| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 01/05/2000 | EP0969290A2 A general port capable of implementing the JTAG protocol |
| 01/05/2000 | EP0969288A2 Test arrangement for bond pad |
| 01/05/2000 | EP0968637A2 Method and device for gauging a device for producing electrical components |
| 01/05/2000 | EP0968635A1 A pcb testing circuit for an automatic inserting apparatus and a testing method therefor |
| 01/05/2000 | EP0968435A1 Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus |
| 01/05/2000 | EP0968414A1 Probing with backside emission microscopy |
| 01/05/2000 | EP0739565A4 Subscriber line impedance measurement device and method |
| 01/05/2000 | DE19928555A1 Capacitor insulation resistance measurement method |
| 01/05/2000 | DE19853069A1 Halbleiterprüfungsgerät Semiconductor inspection equipment |
| 01/05/2000 | DE19831216A1 Verfahren und Vorrichtung zur Bestimmung der Abhängigkeit einer ersten Meßgröße von einer zweiten Meßgröße Method and device for determining the function of a first measured quantity of a second measured variable |
| 01/05/2000 | DE19828927A1 Measurement signal correction arrangement for measuring vehicle battery voltage |
| 01/05/2000 | DE19828560A1 Vorrichtung zum Überprüfen von autonomen Solaranlagen Apparatus for testing of autonomous solar systems |
| 01/05/2000 | DE19827045A1 Vorrichtung zur Spannungsmessung Apparatus for voltage measurement |
| 01/05/2000 | DE19825750A1 Hearing aid for testing charging condition of voltage source |
| 01/04/2000 | US6012157 System for verifying the effectiveness of a RAM BIST controller's ability to detect faults in a RAM memory using states indicating by fault severity information |
| 01/04/2000 | US6012155 Method and system for performing automatic extraction and compliance checking of an IEEE 1149.1 standard design within a netlist |
| 01/04/2000 | US6011405 Apparatus and method for probing multiple integrated circuit dice in a semiconductor wafer |
| 01/04/2000 | US6011404 System and method for determining near--surface lifetimes and the tunneling field of a dielectric in a semiconductor |
| 01/04/2000 | US6011403 Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor |
| 01/04/2000 | US6011402 Electro-optic apparatus and method for measuring electric-field vector |
| 01/04/2000 | US6011401 Reference-free direct digital lock-in method and apparatus |
| 01/04/2000 | US6011399 Fault locator apparatus for wire harnesses |
| 01/04/2000 | US6011398 Current-leakage tester |
| 01/04/2000 | US6011387 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
| 01/04/2000 | US6011379 Method for determining state-of-charge using an intelligent system |
| 01/04/2000 | US6011300 Semiconductor integrated circuit device |
| 01/04/2000 | CA2153274C Power-out reset system |
| 01/04/2000 | CA2080522C Apparatus for the determination of the state of an instrument, especially the open and the closed state of an electrical appliance with ancillary contacts |
| 01/04/2000 | CA2073901C Battery with integral condition tester |
| 01/03/2000 | CA2242201A1 Network interface device |
| 12/30/1999 | DE19928612A1 Test adapter card for printed circuit board, for line testing of integrated circuits |
| 12/30/1999 | DE19928524A1 Integrated circuit test unit for testing one or more semiconductor structural elements |
| 12/30/1999 | DE19927094A1 Sampling flip-flop for testing digital logic at end of production line |
| 12/30/1999 | DE19924242A1 Vector restoration with accelerated validation and refinement for error location in large industrial design systems |
| 12/30/1999 | DE19852069C1 Rechargeable battery fault condition checking method especially for mobile or cordless-telephones |
| 12/30/1999 | DE19828058A1 Circuit for detecting conductor open circuit for digital signal, especially revolution rate signal |
| 12/30/1999 | DE19827878A1 Power supply circuit and power measuring circuit for a fuel cell interconnected system (FCIS) |
| 12/29/1999 | WO1999067847A1 A battery having discharge state indication |
| 12/29/1999 | WO1999067654A1 Voltage measuring circuit and voltage supply circuit of an integrated fuel cell system |
| 12/29/1999 | WO1999058992A3 A power cable monitoring system |
| 12/29/1999 | EP0966772A2 Signalling system |
| 12/29/1999 | EP0966702A2 Time interval measurement system incorporating a linear ramp generation circuit |
| 12/29/1999 | EP0966687A1 Peripherally leaded package test contactor |
| 12/29/1999 | EP0797802A4 Digital trimming of on-chip analog components |
| 12/29/1999 | EP0771487B1 A method and apparatus for processing batteries |
| 12/29/1999 | CN1047878C High-frenquency integrated circuit |
| 12/28/1999 | USRE36469 Packaging for semiconductor logic devices |
| 12/28/1999 | US6009546 Algorithmic pattern generator |
| 12/28/1999 | US6009545 System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit |
