| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/25/2000 | US6018228 Rechargeable battery pack capable of transmitting dynamic data about itself |
| 01/25/2000 | US6018194 Transistor clamping fixture |
| 01/25/2000 | US6017215 Expandable panel for environmentally controllable chamber |
| 01/25/2000 | US6016884 Configuration for triggering a personal protection system |
| 01/25/2000 | CA2169290C Voice trouble-shooting system for computer-controlled machines |
| 01/25/2000 | CA2101077C Battery with strength indicator |
| 01/20/2000 | WO2000003569A1 Interconnect assembly for printed circuit boards and method of fabrication |
| 01/20/2000 | WO2000003368A1 Bus-operational sensor device and corresponding test method |
| 01/20/2000 | WO2000003259A2 Method and apparatus for distinguishing regions where a material is present on a surface |
| 01/20/2000 | WO2000003258A1 Integrated circuit with improved synchronism for an external clock signal at a data output |
| 01/20/2000 | WO2000003257A1 Thermal platform and method |
| 01/20/2000 | WO2000003255A2 Device without set-up kit for the targeted moving of electronic components |
| 01/20/2000 | WO2000003253A1 Polarization-sensitive near-field microwave microscope |
| 01/20/2000 | WO2000003252A2 Multi-point probe |
| 01/20/2000 | WO2000003074A1 Plating device |
| 01/20/2000 | DE19857256A1 IC (integrated circuit) socket for IC with multiple parallel pins |
| 01/20/2000 | DE19832387A1 Verfahren zum Feststellen von Einbau- und/oder Kalibrierungsfehlern einer Mehrzahl von Signalauskopplungseinheiten eines oder mehrerer Teilentladungsmeßsysteme A method for detecting the installation and / or calibration errors of a plurality of signal extraction units of one or more Teilentladungsmeßsysteme |
| 01/20/2000 | DE19831794A1 Transistor collector, base and emitter measuring circuit for determining intact function: uses logic components to drive indicators, applies stepwise increasing base pulses and compares with inverted collector signals |
| 01/20/2000 | DE19831723A1 Charge condition recognition method for vehicle battery, measuring battery voltage fall during starter operation and thereafter allocating charge state |
| 01/20/2000 | DE19830738A1 Verfahren und Vorrichtung zur richtungsabhängigen Fehlerortung oder Nachrichtenübertragung auf Niederspannungsnetzen im Betriebszustand Method and apparatus for directional fault location or messaging in low voltage distribution systems in operating condition |
| 01/20/2000 | DE19829967A1 Monitoring arrangement for electrical components, e.g. in inductive heater: measures voltages across components, processes values and displays condition |
| 01/20/2000 | DE19829966A1 Inductive heating device for at least two electrical similar, switched series components, which monitors voltages across components, compares and evaluates measured values and provides display if threshold values are exceeded |
| 01/20/2000 | CA2336531A1 Multi-point probe |
| 01/19/2000 | EP0973345A2 Apparatus and method for transmitting and registering calls for assistance |
| 01/19/2000 | EP0973224A1 Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
| 01/19/2000 | EP0973108A2 Field programmable printed circuit board |
| 01/19/2000 | EP0972207A1 Connection test method |
| 01/19/2000 | EP0972206A1 Method and device for detecting partial discharges |
| 01/19/2000 | EP0972204A1 Flexible shielded laminate beam for electrical contacts |
| 01/19/2000 | EP0807258B1 Test device for flat electronic assemblies |
| 01/19/2000 | EP0676073B2 System for checking the validity of a data carrier |
| 01/19/2000 | CN2359705Y Instrument for testing integrated circuit package |
| 01/19/2000 | CN2359704Y No-screen double-twisted-line tester |
| 01/19/2000 | CN1241725A IC test device |
| 01/18/2000 | US6016566 Comparator for semiconductor testing device |
| 01/18/2000 | US6016565 Semiconductor device testing apparatus |
| 01/18/2000 | US6016564 Method of design for testability, method of design for avoiding bus error and integrated circuit |
| 01/18/2000 | US6016563 Method and apparatus for testing a logic design of a programmable logic device |
| 01/18/2000 | US6016562 Inspection data analyzing apparatus for in-line inspection with enhanced display of inspection results |
| 01/18/2000 | US6016464 Method and system for characterizing terminations in a local area network |
| 01/18/2000 | US6016280 Semiconductor integrated circuit device |
| 01/18/2000 | US6016278 Failure analysis method and device |
| 01/18/2000 | US6016061 Cantilever type probe needle for probe card and method of fabrication and control thereof |
| 01/18/2000 | US6016060 Method, apparatus and system for testing bumped semiconductor components |
| 01/18/2000 | US6016058 In-service wiring verification circuitry |
