| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/27/1999 | US5930149 For performing a static supply current test of a circuit |
| 07/27/1999 | US5929797 D/A converter control method for IC test apparatus |
| 07/27/1999 | US5929764 Battery powered electronic device for exchanging information with a battery mailbox |
| 07/27/1999 | US5929652 Apparatus for measuring minority carrier lifetimes in semiconductor materials |
| 07/27/1999 | US5929651 Semiconductor wafer test and burn-in |
| 07/27/1999 | US5929650 Method and apparatus for performing operative testing on an integrated circuit |
| 07/27/1999 | US5929647 Method and apparatus for testing semiconductor dice |
| 07/27/1999 | US5929645 Integrated circuit tester using ion beam |
| 07/27/1999 | US5929642 Method of locating a fault in a predetermined monitoring region of a multiphase electric power transmission system |
| 07/27/1999 | US5929628 Apparatus and method for performing amplitude calibration in an electronic circuit tester |
| 07/27/1999 | US5929626 System for measuring low current with contact making and breaking device |
| 07/27/1999 | US5929601 Battery management apparatus for portable electronic devices |
| 07/27/1999 | US5929459 Methods and apparatus for inspecting a workpiece with edge and co-planarity determination |
| 07/27/1999 | US5929340 Environmental test apparatus with ambient-positioned card support platform |
| 07/27/1999 | US5928374 Scanning device and method for hierarchically forming a scan path for a network |
| 07/27/1999 | US5927512 Method for sorting integrated circuit devices |
| 07/27/1999 | US5926951 Method of stacking electronic components |
| 07/27/1999 | CA2017630C Work station monitor |
| 07/22/1999 | WO1999037042A1 System and method for sharing a spare channel among two or more optical ring networks |
| 07/22/1999 | WO1999036794A1 Diagnosis of electrical consumers in a motor vehicle |
| 07/22/1999 | DE19901922A1 Loading and unloading mechanism for integrated circuit into or from holding socket |
| 07/22/1999 | DE19838857A1 Semiconductor arrangement for memory cell evaluation |
| 07/22/1999 | DE19826021A1 Semiconductor memory arrangement |
| 07/22/1999 | CA2318044A1 System and method for sharing a spare channel among two or more optical ring networks |
| 07/21/1999 | EP0930652A1 Portion of metallization of integrated circuit |
| 07/21/1999 | EP0930570A2 Interconnect testing through utilization of board topology data |
| 07/21/1999 | EP0929820A1 Modular, semiconductor reliability test system |
| 07/21/1999 | EP0929819A1 Membrane probing system with local contact scrub |
| 07/21/1999 | CN2329977Y Self-testing motor for stator and rotor friction |
| 07/21/1999 | CN1223404A Semiconductor integrated circuit |
| 07/21/1999 | CN1223378A Socket for tester of semiconductor chip property |
| 07/21/1999 | CN1223208A Electric vehicle |
| 07/21/1999 | CN1044285C Method and apparatus for detecting of remained quantity of electricity of battery used in electric vehicles |
| 07/20/1999 | US5926774 Test system for testing the quality of semiconductor parts and handling the collection of operation status data on the tester and handlers |
| 07/20/1999 | US5926688 Method of removing thin film layers of a semiconductor component |
| 07/20/1999 | US5926622 Method for verifying a system model |
| 07/20/1999 | US5926487 High performance registers for pulsed logic |
| 07/20/1999 | US5926486 Automated system for determining the dynamic thresholds of digital logic devices |
| 07/20/1999 | US5926424 Semiconductor memory device capable of performing internal test at high speed |
| 07/20/1999 | US5926423 Wafer burn-in circuit for a semiconductor memory device |
| 07/20/1999 | US5926420 Merged Memory and Logic (MML) integrated circuits including data path width reducing circuits and methods |
| 07/20/1999 | US5926036 Programmable logic array circuits comprising look up table implementation of fast carry adders and counters |
| 07/20/1999 | US5926030 Method of reducing a measuring time during an automatic measurement of integrated circuits |
| 07/20/1999 | US5926028 Probe card having separated upper and lower probe needle groups |
| 07/20/1999 | US5926027 Apparatus and method for testing a device |
| 07/20/1999 | US5926026 Male terminal inspecting tool of connector |
| 07/20/1999 | US5926019 System for evaluating the play back of magnetoresistive heads |
| 07/20/1999 | US5926008 Apparatus and method for determining the capacity of a nickel-cadmium battery |
| 07/20/1999 | US5925480 Thermochromic battery tester |
