| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/29/1999 | US5917329 Substrate tester having shorting pad actuator method and apparatus |
| 06/29/1999 | US5917327 To apply an electrostatic force to hold a semiconductor wafer during process |
| 06/29/1999 | US5917318 High-speed responsive power supply for measuring equipment |
| 06/29/1999 | US5917305 Battery control architecture with standardized language |
| 06/29/1999 | US5917240 Semiconductor device socket |
| 06/29/1999 | US5917229 Programmable/reprogrammable printed circuit board using fuse and/or antifuse as interconnect |
| 06/29/1999 | US5916715 Process of using electrical signals for determining lithographic misalignment of vias relative to electrically active elements |
| 06/29/1999 | US5915838 Method and apparatus for local temperature sensing for use in performing high resolution in-situ parameter measurements |
| 06/29/1999 | US5915755 Method for forming an interconnect for testing unpackaged semiconductor dice |
| 06/29/1999 | CA2004436C Test chip for use in semiconductor fault analysis |
| 06/24/1999 | WO1999031752A1 Lithium-polymer type battery and control system |
| 06/24/1999 | WO1999031607A1 Method for developing semiconductor integrated circuit device |
| 06/24/1999 | WO1999031588A1 Method, apparatus and device for digital testing and diagnostics of pc boards |
| 06/24/1999 | WO1999031587A1 Method and apparatus for utilizing mux scan flip-flops to test speed related defects |
| 06/24/1999 | WO1999031586A1 Parallel test method |
| 06/24/1999 | WO1999031585A1 Monitoring system for a digital trimming cell |
| 06/24/1999 | WO1999031304A1 Plating device and method of confirming current feed |
| 06/24/1999 | WO1999019737A3 Battery capacity measurement circuit |
| 06/24/1999 | WO1999016697A8 Diagnosing malfunctions in materials handling vehicles |
| 06/24/1999 | DE19756043A1 Detecting short circuit in cable network of electrical power supply system |
| 06/24/1999 | DE19754871A1 Method to check quality of wire bonds in integrated circuit production |
| 06/24/1999 | CA2313646A1 Monitoring system |
| 06/23/1999 | EP0924528A1 Electronic device for diagnosing faults in electrical systems |
| 06/23/1999 | EP0924527A1 Wafer probe station with impression of ultrasonic vibrations on probe contacts |
| 06/23/1999 | EP0924526A1 Device for detecting a fault on a high voltage overhead line in an electrical energy distribution network |
| 06/23/1999 | EP0923961A1 Battery management apparatus for portable electronic devices |
| 06/23/1999 | EP0923601A2 Librairies of backbone-cyclized peptidomimetics |
| 06/23/1999 | EP0551337B1 Monitoring gas insulated substations |
| 06/23/1999 | CN2325785Y Structure equipment for pressing thin film into fairness |
| 06/23/1999 | CN2325784Y Ring-like elctrode of spark test machine |
| 06/23/1999 | CN2325783Y Comprehensive type instrument for locating faults in communication cable |
| 06/23/1999 | CN2325171Y Multi-function screw driver with test-pencil function for automobile driver use |
| 06/22/1999 | US5915231 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 06/22/1999 | US5915083 Smart debug interface circuit for efficiently for debugging a software application for a programmable digital processor device |
| 06/22/1999 | US5914968 Method and apparatus for initiating and controlling test modes within an integrated circuit |
| 06/22/1999 | US5914964 Memory fail analysis device in semiconductor memory test system |
| 06/22/1999 | US5914953 Network message routing using routing table information and supplemental enable information for deadlock prevention |
| 06/22/1999 | US5914902 Synchronous memory tester |
| 06/22/1999 | US5914663 Detection of subsidence current in the determination of circuit breaker status in a power system |
| 06/22/1999 | US5914625 Clock driver circuit and semiconductor integrated circuit device |
| 06/22/1999 | US5914615 Method of improving the quality and efficiency of Iddq testing |
| 06/22/1999 | US5914613 Membrane probing system with local contact scrub |
| 06/22/1999 | US5914611 Method and apparatus for measuring sheet resistance and thickness of thin films and substrates |
| 06/22/1999 | US5914609 Method and system for battery charging and testing with semi-automatic calibration |
| 06/22/1999 | US5914606 Battery cell voltage monitor and method |
| 06/22/1999 | US5914605 Electronic battery tester |
| 06/22/1999 | US5914536 Semiconductor device and soldering portion inspecting method therefor |
| 06/22/1999 | CA2240996A1 Battery management apparatus for portable electronic devices |
| 06/22/1999 | CA2148106C Printed circuit board testing device with foil adapter |