| 01/18/2000 | US6016047 Battery management system and battery simulator |
| 01/18/2000 | US6016018 Electronic apparatus incorporating battery |
| 01/18/2000 | US6014965 Apparatus for recognizing the shape of a semiconductor wafer |
| 01/18/2000 | US6014901 Extraction force tester |
| 01/13/2000 | WO2000002058A1 Method and device for determining the dependence of a first measured quantity on a second measured quantity |
| 01/13/2000 | WO2000002057A1 Apparatus for detecting electrical shorts and opens on circuit boards having a plurality of bus lines |
| 01/13/2000 | DE19931278A1 Test card for IC testing device uses needle contacts coupled to contact test object |
| 01/13/2000 | DE19931047A1 Data protection method for electronic component testing machine |
| 01/13/2000 | DE19928981A1 Semiconductor memory testing device, e.g. for quality control testing |
| 01/13/2000 | DE19905719A1 Integrated semiconductor circuit with test connections |
| 01/13/2000 | DE19830772A1 Bus-betreibbare Sensorvorrichtung und entsprechendes Prüfverfahren Bus-operated sensor device and corresponding test methods |
| 01/13/2000 | DE19830571A1 Integrierte Schaltung Integrated circuit |
| 01/12/2000 | EP0971362A1 Data entegrity checking apparatus |
| 01/12/2000 | EP0971238A2 Procedure and apparatus for directional fault-location or information transmission on low voltage networks in use |
| 01/12/2000 | EP0970522A1 Bga connector with heat activated connection and disconnection means |
| 01/12/2000 | EP0768538B1 Method and tester for applying a pulse trigger to a unit to be triggered |
| 01/12/2000 | CN2358460Y Tester for testing battery capacity |
| 01/12/2000 | CN2358459Y Fault detector for silicon controlled dc speed governing system |
| 01/12/2000 | CN1241304A Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
| 01/12/2000 | CN1241259A Instrument for measuring voltages of cells |
| 01/12/2000 | CN1240939A Electronic component and device testing unit |
| 01/11/2000 | US6014764 Providing test vectors with pattern chaining definition |
| 01/11/2000 | US6014763 At-speed scan testing |
| 01/11/2000 | US6014760 Scheduling method and apparatus for a distributed automated testing system |
| 01/11/2000 | US6014734 Superscalar microprocessor configured to predict return addresses from a return stack storage |
| 01/11/2000 | US6014598 Model-based fault detection system for electric motors |
| 01/11/2000 | US6014336 Test enable control for built-in self-test |
| 01/11/2000 | US6014334 Sample and load scheme for observability of internal nodes in a PLD |
| 01/11/2000 | US6014305 ESD event detector |
| 01/11/2000 | US6014301 Fault indicator providing contact closure on fault detection |
| 01/11/2000 | US6014091 Sensor device, especially a hall sensor, with a binary output and a fault detection circuit |
| 01/11/2000 | US6014083 Metalclad switchgear assembly with partial discharge detection |
| 01/11/2000 | US6014050 Variable impedance delay elements |
| 01/11/2000 | US6014035 Test system and test method for liquid crystal display device |
| 01/11/2000 | US6014034 Method for testing semiconductor thin gate oxide |
| 01/11/2000 | US6014033 Method of identifying the point at which an integrated circuit fails a functional test |
| 01/11/2000 | US6014031 Apparatus for pressing an electronic card against contacts of a test socket |
| 01/11/2000 | US6014030 Current-level monitor with hierarchical precision |
| 01/11/2000 | US6014014 State-of-charge-measurable batteries |
| 01/11/2000 | US6014013 Battery charge management architecture |
| 01/11/2000 | US6014012 Apparatus for managing a battery unit having storage batteries |
| 01/11/2000 | US6014005 Method and circuit arrangement for the control of a motor |
| 01/11/2000 | US6013537 Method of semiconductor wafer testing |
| 01/11/2000 | US6013533 Real time quiescent current test limit methodology |
| 01/11/2000 | US6012836 Method of reducing boolean complements in code generated by a circuit compiler |
| 01/11/2000 | US6012833 Large-scale-integration circuit device and method of manufacturing same |
| 01/06/2000 | WO2000001208A1 Assembly of an electronic component with spring packaging |
| 01/06/2000 | WO2000000941A1 Wrist strap integrity check circuitry |
| 01/06/2000 | WO2000000839A1 Device for testing solar home systems |
| 01/06/2000 | WO2000000838A1 Method for monitoring electromechanical, pneumatic or hydraulic actuators, and implementing device |
| 01/06/2000 | WO2000000837A1 A skew calibration means and a method of skew calibration |
| 01/06/2000 | WO2000000836A1 A skew calibration means and a method of skew calibration |
| 01/06/2000 | WO1999056396A3 Testable ic having analog and digital circuits |
| 01/06/2000 | CA2346883A1 A skew calibration means and a method of skew calibration |
| 01/05/2000 | EP0969543A2 Battery with integral condition tester |