| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 08/10/1999 | US5936845 IC package and IC probe card with organic substrate |
| 08/10/1999 | US5936687 Liquid crystal display having an electrostatic discharge protection circuit and a method for testing display quality using the circuit |
| 08/10/1999 | US5936536 Electrical insulation testing device and method for electrosurgical instruments |
| 08/10/1999 | US5936534 Alarm circuit for residual capacity of battery in portable radio transmitting and receiving apparatus |
| 08/10/1999 | US5936448 Integrated circuit having independently testable input-output circuits and test method therefor |
| 08/10/1999 | US5936423 Semiconductor IC with an output circuit power supply used as a signal input/output terminal |
| 08/10/1999 | US5936422 Method for testing and matching electrical components |
| 08/10/1999 | US5936420 Semiconductor inspecting apparatus |
| 08/10/1999 | US5936419 Test method and apparatus utilizing reactive charging currents to determine whether a test sample is properly connected |
| 08/10/1999 | US5936418 Semiconductor device socket |
| 08/10/1999 | US5936417 Test head for IC tester |
| 08/10/1999 | US5936416 Probe inspection apparatus |
| 08/10/1999 | US5936415 Method and apparatus for a pin-configurable integrated circuit tester board |
| 08/10/1999 | US5936409 Quality discrimination method for screening inspection of capacitors manufactured |
| 08/10/1999 | US5936408 Simplified contactless test of MCM thin film I/O nets using a plasma |
| 08/10/1999 | US5936407 Intravehicular auto harness integrity tester with switch |
| 08/10/1999 | US5936394 Method and apparatus for measuring critical current value of superconducting wire |
| 08/10/1999 | US5936385 System monitoring the discharging period of the charging/discharging cycles of a rechargeable battery, and host device including a smart battery |
| 08/10/1999 | US5936383 Self-correcting and adjustable method and apparatus for predicting the remaining capacity and reserve time of a battery on discharge |
| 08/10/1999 | US5936260 Semiconductor reliability test chip |
| 08/10/1999 | US5935266 Method for powering-up a microprocessor under debugger control |
| 08/10/1999 | US5935265 Scan path circuit permitting transition between first and second sets of check data |
| 08/10/1999 | US5935264 Method and apparatus for determining a set of tests for integrated circuit testing |
| 08/10/1999 | US5935256 Parallel processing integrated circuit tester |
| 08/10/1999 | US5935255 CPU core to bus speed ratio detection |
| 08/10/1999 | US5935180 Electrical test system for vehicle manufacturing quality assurance |
| 08/10/1999 | US5934914 Microelectronic contacts with asperities and methods of making same |
| 08/10/1999 | CA2110472C Method and apparatus for in-situ testing of integrated circuit chips |
| 08/05/1999 | WO1999039354A2 Event phase modulator for integrated circuit tester |
| 08/05/1999 | WO1999039218A2 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
| 08/05/1999 | WO1999039217A1 System and method for measurement of partial discharge signals in high voltage apparatus |
| 08/05/1999 | WO1999039215A1 Multi-probe test head |
| 08/05/1999 | WO1999028755A3 Electronic circuits for detecting the earthing system and for testing the efficiency of residual current circuit-breakers connected to phase, neutral and earth of electrical users |
| 08/05/1999 | WO1999021021A9 Semiconductor material characterizing method and apparatus |
| 08/05/1999 | DE19844703A1 Logic integrated semiconductor device for use as synchronous memory |
| 08/05/1999 | CA2319549A1 System and method for measurement of partial discharge signals in high voltage apparatus |
| 08/05/1999 | CA2281932A1 Multi-probe test head |
| 08/04/1999 | EP0933817A2 Semiconductor memory with stacked structure |
| 08/04/1999 | EP0933785A1 Semiconductor device and power supply current detecting method |
| 08/04/1999 | EP0933644A1 Device scan testing |
| 08/04/1999 | EP0933643A1 Procedure for fault localisation in AC networks |
| 08/04/1999 | EP0933642A2 A connection inspecting apparatus for a cord and a method for inspecting a connection of a cord |
| 08/04/1999 | EP0932904A1 Overvoltage detection circuit for test mode selection |
| 08/04/1999 | EP0870272A4 Reader using moving averages to break the (n,k) code barrier for upc, ean, and others |
| 08/04/1999 | EP0805978A4 Condition tester for a battery |
| 08/04/1999 | EP0805977A4 Composite film moisture barrier for on-cell tester |
| 08/04/1999 | EP0786094B1 System and method for making electromagnetic measurements using a transverse electromagnetic cell |
| 08/04/1999 | CN2331977Y Apparatus for testing voltage of vehicle storage battery |
| 08/04/1999 | CN1224932A Semiconductor memory device |
| 08/04/1999 | CN1224846A Contact-making apparatus affording ease of servicing |
