Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/1999
05/25/1999US5907244 Method and apparatus for detecting winding errors in an electric motor stator
05/25/1999US5907102 System and method for performing tensile stress-strain and fatigue tests
05/25/1999US5906472 Apparatus for removing and storing semiconductor device trays
05/25/1999CA2180163C High voltage dc-biased ac test system
05/25/1999CA2164083C Pulse based cable attenuation measurement system
05/25/1999CA2160173C Ground fault detecting apparatus and method for detecting ground fault of field circuit and exciting circuit by detecting ground fault current flowing from ground to neutral pointof exciting circuit
05/20/1999WO1999024842A1 Method and apparatus for battery gauging in a portable communication device
05/20/1999WO1999024841A1 Boundary scan system with address dependent instructions
05/20/1999WO1999024840A1 Device for checking an electric drive
05/20/1999WO1999024838A1 Manipulator for automatic test equipment with active compliance
05/20/1999WO1999024818A1 Process and device for detecting the location of components and/or for checking the position of component connections and mounting head with a device for detecting the location of components and/or checking the position of component connections
05/20/1999DE19851861A1 Fault analysis memory for semiconductor memory testers
05/20/1999DE19851732A1 Current-regulation stage fault-monitoring system
05/20/1999DE19753048A1 Method of contact monitoring between conducting devices using potential detection e.g. for voltage breakdown protection in DC rail system
05/20/1999DE19751134A1 Automatic method to test and set up high frequency stages in equipment with digital signal processing, especially for filter tuning
05/20/1999DE19748029A1 Verfahren zum Testen elektrischer Baugruppen A method for testing electrical components
05/20/1999CA2309144A1 Boundary scan system with address dependent instructions
05/20/1999CA2254232A1 Method and apparatus for monitoring a selected group of fuel cells of a high-temperature fuel cell stack
05/19/1999EP0917068A2 Semiconductor integrated circuit
05/19/1999EP0916959A2 Method for determining the starting ability of the starter-battery of a motor-vehicle
05/19/1999EP0916958A1 Test method for an inductive resonant circuit
05/19/1999EP0916957A1 Non-contact testing system and --method for an integrated circuit, and the input capacitance of such an integrated circuit
05/19/1999EP0916955A2 Test head manipulator
05/19/1999CN2319819Y Electrooptical source service life tester
05/19/1999CN2319817Y Integral maintenance experiment appts. of frequency converting governor
05/19/1999CN1217062A Assembly and method for testing integrated circuit device
05/19/1999CN1216850A Semiconductor memory device with redundant decoder having small scale in circuitry
05/19/1999CN1216827A Device for testing remained volume of electricity of a cell
05/19/1999CN1216826A Electric leak detecting apparatus for electric motorcars
05/18/1999US5905967 Timing generator with multiple coherent synchronized clocks
05/18/1999US5905738 Digital bus monitor integrated circuits
05/18/1999US5905737 Test circuit
05/18/1999US5905691 Semiconductor memory
05/18/1999US5905690 Synchronous semiconductor device having circuitry capable of surely resetting test mode
05/18/1999US5905650 Failure analyzer
05/18/1999US5905577 Dual-laser voltage probing of IC's
05/18/1999US5905439 Apparatus and method for monitoring a plurality of parallel loads having a common supply
05/18/1999US5905421 Apparatus for measuring and/or injecting high frequency signals in integrated systems
05/18/1999US5905403 Multiple output programmable reference voltage source
05/18/1999US5905384 Method for testing semiconductor element
05/18/1999US5905383 Multi-chip module development substrate
05/18/1999US5905382 Universal wafer carrier for wafer level die burn-in
05/18/1999US5905381 Functional OBIC analysis
05/18/1999US5904506 Semiconductor device suitable for testing
05/18/1999US5904489 Topside analysis of a multi-layer integrated circuit die mounted in a flip-chip package
05/18/1999US5904488 Semiconductor integrated circuit device
05/18/1999CA2150154C Method and apparatus for generating conformance test data sequences
