G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1999
10/27/1999	CN1233083A Battery state monitoring circuit and battery device
10/27/1999	CN1233059A Memory test device and method capable of achieving fast memory test without increasing chip pin number
10/27/1999	CN1232972A Key path searching method and system
10/26/1999	US5974578 Integrated circuit and test method therefor
10/26/1999	US5974577 Integrated circuit with voltage over-stress indicating circuit
10/26/1999	US5974476 On-chip input/output device having programmable I/O unit being configured based upon internal configuration circuit
10/26/1999	US5974364 Method for controlling a test mode of an electric device
10/26/1999	US5974362 Signal generator for testing radio frequency components
10/26/1999	US5974249 Zero footprint method and apparatus for expanding allocated memory space of a process using a virtual memory area
10/26/1999	US5974248 Intermediate test file conversion and comparison
10/26/1999	US5974241 Test bench interface generator for tester compatible simulations
10/26/1999	US5973990 Synchronous semiconductor memory device including a circuit for arbitrarily controlling activation/inactivation timing of word line
10/26/1999	US5973971 Device and method for verifying independent reads and writes in a memory array
10/26/1999	US5973941 Electricity meter with a switching mode transformer power supply circuit
10/26/1999	US5973605 Thermistor monitor system
10/26/1999	US5973571 Semiconductor integrated circuit having a phase locked loop
10/26/1999	US5973542 Driver circuit with temperature correction circuit
10/26/1999	US5973541 Parametric tuning of an integrated circuit after fabrication
10/26/1999	US5973507 Exclusive-or gate for use in delay using transmission gate circuitry
10/26/1999	US5973505 System for evaluating probing networks
10/26/1999	US5973504 Programmable high-density electronic device testing
10/26/1999	US5973500 Apparatus for detecting insulation defects in devices connected into power distribution networks
10/26/1999	US5973499 Method for testing electrical loads in a vehicle electrical system
10/26/1999	US5973497 Method of determining and displaying battery charge status
10/26/1999	US5973493 Test tray positioning stopper mechanism for automatic handler
10/26/1999	US5973340 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits
10/26/1999	US5973285 Connector alignment assembly for an electronic memory module tester
10/26/1999	US5972725 Device analysis for face down chip
10/26/1999	US5971608 Apparatus for inspecting bump junction of flip chips and method of inspecting the same
10/26/1999	US5971586 Identifying causes of semiconductor production yield loss
10/21/1999	WO1999053527A2 Method and system for fabricating and testing assemblies containing wire bonded semiconductor dice
10/21/1999	WO1999053330A1 High speed, real-time, state interconnect for automatic test equipment
10/21/1999	WO1999053329A1 Method of diagnosing deterioration of electric power cable
10/21/1999	WO1999053235A1 Rechargable security intelligent torch
10/21/1999	DE19917320A1 Clock generator for a system for testing semiconductors
10/21/1999	DE19916903A1 Adjustment of delay time in computer processes
10/21/1999	DE19915398A1 Offset or skew adjustment method in integrated circuit test apparatus
10/21/1999	DE19912467A1 Editing apparatus for definition of a physical translation of logic result bit map into physical result bit map
10/21/1999	DE19900299A1 Memory tester with output of data pertaining to test sample
10/21/1999	DE19817944A1 Switch mechanism for an electric switching system esp. a high voltage system
10/21/1999	DE19802003C1 Function testing device for surface mounted component group
10/20/1999	EP0951196A2 Optical layer quasi-centralized restoration
10/20/1999	EP0950901A2 Test device for an electronic apparatus, especially an overload relay
10/20/1999	EP0950883A2 Testbench for brakes
10/20/1999	EP0950285A1 Timing signal generator
10/20/1999	EP0950273A1 Multiple rolling contacts
10/20/1999	EP0950192A1 Core test control
10/20/1999	EP0950191A1 Contact probe unit
10/20/1999	EP0886214B1 Multi-channel architecture with channel independent clock signals
10/20/1999	EP0858604A4 Source of waveform distortion discrimination circuit and method
