| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/09/2000 | CN1243957A High-temp and low-temp service lifes tester for electromagnetic relay |
| 02/09/2000 | CN1243956A Method for sticking out accident event in digital oscilloscope |
| 02/08/2000 | US6023778 Method and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signal |
| 02/08/2000 | US6023770 Semiconductor device |
| 02/08/2000 | US6023663 Method and apparatus for inspecting a solder joint using a correlation neural network |
| 02/08/2000 | US6023539 Code reading apparatus having optimal battery voltage detection function |
| 02/08/2000 | US6023439 Programmable logic array integrated circuits |
| 02/08/2000 | US6023433 Semiconductor memory device with a redundant decoder having a small scale in circuitry |
| 02/08/2000 | US6023228 Method and apparatus for checking electrical drive mechanisms |
| 02/08/2000 | US6023186 CMOS integrated circuit device and inspection method thereof |
| 02/08/2000 | US6023173 Manipulator with expanded range of motion |
| 02/08/2000 | US6023172 Light-based method and apparatus for maintaining probe cards |
| 02/08/2000 | US6022750 Method for fabricating semiconductor interconnect having test structures for evaluating electrical characteristics of the interconnect |
| 02/08/2000 | US6022124 Machine-vision ring-reflector illumination system and method |
| 02/08/2000 | CA2126756C Method for determining the short-circuit inductance of an asynchronous machine |
| 02/03/2000 | WO2000005797A1 System and method for safe transport of an actuating fluid and electrical power, and multipurpose cable used in said system |
| 02/03/2000 | WO2000005723A2 Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit |
| 02/03/2000 | WO2000005596A1 Signalling system |
| 02/03/2000 | WO2000005595A1 Grinding chip |
| 02/03/2000 | WO2000005591A1 Method of and apparatus for generating a multitone test signal |
| 02/03/2000 | DE19929650A1 Incorrect setting detector of clock generator of IC test device |
| 02/03/2000 | DE19832307A1 Integrierte Schaltung mit einer Selbsttesteinrichtung Integrated circuit having a self-test device |
| 02/03/2000 | CA2338282A1 Signalling system |
| 02/02/2000 | EP0977384A1 Method and apparatus for measuring spectral energy of mobile handset |
| 02/02/2000 | EP0977053A2 Non-contact type wave signal observation apparatus |
| 02/02/2000 | EP0977052A2 Non-contact type wave signal observation apparatus |
| 02/02/2000 | EP0977050A2 Display apparatus |
| 02/02/2000 | EP0977047A2 Apparatus for managing a battery unit having storage batteries |
| 02/02/2000 | EP0977046A1 Method and apparatus for testing the quality of the vacuum in a vacuum switch |
| 02/02/2000 | EP0977045A2 Apparatus for coupling a test head and probe card in a wafer testing system |
| 02/02/2000 | EP0977044A1 Mastless antenna test device |
| 02/02/2000 | EP0976649A2 Moving apparatus with drive force assist mechanism and movement control method |
| 02/02/2000 | EP0976189A1 Method for determining the location of a partial discharge |
| 02/02/2000 | EP0975986A1 Thermochromic game piece |
| 02/02/2000 | EP0975985A1 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers |
| 02/02/2000 | EP0975984A1 Diagnosis of electrical consumers in a motor vehicle |
| 02/02/2000 | EP0975953A1 Device for inspecting test objects and the use thereof |
| 02/02/2000 | EP0975691A1 Multifunctional polymeric tissue coatings |
| 02/02/2000 | CN2362137Y Power supply load ability tester |
| 02/02/2000 | CN2362136Y Charging state monitoring indicator |
| 02/02/2000 | CN2362135Y 埋式线缆探测器 Buried cable detectors |
| 02/02/2000 | CN2362134Y Power supply device roasting tester |
| 02/02/2000 | CN1243347A Overhead insulation bucket arm vehicle with dirt-detection device |
| 02/02/2000 | CN1243255A Apparatus for managing battery with accumulator |
| 02/02/2000 | CN1049076C Method and apparatus for processing batteries |
| 02/01/2000 | US6021515 Pattern generator for semiconductor test system |
| 02/01/2000 | US6021514 Limited latch linehold capability for LBIST testing |
| 02/01/2000 | US6021513 Testable programmable gate array and associated LSSD/deterministic test methodology |
| 02/01/2000 | US6021401 Computer system, apparatus and method for calculating demand usage |
| 02/01/2000 | US6021380 Automatic semiconductor wafer sorter/prober with extended optical inspection |
| 02/01/2000 | US6021366 Method for testing electrical wiring buck of vehicle |
| 02/01/2000 | US6021315 System and method for testing of wireless communication devices |
| 02/01/2000 | US6021074 Direct access to random redundant logic gates by using multiple short addresses |