| 12/28/1999 | US6009370 Control unit for vehicle and total control system therefor |
| 12/28/1999 | US6009246 Method and system for evaluating intrusive repair for plurality of devices |
| 12/28/1999 | US6009187 Wafer prober having an emissive display inspection system and method of use |
| 12/28/1999 | US6009028 Failure self-diagnosis device for semiconductor memory |
| 12/28/1999 | US6009027 Test method and circuit for semiconductor memory |
| 12/28/1999 | US6008840 Apparatus for inspecting electronic component insertion in a printed circuit board and the method therefor |
| 12/28/1999 | US6008683 Switchable load for testing a semiconductor integrated circuit device |
| 12/28/1999 | US6008663 Eliminating phase shift in an integrated circuit tester |
| 12/28/1999 | US6008655 Frequency divider testing circuit clock-sampling window variable with divider output |
| 12/28/1999 | US6008654 Method and apparatus for testing lines in a telecommunications network |
| 12/28/1999 | US6008652 Battery tub tester |
| 12/28/1999 | US6008636 Test system with robot arm for delivering a device under test |
| 12/28/1999 | US6008605 Method for determining the active power of asynchronous electric motors |
| 12/28/1999 | US6008061 Method of manufacturing semiconductor device having a test pad |
| 12/28/1999 | US6006616 Semiconductor tester with power assist for vertical test head movement |
| 12/23/1999 | WO1999066729A1 Multi-function viewer/tester for miniature electric components |
| 12/23/1999 | WO1999066421A1 Functional verification of integrated circuit designs |
| 12/23/1999 | WO1999066340A1 Method of and apparatus for measuring battery capacity |
| 12/23/1999 | WO1999066339A1 Voltage measuring device |
| 12/23/1999 | WO1999066338A1 Using power-on mode to control test mode |
| 12/23/1999 | WO1999066337A2 Device for measuring and analyzing electrical signals of an integrated circuit component |
| 12/23/1999 | WO1999066335A1 Method and system for performance testing of rotating machines |
| 12/23/1999 | WO1999066285A1 Environmental test apparatus with ambient-positioned card support platform |
| 12/23/1999 | WO1999065508A1 Conformationally constrained backbone cyclized somatostatin analogs |
| 12/23/1999 | WO1999065287A2 Non-contact test method and apparatus |
| 12/23/1999 | WO1999058993A3 Integrated circuit with scan register chain |
| 12/23/1999 | WO1999012044A3 Battery charge indicator |
| 12/23/1999 | DE19927873A1 Testing of chip-scale-housings for ICs with which plate is provided on which several chip-scale-housings are applied |
| 12/23/1999 | DE19926701A1 Contact plug for testing semiconductor disc of encased LSI component or printed circuit board for component to be tested |
| 12/23/1999 | DE19918360A1 Determining recombinant life duration of metal-insulator-semiconductor structures used as important control parameter with development and monitoring of silicon based semiconductor materials and technologies |
| 12/23/1999 | DE19916568A1 Component tray transfer arm of semiconductor IC test device |
| 12/23/1999 | DE19860704A1 Semiconductor wafer inspecting method using a scanning electron microscope (SEM) |
| 12/23/1999 | CA2334962A1 Method and system for performance testing of rotating machines |
| 12/22/1999 | EP0965931A2 Modeling method and simulation method |
| 12/22/1999 | EP0965906A2 Calibrating rechargeable battery |
| 12/22/1999 | EP0965850A1 Scan test method for multiple clocks integrated circuit |
| 12/22/1999 | EP0965847A2 Electrode spacing conversion adaptor |
| 12/22/1999 | EP0965846A2 Integrated circuit test socket |
| 12/22/1999 | EP0965845A1 Test head assembly |
| 12/22/1999 | EP0965148A2 Apparatus for detecting cell reversal in rechargeable batteries |
| 12/22/1999 | EP0965047A1 Method and device for identifying the system parameters stator resistance and rotor resistance of a transmitter-free induction machine operated in a field-oriented manner |
| 12/22/1999 | CN2355336Y Railways signal inspector |
| 12/22/1999 | CN2355335Y Peak current inspector for wireless fault determiner for high voltage transmission lines |
| 12/22/1999 | CN2355334Y Fault singnal inspector for branches of rectifier |
| 12/22/1999 | CN1239398A Socket for integrated circuit chip |
| 12/22/1999 | CN1239335A Battery state monitoring circuit and battery device |
| 12/22/1999 | CN1239321A Apparatus and method for contact failure inspection in semiconductor devices |
| 12/22/1999 | CN1239226A Calibrating method of rechargeable battery capacity``````` |
| 12/21/1999 | US6006353 Error correction method for radio communication and radio communication apparatus |
| 12/21/1999 | US6006350 Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device |
| 12/21/1999 | US6006349 High speed pattern generating method and high speed pattern generator using the method |