10/20/1999	EP0843825B1 Semiconductor wafer test and burn-in
10/20/1999	CN2344782Y 电路故障探测器 Circuit fault detector
10/20/1999	CN2344781Y Special-purpose electroscope for power supply contact network of electrified railway
10/20/1999	CN2344780Y Multifunctional circuit tester for automobile
10/20/1999	CN1232546A Modular, semiconductor reliability test system
10/20/1999	CN1232349A Single board test apparatus for conference TV system
10/20/1999	CN1232288A Probe end cleaning sheet
10/20/1999	CN1232273A Reduced signal test for dynamic random access memory
10/20/1999	CN1232186A Address decoding circuit and method of address decoding
10/20/1999	CN1232185A Pallet transfer arm, changing device and treatment method, and IC test device
10/20/1999	CN1232184A IC test device
10/20/1999	CN1045821C Exciting ground detector and ground relay in which grounding is detected by DC
10/19/1999	US5970428 Ground loop detector circuit and method
10/19/1999	US5970395 Apparatus and method for detecting an interference radiation on board of an aircraft
10/19/1999	US5970312 Method for evaluating HSG silicon film of semiconductor device by atomic force microscopy
10/19/1999	US5970167 Integrated circuit failure analysis using color voltage contrast
10/19/1999	US5970074 Method and apparatus for measuring threshold characteristic of semiconductor integrated circuit
10/19/1999	US5970073 Test pattern generator circuit for IC testing equipment
10/19/1999	US5970052 Method for dynamic bandwidth testing
10/19/1999	US5970008 Efficient method for obtaining usable parts from a partially good memory integrated circuit
10/19/1999	US5970005 Testing structure and method for high density PLDs which have flexible logic built-in blocks
10/19/1999	US5970004 Semiconductor memory device allowing test regardless of spare cell arrangement
10/19/1999	US5969922 Failure indicator for a protection component
10/19/1999	US5969920 Test circuit for verifying operation of an arc fault detector
10/19/1999	US5969819 Measuring surface flatness using shadow moire technology and phase-stepping image processing
10/19/1999	US5969752 Multi-function viewer/tester for miniature electric components
10/19/1999	US5969626 ESD ground monitor for electrostatic safe work tables
10/19/1999	US5969625 High sensitivity battery resistance monitor and method therefor
10/19/1999	US5969624 Battery charge control system for a hybrid vehicle driven by an electric motor and an internal combustion engine
10/19/1999	US5969558 Abnormal clock signal detector and switching device
10/19/1999	US5969538 Semiconductor wafer with interconnect between dies for testing and a process of testing
10/19/1999	US5969537 Semiconductor device testing apparatus
10/19/1999	US5969536 Semiconductor device and burn-in method thereof
10/19/1999	US5969535 Probe card with connector
10/19/1999	US5969534 Semiconductor testing apparatus
10/19/1999	US5969531 Inspection apparatus for inspecting performance of structure by inserting measuring element through gap formed therein
10/19/1999	US5969530 Circuit board inspection apparatus and method employing a rapidly changing electrical parameter signal
10/19/1999	US5969529 Electronic apparatus having battery power source
10/19/1999	US5969516 Electrical circuit interrupter device locator
10/19/1999	US5969432 Arrangement for controlling a load connected to the secondary side of a transformer
10/19/1999	US5969345 Micromachined probes for nanometer scale measurements and methods of making such probes
10/19/1999	US5968282 Brush with thinner bristles; soft rubber cleaner with inorganic filler; semiconductors
10/19/1999	US5968196 Configuration control in a programmable logic device using non-volatile elements
10/19/1999	US5968195 Estimation of failure section region with small simulation calculation quantity
10/19/1999	US5968194 Method for application of weighted random patterns to partial scan designs
10/19/1999	US5968193 Dual site loadboard tester
10/19/1999	US5968191 Method and apparatus for testing integrated circuits in a mixed-signal environment
10/19/1999	US5966940 Semiconductor thermal conditioning apparatus and method
10/19/1999	US5966806 Control method of terminal crimping device
10/19/1999	CA2048231C Fail-safe photoelectric detector

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