| 02/01/2000 | US6020821 Method of detecting the position of a switching device and encapsulated switching installation having at least one switching device |
| 02/01/2000 | US6020772 Flash output LSSD latch |
| 02/01/2000 | US6020753 TFT and reliability evaluation method thereof |
| 02/01/2000 | US6020752 IC testing device adapted to selectively use I/O common system and I/O split system functions |
| 02/01/2000 | US6020750 Wafer test and burn-in platform using ceramic tile supports |
| 02/01/2000 | US6020749 Method and apparatus for performing testing of double-sided ball grid array devices |
| 02/01/2000 | US6020748 Method and apparatus for conducting failure analysis on IC chip package |
| 02/01/2000 | US6020746 Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die |
| 02/01/2000 | US6020743 Method and apparatus for detecting failed batteries |
| 02/01/2000 | US6020718 Battery capacity predicting method, battery unit and apparatus using battery unit |
| 02/01/2000 | US6020717 Monitoring apparatus for a series assembly of battery modules |
| 02/01/2000 | US6020635 Converter socket terminal |
| 02/01/2000 | US6020624 Semiconductor package with bi-substrate die |
| 02/01/2000 | US6019564 Semiconductor device transporting and handling apparatus |
| 02/01/2000 | US6019502 Test circuits and methods for built-in testing integrated devices |
| 02/01/2000 | US6019501 Address generating device for memory tester |
| 02/01/2000 | CA2175861C Power control method and apparatus suitable for use in a radio communication device |
| 01/27/2000 | WO2000004671A2 Method and apparatus for identifying and tracking connections of communication lines |
| 01/27/2000 | WO2000004620A2 System and method for monitoring a vehicle battery |
| 01/27/2000 | WO2000004585A2 Chip carrier device and method for the production of a chip carrier device with an electrical test |
| 01/27/2000 | WO2000004582A1 Temperature control of electronic devices using power following feedback |
| 01/27/2000 | WO2000004396A1 Apparatus, method and system of liquid-based, wide range, fast response temperature cycling control of electronic devices |
| 01/27/2000 | WO2000004395A1 Device for the electric testing of integrated circuits |
| 01/27/2000 | WO1999057567A3 Method and apparatus for protecting sensitive data during automatic testing of hardware |
| 01/27/2000 | DE19931337A1 Fixing system for testing semiconductor components |
| 01/27/2000 | DE19832021A1 Probe or scanning head for microwave circuit measurements inside planar conductor |
| 01/27/2000 | DE19831634A1 Chip carrier device production for an encased chip arrangement with an electrical test simplifies chip contact mechanism on substrates by a strip conductor structure and through-plating |
| 01/27/2000 | CA2338234A1 System and method for monitoring a vehicle battery |
| 01/27/2000 | CA2335097A1 Method and apparatus for identifying and tracking connections of communication lines |
| 01/26/2000 | EP0975025A1 Photoelectric conversion integrated circuit device |
| 01/26/2000 | EP0974848A2 Integrated circuit with self-testing device |
| 01/26/2000 | EP0974846A2 Method for detecting mounting or calibration faults of several signal isolating units in one or several partial discharge systems |
| 01/26/2000 | EP0974845A1 Apparatus for testing electric properties using a multi-point probe |
| 01/26/2000 | EP0974844A1 Electrical probe with light source |
| 01/26/2000 | EP0974112A1 Method for designing complex, digital and integrated circuits and a circuit structure for carrying out said method |
| 01/26/2000 | CN2360857Y Stranded cable on/off and line insulating discriminator circuit |
| 01/26/2000 | CN1242523A Method and arrangement for automatically testing electric properties of circuits on main distrubuting frame |
| 01/26/2000 | CN1048829C Method and means for supervision of valve units |
| 01/25/2000 | US6018815 Adaptable scan chains for debugging and manufacturing test purposes |
| 01/25/2000 | US6018814 Star-I: scalable tester architecture with I-cached SIMD technology |
| 01/25/2000 | US6018813 Identification and test generation for primitive faults |
| 01/25/2000 | US6018513 Communication control apparatus |
| 01/25/2000 | US6018490 Programmable logic array integrated circuits |
| 01/25/2000 | US6018485 Semiconductor memory device with cascaded burn-in test capability |
| 01/25/2000 | US6018462 Multi-tip module |
| 01/25/2000 | US6018249 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 01/25/2000 | US6018248 Frame for holding a bladed element of an IC handling system |