05/18/1999CA2143786C Method for measuring transmission parameters of balanced pair
05/14/1999WO1999023738A1 Method and apparatus for charging a battery
05/14/1999WO1999023731A1 Multiple rolling contacts
05/14/1999WO1999023665A1 Method for testing the bus terminals of writable-readable integrated electronic integrated circuits, especially of memory chips
05/14/1999WO1999023503A1 Core test control
05/14/1999WO1999023502A1 System to simultaneously test trays of integrated circuit packages
05/14/1999WO1999023501A1 Integrated circuit tester having pattern generator controlled data bus
05/14/1999WO1999023500A1 Method for testing electrical modules
05/14/1999WO1999023499A1 Modular integrated circuit tester with distributed synchronization and control
05/14/1999WO1999023496A1 A contacting device
05/14/1999WO1999022806A1 Packaging and coating for bio-electrical stimulation and recording electrodes
05/14/1999WO1999022572A2 Method for producing and controlling electronic components
05/14/1999WO1999000004A9 Apparatus for monitoring temperature of a power source
05/14/1999CA2308383A1 Packaging and coating for bio-electrical stimulation and recording electrodes
05/14/1999CA2216201A1 A load and supply status indicator
05/12/1999EP0915348A2 Ground fault detection and protection method for a variable speed ac electric motor
05/12/1999EP0915344A2 Test head for microstructures with interface
05/12/1999EP0915343A2 Service friendly contacting device
05/12/1999EP0914617A1 Process for testing a product and equipment for carrying out the process
05/12/1999EP0855102A4 Compensated delay locked loop timing vernier
05/12/1999EP0815460B1 Manufacturing defect analyzer with improved fault coverage
05/12/1999EP0776478B1 Method and device for monitoring power-supply networks
05/12/1999EP0540967B1 A method for generating test patterns for use with a scan circuit
05/12/1999CN2318641Y Battery clamp
05/12/1999CN2318640Y Speech number-report line connector
05/12/1999CN2318639Y Earth monitor for electrostatic earthed system
05/11/1999US5903764 Smart battery selector offering power conversion internally within a portable device
05/11/1999US5903745 Timing generator for plural reference clocks
05/11/1999US5903580 Fault simulator of creating a signal pattern for use in a fault inspection of a semiconductor integrated circuit
05/11/1999US5903579 Scan path forming circuit
05/11/1999US5903578 For generating a reduced netlist for a digital logic block
05/11/1999US5903576 Memory test system
05/11/1999US5903575 Semiconductor memory device having fast data writing mode and method of writing testing data in fast data writing mode
05/11/1999US5903512 In a computer system
05/11/1999US5903477 Simulation apparatus and simulation method for electromagnetic field intensity using moment method
05/11/1999US5903475 System simulation for testing integrated circuit models
05/11/1999US5903466 Constraint driven insertion of scan logic for implementing design for test within an integrated circuit design
05/11/1999US5903422 Overcurrent sensing circuit for power MOS field effect transistor
05/11/1999US5903221 Method and apparatus for determining the moisture level in a buried splice
05/11/1999US5903220 Electrostatic discharge event detector
05/11/1999US5903164 Active wafer level contacting system
05/11/1999US5903163 Apparatus for testing integrated circuit devices
05/11/1999US5903162 Probe adapter for electronic devices
05/11/1999US5903160 Method and apparatus for testing an electrical conductor assembly
05/11/1999US5903159 Microwave sensor for sensing discharge faults
05/11/1999US5903158 Monitoring of internal partial discharges in a power transformer
05/11/1999US5903157 Measuring system for enclosed high-voltage switchgear
05/11/1999US5903156 Method for detecting trouble location in wire harnesses and wire harness to be used in the method
05/11/1999US5903155 Method of measurement for fault-distance determination on a HVDC power transmission line having at least two lines connected in parallel
05/11/1999US5903154 Battery test contact assembly
05/11/1999US5903146 Distributing test system and method
05/11/1999US5903144 Circuit configuration for phase difference measurement
05/11/1999US5903143 Probe apparatus with RC circuit connected between ground and a guard
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