| 07/20/1999 | US5925479 Light transparent layer of amorphous silicon nitride and at least one layer of hydrophobic fluorocarbon polymer; prevents moisture from destroying the effectiveness of a cell condition tester on a battery |
| 07/20/1999 | US5925145 Integrated circuit tester with cached vector memories |
| 07/20/1999 | US5925144 Error correction code circuit that performs built-in self test |
| 07/20/1999 | US5925143 Scan-bypass architecture without additional external latches |
| 07/20/1999 | US5925141 Semiconductor memory device with data scramble circuit |
| 07/20/1999 | US5924183 Method of adapting a hand test socket for use in a workpress assembly |
| 07/20/1999 | CA2100253C Battery tester |
| 07/20/1999 | CA2039698C Microcomputer based electronic trip system for circuit breakers |
| 07/15/1999 | WO1999035757A1 Dual-mode radio communication device having function for selectively using analog or digital mode |
| 07/15/1999 | WO1999035719A1 Connector |
| 07/15/1999 | WO1999035547A2 Power contact for testing a power source |
| 07/15/1999 | WO1999035505A2 Method for removing accumulated solder from probe card probing features |
| 07/15/1999 | DE19900337A1 Difference signal transmission circuit |
| 07/15/1999 | DE19860597A1 Separation and rearrangement method for the static compression of test sequences for sequential circuits |
| 07/15/1999 | DE19836614A1 Semiconductor chip having corner connector pads for quality control |
| 07/15/1999 | DE19836557A1 Holder for manipulator for modular integrated circuit for use in quality control testing |
| 07/15/1999 | DE19740543C1 Integrated circuit test method |
| 07/14/1999 | EP0929094A2 Method and device for measuring the depth of a buried interface |
| 07/14/1999 | EP0928971A1 Automatically adapting forward or reversed biased photodiode detection circuit |
| 07/14/1999 | EP0928486A1 Device and method for testing integrated circuit dice in an integrated circuit module |
| 07/14/1999 | EP0928425A1 Test device for an electronic tripping device |
| 07/14/1999 | EP0928424A1 Automatic fault location in cabling systems |
| 07/14/1999 | EP0928422A1 Grid array package test contactor |
| 07/14/1999 | EP0859318B1 Optimized memory organization in a multi-channel computer architecture |
| 07/14/1999 | EP0781216B1 Electronic safety device for motor vehicle passengers |
| 07/14/1999 | EP0346404B2 Process for determining the energy content of an electrochemical storage battery |
| 07/14/1999 | CN2329012Y Isolated amplifier for monitoring DC power supply equipment |
| 07/14/1999 | CN2329011Y Automatic regulating and controlling load box |
| 07/14/1999 | CN2329010Y Address report device for line short curcuit accident |
| 07/14/1999 | CN1223013A Process for manufacturing semiconductor device and semiconductor component |
| 07/14/1999 | CN1222976A Reusable die carrier for burn-in and burn-in process |
| 07/14/1999 | CN1222695A Method of monitoring the functional capability of tap selector |
| 07/13/1999 | US5923867 Object oriented simulation modeling |
| 07/13/1999 | US5923836 Testing integrated circuit designs on a computer simulation using modified serialized scan patterns |
| 07/13/1999 | US5923677 Method and apparatus for detecting failures between circuits |
| 07/13/1999 | US5923676 Bist architecture for measurement of integrated circuit delays |
| 07/13/1999 | US5923675 Semiconductor tester for testing devices with embedded memory |
| 07/13/1999 | US5923674 Semiconductor electrically erasable and writeable non-volatile memory device |
| 07/13/1999 | US5923599 In a semiconductor memory unit |
| 07/13/1999 | US5923568 Distributed capacitance estimations of interconnects within integrated circuits |
| 07/13/1999 | US5923567 Method of making integrated circuits |
| 07/13/1999 | US5923565 Apparatus and method for extracting capacitance in the presence of two ground planes |
| 07/13/1999 | US5923512 Fault tolerant circuit arrangements |
| 07/13/1999 | US5923430 Method for characterizing defects on semiconductor wafers |
| 07/13/1999 | US5923191 Device and a method for monitoring a system clock signal |
| 07/13/1999 | US5923181 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module |
| 07/13/1999 | US5923180 Compliant wafer prober docking adapter |
| 07/13/1999 | US5923178 Probe assembly and method for switchable multi-DUT testing of integrated circuit wafers |
| 07/13/1999 | US5923177 Portable wedge probe for perusing signals on the pins of an IC |
| 07/13/1999 | US5923157 Semiconductor device capable of decreasing an internal voltage in period of acceleration test |
| 07/13/1999 | US5923149 Charging apparatus |