the same and memory cell evaluation method
11/02/1999US5978292 Consumption current circuit and method for memory device
11/02/1999US5978218 Cooling system for IC tester
11/02/1999US5978197 Testing ESD protection schemes in semiconductor integrated circuits
11/02/1999US5977893 Method for testing charge redistribution type digital-to-analog and analog-to-digital converters
11/02/1999US5977879 Display device and an inspection circuit
11/02/1999US5977788 Elevated temperature measurement of the minority carrier lifetime in the depletion layer of a semiconductor wafer
11/02/1999US5977786 Adapter including solid body
11/02/1999US5977785 Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment
11/02/1999US5977784 Method of performing an operation on an integrated circuit
11/02/1999US5977776 Circuit board testing method
11/02/1999US5977775 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic equipment
11/02/1999US5977774 Method for detecting open circuits with a measurement device
11/02/1999US5977773 Non-intrusive impedance-based cable tester
11/02/1999US5977763 Circuit and method for measuring and forcing an internal voltage of an integrated circuit
11/02/1999US5977751 Battery monitoring unit having a sense FET circuit arrangement
11/02/1999US5977750 Battery diagnostic method and apparatus
11/02/1999US5977731 Power system stabilizer and power system stabilization method
11/02/1999US5976899 Reduced terminal testing system
11/02/1999US5976898 Localization of defects of a metallic layer of a semiconductor circuit
11/02/1999US5975915 Socket for inspection of semiconductor device
11/02/1999US5975757 Method and apparatus for providing surface images
11/02/1999US5974662 Method of planarizing tips of probe elements of a probe card assembly
10/1999
10/28/1999WO1999054839A1 Configuration control in a programmable logic device using non-volatile elements
10/28/1999WO1999054744A1 Battery measuring terminal
10/28/1999WO1999054743A1 Electrical circuit breaker locator with transmitter and receiver
10/28/1999WO1999054742A1 Layout, method and current measuring device for measuring a current in a conductor
10/28/1999WO1998041850A9 Probing with backside emission microscopy
10/28/1999DE19917085A1 Address decoder switch for external macros, providing test mode
10/28/1999DE19833208C1 Integrated circuit with built-in self-test device
10/28/1999DE19818290A1 Measuring arrangement for electromagnetic acceptability of domestic appliances
10/28/1999DE19818264A1 Motor vehicle airbag or seatbelt tensioner safety test equipment
10/28/1999DE19817940A1 Error signal generation method corresponding to leakage signal
10/28/1999DE19817336A1 Short circuit detector arrangement for static converter bridge
10/28/1999DE19625185C2 Präzisionstaktgeber Precision Clock
10/28/1999CA2295445A1 Configuration control in a programmable logic device using non-volatile elements
10/27/1999EP0952601A2 Protective switching device
10/27/1999EP0952456A2 Means for determining the integrated value of current flow, means for determining the value of current flow and a battery pack employing those means
10/27/1999EP0951732A2 Testing station for semiconductor wafers or wafer fragments
10/27/1999EP0878042B1 Metal-encased switchgear with partial discharge detection
10/27/1999EP0878041B1 Encased arrangement
10/27/1999EP0878040B1 Metal-encased switchgear
10/27/1999CN1233325A Model-based fault detection system for electric motors
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