Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1999
12/21/1999US6006348 Flip flop circuit for scan test with two latch circuits
12/21/1999US6006346 Method and equipment for automatically testing electronic components
12/21/1999US6006343 Method and apparatus for streamlined testing of electrical circuits
12/21/1999US6006170 Method and system for ascertaining anomalies in electric motors
12/21/1999US6006147 Translator and voltage check module for hand-held vehicle tester
12/21/1999US6005829 Method for characterizing interconnect timing characteristics
12/21/1999US6005815 Semiconductor memory
12/21/1999US6005814 Test mode entrance through clocked addresses
12/21/1999US6005762 Cooling system of a semiconductor testing device using a control computer
12/21/1999US6005433 Low charge injection mosfet switch
12/21/1999US6005407 Oscillation-based test method for testing an at least partially analog circuit
12/21/1999US6005406 Test device and method facilitating aggressive circuit design
12/21/1999US6005404 Environmental test apparatus with partition-isolated thermal chamber
12/21/1999US6005401 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
12/21/1999US6005400 High resolution three-dimensional doping profiler
12/21/1999US6005398 High speed phase and amplitude measurement system and method
12/21/1999US6005394 Process and apparatus for the capacitive testing of printed circuits
12/21/1999US6005393 Method of determining an earth-fault current
12/21/1999US6005386 Substrate tester method and apparatus having rotatable and infinitely adjustable locator jaws
12/21/1999US6005385 Test board circuit for detecting tester malfunction and protecting devices under test
12/21/1999US6005373 System with anticipatory power supply load signal
12/21/1999US6005369 Method and apparatus for testing a vehicle charge storage system
12/21/1999US6005290 Multi chip module having self limiting contact members
12/21/1999US6005288 Compliant contact system with alignment structure for testing unpackaged semiconductor device
12/21/1999US6005248 Method for observing a reaction process by transmission electron microscopy
12/21/1999US6004142 Interposer converter to allow single-sided contact to circuit modules
12/21/1999US6004027 Method and apparatus for constructing test subsequence graphs utilizing unique input/output sequence (UIO) sets
12/21/1999CA2206716C Arrester with external isolator
12/21/1999CA2188360C Apparatus and method for discharging and charging a multiple battery arrangement
12/21/1999CA2050501C Circuit test method
12/16/1999WO1999064882A1 Measuring and compensating for warp in the inspection of printed circuit board assemblies
12/16/1999WO1999064881A1 Integrated circuit tester with amorphous logic
12/16/1999WO1999064880A1 Semiconductor wafer evaluating apparatus and method
12/16/1999WO1999064879A1 A method and apparatus for finding and locating manufacturing defects on a printed circuit board
12/16/1999WO1999064878A1 System measuring partial discharge using digital peak detection
12/16/1999WO1999064877A1 System for digital measurement of breakdown voltage of high-voltage samples
12/16/1999WO1999064844A1 Method of determining an impurity concentration in highly doped semiconductor materials
12/16/1999DE19926663A1 Testing field programmable gate array with multi-programmable intermediate connections
12/16/1999DE19824362A1 Verfahren zur Funktionsüberwachung eines Sensorbausteins sowie Sensorbaustein zur Durchführung des Verfahrens A method for functional monitoring of a sensor block and the sensor block for performing the method
12/15/1999EP0964522A1 Oscillator module and communications device using the same
12/15/1999EP0964346A2 Reconstruction engine for a hardware circuit emulator
12/15/1999EP0964257A1 Method od design for testability for integrated circuits
12/15/1999EP0964256A1 Method and device for locating short circuits in a bus of a multiplexed network for information transmission
12/15/1999EP0964255A1 Method and circuit for detecting the presence of a connector in a socket
12/15/1999EP0964243A1 Method of determining an impurity concentration in highly doped semiconductor materials
12/15/1999EP0878043B1 Method of determining the position of a switching device
12/15/1999CN1238460A Method for detecting short-circuit conditions and device which uses this method
12/15/1999CN1047494C Inspection equipment for illuminating system state
12/14/1999US6003154 System and method for covering illegal states in a programmable gate array
12/14/1999US6003150 Method for testing field programmable gate arrays
12/14/1999US6002878 Processor power consumption estimator that using instruction and action formulas which having average static and dynamic power coefficients