| 06/17/1999 | WO1999030545A1 A pcb testing circuit for an automatic inserting apparatus and a testing method therefor |
| 06/17/1999 | WO1999030236A1 TEST CIRCUITRY FOR ASICs |
| 06/17/1999 | WO1999030176A1 Semiconductor integrated circuit and method for diagnosing logic circuit |
| 06/17/1999 | WO1999030174A1 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 06/17/1999 | WO1999030172A2 Wideband isolation system |
| 06/17/1999 | WO1999030120A1 Method for measuring temperature on operating components and measuring device |
| 06/17/1999 | WO1999016158A3 Time-domain circuit modeller |
| 06/16/1999 | EP0923196A2 Analog-to digital converter test system and method |
| 06/16/1999 | EP0923082A2 Semiconductor memory having a sense amplifier |
| 06/16/1999 | EP0922964A1 Socket for inspection of semiconductor device |
| 06/16/1999 | EP0922321A1 Circuit arrangement for monitoring of an electronic tripping device for low voltage switches |
| 06/16/1999 | EP0922255A1 Microprocessor subassembly |
| 06/16/1999 | EP0922232A1 Battery-powered electrical device |
| 06/16/1999 | EP0922231A1 Method of measurement for locating line faults on hvdc lines |
| 06/16/1999 | EP0886894A4 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 06/16/1999 | EP0852730A4 Parallel processing integrated circuit tester |
| 06/16/1999 | EP0721722B1 Method of predicting voltages in telephone line measurement |
| 06/16/1999 | EP0672248B1 Electronic battery tester with automatic compensation for low state-of-charge |
| 06/16/1999 | EP0664933B1 Sensor for registration of leak current |
| 06/16/1999 | CN2324641Y Dry battery electrometering mark |
| 06/16/1999 | CN1220008A Method for testing electronic components |
| 06/16/1999 | CN1219800A Oscillatory circuit having built-in test circuit for checking oscillating signal for duty factor |
| 06/16/1999 | CN1043694C Circuit for generating internal source voltage |
| 06/15/1999 | US5913022 Loading hardware pattern memory in automatic test equipment for testing circuits |
| 06/15/1999 | US5912901 Method and built-in self-test apparatus for testing an integrated circuit which capture failure information for a selected failure |
| 06/15/1999 | US5912900 Method and system for testing self-timed circuitry |
| 06/15/1999 | US5912856 Internal voltage generating circuit in semiconductor memory device |
| 06/15/1999 | US5912852 Synchronous memory test method |
| 06/15/1999 | US5912562 Quiescent current monitor circuit for wafer level integrated circuit testing |
| 06/15/1999 | US5912559 Apparatus for detection and localization of electrostatic discharge (ESD) susceptible areas of electronic systems |
| 06/15/1999 | US5912555 Probe apparatus |
| 06/15/1999 | US5912548 Battery pack monitoring system |
| 06/15/1999 | US5912544 Electronic equipment and method for enabling plural types of batteries to be selectively used |
| 06/15/1999 | US5912502 Wafer having a plurality of IC chips having different sizes formed thereon |
| 06/15/1999 | US5912046 By placing the liquid having solids in suspension in a centrifuge and spinning it about an axis so that liquid is forced against the surface of component |
| 06/15/1999 | US5911897 Temperature control for high power burn-in for integrated circuits |
| 06/15/1999 | US5911606 Pin connector, pin connector holder and packaging board for mounting electronic component |
| 06/10/1999 | WO1999028833A1 Method and system for improving a transistor model |
| 06/10/1999 | WO1999028756A1 Method of measuring current while applying a voltage and apparatus therefor |
| 06/10/1999 | WO1999028755A2 Electronic circuits for detecting the earthing system and for testing the efficiency of residual current circuit-breakers connected to phase, neutral and earth of electrical users |
| 06/10/1999 | WO1999028169A1 Control device for a motor vehicle with a remote control or transponder |
| 06/10/1999 | DE19801627C1 Method of diagnosing electrical loads in motor vehicles |
| 06/10/1999 | CA2318330A1 Method and system for improving a transistor model |
| 06/09/1999 | EP0921639A1 Dynamic logic gate with relaxed timing requirements and output state holding |
| 06/09/1999 | EP0921528A1 A memory device using direct access mode test and a method of testing the same |
| 06/09/1999 | EP0921458A2 Information terminal device with power control means |
| 06/09/1999 | EP0921406A2 Method and system for testing an integrated circuit |
| 06/09/1999 | EP0921405A1 Method for directional detection of a fault on an electric power distribution unit |
| 06/09/1999 | EP0921403A2 Diagnostic circuit for potentiometric sensors |
| 06/09/1999 | EP0921400A2 Terminal apparatus for electro-optic probe |
| 06/09/1999 | EP0920727A1 Electric motor monitor |