| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/23/2000 | EP0981134A2 Signal processing apparatus having non-volatile memory and programming method of the non-volatile memory |
| 02/23/2000 | EP0981056A2 Method for determining the condition of a pump |
| 02/23/2000 | EP0981055A2 Non-contact type wave signal observation apparatus |
| 02/23/2000 | EP0980530A1 Measurement of microwave radiation |
| 02/23/2000 | EP0980520A1 Process and circuitry for inspecting welding points |
| 02/23/2000 | EP0944840A4 Probe card for high speed testing |
| 02/23/2000 | CN2365746Y Induction voltage regulating integral apparatus for test |
| 02/23/2000 | CN2365678Y Light emitting diode detector |
| 02/23/2000 | CN1245632A PCB testing circuit for automatic inserting apparatus and testing method therefor |
| 02/23/2000 | CN1245609A Emergency telephone with automatic low-battery signaling |
| 02/23/2000 | CN1245360A Intelligent protector of accumulators for diesel locomotive |
| 02/23/2000 | CN1245294A Method for measuring the position of tapping switch for electric power transformer |
| 02/23/2000 | CN1049736C Numerical megger |
| 02/22/2000 | US6029263 Interconnect testing using non-compatible scan architectures |
| 02/22/2000 | US6029262 Graphical editor for defining memory test sequences |
| 02/22/2000 | US6029261 Test circuit and system for interconnect testing of high-level packages |
| 02/22/2000 | US6029117 coupled noise estimation method for on-chip interconnects |
| 02/22/2000 | US6028994 Method for predicting performance of microelectronic device based on electrical parameter test data using computer model |
| 02/22/2000 | US6028988 System for logic synthesis-for-testability capable of improving testability for an FSM having an asynchronous reset state |
| 02/22/2000 | US6028983 Apparatus and methods for testing a microprocessor chip using dedicated scan strings |
| 02/22/2000 | US6028952 System and method for compressing and analyzing time-resolved optical data obtained from operating integrated circuits |
| 02/22/2000 | US6028838 Navigation apparatus |
| 02/22/2000 | US6028808 Programmable logic array integrated circuits |
| 02/22/2000 | US6028798 Low voltage test mode operation enable scheme with hardware safeguard |
| 02/22/2000 | US6028662 Adjustment of particle beam landing angle |
| 02/22/2000 | US6028443 Test circuit for semiconductor integrated logic circuit using tristate buffers allowing control circuit for tristate to be tested |
| 02/22/2000 | US6028442 Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof |
| 02/22/2000 | US6028439 Modular integrated circuit tester with distributed synchronization and control |
| 02/22/2000 | US6028438 Current sense circuit |
| 02/22/2000 | US6028436 Method for forming coaxial silicon interconnects |
| 02/22/2000 | US6028435 Semiconductor device evaluation system using optical fiber |
| 02/22/2000 | US6028434 Method and apparatus for detecting emitted radiation from interrupted electrons |
| 02/22/2000 | US6028431 On-board wiring fault detection device |
| 02/22/2000 | US6028430 Method for monitoring a capacitor bushing, and monitoring system |
| 02/22/2000 | US6028423 Isolation instrument for electrical testing |
| 02/22/2000 | US6028408 Control device for a windshield wiper motor |
| 02/22/2000 | US6028301 Method for controlling a micro electro-mechanical systems and verifying the state thereof using light |
| 02/22/2000 | US6027365 Test card receptacle and header |
| 02/22/2000 | US6027301 Semiconductor wafer testing apparatus with a combined wafer alignment/wafer recognition station |
| 02/22/2000 | CA2161257C Method and apparatus for testing telecommunications equipment using a reduced redundancy test signal |
| 02/22/2000 | CA2156697C Automotive diagnostic communications |
| 02/22/2000 | CA2030070C Continuous monitoring system of the electrical conduction of a mains system |
| 02/19/2000 | CA2242497A1 Method and apparatus for the continuous performance monitoring of a lead acid battery system |
| 02/17/2000 | WO2000008834A1 Method of and system for actuating faults |
| 02/17/2000 | WO2000008479A1 Integrated circuit with an integrated module test |
| 02/17/2000 | WO2000008478A1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 02/17/2000 | DE19937326A1 Device for precise measurement of workpieces, especially to position computer chips in chip sockets, using image processing device; has carrier with associated reference points that are stored in memory |
| 02/17/2000 | DE19937320A1 Integrated circuit structural element; has externally accessible signal line at capsule containing integrated circuit chip connected to signal line with operating mode selective signal production circuit for operating mode control signal |