12/14/1999US6002792 Semiconductor device inspection system
12/14/1999US6002609 Semiconductor device having a security circuit for preventing illegal access
12/14/1999US6002426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits
12/14/1999US6002331 Method and apparatus for identifying and tracking connections of communication lines
12/14/1999US6002266 Socket including centrally distributed test tips for testing unpackaged singulated die
12/14/1999US6002264 Interconnect adapter to printed circuit assembly for testing in an operational environment
12/14/1999US6002263 Probe station having inner and outer shielding
12/14/1999US6002262 Method of and apparatus for measuring flatness of semiconductor wafers that have not been subjected to donor-killer treatment
12/14/1999US6002260 Fault sensor suitable for use in heterogenous power distribution systems
12/14/1999US6002247 Method for determining correct pairing of bundled twisted wire pair circuitry
12/14/1999US6002238 Method and apparatus for measuring complex impedance of cells and batteries
12/14/1999US6002131 Scanning probe potentiometer
12/09/1999WO1999063689A1 Method and system for monitoring broadband quality of services
12/09/1999WO1999063354A1 Edge-triggered scan flip-flop and one-pass scan synthesis methodology
12/09/1999WO1999063353A1 Turning center with integrated non-contact inspection system
12/09/1999WO1999063352A1 Closely-coupled multiple-winding magnetic induction-type sensor
12/09/1999WO1999017121A3 Format sensitive timing calibration for an integrated circuit tester
12/09/1999DE19922907A1 Calibrating output time of test signal for semiconductor test unit which has base on which semiconductor under test is mounted
12/09/1999DE19911098A1 Voltage decision circuit for charging type battery used in mobile telephone
12/09/1999DE19823787A1 Verfahren und Anordnung zur Früherkennung von Läuferschäden bei Asynchronmaschinen Method and system for early detection of rotor damage for induction
12/09/1999DE19822780A1 Verfahren und Vorrichtung zur Überprüfung eines elektrischen Schaltkreises, insbesondere eines Zündschaltkreises eines Kraftfahrzeug-Insassenschutzsystems Method and apparatus for checking an electrical circuit, in particular an ignition circuit of a motor vehicle occupant protection system
12/09/1999DE19816942A1 Circuit for monitoring an electric circuit for conductor breaks particularly for input and output circuits of sensors
12/09/1999DE19815721A1 Dual loop resistance test meter with fault detection display for low voltage networks
12/08/1999EP0963080A2 Network transceiver having media independent interface
12/08/1999EP0963079A2 Auto-negotiation systems for multiple port data communication devices
12/08/1999EP0963023A2 Arc fault detector comparing integrated interval to interval filtered load current and circuit breaker incorporating same
12/08/1999EP0962783A2 Apparatus for measuring electrical characteristics of circuit
12/08/1999EP0962777A2 Printed circuit board testing apparatus
12/08/1999EP0962776A2 Probe card suitable for inspection of multi-pin devices
12/08/1999EP0962748A1 Method and circuit for monitoring the functioning of a sensor module
12/08/1999EP0961936A1 Semiconductor tester with data serializer
12/08/1999EP0961935A2 Method and apparatus for characterizing a specimen of semiconductor material
12/08/1999EP0902896A4 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
12/08/1999EP0872071A4 Clock signal distribution system
12/08/1999CN2353081Y Circuit protective arrangement for emergency lamp
12/08/1999CN2352967Y Moving contact motion locus sensor
12/08/1999CN1237769A Semiconductor memory device and method of burn-in testing
12/08/1999CN1237714A Semiconductor device testing apparatus and semiconductor device testing system
12/08/1999CN1237713A Method for removing micro short circuit and its apparatus
12/08/1999CN1237709A Probe card suitable for inspection of multi-pin devices
12/07/1999US6000051 Method and apparatus for high-speed interconnect testing
12/07/1999US6000050 Method for minimizing ground bounce during DC parametric tests using boundary scan register
12/07/1999US6000048 Combined logic and memory circuit with built-in memory test
12/07/1999US5999900 Reduced redundancy test signal similar to natural speech for supporting data manipulation functions in testing telecommunications equipment
12/07/1999US5999457 Semiconductor integrated circuit
12/07/1999US5999390 Input buffer circuit for semiconductor device
12/07/1999US5999268 Apparatus for aligning a semiconductor wafer with an inspection contactor
12/07/1999US5999102 Battery pack
12/07/1999US5999013 Method and apparatus for testing variable voltage and variable impedance drivers
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