| 08/04/1999 | CN1224835A Non-destructive method and device for measuring depth of buried interface |
| 08/04/1999 | CN1044519C Intelligent multiple-line numerical code identification device |
| 08/04/1999 | CN1044518C Printed circuit board test fixture and method |
| 08/03/1999 | US5933633 Computer-readable medium |
| 08/03/1999 | US5933619 Logic circuit design apparatus |
| 08/03/1999 | US5933522 Specific part searching method and device for memory LSI |
| 08/03/1999 | US5933378 Integrated circuit having forced substrate test mode with improved substrate isolation |
| 08/03/1999 | US5933358 Method and system of performing voltage drop analysis for power supply networks of VLSI circuits |
| 08/03/1999 | US5933356 Method and system for creating and verifying structural logic model of electronic design from behavioral description, including generation of logic and timing models |
| 08/03/1999 | US5933305 For an ac electrical system |
| 08/03/1999 | US5933020 Test structure |
| 08/03/1999 | US5933012 Device for sensing of electric discharges in a test object |
| 08/03/1999 | US5932891 Semiconductor device with test terminal and IC socket |
| 08/03/1999 | US5932323 Method and apparatus for mounting, inspecting and adjusting probe card needles |
| 08/03/1999 | US5931963 Fault simulation apparatus |
| 08/03/1999 | US5931962 Method and apparatus for improving timing accuracy of a semiconductor test system |
| 08/03/1999 | US5931953 For asserting test signals at controlled times |
| 08/03/1999 | US5931952 Parallel processing integrated circuit tester |
| 08/03/1999 | US5931311 Module handling apparatus and method with rapid switchover capability |
| 08/03/1999 | US5931048 Manipulator for automatic test equipment test head |
| 07/29/1999 | WO1999038229A1 Robust, small scale electrical contactor |
| 07/29/1999 | WO1999038209A2 Method and apparatus for temperature control of a semiconductor electrical-test contactor assembly |
| 07/29/1999 | WO1999038197A2 Test head structure for integrated circuit tester |
| 07/29/1999 | WO1999038024A1 Method for computer assisted optimization of inspection specifications and minimization of test software |
| 07/29/1999 | DE4417573C2 Testanordnung für Kurzschlußtests auf einer Leiterplatte und Verfahren zum Testen der Verbindung einer Mehrzahl von Knoten auf einer Leiterplatte unter Verwendung dieser Testanordnung Test arrangement for short tests on a circuit board and method for testing the connection of a plurality of nodes on a circuit board using these test arrangement |
| 07/29/1999 | DE19859762A1 Circuit for monitoring function of sensor system for refuse collection vehicle |
| 07/29/1999 | DE19838491A1 Measuring consistency evaluation method for semiconductor component testing device, e.g. for integrated circuit quality control testing |
| 07/29/1999 | DE19803032A1 Computerized optimization of test specifications for products and processes |
| 07/29/1999 | DE19801247A1 Device for the precise alignment of semi-conductor chips having controlled collapse connection pads onto a substrate |
| 07/28/1999 | EP0932240A2 Battery system and electric vehicle using the battery system |
| 07/28/1999 | EP0931392A1 Apparatus and method for restoring fiber optic communications network connections |
| 07/28/1999 | EP0931268A1 A test probe |
| 07/28/1999 | EP0820588A4 Multilayer moisture barrier for electrochemical cell tester |
| 07/28/1999 | CN2331083Y Temperature-control semi-conductor photoelectric characteristic testing sample stand |
| 07/28/1999 | CN2330999Y Accumulator automatic on-line detecting instrument |
| 07/28/1999 | CN2330998Y 气体放电管快速测试仪 Gas discharge tube tester fast |
| 07/28/1999 | CN2330997Y Motor protective device testing instrument |
| 07/28/1999 | CN1224220A Semiconductor memory capable of testing regardless of spare unit configuration |
| 07/28/1999 | CN1224219A Input buffer circuit for semiconductor IC circuit |
| 07/28/1999 | CN1223944A Side stand for two-wheel cycles |
| 07/28/1999 | CN1044408C Method for separating secondary cell |
| 07/28/1999 | CA2260510A1 Focused ion beam imaging method |
| 07/27/1999 | US5930735 Integrated circuit tester including at least one quasi-autonomous test instrument |
| 07/27/1999 | US5930588 Formed on top of a semiconductor substrate |
| 07/27/1999 | US5930382 Wiring pattern inspecting method and system for carrying out the same |
| 07/27/1999 | US5930271 Circuit testing apparatus for testing circuit device including functional block |
| 07/27/1999 | US5930270 Logic built in self-test diagnostic method |
| 07/27/1999 | US5930269 Testing system for semiconductor device without influence of defective device |
| 07/27/1999 | US5930187 One-chip LSI including a general memory and a logic |
| 07/27/1999 | US5930186 Method and apparatus for testing counter and serial access memory |