| 02/17/2000 | DE19849526C1 Individual cable wire testing device, e.g. for electrical wiring harness in automobile; has each wire held between contact tongues projecting through slit in base plate upon relative displacement of counter plate |
| 02/17/2000 | DE19837490A1 Method to measure two-dimensional potential distribution in CMOS semiconductor element and determine two-dimensional doping distribution, uses electron holography to measure phase of electron wave in transmission electron microscope |
| 02/17/2000 | DE19835731A1 Method to indicate direction of earth short circuit current; involves comparing phase angle of this current with voltage using transmitter with annular iron yoke to transmit true angle 50 Hz signal of earth short circuit current |
| 02/17/2000 | DE19834740A1 Battery with insulated housing for use in vehicle |
| 02/16/2000 | EP0980142A2 Method and arrangement for determining state information of power semiconductor |
| 02/16/2000 | EP0980131A2 Method and apparatus for monitoring of at least one switchable battery-set for the emergency supply of electrical and/or electronic consumers |
| 02/16/2000 | EP0980007A1 Transmitter battery life indication apparatus and method |
| 02/16/2000 | EP0980006A2 Locating a short circuit in a mains electricity line |
| 02/16/2000 | EP0980005A1 Method and circuit for functional testing of an ignition circuit from a passenger safety system |
| 02/16/2000 | EP0979418A2 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
| 02/16/2000 | EP0979417A1 Single pass doublet mode intergrated circuit tester |
| 02/16/2000 | EP0979416A1 Coherent switching power supply for an analog circuit tester |
| 02/16/2000 | EP0979415A1 Manipulator with expanded range of motion |
| 02/16/2000 | EP0979414A1 Multi-probe test head |
| 02/16/2000 | EP0979413A1 Integrated circuit tester with compensation for leakage current |
| 02/16/2000 | EP0979389A1 Cable tray assembly for testing device |
| 02/16/2000 | EP0891623B1 Circuit arrangement with a test circuit |
| 02/16/2000 | CN1244925A IC testing method and IC testing device using the same |
| 02/16/2000 | CN1244924A Method of measuring current while applying a voltage and apparatus therefor |
| 02/16/2000 | CN1244923A IC testing device |
| 02/16/2000 | CN1244741A Tested quantity earth line and phase line selector |
| 02/16/2000 | CN1244662A Corrector |
| 02/16/2000 | CN1049539C Synchronizing circuit |
| 02/15/2000 | US6026350 Self-framing serial trigger for an oscilloscope or the like |
| 02/15/2000 | US6026226 Local compilation in context within a design hierarchy |
| 02/15/2000 | US6026039 Parallel test circuit for semiconductor memory |
| 02/15/2000 | US6026038 Wafer burn-in test circuit and method for testing a semiconductor memory |
| 02/15/2000 | US6025734 Method of monitoring ion contamination in integrated circuits |
| 02/15/2000 | US6025733 Semiconductor memory device |
| 02/15/2000 | US6025730 Direct connect interconnect for testing semiconductor dice and wafers |
| 02/15/2000 | US6025729 Floating spring probe wireless test fixture |
| 02/15/2000 | US6025709 One port complex transmission and group delay measurements |
| 02/15/2000 | US6025708 System for verifying signal voltage level accuracy on a digital testing device |
| 02/15/2000 | US6025567 Binning wheel for testing and sorting capacitor chips |
| 02/15/2000 | US6024629 Probe apparatus and a method for polishing a probe |
| 02/15/2000 | US6024478 Design aiding apparatus and method for designing a semiconductor device |
| 02/15/2000 | CA2167062C Adapter with solid body |
| 02/10/2000 | WO2000007299A1 Low charge injection mosfet switch |
| 02/10/2000 | WO2000007256A1 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 02/10/2000 | WO2000007084A2 Algorithmic pattern generator |
| 02/10/2000 | WO2000007031A1 Inspection system for inspecting discrete wiring patterns formed on a continuous substrate sheet of a flexible material |
| 02/10/2000 | WO2000007029A1 Holder of electroconductive contactor, and method for producing the same |
| 02/10/2000 | WO1999065287A3 Non-contact test method and apparatus |
| 02/10/2000 | DE19912260A1 Stabilisatorvorrichtung und Stabilisierungsverfahren für ein Stromnetz Stabilizer apparatus and method for stabilizing a power grid |
| 02/10/2000 | DE19861088A1 Repairing integrated circuits by replacing subassemblies with substitutes |
| 02/10/2000 | DE19835608A1 JTAG interface initialisation circuit with error prevention |
| 02/09/2000 | EP0978846A2 Timing of wordline activation for DC burn-in of a dram with the self-refresh |
| 02/09/2000 | EP0978726A2 Semiconductor device having a test circuit |
| 02/09/2000 | EP0978125A1 System for optimizing memory repair time using test data |
| 02/09/2000 | CN2363289Y Warning timer for board-contact type thermo-relay |
| 02/09/2000 | CN2363288Y Digital leakage current tester |
| 02/09/2000 | CN1244059A Device and method for stabilizing electric power system |